{"id":"https://openalex.org/W2535884435","doi":"https://doi.org/10.1109/iolts.2016.7604676","title":"Flexible in-silicon checking of run-time programmable assertions","display_name":"Flexible in-silicon checking of run-time programmable assertions","publication_year":2016,"publication_date":"2016-07-01","ids":{"openalex":"https://openalex.org/W2535884435","doi":"https://doi.org/10.1109/iolts.2016.7604676","mag":"2535884435"},"language":"en","primary_location":{"id":"doi:10.1109/iolts.2016.7604676","is_oa":false,"landing_page_url":"https://doi.org/10.1109/iolts.2016.7604676","pdf_url":null,"source":null,"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"2016 IEEE 22nd International Symposium on On-Line Testing and Robust System Design (IOLTS)","raw_type":"proceedings-article"},"type":"article","indexed_in":["crossref"],"open_access":{"is_oa":false,"oa_status":"closed","oa_url":null,"any_repository_has_fulltext":false},"authorships":[{"author_position":"first","author":{"id":"https://openalex.org/A5057945028","display_name":"Yumin Zhou","orcid":null},"institutions":[{"id":"https://openalex.org/I8087733","display_name":"University of T\u00fcbingen","ror":"https://ror.org/03a1kwz48","country_code":"DE","type":"education","lineage":["https://openalex.org/I8087733"]}],"countries":["DE"],"is_corresponding":true,"raw_author_name":"Yumin Zhou","raw_affiliation_strings":["Wilhelm-Schickard-Institute, University of T\u00fcbingen, T\u00fcbingen, Germany"],"affiliations":[{"raw_affiliation_string":"Wilhelm-Schickard-Institute, University of T\u00fcbingen, T\u00fcbingen, Germany","institution_ids":["https://openalex.org/I8087733"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5074802358","display_name":"Oliver Bringmann","orcid":"https://orcid.org/0000-0002-1615-507X"},"institutions":[{"id":"https://openalex.org/I8087733","display_name":"University of T\u00fcbingen","ror":"https://ror.org/03a1kwz48","country_code":"DE","type":"education","lineage":["https://openalex.org/I8087733"]}],"countries":["DE"],"is_corresponding":false,"raw_author_name":"Oliver Bringmann","raw_affiliation_strings":["Wilhelm-Schickard-Institute, University of T\u00fcbingen, T\u00fcbingen, Germany"],"affiliations":[{"raw_affiliation_string":"Wilhelm-Schickard-Institute, University of T\u00fcbingen, T\u00fcbingen, Germany","institution_ids":["https://openalex.org/I8087733"]}]},{"author_position":"last","author":{"id":"https://openalex.org/A5087076980","display_name":"Wolfgang Rosenstiel","orcid":null},"institutions":[{"id":"https://openalex.org/I8087733","display_name":"University of T\u00fcbingen","ror":"https://ror.org/03a1kwz48","country_code":"DE","type":"education","lineage":["https://openalex.org/I8087733"]}],"countries":["DE"],"is_corresponding":false,"raw_author_name":"Wolfgang Rosenstiel","raw_affiliation_strings":["Faculty of Science, University of T\u00fcbingen"],"affiliations":[{"raw_affiliation_string":"Faculty of Science, University of T\u00fcbingen","institution_ids":["https://openalex.org/I8087733"]}]}],"institutions":[],"countries_distinct_count":1,"institutions_distinct_count":3,"corresponding_author_ids":["https://openalex.org/A5057945028"],"corresponding_institution_ids":["https://openalex.org/I8087733"],"apc_list":null,"apc_paid":null,"fwci":0.1838,"has_fulltext":false,"cited_by_count":1,"citation_normalized_percentile":{"value":0.58720089,"is_in_top_1_percent":false,"is_in_top_10_percent":false},"cited_by_percentile_year":{"min":90,"max":94},"biblio":{"volume":"9","issue":null,"first_page":"78","last_page":"83"},"is_retracted":false,"is_paratext":false,"is_xpac":false,"primary_topic":{"id":"https://openalex.org/T11005","display_name":"Radiation Effects in Electronics","score":0.9998999834060669,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},"topics":[{"id":"https://openalex.org/T11005","display_name":"Radiation Effects in Electronics","score":0.9998999834060669,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T10142","display_name":"Formal Methods in Verification","score":0.9993000030517578,"subfield":{"id":"https://openalex.org/subfields/1703","display_name":"Computational Theory and Mathematics"},"field":{"id":"https://openalex.org/fields/17","display_name":"Computer Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T10904","display_name":"Embedded Systems Design Techniques","score":0.9990000128746033,"subfield":{"id":"https://openalex.org/subfields/1708","display_name":"Hardware and Architecture"},"field":{"id":"https://openalex.org/fields/17","display_name":"Computer Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"keywords":[{"id":"https://openalex.org/keywords/assertion","display_name":"Assertion","score":0.9264185428619385},{"id":"https://openalex.org/keywords/computer-science","display_name":"Computer science","score":0.8050795197486877},{"id":"https://openalex.org/keywords/software","display_name":"Software","score":0.5667747855186462},{"id":"https://openalex.org/keywords/programming-language","display_name":"Programming language","score":0.5509440898895264},{"id":"https://openalex.org/keywords/model-checking","display_name":"Model checking","score":0.49563300609588623},{"id":"https://openalex.org/keywords/field-programmable-gate-array","display_name":"Field-programmable gate array","score":0.4886498749256134},{"id":"https://openalex.org/keywords/embedded-system","display_name":"Embedded system","score":0.47045719623565674},{"id":"https://openalex.org/keywords/state","display_name":"State (computer science)","score":0.41340917348861694}],"concepts":[{"id":"https://openalex.org/C40422974","wikidata":"https://www.wikidata.org/wiki/Q741248","display_name":"Assertion","level":2,"score":0.9264185428619385},{"id":"https://openalex.org/C41008148","wikidata":"https://www.wikidata.org/wiki/Q21198","display_name":"Computer science","level":0,"score":0.8050795197486877},{"id":"https://openalex.org/C2777904410","wikidata":"https://www.wikidata.org/wiki/Q7397","display_name":"Software","level":2,"score":0.5667747855186462},{"id":"https://openalex.org/C199360897","wikidata":"https://www.wikidata.org/wiki/Q9143","display_name":"Programming language","level":1,"score":0.5509440898895264},{"id":"https://openalex.org/C110251889","wikidata":"https://www.wikidata.org/wiki/Q1569697","display_name":"Model checking","level":2,"score":0.49563300609588623},{"id":"https://openalex.org/C42935608","wikidata":"https://www.wikidata.org/wiki/Q190411","display_name":"Field-programmable gate array","level":2,"score":0.4886498749256134},{"id":"https://openalex.org/C149635348","wikidata":"https://www.wikidata.org/wiki/Q193040","display_name":"Embedded system","level":1,"score":0.47045719623565674},{"id":"https://openalex.org/C48103436","wikidata":"https://www.wikidata.org/wiki/Q599031","display_name":"State (computer science)","level":2,"score":0.41340917348861694}],"mesh":[],"locations_count":1,"locations":[{"id":"doi:10.1109/iolts.2016.7604676","is_oa":false,"landing_page_url":"https://doi.org/10.1109/iolts.2016.7604676","pdf_url":null,"source":null,"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"2016 IEEE 22nd International Symposium on On-Line Testing and Robust System Design (IOLTS)","raw_type":"proceedings-article"}],"best_oa_location":null,"sustainable_development_goals":[{"score":0.6399999856948853,"display_name":"Industry, innovation and infrastructure","id":"https://metadata.un.org/sdg/9"}],"awards":[],"funders":[],"has_content":{"pdf":false,"grobid_xml":false},"content_urls":null,"referenced_works_count":23,"referenced_works":["https://openalex.org/W17622403","https://openalex.org/W567973435","https://openalex.org/W604137612","https://openalex.org/W1595370658","https://openalex.org/W1714370737","https://openalex.org/W1934160092","https://openalex.org/W1991572589","https://openalex.org/W1997470865","https://openalex.org/W2003519602","https://openalex.org/W2068622604","https://openalex.org/W2093905071","https://openalex.org/W2104392085","https://openalex.org/W2105167627","https://openalex.org/W2122146819","https://openalex.org/W2152154822","https://openalex.org/W2188922879","https://openalex.org/W2491385276","https://openalex.org/W4246045935","https://openalex.org/W4292002200","https://openalex.org/W6600728523","https://openalex.org/W6640430588","https://openalex.org/W6667909597","https://openalex.org/W6687424872"],"related_works":["https://openalex.org/W1498103021","https://openalex.org/W2035655557","https://openalex.org/W1968067090","https://openalex.org/W4295166216","https://openalex.org/W2177044681","https://openalex.org/W2363944576","https://openalex.org/W1996242078","https://openalex.org/W2351041855","https://openalex.org/W2570254841","https://openalex.org/W2742986847"],"abstract_inverted_index":{"Recently,":[0],"Assertion-Based":[1],"Verification":[2],"(ABV)":[3],"has":[4],"been":[5],"significantly":[6],"improved":[7],"and":[8,93],"used":[9,73],"not":[10],"only":[11],"in":[12,16,59,99],"academia":[13],"but":[14],"also":[15],"industry.":[17],"In":[18,37],"this":[19,108,119],"paper,":[20],"we":[21],"present":[22],"a":[23,31],"new":[24],"assertion":[25,33,68],"checking":[26],"approach":[27,109],"that":[28],"dynamically":[29],"interprets":[30],"software-defined":[32],"checker":[34,49,86],"during":[35],"run-time.":[36],"contrast":[38],"to":[39,50],"the":[40,44,60,76,82,85,88,91,94,100],"state-of-the-art":[41],"hardware":[42,65],"checker,":[43],"presented":[45],"method":[46],"compiles":[47],"its":[48],"instructions,":[51],"which":[52],"can":[53],"be":[54],"changed":[55],"flexibly":[56],"by":[57],"software":[58],"in-silicon":[61],"phase.":[62],"A":[63],"stand-alone":[64],"block,":[66],"called":[67],"processing":[69],"unit":[70,80],"(APU),":[71],"is":[72],"for":[74],"implementing":[75],"compiled":[77],"instructions.":[78],"This":[79],"handles":[81],"storage":[83],"of":[84,90,96,118],"code,":[87],"execution":[89],"checking,":[92],"feedback":[95],"checked":[97],"results":[98],"system":[101],"run-time":[102],"environment.":[103],"We":[104],"have":[105],"successfully":[106],"evaluated":[107],"on":[110],"an":[111],"FPGA-based":[112],"prototyping":[113],"board,":[114],"showing":[115],"measurable":[116],"benefits":[117],"approach.":[120]},"counts_by_year":[{"year":2018,"cited_by_count":1}],"updated_date":"2025-11-06T03:46:38.306776","created_date":"2025-10-10T00:00:00"}