{"id":"https://openalex.org/W1966444522","doi":"https://doi.org/10.1109/iolts.2014.6873689","title":"Flip-Flop Selection for In-Situ Slack-Time Monitoring based on the Activation Probability of Timing-Critical Paths","display_name":"Flip-Flop Selection for In-Situ Slack-Time Monitoring based on the Activation Probability of Timing-Critical Paths","publication_year":2014,"publication_date":"2014-07-01","ids":{"openalex":"https://openalex.org/W1966444522","doi":"https://doi.org/10.1109/iolts.2014.6873689","mag":"1966444522"},"language":"en","primary_location":{"id":"doi:10.1109/iolts.2014.6873689","is_oa":false,"landing_page_url":"https://doi.org/10.1109/iolts.2014.6873689","pdf_url":null,"source":null,"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"2014 IEEE 20th International On-Line Testing Symposium (IOLTS)","raw_type":"proceedings-article"},"type":"preprint","indexed_in":["crossref"],"open_access":{"is_oa":false,"oa_status":"closed","oa_url":null,"any_repository_has_fulltext":false},"authorships":[{"author_position":"first","author":{"id":"https://openalex.org/A5075497709","display_name":"S\u00e9bastien Sarrazin","orcid":null},"institutions":[{"id":"https://openalex.org/I12356871","display_name":"T\u00e9l\u00e9com Paris","ror":"https://ror.org/01naq7912","country_code":"FR","type":"education","lineage":["https://openalex.org/I12356871","https://openalex.org/I205703379","https://openalex.org/I4210145102"]},{"id":"https://openalex.org/I2738703131","display_name":"Commissariat \u00e0 l'\u00c9nergie Atomique et aux \u00c9nergies Alternatives","ror":"https://ror.org/00jjx8s55","country_code":"FR","type":"government","lineage":["https://openalex.org/I2738703131"]},{"id":"https://openalex.org/I4210085861","display_name":"Laboratoire d'Int\u00e9gration des Syst\u00e8mes et des Technologies","ror":"https://ror.org/000dbcc61","country_code":"FR","type":"government","lineage":["https://openalex.org/I2738703131","https://openalex.org/I2738703131","https://openalex.org/I277688954","https://openalex.org/I4210085861","https://openalex.org/I4210117989"]}],"countries":["FR"],"is_corresponding":false,"raw_author_name":"Sebastien Sarrazin","raw_affiliation_strings":["Telecom ParisTech, Paris, France","CEA, LIST PC 172 91191 Gif sur Yvette Cedex, France"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Telecom ParisTech, Paris, France","institution_ids":["https://openalex.org/I12356871"]},{"raw_affiliation_string":"CEA, LIST PC 172 91191 Gif sur Yvette Cedex, France","institution_ids":["https://openalex.org/I4210085861","https://openalex.org/I2738703131"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5047538474","display_name":"Samuel Evain","orcid":null},"institutions":[{"id":"https://openalex.org/I2738703131","display_name":"Commissariat \u00e0 l'\u00c9nergie Atomique et aux \u00c9nergies Alternatives","ror":"https://ror.org/00jjx8s55","country_code":"FR","type":"government","lineage":["https://openalex.org/I2738703131"]},{"id":"https://openalex.org/I4210085861","display_name":"Laboratoire d'Int\u00e9gration des Syst\u00e8mes et des Technologies","ror":"https://ror.org/000dbcc61","country_code":"FR","type":"government","lineage":["https://openalex.org/I2738703131","https://openalex.org/I2738703131","https://openalex.org/I277688954","https://openalex.org/I4210085861","https://openalex.org/I4210117989"]}],"countries":["FR"],"is_corresponding":false,"raw_author_name":"Samuel Evain","raw_affiliation_strings":["CEA, LIST, France","CEA, LIST PC 172 91191 Gif sur Yvette Cedex, France"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"CEA, LIST, France","institution_ids":["https://openalex.org/I4210085861","https://openalex.org/I2738703131"]},{"raw_affiliation_string":"CEA, LIST PC 172 91191 Gif sur Yvette Cedex, France","institution_ids":["https://openalex.org/I4210085861","https://openalex.org/I2738703131"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5005367930","display_name":"Ivan Miro-Panades","orcid":"https://orcid.org/0000-0001-7719-661X"},"institutions":[{"id":"https://openalex.org/I106785703","display_name":"Institut polytechnique de Grenoble","ror":"https://ror.org/05sbt2524","country_code":"FR","type":"education","lineage":["https://openalex.org/I106785703","https://openalex.org/I899635006"]},{"id":"https://openalex.org/I2738703131","display_name":"Commissariat \u00e0 l'\u00c9nergie Atomique et aux \u00c9nergies Alternatives","ror":"https://ror.org/00jjx8s55","country_code":"FR","type":"government","lineage":["https://openalex.org/I2738703131"]},{"id":"https://openalex.org/I3020098449","display_name":"CEA Grenoble","ror":"https://ror.org/02mg6n827","country_code":"FR","type":"government","lineage":["https://openalex.org/I2738703131","https://openalex.org/I3020098449"]},{"id":"https://openalex.org/I4210150049","display_name":"Laboratoire d'\u00c9lectronique des Technologies de l'Information","ror":"https://ror.org/04mf0wv34","country_code":"FR","type":"government","lineage":["https://openalex.org/I2738703131","https://openalex.org/I2738703131","https://openalex.org/I4210117989","https://openalex.org/I4210150049"]}],"countries":["FR"],"is_corresponding":false,"raw_author_name":"Ivan Miro-Panades","raw_affiliation_strings":["CEA, LETI, Grenoble, France","CEA, LETI Minatec Campus, 17 rue des Martyrs 38054 Grenoble Cedex 9, France"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"CEA, LETI, Grenoble, France","institution_ids":["https://openalex.org/I4210150049","https://openalex.org/I3020098449","https://openalex.org/I2738703131"]},{"raw_affiliation_string":"CEA, LETI Minatec Campus, 17 rue des Martyrs 38054 Grenoble Cedex 9, France","institution_ids":["https://openalex.org/I3020098449","https://openalex.org/I4210150049","https://openalex.org/I2738703131","https://openalex.org/I106785703"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5018022196","display_name":"L\u00edrida Naviner","orcid":"https://orcid.org/0000-0002-6320-4153"},"institutions":[{"id":"https://openalex.org/I12356871","display_name":"T\u00e9l\u00e9com Paris","ror":"https://ror.org/01naq7912","country_code":"FR","type":"education","lineage":["https://openalex.org/I12356871","https://openalex.org/I205703379","https://openalex.org/I4210145102"]}],"countries":["FR"],"is_corresponding":false,"raw_author_name":"Lirida Alves de Barros Naviner","raw_affiliation_strings":["Telecom ParisTech, Paris, France","TELECOM ParisTech, 46 rue Barrault, 75634 Paris CEDEX 13, France#TAB#"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Telecom ParisTech, Paris, France","institution_ids":["https://openalex.org/I12356871"]},{"raw_affiliation_string":"TELECOM ParisTech, 46 rue Barrault, 75634 Paris CEDEX 13, France#TAB#","institution_ids":["https://openalex.org/I12356871"]}]},{"author_position":"last","author":{"id":"https://openalex.org/A5070545363","display_name":"Valentin Gherman","orcid":"https://orcid.org/0009-0008-8322-9906"},"institutions":[{"id":"https://openalex.org/I2738703131","display_name":"Commissariat \u00e0 l'\u00c9nergie Atomique et aux \u00c9nergies Alternatives","ror":"https://ror.org/00jjx8s55","country_code":"FR","type":"government","lineage":["https://openalex.org/I2738703131"]},{"id":"https://openalex.org/I4210085861","display_name":"Laboratoire d'Int\u00e9gration des Syst\u00e8mes et des Technologies","ror":"https://ror.org/000dbcc61","country_code":"FR","type":"government","lineage":["https://openalex.org/I2738703131","https://openalex.org/I2738703131","https://openalex.org/I277688954","https://openalex.org/I4210085861","https://openalex.org/I4210117989"]}],"countries":["FR"],"is_corresponding":false,"raw_author_name":"Valentin Gherman","raw_affiliation_strings":["CEA, LIST, France","CEA, LIST PC 172 91191 Gif sur Yvette Cedex, France"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"CEA, LIST, France","institution_ids":["https://openalex.org/I4210085861","https://openalex.org/I2738703131"]},{"raw_affiliation_string":"CEA, LIST PC 172 91191 Gif sur Yvette Cedex, France","institution_ids":["https://openalex.org/I4210085861","https://openalex.org/I2738703131"]}]}],"institutions":[],"countries_distinct_count":1,"institutions_distinct_count":5,"corresponding_author_ids":[],"corresponding_institution_ids":[],"apc_list":null,"apc_paid":null,"fwci":0.2129,"has_fulltext":false,"cited_by_count":2,"citation_normalized_percentile":{"value":0.56923594,"is_in_top_1_percent":false,"is_in_top_10_percent":false},"cited_by_percentile_year":{"min":90,"max":94},"biblio":{"volume":null,"issue":null,"first_page":"160","last_page":"163"},"is_retracted":false,"is_paratext":false,"is_xpac":false,"primary_topic":{"id":"https://openalex.org/T10363","display_name":"Low-power high-performance VLSI design","score":1.0,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},"topics":[{"id":"https://openalex.org/T10363","display_name":"Low-power high-performance VLSI design","score":1.0,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T11005","display_name":"Radiation Effects in Electronics","score":0.9998999834060669,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T10472","display_name":"Semiconductor materials and devices","score":0.9997000098228455,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"keywords":[{"id":"https://openalex.org/keywords/latency","display_name":"Latency (audio)","score":0.6096609830856323},{"id":"https://openalex.org/keywords/computer-science","display_name":"Computer science","score":0.602998673915863},{"id":"https://openalex.org/keywords/real-time-computing","display_name":"Real-time computing","score":0.5855094790458679},{"id":"https://openalex.org/keywords/flip-flop","display_name":"Flip-flop","score":0.5712158679962158},{"id":"https://openalex.org/keywords/timing-failure","display_name":"Timing failure","score":0.4909723103046417},{"id":"https://openalex.org/keywords/power","display_name":"Power (physics)","score":0.48646995425224304},{"id":"https://openalex.org/keywords/static-timing-analysis","display_name":"Static timing analysis","score":0.44849681854248047},{"id":"https://openalex.org/keywords/electronic-circuit","display_name":"Electronic circuit","score":0.37582725286483765},{"id":"https://openalex.org/keywords/reliability-engineering","display_name":"Reliability engineering","score":0.32389888167381287},{"id":"https://openalex.org/keywords/embedded-system","display_name":"Embedded system","score":0.30171674489974976},{"id":"https://openalex.org/keywords/clock-signal","display_name":"Clock signal","score":0.21885946393013},{"id":"https://openalex.org/keywords/engineering","display_name":"Engineering","score":0.20792362093925476},{"id":"https://openalex.org/keywords/clock-skew","display_name":"Clock skew","score":0.18878477811813354},{"id":"https://openalex.org/keywords/electrical-engineering","display_name":"Electrical engineering","score":0.12779030203819275}],"concepts":[{"id":"https://openalex.org/C82876162","wikidata":"https://www.wikidata.org/wiki/Q17096504","display_name":"Latency (audio)","level":2,"score":0.6096609830856323},{"id":"https://openalex.org/C41008148","wikidata":"https://www.wikidata.org/wiki/Q21198","display_name":"Computer science","level":0,"score":0.602998673915863},{"id":"https://openalex.org/C79403827","wikidata":"https://www.wikidata.org/wiki/Q3988","display_name":"Real-time computing","level":1,"score":0.5855094790458679},{"id":"https://openalex.org/C2781007278","wikidata":"https://www.wikidata.org/wiki/Q183406","display_name":"Flip-flop","level":3,"score":0.5712158679962158},{"id":"https://openalex.org/C104654189","wikidata":"https://www.wikidata.org/wiki/Q7806740","display_name":"Timing failure","level":5,"score":0.4909723103046417},{"id":"https://openalex.org/C163258240","wikidata":"https://www.wikidata.org/wiki/Q25342","display_name":"Power (physics)","level":2,"score":0.48646995425224304},{"id":"https://openalex.org/C93682380","wikidata":"https://www.wikidata.org/wiki/Q2025226","display_name":"Static timing analysis","level":2,"score":0.44849681854248047},{"id":"https://openalex.org/C134146338","wikidata":"https://www.wikidata.org/wiki/Q1815901","display_name":"Electronic circuit","level":2,"score":0.37582725286483765},{"id":"https://openalex.org/C200601418","wikidata":"https://www.wikidata.org/wiki/Q2193887","display_name":"Reliability engineering","level":1,"score":0.32389888167381287},{"id":"https://openalex.org/C149635348","wikidata":"https://www.wikidata.org/wiki/Q193040","display_name":"Embedded system","level":1,"score":0.30171674489974976},{"id":"https://openalex.org/C137059387","wikidata":"https://www.wikidata.org/wiki/Q426882","display_name":"Clock signal","level":3,"score":0.21885946393013},{"id":"https://openalex.org/C127413603","wikidata":"https://www.wikidata.org/wiki/Q11023","display_name":"Engineering","level":0,"score":0.20792362093925476},{"id":"https://openalex.org/C60501442","wikidata":"https://www.wikidata.org/wiki/Q4382014","display_name":"Clock skew","level":4,"score":0.18878477811813354},{"id":"https://openalex.org/C119599485","wikidata":"https://www.wikidata.org/wiki/Q43035","display_name":"Electrical engineering","level":1,"score":0.12779030203819275},{"id":"https://openalex.org/C62520636","wikidata":"https://www.wikidata.org/wiki/Q944","display_name":"Quantum mechanics","level":1,"score":0.0},{"id":"https://openalex.org/C76155785","wikidata":"https://www.wikidata.org/wiki/Q418","display_name":"Telecommunications","level":1,"score":0.0},{"id":"https://openalex.org/C162307627","wikidata":"https://www.wikidata.org/wiki/Q204833","display_name":"Enhanced Data Rates for GSM Evolution","level":2,"score":0.0},{"id":"https://openalex.org/C121332964","wikidata":"https://www.wikidata.org/wiki/Q413","display_name":"Physics","level":0,"score":0.0}],"mesh":[],"locations_count":2,"locations":[{"id":"doi:10.1109/iolts.2014.6873689","is_oa":false,"landing_page_url":"https://doi.org/10.1109/iolts.2014.6873689","pdf_url":null,"source":null,"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"2014 IEEE 20th International On-Line Testing Symposium (IOLTS)","raw_type":"proceedings-article"},{"id":"pmh:oai:HAL:cea-01839855v1","is_oa":false,"landing_page_url":"https://cea.hal.science/cea-01839855","pdf_url":null,"source":{"id":"https://openalex.org/S4306402512","display_name":"HAL (Le Centre pour la Communication Scientifique Directe)","issn_l":null,"issn":null,"is_oa":false,"is_in_doaj":false,"is_core":false,"host_organization":"https://openalex.org/I1294671590","host_organization_name":"Centre National de la Recherche Scientifique","host_organization_lineage":["https://openalex.org/I1294671590"],"host_organization_lineage_names":[],"type":"repository"},"license":null,"license_id":null,"version":"submittedVersion","is_accepted":false,"is_published":false,"raw_source_name":"2014 IEEE 20th International On-Line Testing Symposium (IOLTS), Jul 2014, Catalunya, Spain. pp.160-163, ⟨10.1109/IOLTS.2014.6873689⟩","raw_type":"Conference papers"}],"best_oa_location":null,"sustainable_development_goals":[],"awards":[],"funders":[],"has_content":{"grobid_xml":false,"pdf":false},"content_urls":null,"referenced_works_count":15,"referenced_works":["https://openalex.org/W1541483005","https://openalex.org/W1967709031","https://openalex.org/W1987474522","https://openalex.org/W1989874002","https://openalex.org/W1996183863","https://openalex.org/W2086447087","https://openalex.org/W2104677471","https://openalex.org/W2112188813","https://openalex.org/W2125169487","https://openalex.org/W2125669810","https://openalex.org/W2141565132","https://openalex.org/W2156667996","https://openalex.org/W2162709529","https://openalex.org/W4231450833","https://openalex.org/W4251213825"],"related_works":["https://openalex.org/W2494330009","https://openalex.org/W2891365107","https://openalex.org/W3201048403","https://openalex.org/W3013601069","https://openalex.org/W2116514610","https://openalex.org/W2003180247","https://openalex.org/W2144282137","https://openalex.org/W2032549010","https://openalex.org/W2098440959","https://openalex.org/W4211081879"],"abstract_inverted_index":{"In-situ":[0],"slack-time":[1,41,60,121,130],"monitoring":[2],"may":[3],"be":[4,31],"used":[5],"to":[6,30,33,48,68,127],"enable":[7],"ambitious":[8],"power":[9],"management":[10],"policies":[11],"under":[12],"circuit":[13,154],"wear-out":[14],"and":[15,18,81],"dynamic":[16],"temperature":[17],"supply":[19],"voltage":[20],"variations.":[21],"Given":[22],"a":[23,53,94,144],"limited":[24],"hardware":[25],"budget,":[26],"it":[27],"becomes":[28],"crucial":[29],"able":[32],"select":[34],"the":[35,50,70,82,99,105,112,128,132,149,153],"most":[36],"appropriate":[37],"places":[38],"for":[39,58,148],"in-situ":[40,59,120],"monitoring.":[42,61],"Here,":[43],"two":[44],"metrics":[45,66],"are":[46,109],"proposed":[47],"guide":[49],"selection":[51],"of":[52,55,64,72,84,93,101,131],"set":[54],"flip-flops":[56],"(FFs)":[57],"The":[62,90],"goal":[63],"these":[65],"is":[67,96,117],"maximize":[69],"ratio":[71],"clock":[73,88],"cycles":[74],"with":[75,98,123,143],"at":[76],"least":[77],"one":[78],"monitor":[79,95],"activated":[80,85],"number":[83],"monitors":[86,122,142],"per":[87],"cycle.":[89],"activation":[91],"probability":[92,106],"evaluated":[97],"help":[100],"timing":[102],"simulations":[103],"as":[104],"that":[107,119],"signals":[108],"propagated":[110],"along":[111],"monitored":[113,133],"timing-critical":[114,134],"paths.":[115],"It":[116],"shown":[118],"detection":[124,146],"windows":[125],"correlated":[126],"minimum":[129],"paths":[135],"can":[136],"provide":[137],"better":[138],"results":[139],"than":[140],"similar":[141],"constant":[145],"window":[147],"same":[150],"impact":[151],"on":[152],"latency.":[155]},"counts_by_year":[{"year":2024,"cited_by_count":1},{"year":2016,"cited_by_count":1}],"updated_date":"2026-06-11T09:08:48.828518","created_date":"2025-10-10T00:00:00"}