{"id":"https://openalex.org/W1541509066","doi":"https://doi.org/10.1109/iolts.2015.7229860","title":"Low leakage radiation tolerant CAM/TCAM cell","display_name":"Low leakage radiation tolerant CAM/TCAM cell","publication_year":2015,"publication_date":"2015-07-01","ids":{"openalex":"https://openalex.org/W1541509066","doi":"https://doi.org/10.1109/iolts.2015.7229860","mag":"1541509066"},"language":"en","primary_location":{"id":"doi:10.1109/iolts.2015.7229860","is_oa":false,"landing_page_url":"https://doi.org/10.1109/iolts.2015.7229860","pdf_url":null,"source":null,"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"2015 IEEE 21st International On-Line Testing Symposium (IOLTS)","raw_type":"proceedings-article"},"type":"article","indexed_in":["crossref"],"open_access":{"is_oa":false,"oa_status":"closed","oa_url":null,"any_repository_has_fulltext":false},"authorships":[{"author_position":"first","author":{"id":"https://openalex.org/A5080261012","display_name":"Nikolaos Eftaxiopoulos","orcid":null},"institutions":[{"id":"https://openalex.org/I174458059","display_name":"National Technical University of Athens","ror":"https://ror.org/03cx6bg69","country_code":"GR","type":"education","lineage":["https://openalex.org/I174458059"]}],"countries":["GR"],"is_corresponding":false,"raw_author_name":"Nikolaos Eftaxiopoulos","raw_affiliation_strings":["Department of Computer Science, National Technical University of Athens, Greece","Department of Computer Science, School of Electrical and Computer Engineering, National Technical University of Athens, Greece#TAB#"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Department of Computer Science, National Technical University of Athens, Greece","institution_ids":["https://openalex.org/I174458059"]},{"raw_affiliation_string":"Department of Computer Science, School of Electrical and Computer Engineering, National Technical University of Athens, Greece#TAB#","institution_ids":["https://openalex.org/I174458059"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5067319820","display_name":"Nicholas Axelos","orcid":null},"institutions":[{"id":"https://openalex.org/I174458059","display_name":"National Technical University of Athens","ror":"https://ror.org/03cx6bg69","country_code":"GR","type":"education","lineage":["https://openalex.org/I174458059"]}],"countries":["GR"],"is_corresponding":false,"raw_author_name":"Nicholas Axelos","raw_affiliation_strings":["Department of Computer Science, National Technical University of Athens, Greece","Department of Computer Science, School of Electrical and Computer Engineering, National Technical University of Athens, Greece#TAB#"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Department of Computer Science, National Technical University of Athens, Greece","institution_ids":["https://openalex.org/I174458059"]},{"raw_affiliation_string":"Department of Computer Science, School of Electrical and Computer Engineering, National Technical University of Athens, Greece#TAB#","institution_ids":["https://openalex.org/I174458059"]}]},{"author_position":"last","author":{"id":"https://openalex.org/A5088085592","display_name":"Kiamal Pekmestzi","orcid":"https://orcid.org/0000-0001-8612-2700"},"institutions":[{"id":"https://openalex.org/I174458059","display_name":"National Technical University of Athens","ror":"https://ror.org/03cx6bg69","country_code":"GR","type":"education","lineage":["https://openalex.org/I174458059"]}],"countries":["GR"],"is_corresponding":false,"raw_author_name":"Kiamal Pekmestzi","raw_affiliation_strings":["Department of Computer Science, National Technical University of Athens, Greece","Department of Computer Science, School of Electrical and Computer Engineering, National Technical University of Athens, Greece#TAB#"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Department of Computer Science, National Technical University of Athens, Greece","institution_ids":["https://openalex.org/I174458059"]},{"raw_affiliation_string":"Department of Computer Science, School of Electrical and Computer Engineering, National Technical University of Athens, Greece#TAB#","institution_ids":["https://openalex.org/I174458059"]}]}],"institutions":[],"countries_distinct_count":1,"institutions_distinct_count":1,"corresponding_author_ids":[],"corresponding_institution_ids":["https://openalex.org/I174458059"],"apc_list":null,"apc_paid":null,"fwci":1.6064,"has_fulltext":false,"cited_by_count":13,"citation_normalized_percentile":{"value":0.84819625,"is_in_top_1_percent":false,"is_in_top_10_percent":false},"cited_by_percentile_year":{"min":90,"max":99},"biblio":{"volume":null,"issue":null,"first_page":"206","last_page":"211"},"is_retracted":false,"is_paratext":false,"is_xpac":false,"primary_topic":{"id":"https://openalex.org/T11005","display_name":"Radiation Effects in Electronics","score":1.0,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},"topics":[{"id":"https://openalex.org/T11005","display_name":"Radiation Effects in Electronics","score":1.0,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T10772","display_name":"Distributed systems and fault tolerance","score":0.9961000084877014,"subfield":{"id":"https://openalex.org/subfields/1705","display_name":"Computer Networks and Communications"},"field":{"id":"https://openalex.org/fields/17","display_name":"Computer Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T10502","display_name":"Advanced Memory and Neural Computing","score":0.9940999746322632,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"keywords":[{"id":"https://openalex.org/keywords/spice","display_name":"Spice","score":0.7661058902740479},{"id":"https://openalex.org/keywords/leakage","display_name":"Leakage (economics)","score":0.6968190670013428},{"id":"https://openalex.org/keywords/computer-science","display_name":"Computer science","score":0.5655853152275085},{"id":"https://openalex.org/keywords/cmos","display_name":"CMOS","score":0.5500591397285461},{"id":"https://openalex.org/keywords/dice","display_name":"Dice","score":0.5264366865158081},{"id":"https://openalex.org/keywords/node","display_name":"Node (physics)","score":0.46619290113449097},{"id":"https://openalex.org/keywords/dissipation","display_name":"Dissipation","score":0.4645061194896698},{"id":"https://openalex.org/keywords/standard-cell","display_name":"Standard cell","score":0.4518468379974365},{"id":"https://openalex.org/keywords/soft-error","display_name":"Soft error","score":0.43521106243133545},{"id":"https://openalex.org/keywords/embedded-system","display_name":"Embedded system","score":0.430059015750885},{"id":"https://openalex.org/keywords/computer-hardware","display_name":"Computer hardware","score":0.4236801862716675},{"id":"https://openalex.org/keywords/electronic-engineering","display_name":"Electronic engineering","score":0.37769174575805664},{"id":"https://openalex.org/keywords/engineering","display_name":"Engineering","score":0.2588425278663635},{"id":"https://openalex.org/keywords/integrated-circuit","display_name":"Integrated circuit","score":0.24587902426719666},{"id":"https://openalex.org/keywords/operating-system","display_name":"Operating system","score":0.11562168598175049},{"id":"https://openalex.org/keywords/physics","display_name":"Physics","score":0.06600672006607056}],"concepts":[{"id":"https://openalex.org/C2780077345","wikidata":"https://www.wikidata.org/wiki/Q16891888","display_name":"Spice","level":2,"score":0.7661058902740479},{"id":"https://openalex.org/C2777042071","wikidata":"https://www.wikidata.org/wiki/Q6509304","display_name":"Leakage (economics)","level":2,"score":0.6968190670013428},{"id":"https://openalex.org/C41008148","wikidata":"https://www.wikidata.org/wiki/Q21198","display_name":"Computer science","level":0,"score":0.5655853152275085},{"id":"https://openalex.org/C46362747","wikidata":"https://www.wikidata.org/wiki/Q173431","display_name":"CMOS","level":2,"score":0.5500591397285461},{"id":"https://openalex.org/C22029948","wikidata":"https://www.wikidata.org/wiki/Q45089","display_name":"Dice","level":2,"score":0.5264366865158081},{"id":"https://openalex.org/C62611344","wikidata":"https://www.wikidata.org/wiki/Q1062658","display_name":"Node (physics)","level":2,"score":0.46619290113449097},{"id":"https://openalex.org/C135402231","wikidata":"https://www.wikidata.org/wiki/Q898440","display_name":"Dissipation","level":2,"score":0.4645061194896698},{"id":"https://openalex.org/C78401558","wikidata":"https://www.wikidata.org/wiki/Q464496","display_name":"Standard cell","level":3,"score":0.4518468379974365},{"id":"https://openalex.org/C154474529","wikidata":"https://www.wikidata.org/wiki/Q1658917","display_name":"Soft error","level":2,"score":0.43521106243133545},{"id":"https://openalex.org/C149635348","wikidata":"https://www.wikidata.org/wiki/Q193040","display_name":"Embedded system","level":1,"score":0.430059015750885},{"id":"https://openalex.org/C9390403","wikidata":"https://www.wikidata.org/wiki/Q3966","display_name":"Computer hardware","level":1,"score":0.4236801862716675},{"id":"https://openalex.org/C24326235","wikidata":"https://www.wikidata.org/wiki/Q126095","display_name":"Electronic engineering","level":1,"score":0.37769174575805664},{"id":"https://openalex.org/C127413603","wikidata":"https://www.wikidata.org/wiki/Q11023","display_name":"Engineering","level":0,"score":0.2588425278663635},{"id":"https://openalex.org/C530198007","wikidata":"https://www.wikidata.org/wiki/Q80831","display_name":"Integrated circuit","level":2,"score":0.24587902426719666},{"id":"https://openalex.org/C111919701","wikidata":"https://www.wikidata.org/wiki/Q9135","display_name":"Operating system","level":1,"score":0.11562168598175049},{"id":"https://openalex.org/C121332964","wikidata":"https://www.wikidata.org/wiki/Q413","display_name":"Physics","level":0,"score":0.06600672006607056},{"id":"https://openalex.org/C97355855","wikidata":"https://www.wikidata.org/wiki/Q11473","display_name":"Thermodynamics","level":1,"score":0.0},{"id":"https://openalex.org/C162324750","wikidata":"https://www.wikidata.org/wiki/Q8134","display_name":"Economics","level":0,"score":0.0},{"id":"https://openalex.org/C2524010","wikidata":"https://www.wikidata.org/wiki/Q8087","display_name":"Geometry","level":1,"score":0.0},{"id":"https://openalex.org/C33923547","wikidata":"https://www.wikidata.org/wiki/Q395","display_name":"Mathematics","level":0,"score":0.0},{"id":"https://openalex.org/C66938386","wikidata":"https://www.wikidata.org/wiki/Q633538","display_name":"Structural engineering","level":1,"score":0.0},{"id":"https://openalex.org/C139719470","wikidata":"https://www.wikidata.org/wiki/Q39680","display_name":"Macroeconomics","level":1,"score":0.0}],"mesh":[],"locations_count":1,"locations":[{"id":"doi:10.1109/iolts.2015.7229860","is_oa":false,"landing_page_url":"https://doi.org/10.1109/iolts.2015.7229860","pdf_url":null,"source":null,"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"2015 IEEE 21st International On-Line Testing Symposium (IOLTS)","raw_type":"proceedings-article"}],"best_oa_location":null,"sustainable_development_goals":[{"score":0.6200000047683716,"id":"https://metadata.un.org/sdg/7","display_name":"Affordable and clean energy"}],"awards":[],"funders":[{"id":"https://openalex.org/F4320321038","display_name":"Fonds National de la Recherche Luxembourg","ror":"https://ror.org/039z13y21"}],"has_content":{"pdf":false,"grobid_xml":false},"content_urls":null,"referenced_works_count":31,"referenced_works":["https://openalex.org/W1490721014","https://openalex.org/W1971670074","https://openalex.org/W1979668030","https://openalex.org/W1986990212","https://openalex.org/W2008749436","https://openalex.org/W2014466003","https://openalex.org/W2030139728","https://openalex.org/W2032797509","https://openalex.org/W2033907418","https://openalex.org/W2038394953","https://openalex.org/W2050431855","https://openalex.org/W2062143991","https://openalex.org/W2069345435","https://openalex.org/W2085733052","https://openalex.org/W2099569658","https://openalex.org/W2103902557","https://openalex.org/W2106281713","https://openalex.org/W2109926308","https://openalex.org/W2122995125","https://openalex.org/W2127798145","https://openalex.org/W2143137068","https://openalex.org/W2147409023","https://openalex.org/W2151961246","https://openalex.org/W2153953229","https://openalex.org/W2154780975","https://openalex.org/W2159262743","https://openalex.org/W2171347834","https://openalex.org/W3140899244","https://openalex.org/W3149410719","https://openalex.org/W3150716070","https://openalex.org/W6681516034"],"related_works":["https://openalex.org/W3104750253","https://openalex.org/W3021239166","https://openalex.org/W2586273397","https://openalex.org/W2390936256","https://openalex.org/W2483429559","https://openalex.org/W2016385589","https://openalex.org/W2009559548","https://openalex.org/W2890643743","https://openalex.org/W4366341510","https://openalex.org/W2968511773"],"abstract_inverted_index":{"In":[0],"this":[1],"paper":[2],"we":[3],"propose":[4],"a":[5,23,27,43,54,62,67],"leakage-aware":[6],"soft":[7],"error":[8],"tolerant":[9],"storage":[10],"element,":[11],"implementable":[12],"in":[13,59,70],"standard":[14,76],"CMOS":[15],"technology":[16,65],"and":[17,25,46],"able":[18],"to":[19,35,74,86],"operate":[20],"both":[21],"as":[22,26,42,53,82,84],"CAM":[24,44],"TCAM":[28,55,80],"cell.":[29,56],"The":[30],"proposed":[31],"cell":[32,45,81],"is":[33],"immune":[34],"SNUs":[36],"(Single":[37],"Node":[38],"Upsets)":[39],"when":[40,51],"operating":[41,52],"demonstrates":[47],"partial":[48],"resilience":[49],"(75%)":[50],"Simulation":[57],"results":[58],"SPICE":[60],"at":[61],"45nm":[63],"PTM":[64],"show":[66],"significant":[68],"reduction":[69],"leakage":[71],"dissipation":[72],"compared":[73,85],"the":[75],"but":[77],"unprotected":[78],"6T-based":[79],"well":[83],"conventional":[87],"DICE-based":[88],"CAM/TCAM":[89],"solutions.":[90]},"counts_by_year":[{"year":2025,"cited_by_count":1},{"year":2022,"cited_by_count":1},{"year":2019,"cited_by_count":3},{"year":2018,"cited_by_count":6},{"year":2017,"cited_by_count":2}],"updated_date":"2026-06-26T08:34:08.712188","created_date":"2025-10-10T00:00:00"}