{"id":"https://openalex.org/W2538884290","doi":"https://doi.org/10.1109/iolts.2016.7604663","title":"Cache-aware reliability evaluation through LLVM-based analysis and fault injection","display_name":"Cache-aware reliability evaluation through LLVM-based analysis and fault injection","publication_year":2016,"publication_date":"2016-07-01","ids":{"openalex":"https://openalex.org/W2538884290","doi":"https://doi.org/10.1109/iolts.2016.7604663","mag":"2538884290"},"language":"en","primary_location":{"id":"doi:10.1109/iolts.2016.7604663","is_oa":false,"landing_page_url":"https://doi.org/10.1109/iolts.2016.7604663","pdf_url":null,"source":null,"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"2016 IEEE 22nd International Symposium on On-Line Testing and Robust System Design (IOLTS)","raw_type":"proceedings-article"},"type":"article","indexed_in":["crossref"],"open_access":{"is_oa":true,"oa_status":"green","oa_url":"https://hal-lirmm.ccsd.cnrs.fr/lirmm-01444619","any_repository_has_fulltext":true},"authorships":[{"author_position":"first","author":{"id":"https://openalex.org/A5090261822","display_name":"Maha Kooli","orcid":"https://orcid.org/0000-0003-3594-8371"},"institutions":[{"id":"https://openalex.org/I4210101743","display_name":"Laboratoire d'Informatique, de Robotique et de Micro\u00e9lectronique de Montpellier","ror":"https://ror.org/013yean28","country_code":"FR","type":"facility","lineage":["https://openalex.org/I1294671590","https://openalex.org/I1294671590","https://openalex.org/I1326498283","https://openalex.org/I151295451","https://openalex.org/I19894307","https://openalex.org/I4210101743","https://openalex.org/I4210159245","https://openalex.org/I4412460525"]}],"countries":["FR"],"is_corresponding":true,"raw_author_name":"Maha Kooli","raw_affiliation_strings":["Laboratoire d'Informatique, de Robotique et de Microelectronique de Montpellier (LIRMM), France"],"affiliations":[{"raw_affiliation_string":"Laboratoire d'Informatique, de Robotique et de Microelectronique de Montpellier (LIRMM), France","institution_ids":["https://openalex.org/I4210101743"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5078888989","display_name":"Giorgio Di Natale","orcid":"https://orcid.org/0000-0001-8063-5388"},"institutions":[{"id":"https://openalex.org/I4210101743","display_name":"Laboratoire d'Informatique, de Robotique et de Micro\u00e9lectronique de Montpellier","ror":"https://ror.org/013yean28","country_code":"FR","type":"facility","lineage":["https://openalex.org/I1294671590","https://openalex.org/I1294671590","https://openalex.org/I1326498283","https://openalex.org/I151295451","https://openalex.org/I19894307","https://openalex.org/I4210101743","https://openalex.org/I4210159245","https://openalex.org/I4412460525"]}],"countries":["FR"],"is_corresponding":false,"raw_author_name":"Giorgio Di Natale","raw_affiliation_strings":["Laboratoire d'Informatique, de Robotique et de Microelectronique de Montpellier (LIRMM), France"],"affiliations":[{"raw_affiliation_string":"Laboratoire d'Informatique, de Robotique et de Microelectronique de Montpellier (LIRMM), France","institution_ids":["https://openalex.org/I4210101743"]}]},{"author_position":"last","author":{"id":"https://openalex.org/A5074986688","display_name":"Alberto Bosio","orcid":"https://orcid.org/0000-0001-6116-7339"},"institutions":[{"id":"https://openalex.org/I4210101743","display_name":"Laboratoire d'Informatique, de Robotique et de Micro\u00e9lectronique de Montpellier","ror":"https://ror.org/013yean28","country_code":"FR","type":"facility","lineage":["https://openalex.org/I1294671590","https://openalex.org/I1294671590","https://openalex.org/I1326498283","https://openalex.org/I151295451","https://openalex.org/I19894307","https://openalex.org/I4210101743","https://openalex.org/I4210159245","https://openalex.org/I4412460525"]}],"countries":["FR"],"is_corresponding":false,"raw_author_name":"Alberto Bosio","raw_affiliation_strings":["Laboratoire d'Informatique, de Robotique et de Microelectronique de Montpellier (LIRMM), France"],"affiliations":[{"raw_affiliation_string":"Laboratoire d'Informatique, de Robotique et de Microelectronique de Montpellier (LIRMM), France","institution_ids":["https://openalex.org/I4210101743"]}]}],"institutions":[],"countries_distinct_count":1,"institutions_distinct_count":3,"corresponding_author_ids":["https://openalex.org/A5090261822"],"corresponding_institution_ids":["https://openalex.org/I4210101743"],"apc_list":null,"apc_paid":null,"fwci":1.6764,"has_fulltext":false,"cited_by_count":12,"citation_normalized_percentile":{"value":0.85904713,"is_in_top_1_percent":false,"is_in_top_10_percent":false},"cited_by_percentile_year":{"min":89,"max":99},"biblio":{"volume":null,"issue":null,"first_page":"19","last_page":"22"},"is_retracted":false,"is_paratext":false,"is_xpac":false,"primary_topic":{"id":"https://openalex.org/T11005","display_name":"Radiation Effects in Electronics","score":1.0,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},"topics":[{"id":"https://openalex.org/T11005","display_name":"Radiation Effects in Electronics","score":1.0,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T10054","display_name":"Parallel Computing and Optimization Techniques","score":0.9976999759674072,"subfield":{"id":"https://openalex.org/subfields/1708","display_name":"Hardware and Architecture"},"field":{"id":"https://openalex.org/fields/17","display_name":"Computer Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T10933","display_name":"Real-Time Systems Scheduling","score":0.9962999820709229,"subfield":{"id":"https://openalex.org/subfields/1708","display_name":"Hardware and Architecture"},"field":{"id":"https://openalex.org/fields/17","display_name":"Computer Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"keywords":[{"id":"https://openalex.org/keywords/fault-injection","display_name":"Fault injection","score":0.8606724739074707},{"id":"https://openalex.org/keywords/computer-science","display_name":"Computer science","score":0.8289501667022705},{"id":"https://openalex.org/keywords/cache","display_name":"Cache","score":0.7339490056037903},{"id":"https://openalex.org/keywords/embedded-system","display_name":"Embedded system","score":0.5713850259780884},{"id":"https://openalex.org/keywords/reliability","display_name":"Reliability (semiconductor)","score":0.5460413694381714},{"id":"https://openalex.org/keywords/vhdl","display_name":"VHDL","score":0.5215194821357727},{"id":"https://openalex.org/keywords/fault","display_name":"Fault (geology)","score":0.5072362422943115},{"id":"https://openalex.org/keywords/process","display_name":"Process (computing)","score":0.41409018635749817},{"id":"https://openalex.org/keywords/parallel-computing","display_name":"Parallel computing","score":0.3506847620010376},{"id":"https://openalex.org/keywords/software","display_name":"Software","score":0.34935083985328674},{"id":"https://openalex.org/keywords/reliability-engineering","display_name":"Reliability engineering","score":0.34900128841400146},{"id":"https://openalex.org/keywords/field-programmable-gate-array","display_name":"Field-programmable gate array","score":0.32174423336982727},{"id":"https://openalex.org/keywords/operating-system","display_name":"Operating system","score":0.26267796754837036}],"concepts":[{"id":"https://openalex.org/C2775928411","wikidata":"https://www.wikidata.org/wiki/Q2041312","display_name":"Fault injection","level":3,"score":0.8606724739074707},{"id":"https://openalex.org/C41008148","wikidata":"https://www.wikidata.org/wiki/Q21198","display_name":"Computer science","level":0,"score":0.8289501667022705},{"id":"https://openalex.org/C115537543","wikidata":"https://www.wikidata.org/wiki/Q165596","display_name":"Cache","level":2,"score":0.7339490056037903},{"id":"https://openalex.org/C149635348","wikidata":"https://www.wikidata.org/wiki/Q193040","display_name":"Embedded system","level":1,"score":0.5713850259780884},{"id":"https://openalex.org/C43214815","wikidata":"https://www.wikidata.org/wiki/Q7310987","display_name":"Reliability (semiconductor)","level":3,"score":0.5460413694381714},{"id":"https://openalex.org/C36941000","wikidata":"https://www.wikidata.org/wiki/Q209455","display_name":"VHDL","level":3,"score":0.5215194821357727},{"id":"https://openalex.org/C175551986","wikidata":"https://www.wikidata.org/wiki/Q47089","display_name":"Fault (geology)","level":2,"score":0.5072362422943115},{"id":"https://openalex.org/C98045186","wikidata":"https://www.wikidata.org/wiki/Q205663","display_name":"Process (computing)","level":2,"score":0.41409018635749817},{"id":"https://openalex.org/C173608175","wikidata":"https://www.wikidata.org/wiki/Q232661","display_name":"Parallel computing","level":1,"score":0.3506847620010376},{"id":"https://openalex.org/C2777904410","wikidata":"https://www.wikidata.org/wiki/Q7397","display_name":"Software","level":2,"score":0.34935083985328674},{"id":"https://openalex.org/C200601418","wikidata":"https://www.wikidata.org/wiki/Q2193887","display_name":"Reliability engineering","level":1,"score":0.34900128841400146},{"id":"https://openalex.org/C42935608","wikidata":"https://www.wikidata.org/wiki/Q190411","display_name":"Field-programmable gate array","level":2,"score":0.32174423336982727},{"id":"https://openalex.org/C111919701","wikidata":"https://www.wikidata.org/wiki/Q9135","display_name":"Operating system","level":1,"score":0.26267796754837036},{"id":"https://openalex.org/C121332964","wikidata":"https://www.wikidata.org/wiki/Q413","display_name":"Physics","level":0,"score":0.0},{"id":"https://openalex.org/C163258240","wikidata":"https://www.wikidata.org/wiki/Q25342","display_name":"Power (physics)","level":2,"score":0.0},{"id":"https://openalex.org/C62520636","wikidata":"https://www.wikidata.org/wiki/Q944","display_name":"Quantum mechanics","level":1,"score":0.0},{"id":"https://openalex.org/C165205528","wikidata":"https://www.wikidata.org/wiki/Q83371","display_name":"Seismology","level":1,"score":0.0},{"id":"https://openalex.org/C127313418","wikidata":"https://www.wikidata.org/wiki/Q1069","display_name":"Geology","level":0,"score":0.0},{"id":"https://openalex.org/C127413603","wikidata":"https://www.wikidata.org/wiki/Q11023","display_name":"Engineering","level":0,"score":0.0}],"mesh":[],"locations_count":2,"locations":[{"id":"doi:10.1109/iolts.2016.7604663","is_oa":false,"landing_page_url":"https://doi.org/10.1109/iolts.2016.7604663","pdf_url":null,"source":null,"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"2016 IEEE 22nd International Symposium on On-Line Testing and Robust System Design (IOLTS)","raw_type":"proceedings-article"},{"id":"pmh:oai:HAL:lirmm-01444619v1","is_oa":true,"landing_page_url":"https://hal-lirmm.ccsd.cnrs.fr/lirmm-01444619","pdf_url":null,"source":{"id":"https://openalex.org/S4306402512","display_name":"HAL (Le Centre pour la Communication Scientifique Directe)","issn_l":null,"issn":null,"is_oa":false,"is_in_doaj":false,"is_core":false,"host_organization":"https://openalex.org/I1294671590","host_organization_name":"Centre National de la Recherche Scientifique","host_organization_lineage":["https://openalex.org/I1294671590"],"host_organization_lineage_names":[],"type":"repository"},"license":"other-oa","license_id":"https://openalex.org/licenses/other-oa","version":"submittedVersion","is_accepted":false,"is_published":false,"raw_source_name":"http://tima.imag.fr/conferences/iolts/iolts16/","raw_type":"Conference papers"}],"best_oa_location":{"id":"pmh:oai:HAL:lirmm-01444619v1","is_oa":true,"landing_page_url":"https://hal-lirmm.ccsd.cnrs.fr/lirmm-01444619","pdf_url":null,"source":{"id":"https://openalex.org/S4306402512","display_name":"HAL (Le Centre pour la Communication Scientifique Directe)","issn_l":null,"issn":null,"is_oa":false,"is_in_doaj":false,"is_core":false,"host_organization":"https://openalex.org/I1294671590","host_organization_name":"Centre National de la Recherche Scientifique","host_organization_lineage":["https://openalex.org/I1294671590"],"host_organization_lineage_names":[],"type":"repository"},"license":"other-oa","license_id":"https://openalex.org/licenses/other-oa","version":"submittedVersion","is_accepted":false,"is_published":false,"raw_source_name":"http://tima.imag.fr/conferences/iolts/iolts16/","raw_type":"Conference papers"},"sustainable_development_goals":[],"awards":[],"funders":[],"has_content":{"grobid_xml":false,"pdf":false},"content_urls":null,"referenced_works_count":19,"referenced_works":["https://openalex.org/W611078108","https://openalex.org/W1911878188","https://openalex.org/W2033589075","https://openalex.org/W2049025281","https://openalex.org/W2055934382","https://openalex.org/W2062132293","https://openalex.org/W2098473740","https://openalex.org/W2115194678","https://openalex.org/W2135254996","https://openalex.org/W2144512449","https://openalex.org/W2152640154","https://openalex.org/W2153185479","https://openalex.org/W2395736669","https://openalex.org/W2413100097","https://openalex.org/W3147044877","https://openalex.org/W3149134903","https://openalex.org/W4246166885","https://openalex.org/W6654520830","https://openalex.org/W6681412805"],"related_works":["https://openalex.org/W3004362061","https://openalex.org/W4297665406","https://openalex.org/W2364622490","https://openalex.org/W2042515040","https://openalex.org/W2383986884","https://openalex.org/W2356141508","https://openalex.org/W1735031787","https://openalex.org/W2749962643","https://openalex.org/W2390807153","https://openalex.org/W2538906952"],"abstract_inverted_index":{"Reliability":[0],"evaluation":[1],"is":[2,8,32,102,143],"a":[3,58,113],"high":[4],"costly":[5],"process":[6],"that":[7,64],"mainly":[9],"carried":[10],"out":[11],"through":[12],"fault":[13,30,48,155,172],"injection":[14,31,49,156],"or":[15],"by":[16,61],"means":[17],"of":[18,57,78,83,139,176,182],"analytical":[19,23,46],"techniques.":[20,157],"While":[21],"the":[22,29,55,67,70,80,84,92,96,105,118,121,125,131,140,144,159,163,177,180,183],"techniques":[24,50],"are":[25],"fast":[26],"but":[27,35],"inaccurate,":[28],"more":[33],"accurate":[34],"extremely":[36],"time":[37],"consuming.":[38],"This":[39],"paper":[40],"presents":[41],"an":[42,170],"hybrid":[43],"approach":[44,101,142],"combining":[45],"and":[47,69,128,130],"in":[51,149],"order":[52],"to":[53,74,153,166],"evaluate":[54],"reliability":[56],"computing":[59],"system,":[60],"considering":[62],"errors":[63],"affect":[65],"both":[66],"data":[68],"instruction":[71,134],"cache.":[72],"Compared":[73],"existing":[75,154],"techniques,":[76],"instead":[77],"targeting":[79],"hardware":[81],"model":[82],"cache":[85,114,126],"(e.g.,":[86],"VHDL":[87],"description),":[88],"we":[89,161],"only":[90],"consider":[91],"running":[93],"application":[94,122],"(i.e.,":[95],"software":[97],"layer).":[98],"The":[99,136,174],"proposed":[100,141],"based":[103],"on":[104],"Low-Level":[106],"Virtual":[107],"Machine":[108],"(LLVM)":[109],"framework":[110],"coupled":[111],"with":[112,169],"emulator.":[115],"As":[116],"input,":[117],"tool":[119],"requires":[120],"source":[123],"code,":[124],"size":[127],"policy,":[129],"target":[132],"microprocessor":[133],"set.":[135],"main":[137],"advantage":[138],"achieved":[145],"speed":[146],"up":[147],"quantified":[148],"magnitude":[150],"orders":[151],"compared":[152],"For":[158],"validation,":[160],"compare":[162],"simulation":[164],"results":[165,178],"those":[167],"obtained":[168],"FPGA-based":[171],"injector.":[173],"similarity":[175],"proves":[179],"accuracy":[181],"approach.":[184]},"counts_by_year":[{"year":2026,"cited_by_count":1},{"year":2025,"cited_by_count":1},{"year":2021,"cited_by_count":1},{"year":2019,"cited_by_count":3},{"year":2018,"cited_by_count":2},{"year":2017,"cited_by_count":4}],"updated_date":"2026-03-10T16:38:18.471706","created_date":"2025-10-10T00:00:00"}