{"id":"https://openalex.org/W1990608831","doi":"https://doi.org/10.1109/iolts.2013.6604051","title":"Timing vulnerability factors of sequential elements in modern microprocessors","display_name":"Timing vulnerability factors of sequential elements in modern microprocessors","publication_year":2013,"publication_date":"2013-07-01","ids":{"openalex":"https://openalex.org/W1990608831","doi":"https://doi.org/10.1109/iolts.2013.6604051","mag":"1990608831"},"language":"en","primary_location":{"id":"doi:10.1109/iolts.2013.6604051","is_oa":false,"landing_page_url":"https://doi.org/10.1109/iolts.2013.6604051","pdf_url":null,"source":null,"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"2013 IEEE 19th International On-Line Testing Symposium (IOLTS)","raw_type":"proceedings-article"},"type":"article","indexed_in":["crossref"],"open_access":{"is_oa":false,"oa_status":"closed","oa_url":null,"any_repository_has_fulltext":false},"authorships":[{"author_position":"first","author":{"id":"https://openalex.org/A5065582016","display_name":"Arkady Bramnik","orcid":null},"institutions":[{"id":"https://openalex.org/I80687555","display_name":"Israel Electric (Israel)","ror":"https://ror.org/01p8dnv11","country_code":"IL","type":"company","lineage":["https://openalex.org/I80687555"]},{"id":"https://openalex.org/I4210104622","display_name":"Intel (Israel)","ror":"https://ror.org/027t2s119","country_code":"IL","type":"company","lineage":["https://openalex.org/I1343180700","https://openalex.org/I4210104622"]}],"countries":["IL"],"is_corresponding":true,"raw_author_name":"Arkady Bramnik","raw_affiliation_strings":["Intel Corporation, Haifa, Israel","Intel Corp. Haifa, Haifa, Israel"],"affiliations":[{"raw_affiliation_string":"Intel Corporation, Haifa, Israel","institution_ids":["https://openalex.org/I80687555","https://openalex.org/I4210104622"]},{"raw_affiliation_string":"Intel Corp. Haifa, Haifa, Israel","institution_ids":["https://openalex.org/I80687555","https://openalex.org/I4210104622"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5012871536","display_name":"Andrei Sherban","orcid":null},"institutions":[{"id":"https://openalex.org/I4210104622","display_name":"Intel (Israel)","ror":"https://ror.org/027t2s119","country_code":"IL","type":"company","lineage":["https://openalex.org/I1343180700","https://openalex.org/I4210104622"]},{"id":"https://openalex.org/I80687555","display_name":"Israel Electric (Israel)","ror":"https://ror.org/01p8dnv11","country_code":"IL","type":"company","lineage":["https://openalex.org/I80687555"]}],"countries":["IL"],"is_corresponding":false,"raw_author_name":"Andrei Sherban","raw_affiliation_strings":["Intel Corporation, Haifa, Israel","Intel Corp. Haifa, Haifa, Israel"],"affiliations":[{"raw_affiliation_string":"Intel Corporation, Haifa, Israel","institution_ids":["https://openalex.org/I80687555","https://openalex.org/I4210104622"]},{"raw_affiliation_string":"Intel Corp. Haifa, Haifa, Israel","institution_ids":["https://openalex.org/I80687555","https://openalex.org/I4210104622"]}]},{"author_position":"last","author":{"id":"https://openalex.org/A5022491215","display_name":"N. Seifert","orcid":"https://orcid.org/0000-0001-6780-9953"},"institutions":[{"id":"https://openalex.org/I1343180700","display_name":"Intel (United States)","ror":"https://ror.org/01ek73717","country_code":"US","type":"company","lineage":["https://openalex.org/I1343180700"]}],"countries":["US"],"is_corresponding":false,"raw_author_name":"Norbert Seifert","raw_affiliation_strings":["Intel Corporation, Hillsboro, OR, USA","Intel Corp. Hillsboro, Hillsboro, OR, USA"],"affiliations":[{"raw_affiliation_string":"Intel Corporation, Hillsboro, OR, USA","institution_ids":["https://openalex.org/I1343180700"]},{"raw_affiliation_string":"Intel Corp. Hillsboro, Hillsboro, OR, USA","institution_ids":["https://openalex.org/I1343180700"]}]}],"institutions":[],"countries_distinct_count":2,"institutions_distinct_count":3,"corresponding_author_ids":["https://openalex.org/A5065582016"],"corresponding_institution_ids":["https://openalex.org/I4210104622","https://openalex.org/I80687555"],"apc_list":null,"apc_paid":null,"fwci":1.1822,"has_fulltext":false,"cited_by_count":14,"citation_normalized_percentile":{"value":0.80596291,"is_in_top_1_percent":false,"is_in_top_10_percent":false},"cited_by_percentile_year":{"min":89,"max":97},"biblio":{"volume":"4","issue":null,"first_page":"55","last_page":"60"},"is_retracted":false,"is_paratext":false,"is_xpac":false,"primary_topic":{"id":"https://openalex.org/T11005","display_name":"Radiation Effects in Electronics","score":0.9998999834060669,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},"topics":[{"id":"https://openalex.org/T11005","display_name":"Radiation Effects in Electronics","score":0.9998999834060669,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T11032","display_name":"VLSI and Analog Circuit Testing","score":0.9991999864578247,"subfield":{"id":"https://openalex.org/subfields/1708","display_name":"Hardware and Architecture"},"field":{"id":"https://openalex.org/fields/17","display_name":"Computer Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T10904","display_name":"Embedded Systems Design Techniques","score":0.9979000091552734,"subfield":{"id":"https://openalex.org/subfields/1708","display_name":"Hardware and Architecture"},"field":{"id":"https://openalex.org/fields/17","display_name":"Computer Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"keywords":[{"id":"https://openalex.org/keywords/vulnerability","display_name":"Vulnerability (computing)","score":0.7511625289916992},{"id":"https://openalex.org/keywords/computer-science","display_name":"Computer science","score":0.726365327835083},{"id":"https://openalex.org/keywords/key","display_name":"Key (lock)","score":0.7117172479629517},{"id":"https://openalex.org/keywords/soft-error","display_name":"Soft error","score":0.5863720178604126},{"id":"https://openalex.org/keywords/static-timing-analysis","display_name":"Static timing analysis","score":0.5244115591049194},{"id":"https://openalex.org/keywords/distributed-computing","display_name":"Distributed computing","score":0.3631312847137451},{"id":"https://openalex.org/keywords/parallel-computing","display_name":"Parallel computing","score":0.35317763686180115},{"id":"https://openalex.org/keywords/reliability-engineering","display_name":"Reliability engineering","score":0.3431340754032135},{"id":"https://openalex.org/keywords/computer-architecture","display_name":"Computer architecture","score":0.336098849773407},{"id":"https://openalex.org/keywords/embedded-system","display_name":"Embedded system","score":0.30759483575820923},{"id":"https://openalex.org/keywords/engineering","display_name":"Engineering","score":0.17924976348876953},{"id":"https://openalex.org/keywords/electronic-engineering","display_name":"Electronic engineering","score":0.12195008993148804},{"id":"https://openalex.org/keywords/operating-system","display_name":"Operating system","score":0.10114002227783203},{"id":"https://openalex.org/keywords/computer-security","display_name":"Computer security","score":0.09930726885795593}],"concepts":[{"id":"https://openalex.org/C95713431","wikidata":"https://www.wikidata.org/wiki/Q631425","display_name":"Vulnerability (computing)","level":2,"score":0.7511625289916992},{"id":"https://openalex.org/C41008148","wikidata":"https://www.wikidata.org/wiki/Q21198","display_name":"Computer science","level":0,"score":0.726365327835083},{"id":"https://openalex.org/C26517878","wikidata":"https://www.wikidata.org/wiki/Q228039","display_name":"Key (lock)","level":2,"score":0.7117172479629517},{"id":"https://openalex.org/C154474529","wikidata":"https://www.wikidata.org/wiki/Q1658917","display_name":"Soft error","level":2,"score":0.5863720178604126},{"id":"https://openalex.org/C93682380","wikidata":"https://www.wikidata.org/wiki/Q2025226","display_name":"Static timing analysis","level":2,"score":0.5244115591049194},{"id":"https://openalex.org/C120314980","wikidata":"https://www.wikidata.org/wiki/Q180634","display_name":"Distributed computing","level":1,"score":0.3631312847137451},{"id":"https://openalex.org/C173608175","wikidata":"https://www.wikidata.org/wiki/Q232661","display_name":"Parallel computing","level":1,"score":0.35317763686180115},{"id":"https://openalex.org/C200601418","wikidata":"https://www.wikidata.org/wiki/Q2193887","display_name":"Reliability engineering","level":1,"score":0.3431340754032135},{"id":"https://openalex.org/C118524514","wikidata":"https://www.wikidata.org/wiki/Q173212","display_name":"Computer architecture","level":1,"score":0.336098849773407},{"id":"https://openalex.org/C149635348","wikidata":"https://www.wikidata.org/wiki/Q193040","display_name":"Embedded system","level":1,"score":0.30759483575820923},{"id":"https://openalex.org/C127413603","wikidata":"https://www.wikidata.org/wiki/Q11023","display_name":"Engineering","level":0,"score":0.17924976348876953},{"id":"https://openalex.org/C24326235","wikidata":"https://www.wikidata.org/wiki/Q126095","display_name":"Electronic engineering","level":1,"score":0.12195008993148804},{"id":"https://openalex.org/C111919701","wikidata":"https://www.wikidata.org/wiki/Q9135","display_name":"Operating system","level":1,"score":0.10114002227783203},{"id":"https://openalex.org/C38652104","wikidata":"https://www.wikidata.org/wiki/Q3510521","display_name":"Computer security","level":1,"score":0.09930726885795593}],"mesh":[],"locations_count":1,"locations":[{"id":"doi:10.1109/iolts.2013.6604051","is_oa":false,"landing_page_url":"https://doi.org/10.1109/iolts.2013.6604051","pdf_url":null,"source":null,"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"2013 IEEE 19th International On-Line Testing Symposium (IOLTS)","raw_type":"proceedings-article"}],"best_oa_location":null,"sustainable_development_goals":[],"awards":[],"funders":[],"has_content":{"pdf":false,"grobid_xml":false},"content_urls":null,"referenced_works_count":12,"referenced_works":["https://openalex.org/W160422864","https://openalex.org/W1843888872","https://openalex.org/W2014215998","https://openalex.org/W2099569658","https://openalex.org/W2102101882","https://openalex.org/W2117391934","https://openalex.org/W2134490163","https://openalex.org/W2165911142","https://openalex.org/W3149410719","https://openalex.org/W4297422865","https://openalex.org/W6606583247","https://openalex.org/W6843114360"],"related_works":["https://openalex.org/W975040225","https://openalex.org/W2041615232","https://openalex.org/W2149032943","https://openalex.org/W2154081718","https://openalex.org/W2167002145","https://openalex.org/W2106281713","https://openalex.org/W2109966094","https://openalex.org/W2110367374","https://openalex.org/W3149410719","https://openalex.org/W2782851210"],"abstract_inverted_index":{"An":[0],"efficient":[1],"and":[2,41,46],"novel":[3],"technique":[4],"for":[5,38],"computing":[6],"timing":[7,26],"vulnerability":[8],"factors":[9],"(TVF)":[10],"in":[11,30],"modern":[12,39],"complex":[13],"synchronous":[14],"designs":[15],"is":[16],"introduced,":[17],"where":[18],"all":[19],"key":[20],"inputs":[21],"are":[22,54],"based":[23],"on":[24],"static":[25],"data":[27],"readily":[28],"available":[29],"most":[31],"design":[32],"databases.":[33],"The":[34],"benefits":[35],"of":[36],"TVF":[37],"microprocessors":[40],"strategies":[42],"to":[43],"reduce":[44],"TVF,":[45],"hence":[47],"the":[48],"overall":[49],"soft":[50],"error":[51],"rate":[52],"(SER),":[53],"presented.":[55]},"counts_by_year":[{"year":2023,"cited_by_count":2},{"year":2021,"cited_by_count":1},{"year":2020,"cited_by_count":1},{"year":2019,"cited_by_count":3},{"year":2018,"cited_by_count":2},{"year":2016,"cited_by_count":1},{"year":2015,"cited_by_count":3},{"year":2014,"cited_by_count":1}],"updated_date":"2025-11-06T03:46:38.306776","created_date":"2025-10-10T00:00:00"}