{"id":"https://openalex.org/W1505895358","doi":"https://doi.org/10.1109/iolts.2015.7229857","title":"Real-time on-chip supply voltage sensor and its application to trace-based timing error localization","display_name":"Real-time on-chip supply voltage sensor and its application to trace-based timing error localization","publication_year":2015,"publication_date":"2015-07-01","ids":{"openalex":"https://openalex.org/W1505895358","doi":"https://doi.org/10.1109/iolts.2015.7229857","mag":"1505895358"},"language":"en","primary_location":{"id":"doi:10.1109/iolts.2015.7229857","is_oa":false,"landing_page_url":"https://doi.org/10.1109/iolts.2015.7229857","pdf_url":null,"source":null,"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"2015 IEEE 21st International On-Line Testing Symposium (IOLTS)","raw_type":"proceedings-article"},"type":"article","indexed_in":["crossref"],"open_access":{"is_oa":false,"oa_status":"closed","oa_url":null,"any_repository_has_fulltext":false},"authorships":[{"author_position":"first","author":{"id":"https://openalex.org/A5088871394","display_name":"Miho Ueno","orcid":null},"institutions":[{"id":"https://openalex.org/I98285908","display_name":"The University of Osaka","ror":"https://ror.org/035t8zc32","country_code":"JP","type":"education","lineage":["https://openalex.org/I98285908"]}],"countries":["JP"],"is_corresponding":false,"raw_author_name":"Miho Ueno","raw_affiliation_strings":["Dept. Information Systems Engineering, Osaka University","[Dept. Information Systems Eng., Osaka University, Japan]"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Dept. Information Systems Engineering, Osaka University","institution_ids":["https://openalex.org/I98285908"]},{"raw_affiliation_string":"[Dept. Information Systems Eng., Osaka University, Japan]","institution_ids":["https://openalex.org/I98285908"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5002405139","display_name":"Masanori Hashimoto","orcid":"https://orcid.org/0000-0002-0377-2108"},"institutions":[{"id":"https://openalex.org/I98285908","display_name":"The University of Osaka","ror":"https://ror.org/035t8zc32","country_code":"JP","type":"education","lineage":["https://openalex.org/I98285908"]}],"countries":["JP"],"is_corresponding":false,"raw_author_name":"Masanori Hashimoto","raw_affiliation_strings":["Dept. Information Systems Engineering, Osaka University","[Dept. Information Systems Eng., Osaka University, Japan]"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Dept. Information Systems Engineering, Osaka University","institution_ids":["https://openalex.org/I98285908"]},{"raw_affiliation_string":"[Dept. Information Systems Eng., Osaka University, Japan]","institution_ids":["https://openalex.org/I98285908"]}]},{"author_position":"last","author":{"id":"https://openalex.org/A5061693379","display_name":"Takao Onoye","orcid":"https://orcid.org/0000-0002-1894-2448"},"institutions":[{"id":"https://openalex.org/I98285908","display_name":"The University of Osaka","ror":"https://ror.org/035t8zc32","country_code":"JP","type":"education","lineage":["https://openalex.org/I98285908"]}],"countries":["JP"],"is_corresponding":false,"raw_author_name":"Takao Onoye","raw_affiliation_strings":["Dept. Information Systems Engineering, Osaka University","[Dept. Information Systems Eng., Osaka University, Japan]"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Dept. Information Systems Engineering, Osaka University","institution_ids":["https://openalex.org/I98285908"]},{"raw_affiliation_string":"[Dept. Information Systems Eng., Osaka University, Japan]","institution_ids":["https://openalex.org/I98285908"]}]}],"institutions":[],"countries_distinct_count":1,"institutions_distinct_count":3,"corresponding_author_ids":[],"corresponding_institution_ids":[],"apc_list":null,"apc_paid":null,"fwci":1.0042,"has_fulltext":false,"cited_by_count":11,"citation_normalized_percentile":{"value":0.78562762,"is_in_top_1_percent":false,"is_in_top_10_percent":false},"cited_by_percentile_year":{"min":90,"max":96},"biblio":{"volume":null,"issue":null,"first_page":"188","last_page":"193"},"is_retracted":false,"is_paratext":false,"is_xpac":false,"primary_topic":{"id":"https://openalex.org/T10472","display_name":"Semiconductor materials and devices","score":1.0,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},"topics":[{"id":"https://openalex.org/T10472","display_name":"Semiconductor materials and devices","score":1.0,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T14117","display_name":"Integrated Circuits and Semiconductor Failure Analysis","score":1.0,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T11032","display_name":"VLSI and Analog Circuit Testing","score":0.9998999834060669,"subfield":{"id":"https://openalex.org/subfields/1708","display_name":"Hardware and Architecture"},"field":{"id":"https://openalex.org/fields/17","display_name":"Computer Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"keywords":[{"id":"https://openalex.org/keywords/application-specific-integrated-circuit","display_name":"Application-specific integrated circuit","score":0.7130818367004395},{"id":"https://openalex.org/keywords/trace","display_name":"TRACE (psycholinguistics)","score":0.6778183579444885},{"id":"https://openalex.org/keywords/voltage","display_name":"Voltage","score":0.6504034996032715},{"id":"https://openalex.org/keywords/computer-science","display_name":"Computer science","score":0.606436550617218},{"id":"https://openalex.org/keywords/chip","display_name":"Chip","score":0.5358238220214844},{"id":"https://openalex.org/keywords/field-programmable-gate-array","display_name":"Field-programmable gate array","score":0.5219456553459167},{"id":"https://openalex.org/keywords/process","display_name":"Process (computing)","score":0.42225801944732666},{"id":"https://openalex.org/keywords/real-time-computing","display_name":"Real-time computing","score":0.41905349493026733},{"id":"https://openalex.org/keywords/electronic-engineering","display_name":"Electronic engineering","score":0.4074367880821228},{"id":"https://openalex.org/keywords/embedded-system","display_name":"Embedded system","score":0.36058667302131653},{"id":"https://openalex.org/keywords/computer-hardware","display_name":"Computer hardware","score":0.3545878231525421},{"id":"https://openalex.org/keywords/engineering","display_name":"Engineering","score":0.24560007452964783},{"id":"https://openalex.org/keywords/electrical-engineering","display_name":"Electrical engineering","score":0.21870505809783936},{"id":"https://openalex.org/keywords/telecommunications","display_name":"Telecommunications","score":0.07380253076553345}],"concepts":[{"id":"https://openalex.org/C77390884","wikidata":"https://www.wikidata.org/wiki/Q217302","display_name":"Application-specific integrated circuit","level":2,"score":0.7130818367004395},{"id":"https://openalex.org/C75291252","wikidata":"https://www.wikidata.org/wiki/Q1315756","display_name":"TRACE (psycholinguistics)","level":2,"score":0.6778183579444885},{"id":"https://openalex.org/C165801399","wikidata":"https://www.wikidata.org/wiki/Q25428","display_name":"Voltage","level":2,"score":0.6504034996032715},{"id":"https://openalex.org/C41008148","wikidata":"https://www.wikidata.org/wiki/Q21198","display_name":"Computer science","level":0,"score":0.606436550617218},{"id":"https://openalex.org/C165005293","wikidata":"https://www.wikidata.org/wiki/Q1074500","display_name":"Chip","level":2,"score":0.5358238220214844},{"id":"https://openalex.org/C42935608","wikidata":"https://www.wikidata.org/wiki/Q190411","display_name":"Field-programmable gate array","level":2,"score":0.5219456553459167},{"id":"https://openalex.org/C98045186","wikidata":"https://www.wikidata.org/wiki/Q205663","display_name":"Process (computing)","level":2,"score":0.42225801944732666},{"id":"https://openalex.org/C79403827","wikidata":"https://www.wikidata.org/wiki/Q3988","display_name":"Real-time computing","level":1,"score":0.41905349493026733},{"id":"https://openalex.org/C24326235","wikidata":"https://www.wikidata.org/wiki/Q126095","display_name":"Electronic engineering","level":1,"score":0.4074367880821228},{"id":"https://openalex.org/C149635348","wikidata":"https://www.wikidata.org/wiki/Q193040","display_name":"Embedded system","level":1,"score":0.36058667302131653},{"id":"https://openalex.org/C9390403","wikidata":"https://www.wikidata.org/wiki/Q3966","display_name":"Computer hardware","level":1,"score":0.3545878231525421},{"id":"https://openalex.org/C127413603","wikidata":"https://www.wikidata.org/wiki/Q11023","display_name":"Engineering","level":0,"score":0.24560007452964783},{"id":"https://openalex.org/C119599485","wikidata":"https://www.wikidata.org/wiki/Q43035","display_name":"Electrical engineering","level":1,"score":0.21870505809783936},{"id":"https://openalex.org/C76155785","wikidata":"https://www.wikidata.org/wiki/Q418","display_name":"Telecommunications","level":1,"score":0.07380253076553345},{"id":"https://openalex.org/C41895202","wikidata":"https://www.wikidata.org/wiki/Q8162","display_name":"Linguistics","level":1,"score":0.0},{"id":"https://openalex.org/C138885662","wikidata":"https://www.wikidata.org/wiki/Q5891","display_name":"Philosophy","level":0,"score":0.0},{"id":"https://openalex.org/C111919701","wikidata":"https://www.wikidata.org/wiki/Q9135","display_name":"Operating system","level":1,"score":0.0}],"mesh":[],"locations_count":1,"locations":[{"id":"doi:10.1109/iolts.2015.7229857","is_oa":false,"landing_page_url":"https://doi.org/10.1109/iolts.2015.7229857","pdf_url":null,"source":null,"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"2015 IEEE 21st International On-Line Testing Symposium (IOLTS)","raw_type":"proceedings-article"}],"best_oa_location":null,"sustainable_development_goals":[{"display_name":"Affordable and clean energy","score":0.7200000286102295,"id":"https://metadata.un.org/sdg/7"}],"awards":[],"funders":[],"has_content":{"pdf":false,"grobid_xml":false},"content_urls":null,"referenced_works_count":30,"referenced_works":["https://openalex.org/W1686420892","https://openalex.org/W1911029421","https://openalex.org/W1980043105","https://openalex.org/W1988295147","https://openalex.org/W1995322629","https://openalex.org/W2004531774","https://openalex.org/W2018013690","https://openalex.org/W2079706534","https://openalex.org/W2094145914","https://openalex.org/W2098327292","https://openalex.org/W2098702001","https://openalex.org/W2098771792","https://openalex.org/W2098854373","https://openalex.org/W2102587899","https://openalex.org/W2103065376","https://openalex.org/W2111944961","https://openalex.org/W2122146819","https://openalex.org/W2122488218","https://openalex.org/W2127421953","https://openalex.org/W2139642492","https://openalex.org/W2141412618","https://openalex.org/W2143689895","https://openalex.org/W2151802820","https://openalex.org/W2178304595","https://openalex.org/W2302293325","https://openalex.org/W4232751114","https://openalex.org/W6640006728","https://openalex.org/W6670518604","https://openalex.org/W6675078232","https://openalex.org/W6681202827"],"related_works":["https://openalex.org/W2165367082","https://openalex.org/W2111241003","https://openalex.org/W1972641423","https://openalex.org/W611446063","https://openalex.org/W4200391368","https://openalex.org/W2355315220","https://openalex.org/W1485756991","https://openalex.org/W2376218453","https://openalex.org/W2984236338","https://openalex.org/W2368609622"],"abstract_inverted_index":{"This":[0,38],"paper":[1],"presents":[2],"an":[3],"all-digital":[4],"on-chip":[5],"supply":[6],"voltage":[7,12,31,44],"sensor":[8,19,39,57],"that":[9,54],"captures":[10],"one-shot":[11],"fluctuation":[13],"every":[14],"clock":[15],"cycle.":[16],"The":[17,29],"proposed":[18,56],"was":[20,33],"implemented":[21],"on":[22],"ASIC":[23],"in":[24],"65nm":[25],"process":[26],"and":[27,35],"FPGA.":[28],"obtained":[30],"resolution":[32],"3.9mV":[34],"29mV,":[36],"respectively.":[37],"is":[40],"suitable":[41],"for":[42],"providing":[43],"information":[45],"to":[46,59],"trace-based":[47],"error":[48,63],"localization":[49],"system.":[50],"We":[51],"experimentally":[52],"show":[53],"the":[55,60],"contributes":[58],"facilitation":[61],"of":[62],"localization.":[64]},"counts_by_year":[{"year":2021,"cited_by_count":2},{"year":2020,"cited_by_count":2},{"year":2019,"cited_by_count":2},{"year":2018,"cited_by_count":1},{"year":2017,"cited_by_count":1},{"year":2016,"cited_by_count":2},{"year":2015,"cited_by_count":1}],"updated_date":"2026-06-11T09:08:48.828518","created_date":"2025-10-10T00:00:00"}