{"id":"https://openalex.org/W1534526037","doi":"https://doi.org/10.1109/iolts.2015.7229848","title":"Characterizing fault propagation in safety-critical processor designs","display_name":"Characterizing fault propagation in safety-critical processor designs","publication_year":2015,"publication_date":"2015-07-01","ids":{"openalex":"https://openalex.org/W1534526037","doi":"https://doi.org/10.1109/iolts.2015.7229848","mag":"1534526037"},"language":"en","primary_location":{"id":"doi:10.1109/iolts.2015.7229848","is_oa":false,"landing_page_url":"https://doi.org/10.1109/iolts.2015.7229848","pdf_url":null,"source":null,"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"2015 IEEE 21st International On-Line Testing Symposium (IOLTS)","raw_type":"proceedings-article"},"type":"article","indexed_in":["crossref"],"open_access":{"is_oa":true,"oa_status":"green","oa_url":"http://hdl.handle.net/2117/87264","any_repository_has_fulltext":true},"authorships":[{"author_position":"first","author":{"id":"https://openalex.org/A5017113457","display_name":"Jaime Espinosa","orcid":"https://orcid.org/0000-0003-4412-5836"},"institutions":[{"id":"https://openalex.org/I2799803557","display_name":"Barcelona Supercomputing Center","ror":"https://ror.org/05sd8tv96","country_code":"ES","type":"facility","lineage":["https://openalex.org/I2799803557","https://openalex.org/I9617848"]},{"id":"https://openalex.org/I9617848","display_name":"Universitat Polit\u00e8cnica de Catalunya","ror":"https://ror.org/03mb6wj31","country_code":"ES","type":"education","lineage":["https://openalex.org/I9617848"]},{"id":"https://openalex.org/I60053951","display_name":"Universitat Polit\u00e8cnica de Val\u00e8ncia","ror":"https://ror.org/01460j859","country_code":"ES","type":"education","lineage":["https://openalex.org/I60053951"]}],"countries":["ES"],"is_corresponding":true,"raw_author_name":"Jaime Espinosa","raw_affiliation_strings":["Barcelona Supercomputing Center (BSC-CNS)","Universitat Politecnica de Valencia"],"affiliations":[{"raw_affiliation_string":"Barcelona Supercomputing Center (BSC-CNS)","institution_ids":["https://openalex.org/I9617848","https://openalex.org/I2799803557"]},{"raw_affiliation_string":"Universitat Politecnica de Valencia","institution_ids":["https://openalex.org/I60053951"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5047492364","display_name":"Carles Hern\u00e1ndez","orcid":"https://orcid.org/0000-0001-5393-3195"},"institutions":[{"id":"https://openalex.org/I2799803557","display_name":"Barcelona Supercomputing Center","ror":"https://ror.org/05sd8tv96","country_code":"ES","type":"facility","lineage":["https://openalex.org/I2799803557","https://openalex.org/I9617848"]},{"id":"https://openalex.org/I9617848","display_name":"Universitat Polit\u00e8cnica de Catalunya","ror":"https://ror.org/03mb6wj31","country_code":"ES","type":"education","lineage":["https://openalex.org/I9617848"]}],"countries":["ES"],"is_corresponding":false,"raw_author_name":"Carles Hernandez","raw_affiliation_strings":["Barcelona Supercomputing Center (BSC-CNS)"],"affiliations":[{"raw_affiliation_string":"Barcelona Supercomputing Center (BSC-CNS)","institution_ids":["https://openalex.org/I9617848","https://openalex.org/I2799803557"]}]},{"author_position":"last","author":{"id":"https://openalex.org/A5020861175","display_name":"Jaume Abella","orcid":"https://orcid.org/0000-0001-7951-4028"},"institutions":[{"id":"https://openalex.org/I9617848","display_name":"Universitat Polit\u00e8cnica de Catalunya","ror":"https://ror.org/03mb6wj31","country_code":"ES","type":"education","lineage":["https://openalex.org/I9617848"]},{"id":"https://openalex.org/I2799803557","display_name":"Barcelona Supercomputing Center","ror":"https://ror.org/05sd8tv96","country_code":"ES","type":"facility","lineage":["https://openalex.org/I2799803557","https://openalex.org/I9617848"]}],"countries":["ES"],"is_corresponding":false,"raw_author_name":"Jaume Abella","raw_affiliation_strings":["Barcelona Supercomputing Center (BSC-CNS)"],"affiliations":[{"raw_affiliation_string":"Barcelona Supercomputing Center (BSC-CNS)","institution_ids":["https://openalex.org/I9617848","https://openalex.org/I2799803557"]}]}],"institutions":[],"countries_distinct_count":1,"institutions_distinct_count":3,"corresponding_author_ids":["https://openalex.org/A5017113457"],"corresponding_institution_ids":["https://openalex.org/I2799803557","https://openalex.org/I60053951","https://openalex.org/I9617848"],"apc_list":null,"apc_paid":null,"fwci":0.6014,"has_fulltext":false,"cited_by_count":3,"citation_normalized_percentile":{"value":0.71338738,"is_in_top_1_percent":false,"is_in_top_10_percent":false},"cited_by_percentile_year":{"min":96,"max":97},"biblio":{"volume":null,"issue":null,"first_page":"144","last_page":"149"},"is_retracted":false,"is_paratext":false,"is_xpac":false,"primary_topic":{"id":"https://openalex.org/T11005","display_name":"Radiation Effects in Electronics","score":1.0,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},"topics":[{"id":"https://openalex.org/T11005","display_name":"Radiation Effects in Electronics","score":1.0,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T12495","display_name":"Electrostatic Discharge in Electronics","score":0.9987000226974487,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T10904","display_name":"Embedded Systems Design Techniques","score":0.9977999925613403,"subfield":{"id":"https://openalex.org/subfields/1708","display_name":"Hardware and Architecture"},"field":{"id":"https://openalex.org/fields/17","display_name":"Computer Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"keywords":[{"id":"https://openalex.org/keywords/robustness","display_name":"Robustness (evolution)","score":0.8002480268478394},{"id":"https://openalex.org/keywords/computer-science","display_name":"Computer science","score":0.7266491651535034},{"id":"https://openalex.org/keywords/fault-injection","display_name":"Fault injection","score":0.715600848197937},{"id":"https://openalex.org/keywords/reliability-engineering","display_name":"Reliability engineering","score":0.6561002731323242},{"id":"https://openalex.org/keywords/embedded-system","display_name":"Embedded system","score":0.5884697437286377},{"id":"https://openalex.org/keywords/time-to-market","display_name":"Time to market","score":0.4852862060070038},{"id":"https://openalex.org/keywords/fault-tolerance","display_name":"Fault tolerance","score":0.48348385095596313},{"id":"https://openalex.org/keywords/formal-verification","display_name":"Formal verification","score":0.47049757838249207},{"id":"https://openalex.org/keywords/functional-verification","display_name":"Functional verification","score":0.43564358353614807},{"id":"https://openalex.org/keywords/fault-coverage","display_name":"Fault coverage","score":0.4255686402320862},{"id":"https://openalex.org/keywords/certification","display_name":"Certification","score":0.41293954849243164},{"id":"https://openalex.org/keywords/distributed-computing","display_name":"Distributed computing","score":0.24096471071243286},{"id":"https://openalex.org/keywords/engineering","display_name":"Engineering","score":0.17944559454917908},{"id":"https://openalex.org/keywords/software","display_name":"Software","score":0.17260491847991943},{"id":"https://openalex.org/keywords/operating-system","display_name":"Operating system","score":0.07671964168548584}],"concepts":[{"id":"https://openalex.org/C63479239","wikidata":"https://www.wikidata.org/wiki/Q7353546","display_name":"Robustness (evolution)","level":3,"score":0.8002480268478394},{"id":"https://openalex.org/C41008148","wikidata":"https://www.wikidata.org/wiki/Q21198","display_name":"Computer science","level":0,"score":0.7266491651535034},{"id":"https://openalex.org/C2775928411","wikidata":"https://www.wikidata.org/wiki/Q2041312","display_name":"Fault injection","level":3,"score":0.715600848197937},{"id":"https://openalex.org/C200601418","wikidata":"https://www.wikidata.org/wiki/Q2193887","display_name":"Reliability engineering","level":1,"score":0.6561002731323242},{"id":"https://openalex.org/C149635348","wikidata":"https://www.wikidata.org/wiki/Q193040","display_name":"Embedded system","level":1,"score":0.5884697437286377},{"id":"https://openalex.org/C2779229675","wikidata":"https://www.wikidata.org/wiki/Q445235","display_name":"Time to market","level":2,"score":0.4852862060070038},{"id":"https://openalex.org/C63540848","wikidata":"https://www.wikidata.org/wiki/Q3140932","display_name":"Fault tolerance","level":2,"score":0.48348385095596313},{"id":"https://openalex.org/C111498074","wikidata":"https://www.wikidata.org/wiki/Q173326","display_name":"Formal verification","level":2,"score":0.47049757838249207},{"id":"https://openalex.org/C62460635","wikidata":"https://www.wikidata.org/wiki/Q5508853","display_name":"Functional verification","level":3,"score":0.43564358353614807},{"id":"https://openalex.org/C126953365","wikidata":"https://www.wikidata.org/wiki/Q5438152","display_name":"Fault coverage","level":3,"score":0.4255686402320862},{"id":"https://openalex.org/C46304622","wikidata":"https://www.wikidata.org/wiki/Q374814","display_name":"Certification","level":2,"score":0.41293954849243164},{"id":"https://openalex.org/C120314980","wikidata":"https://www.wikidata.org/wiki/Q180634","display_name":"Distributed computing","level":1,"score":0.24096471071243286},{"id":"https://openalex.org/C127413603","wikidata":"https://www.wikidata.org/wiki/Q11023","display_name":"Engineering","level":0,"score":0.17944559454917908},{"id":"https://openalex.org/C2777904410","wikidata":"https://www.wikidata.org/wiki/Q7397","display_name":"Software","level":2,"score":0.17260491847991943},{"id":"https://openalex.org/C111919701","wikidata":"https://www.wikidata.org/wiki/Q9135","display_name":"Operating system","level":1,"score":0.07671964168548584},{"id":"https://openalex.org/C104317684","wikidata":"https://www.wikidata.org/wiki/Q7187","display_name":"Gene","level":2,"score":0.0},{"id":"https://openalex.org/C119599485","wikidata":"https://www.wikidata.org/wiki/Q43035","display_name":"Electrical engineering","level":1,"score":0.0},{"id":"https://openalex.org/C199539241","wikidata":"https://www.wikidata.org/wiki/Q7748","display_name":"Law","level":1,"score":0.0},{"id":"https://openalex.org/C55493867","wikidata":"https://www.wikidata.org/wiki/Q7094","display_name":"Biochemistry","level":1,"score":0.0},{"id":"https://openalex.org/C185592680","wikidata":"https://www.wikidata.org/wiki/Q2329","display_name":"Chemistry","level":0,"score":0.0},{"id":"https://openalex.org/C134146338","wikidata":"https://www.wikidata.org/wiki/Q1815901","display_name":"Electronic circuit","level":2,"score":0.0},{"id":"https://openalex.org/C17744445","wikidata":"https://www.wikidata.org/wiki/Q36442","display_name":"Political science","level":0,"score":0.0},{"id":"https://openalex.org/C11413529","wikidata":"https://www.wikidata.org/wiki/Q8366","display_name":"Algorithm","level":1,"score":0.0}],"mesh":[],"locations_count":2,"locations":[{"id":"doi:10.1109/iolts.2015.7229848","is_oa":false,"landing_page_url":"https://doi.org/10.1109/iolts.2015.7229848","pdf_url":null,"source":null,"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"2015 IEEE 21st International On-Line Testing Symposium (IOLTS)","raw_type":"proceedings-article"},{"id":"pmh:oai:recercat.cat:2072/262045","is_oa":true,"landing_page_url":"http://hdl.handle.net/2117/87264","pdf_url":null,"source":{"id":"https://openalex.org/S4306402147","display_name":"RECERCAT (Consorci de Serveis Universitaris de Catalunya)","issn_l":null,"issn":null,"is_oa":false,"is_in_doaj":false,"is_core":false,"host_organization":"https://openalex.org/I4210090028","host_organization_name":"Consorci de Serveis Universitaris de Catalunya","host_organization_lineage":["https://openalex.org/I4210090028"],"host_organization_lineage_names":[],"type":"repository"},"license":"other-oa","license_id":"https://openalex.org/licenses/other-oa","version":"acceptedVersion","is_accepted":true,"is_published":false,"raw_source_name":"","raw_type":"info:eu-repo/semantics/submittedVersion"}],"best_oa_location":{"id":"pmh:oai:recercat.cat:2072/262045","is_oa":true,"landing_page_url":"http://hdl.handle.net/2117/87264","pdf_url":null,"source":{"id":"https://openalex.org/S4306402147","display_name":"RECERCAT (Consorci de Serveis Universitaris de Catalunya)","issn_l":null,"issn":null,"is_oa":false,"is_in_doaj":false,"is_core":false,"host_organization":"https://openalex.org/I4210090028","host_organization_name":"Consorci de Serveis Universitaris de Catalunya","host_organization_lineage":["https://openalex.org/I4210090028"],"host_organization_lineage_names":[],"type":"repository"},"license":"other-oa","license_id":"https://openalex.org/licenses/other-oa","version":"acceptedVersion","is_accepted":true,"is_published":false,"raw_source_name":"","raw_type":"info:eu-repo/semantics/submittedVersion"},"sustainable_development_goals":[{"id":"https://metadata.un.org/sdg/9","display_name":"Industry, innovation and infrastructure","score":0.6299999952316284}],"awards":[],"funders":[],"has_content":{"pdf":false,"grobid_xml":false},"content_urls":null,"referenced_works_count":19,"referenced_works":["https://openalex.org/W220935706","https://openalex.org/W1490174819","https://openalex.org/W1972649107","https://openalex.org/W2026833966","https://openalex.org/W2028665553","https://openalex.org/W2055115253","https://openalex.org/W2056592359","https://openalex.org/W2067270725","https://openalex.org/W2083004950","https://openalex.org/W2098280085","https://openalex.org/W2098513789","https://openalex.org/W2107822077","https://openalex.org/W2136568261","https://openalex.org/W2144512449","https://openalex.org/W2156631019","https://openalex.org/W2159889776","https://openalex.org/W3200788958","https://openalex.org/W4235799760","https://openalex.org/W4249144718"],"related_works":["https://openalex.org/W2130922779","https://openalex.org/W2105593427","https://openalex.org/W3120172095","https://openalex.org/W4234532445","https://openalex.org/W2118572231","https://openalex.org/W2106507440","https://openalex.org/W2108860137","https://openalex.org/W3209085687","https://openalex.org/W2082366402","https://openalex.org/W2116002481"],"abstract_inverted_index":{"Achieving":[0],"reduced":[1],"time-to-market":[2],"in":[3,30,68,74,102],"modern":[4],"electronic":[5],"designs":[6,17],"targeting":[7],"safety":[8],"critical":[9],"applications":[10],"is":[11,44],"becoming":[12],"very":[13],"challenging,":[14],"as":[15,90],"these":[16],"need":[18],"to":[19,64,82,109,122,124],"go":[20],"through":[21],"a":[22,27,107],"certification":[23],"step":[24],"that":[25],"introduces":[26],"non-negligible":[28],"overhead":[29],"the":[31,75],"verification":[32,79,132],"and":[33,48,52,115],"validation":[34],"process.":[35],"To":[36],"cope":[37],"with":[38],"this":[39,96,118],"challenge,":[40],"safety-critical":[41],"systems":[42],"industry":[43],"demanding":[45],"new":[46],"tools":[47],"methodologies":[49,129],"allowing":[50],"quick":[51],"cost-effective":[53],"means":[54],"for":[55,130],"robustness":[56,78,131],"verification.":[57],"Microarchitectural":[58],"simulators":[59,135],"have":[60],"been":[61],"widely":[62],"used":[63],"test":[65],"reliability":[66],"properties":[67],"different":[69],"domains":[70],"but":[71],"their":[72],"use":[73],"process":[76],"of":[77,106,117],"remains":[80],"yet":[81],"be":[83,137],"validated":[84],"against":[85],"other":[86],"accepted":[87],"methods":[88],"such":[89],"RTL":[91,104],"or":[92],"gate-level":[93],"simulation.":[94],"In":[95],"paper":[97],"we":[98],"perform":[99],"fault":[100,111,127],"injections":[101],"an":[103],"model":[105],"processor":[108],"characterize":[110],"propagation.":[112],"The":[113],"results":[114],"conclusions":[116],"characterization":[119],"will":[120],"serve":[121],"devise":[123],"what":[125],"extent":[126],"injection":[128],"using":[133],"microarchitectural":[134],"can":[136],"employed.":[138]},"counts_by_year":[{"year":2016,"cited_by_count":3}],"updated_date":"2026-04-04T16:13:02.066488","created_date":"2025-10-10T00:00:00"}