{"id":"https://openalex.org/W2031459809","doi":"https://doi.org/10.1109/iolts.2012.6313837","title":"Analyzing and alleviating the impact of errors on an SRAM-based FPGA cluster","display_name":"Analyzing and alleviating the impact of errors on an SRAM-based FPGA cluster","publication_year":2012,"publication_date":"2012-06-01","ids":{"openalex":"https://openalex.org/W2031459809","doi":"https://doi.org/10.1109/iolts.2012.6313837","mag":"2031459809"},"language":"en","primary_location":{"id":"doi:10.1109/iolts.2012.6313837","is_oa":false,"landing_page_url":"https://doi.org/10.1109/iolts.2012.6313837","pdf_url":null,"source":null,"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"2012 IEEE 18th International On-Line Testing Symposium (IOLTS)","raw_type":"proceedings-article"},"type":"preprint","indexed_in":["crossref"],"open_access":{"is_oa":false,"oa_status":"closed","oa_url":null,"any_repository_has_fulltext":false},"authorships":[{"author_position":"first","author":{"id":"https://openalex.org/A5035916982","display_name":"Arwa Ben Dhia","orcid":null},"institutions":[{"id":"https://openalex.org/I12356871","display_name":"T\u00e9l\u00e9com Paris","ror":"https://ror.org/01naq7912","country_code":"FR","type":"education","lineage":["https://openalex.org/I12356871","https://openalex.org/I205703379","https://openalex.org/I4210145102"]},{"id":"https://openalex.org/I1294671590","display_name":"Centre National de la Recherche Scientifique","ror":"https://ror.org/02feahw73","country_code":"FR","type":"government","lineage":["https://openalex.org/I1294671590"]},{"id":"https://openalex.org/I205703379","display_name":"Institut Mines-T\u00e9l\u00e9com","ror":"https://ror.org/025vp2923","country_code":"FR","type":"facility","lineage":["https://openalex.org/I205703379"]},{"id":"https://openalex.org/I4210165912","display_name":"Laboratoire Traitement et Communication de l\u2019Information","ror":"https://ror.org/057er4c39","country_code":"FR","type":"facility","lineage":["https://openalex.org/I12356871","https://openalex.org/I205703379","https://openalex.org/I4210145102","https://openalex.org/I4210165912"]}],"countries":["FR"],"is_corresponding":false,"raw_author_name":"Arwa Ben Dhia","raw_affiliation_strings":["Institut TELECOM, LTCI-CNRS, France","Institut Telecom, Telecom ParisTech, LTCI CNRS, France"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Institut TELECOM, LTCI-CNRS, France","institution_ids":["https://openalex.org/I4210165912","https://openalex.org/I205703379","https://openalex.org/I1294671590"]},{"raw_affiliation_string":"Institut Telecom, Telecom ParisTech, LTCI CNRS, France","institution_ids":["https://openalex.org/I4210165912","https://openalex.org/I205703379","https://openalex.org/I1294671590","https://openalex.org/I12356871"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5018022196","display_name":"L\u00edrida Naviner","orcid":"https://orcid.org/0000-0002-6320-4153"},"institutions":[{"id":"https://openalex.org/I12356871","display_name":"T\u00e9l\u00e9com Paris","ror":"https://ror.org/01naq7912","country_code":"FR","type":"education","lineage":["https://openalex.org/I12356871","https://openalex.org/I205703379","https://openalex.org/I4210145102"]},{"id":"https://openalex.org/I1294671590","display_name":"Centre National de la Recherche Scientifique","ror":"https://ror.org/02feahw73","country_code":"FR","type":"government","lineage":["https://openalex.org/I1294671590"]},{"id":"https://openalex.org/I205703379","display_name":"Institut Mines-T\u00e9l\u00e9com","ror":"https://ror.org/025vp2923","country_code":"FR","type":"facility","lineage":["https://openalex.org/I205703379"]},{"id":"https://openalex.org/I4210165912","display_name":"Laboratoire Traitement et Communication de l\u2019Information","ror":"https://ror.org/057er4c39","country_code":"FR","type":"facility","lineage":["https://openalex.org/I12356871","https://openalex.org/I205703379","https://openalex.org/I4210145102","https://openalex.org/I4210165912"]}],"countries":["FR"],"is_corresponding":false,"raw_author_name":"Lirida Naviner","raw_affiliation_strings":["Institut TELECOM, LTCI-CNRS, France","Institut Telecom, Telecom ParisTech, LTCI CNRS, France"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Institut TELECOM, LTCI-CNRS, France","institution_ids":["https://openalex.org/I4210165912","https://openalex.org/I205703379","https://openalex.org/I1294671590"]},{"raw_affiliation_string":"Institut Telecom, Telecom ParisTech, LTCI CNRS, France","institution_ids":["https://openalex.org/I4210165912","https://openalex.org/I205703379","https://openalex.org/I1294671590","https://openalex.org/I12356871"]}]},{"author_position":"last","author":{"id":"https://openalex.org/A5062676433","display_name":"Philippe Matherat","orcid":null},"institutions":[{"id":"https://openalex.org/I12356871","display_name":"T\u00e9l\u00e9com Paris","ror":"https://ror.org/01naq7912","country_code":"FR","type":"education","lineage":["https://openalex.org/I12356871","https://openalex.org/I205703379","https://openalex.org/I4210145102"]},{"id":"https://openalex.org/I1294671590","display_name":"Centre National de la Recherche Scientifique","ror":"https://ror.org/02feahw73","country_code":"FR","type":"government","lineage":["https://openalex.org/I1294671590"]},{"id":"https://openalex.org/I205703379","display_name":"Institut Mines-T\u00e9l\u00e9com","ror":"https://ror.org/025vp2923","country_code":"FR","type":"facility","lineage":["https://openalex.org/I205703379"]},{"id":"https://openalex.org/I4210165912","display_name":"Laboratoire Traitement et Communication de l\u2019Information","ror":"https://ror.org/057er4c39","country_code":"FR","type":"facility","lineage":["https://openalex.org/I12356871","https://openalex.org/I205703379","https://openalex.org/I4210145102","https://openalex.org/I4210165912"]}],"countries":["FR"],"is_corresponding":false,"raw_author_name":"Philippe Matherat","raw_affiliation_strings":["Institut TELECOM, LTCI-CNRS, France","Institut Telecom, Telecom ParisTech, LTCI CNRS, France"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Institut TELECOM, LTCI-CNRS, France","institution_ids":["https://openalex.org/I4210165912","https://openalex.org/I205703379","https://openalex.org/I1294671590"]},{"raw_affiliation_string":"Institut Telecom, Telecom ParisTech, LTCI CNRS, France","institution_ids":["https://openalex.org/I4210165912","https://openalex.org/I205703379","https://openalex.org/I1294671590","https://openalex.org/I12356871"]}]}],"institutions":[],"countries_distinct_count":1,"institutions_distinct_count":3,"corresponding_author_ids":[],"corresponding_institution_ids":[],"apc_list":null,"apc_paid":null,"fwci":0.7495,"has_fulltext":false,"cited_by_count":3,"citation_normalized_percentile":{"value":0.74397057,"is_in_top_1_percent":false,"is_in_top_10_percent":false},"cited_by_percentile_year":{"min":90,"max":96},"biblio":{"volume":"12","issue":null,"first_page":"31","last_page":"36"},"is_retracted":false,"is_paratext":false,"is_xpac":false,"primary_topic":{"id":"https://openalex.org/T11005","display_name":"Radiation Effects in Electronics","score":0.9998999834060669,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},"topics":[{"id":"https://openalex.org/T11005","display_name":"Radiation Effects in Electronics","score":0.9998999834060669,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T11032","display_name":"VLSI and Analog Circuit Testing","score":0.9998000264167786,"subfield":{"id":"https://openalex.org/subfields/1708","display_name":"Hardware and Architecture"},"field":{"id":"https://openalex.org/fields/17","display_name":"Computer Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T10363","display_name":"Low-power high-performance VLSI design","score":0.9984999895095825,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"keywords":[{"id":"https://openalex.org/keywords/computer-science","display_name":"Computer science","score":0.7120372653007507},{"id":"https://openalex.org/keywords/cluster","display_name":"Cluster (spacecraft)","score":0.682245135307312},{"id":"https://openalex.org/keywords/soft-error","display_name":"Soft error","score":0.6501102447509766},{"id":"https://openalex.org/keywords/field-programmable-gate-array","display_name":"Field-programmable gate array","score":0.6468715667724609},{"id":"https://openalex.org/keywords/reliability","display_name":"Reliability (semiconductor)","score":0.631293535232544},{"id":"https://openalex.org/keywords/static-random-access-memory","display_name":"Static random-access memory","score":0.6275640726089478},{"id":"https://openalex.org/keywords/component","display_name":"Component (thermodynamics)","score":0.5033146739006042},{"id":"https://openalex.org/keywords/critical-path-method","display_name":"Critical path method","score":0.4777461886405945},{"id":"https://openalex.org/keywords/embedded-system","display_name":"Embedded system","score":0.4521680772304535},{"id":"https://openalex.org/keywords/parallel-computing","display_name":"Parallel computing","score":0.44763076305389404},{"id":"https://openalex.org/keywords/single-event-upset","display_name":"Single event upset","score":0.44105011224746704},{"id":"https://openalex.org/keywords/path","display_name":"Path (computing)","score":0.4357945919036865},{"id":"https://openalex.org/keywords/computer-hardware","display_name":"Computer hardware","score":0.29154253005981445},{"id":"https://openalex.org/keywords/electronic-engineering","display_name":"Electronic engineering","score":0.1849517524242401},{"id":"https://openalex.org/keywords/engineering","display_name":"Engineering","score":0.1405602991580963},{"id":"https://openalex.org/keywords/computer-network","display_name":"Computer network","score":0.1036933958530426}],"concepts":[{"id":"https://openalex.org/C41008148","wikidata":"https://www.wikidata.org/wiki/Q21198","display_name":"Computer science","level":0,"score":0.7120372653007507},{"id":"https://openalex.org/C164866538","wikidata":"https://www.wikidata.org/wiki/Q367351","display_name":"Cluster (spacecraft)","level":2,"score":0.682245135307312},{"id":"https://openalex.org/C154474529","wikidata":"https://www.wikidata.org/wiki/Q1658917","display_name":"Soft error","level":2,"score":0.6501102447509766},{"id":"https://openalex.org/C42935608","wikidata":"https://www.wikidata.org/wiki/Q190411","display_name":"Field-programmable gate array","level":2,"score":0.6468715667724609},{"id":"https://openalex.org/C43214815","wikidata":"https://www.wikidata.org/wiki/Q7310987","display_name":"Reliability (semiconductor)","level":3,"score":0.631293535232544},{"id":"https://openalex.org/C68043766","wikidata":"https://www.wikidata.org/wiki/Q267416","display_name":"Static random-access memory","level":2,"score":0.6275640726089478},{"id":"https://openalex.org/C168167062","wikidata":"https://www.wikidata.org/wiki/Q1117970","display_name":"Component (thermodynamics)","level":2,"score":0.5033146739006042},{"id":"https://openalex.org/C115874739","wikidata":"https://www.wikidata.org/wiki/Q825377","display_name":"Critical path method","level":2,"score":0.4777461886405945},{"id":"https://openalex.org/C149635348","wikidata":"https://www.wikidata.org/wiki/Q193040","display_name":"Embedded system","level":1,"score":0.4521680772304535},{"id":"https://openalex.org/C173608175","wikidata":"https://www.wikidata.org/wiki/Q232661","display_name":"Parallel computing","level":1,"score":0.44763076305389404},{"id":"https://openalex.org/C2780073065","wikidata":"https://www.wikidata.org/wiki/Q1476733","display_name":"Single event upset","level":3,"score":0.44105011224746704},{"id":"https://openalex.org/C2777735758","wikidata":"https://www.wikidata.org/wiki/Q817765","display_name":"Path (computing)","level":2,"score":0.4357945919036865},{"id":"https://openalex.org/C9390403","wikidata":"https://www.wikidata.org/wiki/Q3966","display_name":"Computer hardware","level":1,"score":0.29154253005981445},{"id":"https://openalex.org/C24326235","wikidata":"https://www.wikidata.org/wiki/Q126095","display_name":"Electronic engineering","level":1,"score":0.1849517524242401},{"id":"https://openalex.org/C127413603","wikidata":"https://www.wikidata.org/wiki/Q11023","display_name":"Engineering","level":0,"score":0.1405602991580963},{"id":"https://openalex.org/C31258907","wikidata":"https://www.wikidata.org/wiki/Q1301371","display_name":"Computer network","level":1,"score":0.1036933958530426},{"id":"https://openalex.org/C163258240","wikidata":"https://www.wikidata.org/wiki/Q25342","display_name":"Power (physics)","level":2,"score":0.0},{"id":"https://openalex.org/C121332964","wikidata":"https://www.wikidata.org/wiki/Q413","display_name":"Physics","level":0,"score":0.0},{"id":"https://openalex.org/C97355855","wikidata":"https://www.wikidata.org/wiki/Q11473","display_name":"Thermodynamics","level":1,"score":0.0},{"id":"https://openalex.org/C62520636","wikidata":"https://www.wikidata.org/wiki/Q944","display_name":"Quantum mechanics","level":1,"score":0.0},{"id":"https://openalex.org/C201995342","wikidata":"https://www.wikidata.org/wiki/Q682496","display_name":"Systems engineering","level":1,"score":0.0}],"mesh":[],"locations_count":2,"locations":[{"id":"doi:10.1109/iolts.2012.6313837","is_oa":false,"landing_page_url":"https://doi.org/10.1109/iolts.2012.6313837","pdf_url":null,"source":null,"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"2012 IEEE 18th International On-Line Testing Symposium (IOLTS)","raw_type":"proceedings-article"},{"id":"pmh:oai:HAL:hal-01062799v1","is_oa":false,"landing_page_url":"https://imt.hal.science/hal-01062799","pdf_url":null,"source":{"id":"https://openalex.org/S4306402512","display_name":"HAL (Le Centre pour la Communication Scientifique Directe)","issn_l":null,"issn":null,"is_oa":false,"is_in_doaj":false,"is_core":false,"host_organization":"https://openalex.org/I1294671590","host_organization_name":"Centre National de la Recherche Scientifique","host_organization_lineage":["https://openalex.org/I1294671590"],"host_organization_lineage_names":[],"type":"repository"},"license":null,"license_id":null,"version":"submittedVersion","is_accepted":false,"is_published":false,"raw_source_name":"IEEE International On-Line Testing Symposium (IOLTS), Jun 2012, Sitges, Spain. pp.31-36","raw_type":"Conference papers"}],"best_oa_location":null,"sustainable_development_goals":[{"display_name":"Industry, innovation and infrastructure","score":0.44999998807907104,"id":"https://metadata.un.org/sdg/9"}],"awards":[],"funders":[{"id":"https://openalex.org/F4320320883","display_name":"Agence Nationale de la Recherche","ror":"https://ror.org/00rbzpz17"}],"has_content":{"pdf":false,"grobid_xml":false},"content_urls":null,"referenced_works_count":17,"referenced_works":["https://openalex.org/W1523051745","https://openalex.org/W1534763372","https://openalex.org/W1603523129","https://openalex.org/W2010287392","https://openalex.org/W2040166817","https://openalex.org/W2082418834","https://openalex.org/W2112080352","https://openalex.org/W2113645429","https://openalex.org/W2116094656","https://openalex.org/W2119190785","https://openalex.org/W2132507670","https://openalex.org/W2143137068","https://openalex.org/W2144038574","https://openalex.org/W2147360973","https://openalex.org/W2154614244","https://openalex.org/W2156547554","https://openalex.org/W2540089678"],"related_works":["https://openalex.org/W4290647047","https://openalex.org/W2061783171","https://openalex.org/W2622269177","https://openalex.org/W2363504003","https://openalex.org/W2066033226","https://openalex.org/W1523508240","https://openalex.org/W2548582980","https://openalex.org/W2065552285","https://openalex.org/W1500230652","https://openalex.org/W3208260600"],"abstract_inverted_index":{"This":[0],"paper":[1],"proposes":[2],"a":[3,20,23,33,42],"method":[4],"to":[5,58,61,79,92],"analyze":[6],"the":[7,53,64,81,85,94],"effect":[8],"of":[9,40],"manufacturing":[10],"defects":[11],"and":[12,16,84],"soft":[13],"errors:":[14],"stuck-ats":[15,59],"bit":[17,73],"flips,":[18,74],"on":[19],"cluster":[21,28,54,95],"in":[22,38],"Mesh":[24],"FPGA":[25],"architecture.":[26],"The":[27],"reliability":[29],"is":[30,36,55,90],"evaluated":[31],"with":[32],"technique":[34],"that":[35,52,89],"used":[37],"case":[39],"either":[41],"single":[43],"error":[44],"or":[45],"multiple":[46],"simultaneous":[47],"faults.":[48],"Simulation":[49],"results":[50],"show":[51],"more":[56],"robust":[57],"than":[60],"bit-flips,":[62],"whatever":[63],"configuration":[65],"memory":[66],"is.":[67],"Then,":[68],"for":[69],"selective":[70],"hardening":[71],"against":[72],"we":[75],"propose":[76],"an":[77],"approach":[78],"identify":[80],"critical":[82],"path":[83],"most":[86],"eligible":[87],"component":[88],"likely":[91],"improve":[93],"reliability.":[96]},"counts_by_year":[{"year":2014,"cited_by_count":1},{"year":2013,"cited_by_count":2}],"updated_date":"2026-06-11T09:08:48.828518","created_date":"2025-10-10T00:00:00"}