{"id":"https://openalex.org/W1973604819","doi":"https://doi.org/10.1109/iolts.2013.6604070","title":"Error-tolerance evaluation and design techniques for motion estimation computing arrays","display_name":"Error-tolerance evaluation and design techniques for motion estimation computing arrays","publication_year":2013,"publication_date":"2013-07-01","ids":{"openalex":"https://openalex.org/W1973604819","doi":"https://doi.org/10.1109/iolts.2013.6604070","mag":"1973604819"},"language":"en","primary_location":{"id":"doi:10.1109/iolts.2013.6604070","is_oa":false,"landing_page_url":"https://doi.org/10.1109/iolts.2013.6604070","pdf_url":null,"source":null,"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"2013 IEEE 19th International On-Line Testing Symposium (IOLTS)","raw_type":"proceedings-article"},"type":"conference-paper","indexed_in":["crossref"],"open_access":{"is_oa":false,"oa_status":"closed","oa_url":null,"any_repository_has_fulltext":false},"authorships":[{"author_position":"first","author":{"id":"https://openalex.org/A5101941698","display_name":"Shyue-Kung Lu","orcid":"https://orcid.org/0000-0001-9232-2012"},"institutions":[{"id":"https://openalex.org/I154864474","display_name":"National Taiwan University of Science and Technology","ror":"https://ror.org/00q09pe49","country_code":"TW","type":"education","lineage":["https://openalex.org/I154864474"]}],"countries":["TW"],"is_corresponding":false,"raw_author_name":"Shyue-Kung Lu","raw_affiliation_strings":["Department of Electrical Engineering, National Taiwan University of Science and Technology, Taipei, Taiwan","Dept. of Electr. Eng., Nat. Taiwan Univ. of Science & Technol., Taipei, Taiwan"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Department of Electrical Engineering, National Taiwan University of Science and Technology, Taipei, Taiwan","institution_ids":["https://openalex.org/I154864474"]},{"raw_affiliation_string":"Dept. of Electr. Eng., Nat. Taiwan Univ. of Science & Technol., Taipei, Taiwan","institution_ids":["https://openalex.org/I154864474"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5110155783","display_name":"Ming-Chang Chen","orcid":null},"institutions":[{"id":"https://openalex.org/I154864474","display_name":"National Taiwan University of Science and Technology","ror":"https://ror.org/00q09pe49","country_code":"TW","type":"education","lineage":["https://openalex.org/I154864474"]}],"countries":["TW"],"is_corresponding":false,"raw_author_name":"Ming-Chang Chen","raw_affiliation_strings":["Department of Electrical Engineering, National Taiwan University of Science and Technology, Taipei, Taiwan","Dept. of Electr. Eng., Nat. Taiwan Univ. of Science & Technol., Taipei, Taiwan"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Department of Electrical Engineering, National Taiwan University of Science and Technology, Taipei, Taiwan","institution_ids":["https://openalex.org/I154864474"]},{"raw_affiliation_string":"Dept. of Electr. Eng., Nat. Taiwan Univ. of Science & Technol., Taipei, Taiwan","institution_ids":["https://openalex.org/I154864474"]}]},{"author_position":"last","author":{"id":"https://openalex.org/A5082062935","display_name":"Yen-Chi Chen","orcid":null},"institutions":[{"id":"https://openalex.org/I154864474","display_name":"National Taiwan University of Science and Technology","ror":"https://ror.org/00q09pe49","country_code":"TW","type":"education","lineage":["https://openalex.org/I154864474"]}],"countries":["TW"],"is_corresponding":false,"raw_author_name":"Yen-Chi Chen","raw_affiliation_strings":["Department of Electrical Engineering, National Taiwan University of Science and Technology, Taipei, Taiwan","Dept. of Electr. Eng., Nat. Taiwan Univ. of Science & Technol., Taipei, Taiwan"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Department of Electrical Engineering, National Taiwan University of Science and Technology, Taipei, Taiwan","institution_ids":["https://openalex.org/I154864474"]},{"raw_affiliation_string":"Dept. of Electr. Eng., Nat. Taiwan Univ. of Science & Technol., Taipei, Taiwan","institution_ids":["https://openalex.org/I154864474"]}]}],"institutions":[],"countries_distinct_count":1,"institutions_distinct_count":1,"corresponding_author_ids":[],"corresponding_institution_ids":["https://openalex.org/I154864474"],"apc_list":null,"apc_paid":null,"fwci":0.0,"has_fulltext":false,"cited_by_count":0,"citation_normalized_percentile":{"value":0.04369971,"is_in_top_1_percent":false,"is_in_top_10_percent":false},"cited_by_percentile_year":null,"biblio":{"volume":null,"issue":null,"first_page":"167","last_page":"168"},"is_retracted":false,"is_paratext":false,"is_xpac":false,"primary_topic":{"id":"https://openalex.org/T11992","display_name":"CCD and CMOS Imaging Sensors","score":0.9983000159263611,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},"topics":[{"id":"https://openalex.org/T11992","display_name":"CCD and CMOS Imaging Sensors","score":0.9983000159263611,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T10502","display_name":"Advanced Memory and Neural Computing","score":0.9973000288009644,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T11005","display_name":"Radiation Effects in Electronics","score":0.9965999722480774,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"keywords":[{"id":"https://openalex.org/keywords/computer-science","display_name":"Computer science","score":0.7462706565856934},{"id":"https://openalex.org/keywords/fault-tolerance","display_name":"Fault tolerance","score":0.7365798950195312},{"id":"https://openalex.org/keywords/overhead","display_name":"Overhead (engineering)","score":0.580367386341095},{"id":"https://openalex.org/keywords/swap","display_name":"Swap (finance)","score":0.47628727555274963},{"id":"https://openalex.org/keywords/reliability-engineering","display_name":"Reliability engineering","score":0.4735007882118225},{"id":"https://openalex.org/keywords/computer-engineering","display_name":"Computer engineering","score":0.3699074983596802},{"id":"https://openalex.org/keywords/distributed-computing","display_name":"Distributed computing","score":0.2498902976512909},{"id":"https://openalex.org/keywords/engineering","display_name":"Engineering","score":0.11420559883117676}],"concepts":[{"id":"https://openalex.org/C41008148","wikidata":"https://www.wikidata.org/wiki/Q21198","display_name":"Computer science","level":0,"score":0.7462706565856934},{"id":"https://openalex.org/C63540848","wikidata":"https://www.wikidata.org/wiki/Q3140932","display_name":"Fault tolerance","level":2,"score":0.7365798950195312},{"id":"https://openalex.org/C2779960059","wikidata":"https://www.wikidata.org/wiki/Q7113681","display_name":"Overhead (engineering)","level":2,"score":0.580367386341095},{"id":"https://openalex.org/C99821215","wikidata":"https://www.wikidata.org/wiki/Q1136583","display_name":"Swap (finance)","level":2,"score":0.47628727555274963},{"id":"https://openalex.org/C200601418","wikidata":"https://www.wikidata.org/wiki/Q2193887","display_name":"Reliability engineering","level":1,"score":0.4735007882118225},{"id":"https://openalex.org/C113775141","wikidata":"https://www.wikidata.org/wiki/Q428691","display_name":"Computer engineering","level":1,"score":0.3699074983596802},{"id":"https://openalex.org/C120314980","wikidata":"https://www.wikidata.org/wiki/Q180634","display_name":"Distributed computing","level":1,"score":0.2498902976512909},{"id":"https://openalex.org/C127413603","wikidata":"https://www.wikidata.org/wiki/Q11023","display_name":"Engineering","level":0,"score":0.11420559883117676},{"id":"https://openalex.org/C162324750","wikidata":"https://www.wikidata.org/wiki/Q8134","display_name":"Economics","level":0,"score":0.0},{"id":"https://openalex.org/C111919701","wikidata":"https://www.wikidata.org/wiki/Q9135","display_name":"Operating system","level":1,"score":0.0},{"id":"https://openalex.org/C10138342","wikidata":"https://www.wikidata.org/wiki/Q43015","display_name":"Finance","level":1,"score":0.0}],"mesh":[],"locations_count":1,"locations":[{"id":"doi:10.1109/iolts.2013.6604070","is_oa":false,"landing_page_url":"https://doi.org/10.1109/iolts.2013.6604070","pdf_url":null,"source":null,"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"2013 IEEE 19th International On-Line Testing Symposium (IOLTS)","raw_type":"proceedings-article"}],"best_oa_location":null,"sustainable_development_goals":[],"awards":[],"funders":[],"has_content":{"pdf":false,"grobid_xml":false},"content_urls":null,"referenced_works_count":2,"referenced_works":["https://openalex.org/W2099971661","https://openalex.org/W2142107379"],"related_works":["https://openalex.org/W614339039","https://openalex.org/W4230893873","https://openalex.org/W3125166754","https://openalex.org/W2807755437","https://openalex.org/W2509929388","https://openalex.org/W2568675634","https://openalex.org/W1862835629","https://openalex.org/W2136799148","https://openalex.org/W2897533804","https://openalex.org/W2890506991"],"abstract_inverted_index":{"In":[0],"this":[1,44],"paper,":[2],"we":[3],"propose":[4],"evaluation":[5],"flow":[6],"for":[7],"estimating":[8],"the":[9,41,50],"performance":[10],"degradation":[11],"of":[12,43],"motion":[13],"estimation":[14],"(ME)":[15],"architectures":[16],"when":[17,25],"faults":[18],"occur":[19],"and":[20,52],"decide":[21],"their":[22],"acceptability.":[23],"Moreover,":[24],"a":[26,32],"fault":[27],"is":[28,37],"evaluated":[29],"as":[30],"unacceptable,":[31],"swap-based":[33],"error-tolerance":[34],"(ET)":[35],"technique":[36],"proposed":[38],"to":[39,47],"increase":[40],"acceptability":[42,51],"fault.":[45],"According":[46],"experimental":[48],"results,":[49],"effective":[53],"yield":[54],"can":[55],"be":[56],"improved":[57],"significantly":[58],"with":[59],"negligible":[60],"hardware":[61],"overhead.":[62]},"counts_by_year":[],"updated_date":"2026-07-29T14:22:42.915294","created_date":"2025-10-10T00:00:00"}