{"id":"https://openalex.org/W1603216852","doi":"https://doi.org/10.1109/iolts.2015.7229846","title":"Filtering-based error-tolerability evaluation of image processing circuits","display_name":"Filtering-based error-tolerability evaluation of image processing circuits","publication_year":2015,"publication_date":"2015-07-01","ids":{"openalex":"https://openalex.org/W1603216852","doi":"https://doi.org/10.1109/iolts.2015.7229846","mag":"1603216852"},"language":"en","primary_location":{"id":"doi:10.1109/iolts.2015.7229846","is_oa":false,"landing_page_url":"https://doi.org/10.1109/iolts.2015.7229846","pdf_url":null,"source":null,"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"2015 IEEE 21st International On-Line Testing Symposium (IOLTS)","raw_type":"proceedings-article"},"type":"conference-paper","indexed_in":["crossref"],"open_access":{"is_oa":false,"oa_status":"closed","oa_url":null,"any_repository_has_fulltext":false},"authorships":[{"author_position":"first","author":{"id":"https://openalex.org/A5028476747","display_name":"Tong-Yu Hsieh","orcid":"https://orcid.org/0000-0002-7954-5569"},"institutions":[{"id":"https://openalex.org/I142974352","display_name":"National Sun Yat-sen University","ror":"https://ror.org/00mjawt10","country_code":"TW","type":"education","lineage":["https://openalex.org/I142974352"]}],"countries":["TW"],"is_corresponding":false,"raw_author_name":"Tong-Yu Hsieh","raw_affiliation_strings":["Department of Electrical Engineering, National Sun Yat-sen University, Kaohsiung, Taiwan","Department of Electrical Engineering, National Sun Yat\u2010Sen University, Kaohsiung, Taiwan"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Department of Electrical Engineering, National Sun Yat-sen University, Kaohsiung, Taiwan","institution_ids":["https://openalex.org/I142974352"]},{"raw_affiliation_string":"Department of Electrical Engineering, National Sun Yat\u2010Sen University, Kaohsiung, Taiwan","institution_ids":["https://openalex.org/I142974352"]}]},{"author_position":"last","author":{"id":"https://openalex.org/A5057668014","display_name":"Yi-Han Peng","orcid":null},"institutions":[{"id":"https://openalex.org/I142974352","display_name":"National Sun Yat-sen University","ror":"https://ror.org/00mjawt10","country_code":"TW","type":"education","lineage":["https://openalex.org/I142974352"]}],"countries":["TW"],"is_corresponding":false,"raw_author_name":"Yi-Han Peng","raw_affiliation_strings":["Department of Electrical Engineering, National Sun Yat-sen University, Kaohsiung, Taiwan","Department of Electrical Engineering, National Sun Yat\u2010Sen University, Kaohsiung, Taiwan"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Department of Electrical Engineering, National Sun Yat-sen University, Kaohsiung, Taiwan","institution_ids":["https://openalex.org/I142974352"]},{"raw_affiliation_string":"Department of Electrical Engineering, National Sun Yat\u2010Sen University, Kaohsiung, Taiwan","institution_ids":["https://openalex.org/I142974352"]}]}],"institutions":[],"countries_distinct_count":1,"institutions_distinct_count":1,"corresponding_author_ids":[],"corresponding_institution_ids":["https://openalex.org/I142974352"],"apc_list":null,"apc_paid":null,"fwci":0.8235,"has_fulltext":false,"cited_by_count":3,"citation_normalized_percentile":{"value":0.64830554,"is_in_top_1_percent":false,"is_in_top_10_percent":false},"cited_by_percentile_year":{"min":89,"max":96},"biblio":{"volume":"18","issue":null,"first_page":"132","last_page":"137"},"is_retracted":false,"is_paratext":false,"is_xpac":false,"primary_topic":{"id":"https://openalex.org/T11992","display_name":"CCD and CMOS Imaging Sensors","score":0.9998999834060669,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},"topics":[{"id":"https://openalex.org/T11992","display_name":"CCD and CMOS Imaging Sensors","score":0.9998999834060669,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T10323","display_name":"Analog and Mixed-Signal Circuit Design","score":0.998199999332428,"subfield":{"id":"https://openalex.org/subfields/2204","display_name":"Biomedical Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T11032","display_name":"VLSI and Analog Circuit Testing","score":0.9980000257492065,"subfield":{"id":"https://openalex.org/subfields/1708","display_name":"Hardware and Architecture"},"field":{"id":"https://openalex.org/fields/17","display_name":"Computer Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"keywords":[{"id":"https://openalex.org/keywords/computer-science","display_name":"Computer science","score":0.7063947916030884},{"id":"https://openalex.org/keywords/electronic-circuit","display_name":"Electronic circuit","score":0.5699487328529358},{"id":"https://openalex.org/keywords/image-processing","display_name":"Image processing","score":0.5419789552688599},{"id":"https://openalex.org/keywords/image","display_name":"Image (mathematics)","score":0.505847692489624},{"id":"https://openalex.org/keywords/artificial-intelligence","display_name":"Artificial intelligence","score":0.5001175403594971},{"id":"https://openalex.org/keywords/reliability","display_name":"Reliability (semiconductor)","score":0.4626966118812561},{"id":"https://openalex.org/keywords/benchmark","display_name":"Benchmark (surveying)","score":0.44424617290496826},{"id":"https://openalex.org/keywords/feature","display_name":"Feature (linguistics)","score":0.43136265873908997},{"id":"https://openalex.org/keywords/computer-vision","display_name":"Computer vision","score":0.4106637239456177},{"id":"https://openalex.org/keywords/pattern-recognition","display_name":"Pattern recognition (psychology)","score":0.3432983160018921},{"id":"https://openalex.org/keywords/engineering","display_name":"Engineering","score":0.11594074964523315}],"concepts":[{"id":"https://openalex.org/C41008148","wikidata":"https://www.wikidata.org/wiki/Q21198","display_name":"Computer science","level":0,"score":0.7063947916030884},{"id":"https://openalex.org/C134146338","wikidata":"https://www.wikidata.org/wiki/Q1815901","display_name":"Electronic circuit","level":2,"score":0.5699487328529358},{"id":"https://openalex.org/C9417928","wikidata":"https://www.wikidata.org/wiki/Q1070689","display_name":"Image processing","level":3,"score":0.5419789552688599},{"id":"https://openalex.org/C115961682","wikidata":"https://www.wikidata.org/wiki/Q860623","display_name":"Image (mathematics)","level":2,"score":0.505847692489624},{"id":"https://openalex.org/C154945302","wikidata":"https://www.wikidata.org/wiki/Q11660","display_name":"Artificial intelligence","level":1,"score":0.5001175403594971},{"id":"https://openalex.org/C43214815","wikidata":"https://www.wikidata.org/wiki/Q7310987","display_name":"Reliability (semiconductor)","level":3,"score":0.4626966118812561},{"id":"https://openalex.org/C185798385","wikidata":"https://www.wikidata.org/wiki/Q1161707","display_name":"Benchmark (surveying)","level":2,"score":0.44424617290496826},{"id":"https://openalex.org/C2776401178","wikidata":"https://www.wikidata.org/wiki/Q12050496","display_name":"Feature (linguistics)","level":2,"score":0.43136265873908997},{"id":"https://openalex.org/C31972630","wikidata":"https://www.wikidata.org/wiki/Q844240","display_name":"Computer vision","level":1,"score":0.4106637239456177},{"id":"https://openalex.org/C153180895","wikidata":"https://www.wikidata.org/wiki/Q7148389","display_name":"Pattern recognition (psychology)","level":2,"score":0.3432983160018921},{"id":"https://openalex.org/C127413603","wikidata":"https://www.wikidata.org/wiki/Q11023","display_name":"Engineering","level":0,"score":0.11594074964523315},{"id":"https://openalex.org/C62520636","wikidata":"https://www.wikidata.org/wiki/Q944","display_name":"Quantum mechanics","level":1,"score":0.0},{"id":"https://openalex.org/C138885662","wikidata":"https://www.wikidata.org/wiki/Q5891","display_name":"Philosophy","level":0,"score":0.0},{"id":"https://openalex.org/C41895202","wikidata":"https://www.wikidata.org/wiki/Q8162","display_name":"Linguistics","level":1,"score":0.0},{"id":"https://openalex.org/C119599485","wikidata":"https://www.wikidata.org/wiki/Q43035","display_name":"Electrical engineering","level":1,"score":0.0},{"id":"https://openalex.org/C163258240","wikidata":"https://www.wikidata.org/wiki/Q25342","display_name":"Power (physics)","level":2,"score":0.0},{"id":"https://openalex.org/C121332964","wikidata":"https://www.wikidata.org/wiki/Q413","display_name":"Physics","level":0,"score":0.0},{"id":"https://openalex.org/C205649164","wikidata":"https://www.wikidata.org/wiki/Q1071","display_name":"Geography","level":0,"score":0.0},{"id":"https://openalex.org/C13280743","wikidata":"https://www.wikidata.org/wiki/Q131089","display_name":"Geodesy","level":1,"score":0.0}],"mesh":[],"locations_count":1,"locations":[{"id":"doi:10.1109/iolts.2015.7229846","is_oa":false,"landing_page_url":"https://doi.org/10.1109/iolts.2015.7229846","pdf_url":null,"source":null,"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"2015 IEEE 21st International On-Line Testing Symposium (IOLTS)","raw_type":"proceedings-article"}],"best_oa_location":null,"sustainable_development_goals":[{"display_name":"Industry, innovation and infrastructure","score":0.47999998927116394,"id":"https://metadata.un.org/sdg/9"}],"awards":[],"funders":[],"has_content":{"pdf":false,"grobid_xml":false},"content_urls":null,"referenced_works_count":22,"referenced_works":["https://openalex.org/W1498909268","https://openalex.org/W1995710727","https://openalex.org/W2030803967","https://openalex.org/W2032698581","https://openalex.org/W2095347101","https://openalex.org/W2099971661","https://openalex.org/W2114703523","https://openalex.org/W2126044301","https://openalex.org/W2132340548","https://openalex.org/W2133665775","https://openalex.org/W2135856491","https://openalex.org/W2138951641","https://openalex.org/W2142107379","https://openalex.org/W2142688241","https://openalex.org/W2144869312","https://openalex.org/W2153841776","https://openalex.org/W2158003722","https://openalex.org/W2164241781","https://openalex.org/W2171865342","https://openalex.org/W4251708180","https://openalex.org/W6680897015","https://openalex.org/W6682840539"],"related_works":["https://openalex.org/W2378211422","https://openalex.org/W4321353415","https://openalex.org/W2745001401","https://openalex.org/W2130974462","https://openalex.org/W2028665553","https://openalex.org/W2086519370","https://openalex.org/W972276598","https://openalex.org/W2951187577","https://openalex.org/W4400235630","https://openalex.org/W1773555043"],"abstract_inverted_index":{"For":[0],"some":[1,183],"systems":[2],"errors":[3,32,36,75],"can":[4,76,89,108,134,152],"be":[5,48,77,109],"regarded":[6],"as":[7,10,12,165,167,187],"being":[8],"acceptable":[9,140],"long":[11],"their":[13],"significance":[14],"is":[15,70,148,174,180],"low":[16],"enough.":[17],"Image":[18],"processing":[19],"circuits":[20],"are":[21],"one":[22],"such":[23,186],"example":[24],"due":[25],"to":[26,30,47,55,98],"human":[27],"being's":[28],"insensitivity":[29],"minor":[31],"in":[33,182],"colors.":[34],"Significant":[35],"usually":[37],"destroy":[38],"the":[39,56,60,64,68,72,91,99,103,113,131,145,177],"structure":[40],"of":[41,59,74,105,125,144,155],"an":[42,106],"image,":[43],"and":[44,150,171],"thus":[45,151],"appear":[46],"perceptible.":[49],"This":[50,173],"also":[51],"makes":[52],"larger":[53],"changes":[54],"frequency":[57,69,92],"feature":[58],"image.":[61],"By":[62],"examining":[63],"degree":[65],"at":[66],"which":[67],"varied,":[71],"acceptability":[73,104],"determined.":[78],"In":[79],"this":[80],"work":[81],"we":[82],"propose":[83],"a":[84,122,156],"filtering-based":[85],"test":[86],"method":[87,133,147],"that":[88,130],"quantify":[90],"variance":[93,101],"incurred":[94],"by":[95,111],"errors.":[96],"According":[97],"obtained":[100],"value,":[102],"image":[107],"determined":[110],"comparing":[112],"value":[114],"with":[115],"user-specified":[116],"thresholds.":[117],"The":[118,142],"experimental":[119],"results":[120],"on":[121],"large":[123],"number":[124],"erroneous":[126],"benchmark":[127],"images":[128,138],"show":[129],"proposed":[132,146],"accurately":[135],"differentiate":[136],"unacceptable":[137],"from":[139],"ones.":[141],"implementation":[143,154],"simple,":[149],"facilitate":[153],"BIST":[157],"(Built-In":[158],"Self-Test)":[159],"circuitry":[160],"for":[161],"efficient":[162],"product":[163],"grading,":[164],"well":[166],"in-field":[168],"reliability":[169],"determination":[170],"enhancement.":[172],"useful":[175],"when":[176],"target":[178],"circuit":[179],"employed":[181],"critical":[184],"applications":[185],"automotive":[188],"or":[189],"medical":[190],"electronic":[191],"systems.":[192]},"counts_by_year":[{"year":2022,"cited_by_count":1},{"year":2017,"cited_by_count":2}],"updated_date":"2026-07-29T14:22:42.915294","created_date":"2025-10-10T00:00:00"}