{"id":"https://openalex.org/W2062450305","doi":"https://doi.org/10.1109/iolts.2014.6873676","title":"Towards low-cost fault detection strategy of FPGA configuration memory in real-time systems","display_name":"Towards low-cost fault detection strategy of FPGA configuration memory in real-time systems","publication_year":2014,"publication_date":"2014-07-01","ids":{"openalex":"https://openalex.org/W2062450305","doi":"https://doi.org/10.1109/iolts.2014.6873676","mag":"2062450305"},"language":"en","primary_location":{"id":"doi:10.1109/iolts.2014.6873676","is_oa":false,"landing_page_url":"https://doi.org/10.1109/iolts.2014.6873676","pdf_url":null,"source":null,"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"2014 IEEE 20th International On-Line Testing Symposium (IOLTS)","raw_type":"proceedings-article"},"type":"article","indexed_in":["crossref"],"open_access":{"is_oa":false,"oa_status":"closed","oa_url":null,"any_repository_has_fulltext":false},"authorships":[{"author_position":"first","author":{"id":"https://openalex.org/A5057103068","display_name":"Michael Frischke","orcid":null},"institutions":[{"id":"https://openalex.org/I889804353","display_name":"Robert Bosch (Germany)","ror":"https://ror.org/01fe0jt45","country_code":"DE","type":"company","lineage":["https://openalex.org/I889804353"]}],"countries":["DE"],"is_corresponding":true,"raw_author_name":"Michael Frischke","raw_affiliation_strings":["Robert Bosch GmbH, Corporate Research Sector - CR/AEH2, Stuttgart, Germany","Corp. Res. Sector, CR/AEH2 Robert Bosch GmbH, Stuttgart, Germany"],"affiliations":[{"raw_affiliation_string":"Robert Bosch GmbH, Corporate Research Sector - CR/AEH2, Stuttgart, Germany","institution_ids":["https://openalex.org/I889804353"]},{"raw_affiliation_string":"Corp. Res. Sector, CR/AEH2 Robert Bosch GmbH, Stuttgart, Germany","institution_ids":["https://openalex.org/I889804353"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5082886583","display_name":"Andreas Rohatschek","orcid":null},"institutions":[{"id":"https://openalex.org/I889804353","display_name":"Robert Bosch (Germany)","ror":"https://ror.org/01fe0jt45","country_code":"DE","type":"company","lineage":["https://openalex.org/I889804353"]}],"countries":["DE"],"is_corresponding":false,"raw_author_name":"Andreas J. Rohatschek","raw_affiliation_strings":["Robert Bosch GmbH, Corporate Research Sector - CR/AEH2, Stuttgart, Germany","Corp. Res. Sector, CR/AEH2 Robert Bosch GmbH, Stuttgart, Germany"],"affiliations":[{"raw_affiliation_string":"Robert Bosch GmbH, Corporate Research Sector - CR/AEH2, Stuttgart, Germany","institution_ids":["https://openalex.org/I889804353"]},{"raw_affiliation_string":"Corp. Res. Sector, CR/AEH2 Robert Bosch GmbH, Stuttgart, Germany","institution_ids":["https://openalex.org/I889804353"]}]},{"author_position":"last","author":{"id":"https://openalex.org/A5005732789","display_name":"Walter Stechele","orcid":"https://orcid.org/0000-0002-7455-8483"},"institutions":[],"countries":[],"is_corresponding":false,"raw_author_name":"Walter Stechele","raw_affiliation_strings":["TU Muenchen, Institute for Integrated Systems, Muenchen, Germany","Inst. for Integrated Syst., Tech. Univ. Muenchen, Muenchen, Germany"],"affiliations":[{"raw_affiliation_string":"TU Muenchen, Institute for Integrated Systems, Muenchen, Germany","institution_ids":[]},{"raw_affiliation_string":"Inst. for Integrated Syst., Tech. Univ. Muenchen, Muenchen, Germany","institution_ids":[]}]}],"institutions":[],"countries_distinct_count":1,"institutions_distinct_count":3,"corresponding_author_ids":["https://openalex.org/A5057103068"],"corresponding_institution_ids":["https://openalex.org/I889804353"],"apc_list":null,"apc_paid":null,"fwci":0.0,"has_fulltext":false,"cited_by_count":0,"citation_normalized_percentile":{"value":0.10771187,"is_in_top_1_percent":false,"is_in_top_10_percent":false},"cited_by_percentile_year":null,"biblio":{"volume":"1998","issue":null,"first_page":"81","last_page":"86"},"is_retracted":false,"is_paratext":false,"is_xpac":false,"primary_topic":{"id":"https://openalex.org/T11005","display_name":"Radiation Effects in Electronics","score":1.0,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},"topics":[{"id":"https://openalex.org/T11005","display_name":"Radiation Effects in Electronics","score":1.0,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T11032","display_name":"VLSI and Analog Circuit Testing","score":0.9998000264167786,"subfield":{"id":"https://openalex.org/subfields/1708","display_name":"Hardware and Architecture"},"field":{"id":"https://openalex.org/fields/17","display_name":"Computer Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T10904","display_name":"Embedded Systems Design Techniques","score":0.9997000098228455,"subfield":{"id":"https://openalex.org/subfields/1708","display_name":"Hardware and Architecture"},"field":{"id":"https://openalex.org/fields/17","display_name":"Computer Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"keywords":[{"id":"https://openalex.org/keywords/field-programmable-gate-array","display_name":"Field-programmable gate array","score":0.7883553504943848},{"id":"https://openalex.org/keywords/computer-science","display_name":"Computer science","score":0.7275505065917969},{"id":"https://openalex.org/keywords/fault-detection-and-isolation","display_name":"Fault detection and isolation","score":0.7049254179000854},{"id":"https://openalex.org/keywords/embedded-system","display_name":"Embedded system","score":0.6431009769439697},{"id":"https://openalex.org/keywords/automotive-industry","display_name":"Automotive industry","score":0.5879532694816589},{"id":"https://openalex.org/keywords/task","display_name":"Task (project management)","score":0.5491877794265747},{"id":"https://openalex.org/keywords/state","display_name":"State (computer science)","score":0.4849681854248047},{"id":"https://openalex.org/keywords/fault","display_name":"Fault (geology)","score":0.45718711614608765},{"id":"https://openalex.org/keywords/engineering","display_name":"Engineering","score":0.1669497787952423},{"id":"https://openalex.org/keywords/artificial-intelligence","display_name":"Artificial intelligence","score":0.08316487073898315}],"concepts":[{"id":"https://openalex.org/C42935608","wikidata":"https://www.wikidata.org/wiki/Q190411","display_name":"Field-programmable gate array","level":2,"score":0.7883553504943848},{"id":"https://openalex.org/C41008148","wikidata":"https://www.wikidata.org/wiki/Q21198","display_name":"Computer science","level":0,"score":0.7275505065917969},{"id":"https://openalex.org/C152745839","wikidata":"https://www.wikidata.org/wiki/Q5438153","display_name":"Fault detection and isolation","level":3,"score":0.7049254179000854},{"id":"https://openalex.org/C149635348","wikidata":"https://www.wikidata.org/wiki/Q193040","display_name":"Embedded system","level":1,"score":0.6431009769439697},{"id":"https://openalex.org/C526921623","wikidata":"https://www.wikidata.org/wiki/Q190117","display_name":"Automotive industry","level":2,"score":0.5879532694816589},{"id":"https://openalex.org/C2780451532","wikidata":"https://www.wikidata.org/wiki/Q759676","display_name":"Task (project management)","level":2,"score":0.5491877794265747},{"id":"https://openalex.org/C48103436","wikidata":"https://www.wikidata.org/wiki/Q599031","display_name":"State (computer science)","level":2,"score":0.4849681854248047},{"id":"https://openalex.org/C175551986","wikidata":"https://www.wikidata.org/wiki/Q47089","display_name":"Fault (geology)","level":2,"score":0.45718711614608765},{"id":"https://openalex.org/C127413603","wikidata":"https://www.wikidata.org/wiki/Q11023","display_name":"Engineering","level":0,"score":0.1669497787952423},{"id":"https://openalex.org/C154945302","wikidata":"https://www.wikidata.org/wiki/Q11660","display_name":"Artificial intelligence","level":1,"score":0.08316487073898315},{"id":"https://openalex.org/C127313418","wikidata":"https://www.wikidata.org/wiki/Q1069","display_name":"Geology","level":0,"score":0.0},{"id":"https://openalex.org/C11413529","wikidata":"https://www.wikidata.org/wiki/Q8366","display_name":"Algorithm","level":1,"score":0.0},{"id":"https://openalex.org/C165205528","wikidata":"https://www.wikidata.org/wiki/Q83371","display_name":"Seismology","level":1,"score":0.0},{"id":"https://openalex.org/C172707124","wikidata":"https://www.wikidata.org/wiki/Q423488","display_name":"Actuator","level":2,"score":0.0},{"id":"https://openalex.org/C146978453","wikidata":"https://www.wikidata.org/wiki/Q3798668","display_name":"Aerospace engineering","level":1,"score":0.0},{"id":"https://openalex.org/C201995342","wikidata":"https://www.wikidata.org/wiki/Q682496","display_name":"Systems engineering","level":1,"score":0.0}],"mesh":[],"locations_count":1,"locations":[{"id":"doi:10.1109/iolts.2014.6873676","is_oa":false,"landing_page_url":"https://doi.org/10.1109/iolts.2014.6873676","pdf_url":null,"source":null,"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"2014 IEEE 20th International On-Line Testing Symposium (IOLTS)","raw_type":"proceedings-article"}],"best_oa_location":null,"sustainable_development_goals":[{"score":0.46000000834465027,"id":"https://metadata.un.org/sdg/9","display_name":"Industry, innovation and infrastructure"}],"awards":[],"funders":[],"has_content":{"pdf":false,"grobid_xml":false},"content_urls":null,"referenced_works_count":14,"referenced_works":["https://openalex.org/W202046614","https://openalex.org/W1547856364","https://openalex.org/W1591874831","https://openalex.org/W1609545236","https://openalex.org/W2007565138","https://openalex.org/W2027114490","https://openalex.org/W2105364434","https://openalex.org/W2109488193","https://openalex.org/W2150629048","https://openalex.org/W2151104031","https://openalex.org/W2539987145","https://openalex.org/W3144951481","https://openalex.org/W6608142488","https://openalex.org/W6636482328"],"related_works":["https://openalex.org/W4382644535","https://openalex.org/W2111241003","https://openalex.org/W2522768275","https://openalex.org/W2352938035","https://openalex.org/W2351672553","https://openalex.org/W2373392303","https://openalex.org/W2096844293","https://openalex.org/W2363944576","https://openalex.org/W2351041855","https://openalex.org/W2570254841"],"abstract_inverted_index":{"As":[0],"a":[1,24,104,113],"result":[2],"of":[3,43,98],"the":[4,41,44,59,70,83,99],"recent":[5],"advancements":[6],"in":[7,66,73],"technology,":[8],"FPGAs":[9],"are":[10,40],"more":[11],"often":[12],"used":[13],"for":[14,33,47,58],"automotive":[15,121],"applications.":[16],"They":[17,50,107],"must":[18],"therefore":[19],"meet":[20,118],"industrial":[21],"requirements":[22,119],"like":[23],"fast":[25],"and":[26,76],"very":[27],"low":[28],"cost":[29],"fault":[30,54,122],"detection":[31,55,123],"strategy":[32,93],"their":[34,78],"configuration":[35,71],"memory.":[36],"Cyclic":[37],"memory":[38,72,101],"tests":[39,102],"state":[42,97],"art":[45,100],"approach":[46,64,111],"this":[48,67,91],"task.":[49],"do,":[51],"however,":[52],"violate":[53],"times,":[56],"especially":[57],"latest":[60],"FPGA":[61],"devices.":[62],"The":[63],"presented":[65],"paper":[68],"splits":[69],"several":[74],"parts":[75],"prioritizes":[77],"test":[79],"execution":[80],"depending":[81],"on":[82,103,120],"application":[84],"data":[85],"flow.":[86],"Using":[87],"two":[88],"conclusive":[89],"examples":[90],"adaptive":[92],"is":[94,112],"compared":[95],"to":[96,116],"Xilinx":[105],"FPGA.":[106],"show":[108],"that":[109],"our":[110],"useful":[114],"means":[115],"efficiently":[117],"times.":[124]},"counts_by_year":[],"updated_date":"2025-11-06T03:46:38.306776","created_date":"2025-10-10T00:00:00"}