{"id":"https://openalex.org/W2009080282","doi":"https://doi.org/10.1109/iolts.2013.6604046","title":"Integrating embedded test infrastructure in SRAM cores to detect aging","display_name":"Integrating embedded test infrastructure in SRAM cores to detect aging","publication_year":2013,"publication_date":"2013-07-01","ids":{"openalex":"https://openalex.org/W2009080282","doi":"https://doi.org/10.1109/iolts.2013.6604046","mag":"2009080282"},"language":"en","primary_location":{"id":"doi:10.1109/iolts.2013.6604046","is_oa":false,"landing_page_url":"https://doi.org/10.1109/iolts.2013.6604046","pdf_url":null,"source":null,"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"2013 IEEE 19th International On-Line Testing Symposium (IOLTS)","raw_type":"proceedings-article"},"type":"conference-paper","indexed_in":["crossref"],"open_access":{"is_oa":false,"oa_status":"closed","oa_url":null,"any_repository_has_fulltext":false},"authorships":[{"author_position":"first","author":{"id":"https://openalex.org/A5055936885","display_name":"W. Prates","orcid":null},"institutions":[{"id":"https://openalex.org/I45643870","display_name":"Pontif\u00edcia Universidade Cat\u00f3lica do Rio Grande do Sul","ror":"https://ror.org/025vmq686","country_code":"BR","type":"education","lineage":["https://openalex.org/I45643870"]}],"countries":["BR"],"is_corresponding":false,"raw_author_name":"W. Prates","raw_affiliation_strings":["Electrical Engineering Dept, Catholic University \u2013 PUCRS, Porto Alegre, Brazil","Electr. Eng. Dept, Catholic Univ. - PUCRS, Porto Alegre, Brazil"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Electrical Engineering Dept, Catholic University \u2013 PUCRS, Porto Alegre, Brazil","institution_ids":["https://openalex.org/I45643870"]},{"raw_affiliation_string":"Electr. Eng. Dept, Catholic Univ. - PUCRS, Porto Alegre, Brazil","institution_ids":["https://openalex.org/I45643870"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5008111838","display_name":"L. Bolzani","orcid":null},"institutions":[{"id":"https://openalex.org/I45643870","display_name":"Pontif\u00edcia Universidade Cat\u00f3lica do Rio Grande do Sul","ror":"https://ror.org/025vmq686","country_code":"BR","type":"education","lineage":["https://openalex.org/I45643870"]}],"countries":["BR"],"is_corresponding":false,"raw_author_name":"L. Bolzani","raw_affiliation_strings":["Electrical Engineering Dept, Catholic University \u2013 PUCRS, Porto Alegre, Brazil","Electr. Eng. Dept, Catholic Univ. - PUCRS, Porto Alegre, Brazil"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Electrical Engineering Dept, Catholic University \u2013 PUCRS, Porto Alegre, Brazil","institution_ids":["https://openalex.org/I45643870"]},{"raw_affiliation_string":"Electr. Eng. Dept, Catholic Univ. - PUCRS, Porto Alegre, Brazil","institution_ids":["https://openalex.org/I45643870"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5041707514","display_name":"G. Harutyunyan","orcid":"https://orcid.org/0000-0002-9709-8336"},"institutions":[{"id":"https://openalex.org/I1335490905","display_name":"Synopsys (Switzerland)","ror":"https://ror.org/03mb54f81","country_code":"CH","type":"company","lineage":["https://openalex.org/I1335490905","https://openalex.org/I4210088951"]},{"id":"https://openalex.org/I4210094371","display_name":"Scientific Center of Zoology and Hydroecology","ror":"https://ror.org/00t5ymp38","country_code":"AM","type":"facility","lineage":["https://openalex.org/I4210094371","https://openalex.org/I99064381"]}],"countries":["AM","CH"],"is_corresponding":false,"raw_author_name":"G. Harutyunyan","raw_affiliation_strings":["Synopsys, Yerevan, Armenia","Synopsys Yerevan, Yerevan, Armenia"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Synopsys, Yerevan, Armenia","institution_ids":["https://openalex.org/I4210094371"]},{"raw_affiliation_string":"Synopsys Yerevan, Yerevan, Armenia","institution_ids":["https://openalex.org/I1335490905"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5008524736","display_name":"A. Davtyan","orcid":null},"institutions":[{"id":"https://openalex.org/I1335490905","display_name":"Synopsys (Switzerland)","ror":"https://ror.org/03mb54f81","country_code":"CH","type":"company","lineage":["https://openalex.org/I1335490905","https://openalex.org/I4210088951"]},{"id":"https://openalex.org/I4210094371","display_name":"Scientific Center of Zoology and Hydroecology","ror":"https://ror.org/00t5ymp38","country_code":"AM","type":"facility","lineage":["https://openalex.org/I4210094371","https://openalex.org/I99064381"]}],"countries":["AM","CH"],"is_corresponding":false,"raw_author_name":"A. Davtyan","raw_affiliation_strings":["Synopsys, Yerevan, Armenia","Synopsys Yerevan, Yerevan, Armenia"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Synopsys, Yerevan, Armenia","institution_ids":["https://openalex.org/I4210094371"]},{"raw_affiliation_string":"Synopsys Yerevan, Yerevan, Armenia","institution_ids":["https://openalex.org/I1335490905"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5056273734","display_name":"Fabian Vargas","orcid":"https://orcid.org/0000-0002-3871-6464"},"institutions":[{"id":"https://openalex.org/I45643870","display_name":"Pontif\u00edcia Universidade Cat\u00f3lica do Rio Grande do Sul","ror":"https://ror.org/025vmq686","country_code":"BR","type":"education","lineage":["https://openalex.org/I45643870"]}],"countries":["BR"],"is_corresponding":false,"raw_author_name":"F. Vargas","raw_affiliation_strings":["Electrical Engineering Dept, Catholic University \u2013 PUCRS, Porto Alegre, Brazil","Electr. Eng. Dept, Catholic Univ. - PUCRS, Porto Alegre, Brazil"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Electrical Engineering Dept, Catholic University \u2013 PUCRS, Porto Alegre, Brazil","institution_ids":["https://openalex.org/I45643870"]},{"raw_affiliation_string":"Electr. Eng. Dept, Catholic Univ. - PUCRS, Porto Alegre, Brazil","institution_ids":["https://openalex.org/I45643870"]}]},{"author_position":"last","author":{"id":"https://openalex.org/A5108606295","display_name":"Y. Zorian","orcid":null},"institutions":[{"id":"https://openalex.org/I4210088951","display_name":"Synopsys (United States)","ror":"https://ror.org/013by2m91","country_code":"US","type":"company","lineage":["https://openalex.org/I4210088951"]}],"countries":["US"],"is_corresponding":false,"raw_author_name":"Y. Zorian","raw_affiliation_strings":["Synopsys, CA, USA"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Synopsys, CA, USA","institution_ids":["https://openalex.org/I4210088951"]}]}],"institutions":[],"countries_distinct_count":4,"institutions_distinct_count":4,"corresponding_author_ids":[],"corresponding_institution_ids":[],"apc_list":null,"apc_paid":null,"fwci":0.8106,"has_fulltext":false,"cited_by_count":8,"citation_normalized_percentile":{"value":0.65684243,"is_in_top_1_percent":false,"is_in_top_10_percent":false},"cited_by_percentile_year":{"min":89,"max":97},"biblio":{"volume":null,"issue":null,"first_page":"25","last_page":"30"},"is_retracted":false,"is_paratext":false,"is_xpac":false,"primary_topic":{"id":"https://openalex.org/T10472","display_name":"Semiconductor materials and devices","score":1.0,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},"topics":[{"id":"https://openalex.org/T10472","display_name":"Semiconductor materials and devices","score":1.0,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T14117","display_name":"Integrated Circuits and Semiconductor Failure Analysis","score":1.0,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T10558","display_name":"Advancements in Semiconductor Devices and Circuit Design","score":0.9998000264167786,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"keywords":[{"id":"https://openalex.org/keywords/static-random-access-memory","display_name":"Static random-access memory","score":0.9681065082550049},{"id":"https://openalex.org/keywords/reliability","display_name":"Reliability (semiconductor)","score":0.5475339889526367},{"id":"https://openalex.org/keywords/embedded-system","display_name":"Embedded system","score":0.49630600214004517},{"id":"https://openalex.org/keywords/computer-science","display_name":"Computer science","score":0.4515879452228546},{"id":"https://openalex.org/keywords/spice","display_name":"Spice","score":0.42017483711242676},{"id":"https://openalex.org/keywords/electronic-engineering","display_name":"Electronic engineering","score":0.40809544920921326},{"id":"https://openalex.org/keywords/engineering","display_name":"Engineering","score":0.38151904940605164},{"id":"https://openalex.org/keywords/reliability-engineering","display_name":"Reliability engineering","score":0.3680882155895233},{"id":"https://openalex.org/keywords/power","display_name":"Power (physics)","score":0.32460224628448486}],"concepts":[{"id":"https://openalex.org/C68043766","wikidata":"https://www.wikidata.org/wiki/Q267416","display_name":"Static random-access memory","level":2,"score":0.9681065082550049},{"id":"https://openalex.org/C43214815","wikidata":"https://www.wikidata.org/wiki/Q7310987","display_name":"Reliability (semiconductor)","level":3,"score":0.5475339889526367},{"id":"https://openalex.org/C149635348","wikidata":"https://www.wikidata.org/wiki/Q193040","display_name":"Embedded system","level":1,"score":0.49630600214004517},{"id":"https://openalex.org/C41008148","wikidata":"https://www.wikidata.org/wiki/Q21198","display_name":"Computer science","level":0,"score":0.4515879452228546},{"id":"https://openalex.org/C2780077345","wikidata":"https://www.wikidata.org/wiki/Q16891888","display_name":"Spice","level":2,"score":0.42017483711242676},{"id":"https://openalex.org/C24326235","wikidata":"https://www.wikidata.org/wiki/Q126095","display_name":"Electronic engineering","level":1,"score":0.40809544920921326},{"id":"https://openalex.org/C127413603","wikidata":"https://www.wikidata.org/wiki/Q11023","display_name":"Engineering","level":0,"score":0.38151904940605164},{"id":"https://openalex.org/C200601418","wikidata":"https://www.wikidata.org/wiki/Q2193887","display_name":"Reliability engineering","level":1,"score":0.3680882155895233},{"id":"https://openalex.org/C163258240","wikidata":"https://www.wikidata.org/wiki/Q25342","display_name":"Power (physics)","level":2,"score":0.32460224628448486},{"id":"https://openalex.org/C121332964","wikidata":"https://www.wikidata.org/wiki/Q413","display_name":"Physics","level":0,"score":0.0},{"id":"https://openalex.org/C62520636","wikidata":"https://www.wikidata.org/wiki/Q944","display_name":"Quantum mechanics","level":1,"score":0.0}],"mesh":[],"locations_count":1,"locations":[{"id":"doi:10.1109/iolts.2013.6604046","is_oa":false,"landing_page_url":"https://doi.org/10.1109/iolts.2013.6604046","pdf_url":null,"source":null,"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"2013 IEEE 19th International On-Line Testing Symposium (IOLTS)","raw_type":"proceedings-article"}],"best_oa_location":null,"sustainable_development_goals":[{"id":"https://metadata.un.org/sdg/9","display_name":"Industry, innovation and infrastructure","score":0.6200000047683716}],"awards":[],"funders":[],"has_content":{"pdf":false,"grobid_xml":false},"content_urls":null,"referenced_works_count":7,"referenced_works":["https://openalex.org/W1970023301","https://openalex.org/W1989721474","https://openalex.org/W2011920948","https://openalex.org/W2060311166","https://openalex.org/W2071691160","https://openalex.org/W2081580265","https://openalex.org/W2167669450"],"related_works":["https://openalex.org/W2374901194","https://openalex.org/W2033512842","https://openalex.org/W2994319598","https://openalex.org/W4322734194","https://openalex.org/W1607054433","https://openalex.org/W3005535424","https://openalex.org/W4233600955","https://openalex.org/W2913665393","https://openalex.org/W2369695847","https://openalex.org/W3116237489"],"abstract_inverted_index":{"One":[0],"of":[1,26,37,69,83],"the":[2,24,27,34,47,66,73,81,99,115,126,143,151],"most":[3],"important":[4],"phenomena":[5],"degrading":[6],"Nano-scale":[7],"Static":[8],"Random":[9],"Access":[10],"Memory":[11],"(SRAM)":[12],"reliability":[13],"is":[14,44,62,78,107,111],"related":[15],"to":[16,45,54,64,102,124,129,150],"Negative-Bias":[17],"Temperature":[18],"Instability":[19],"(NBTI).":[20],"This":[21],"paper":[22],"presents":[23],"integration":[25],"OCAS":[28,61,85,127],"(On-Chip":[29],"Aging":[30],"Sensor)":[31],"approach":[32,106],"in":[33,72,134],"design":[35],"methodology":[36],"28nm":[38],"single-port":[39],"SRAM":[40,56,74,87,100,116],"cores.":[41],"The":[42,76,105],"goal":[43],"enhance":[46],"current":[48],"test":[49],"and":[50,146],"repair":[51],"on-chip":[52],"infrastructure":[53],"detect":[55,65,103,130],"aging":[57,67,132],"during":[58],"system":[59],"lifetime.":[60],"able":[63],"state":[68],"a":[70],"cell":[71],"array.":[75],"strategy":[77],"based":[79],"on":[80],"connection":[82],"one":[84],"per":[86],"column,":[88],"which":[89],"periodically":[90],"performs":[91],"off-line":[92],"testing":[93],"by":[94],"monitoring":[95],"write":[96],"operations":[97],"into":[98],"cells":[101],"aging.":[104],"application-transparent":[108],"since":[109],"it":[110],"does":[112],"not":[113],"change":[114],"content":[117],"after":[118],"testing.":[119],"SPICE":[120],"simulations":[121],"allowed":[122],"us":[123],"analyze":[125],"sensitivity":[128],"early":[131],"states":[133],"this":[135],"very":[136],"deep":[137],"submicron":[138],"technology,":[139],"as":[140,142],"well":[141],"area,":[144],"power":[145],"performance":[147],"penalties":[148],"due":[149],"sensor":[152],"insertion.":[153]},"counts_by_year":[{"year":2026,"cited_by_count":1},{"year":2024,"cited_by_count":2},{"year":2019,"cited_by_count":1},{"year":2017,"cited_by_count":2},{"year":2016,"cited_by_count":1},{"year":2014,"cited_by_count":1}],"updated_date":"2026-07-29T14:22:42.915294","created_date":"2025-10-10T00:00:00"}