{"id":"https://openalex.org/W2167412132","doi":"https://doi.org/10.1109/iolts.2011.5994539","title":"Evaluation techniques for on-line testing of robust systems based on critical tasks distribution","display_name":"Evaluation techniques for on-line testing of robust systems based on critical tasks distribution","publication_year":2011,"publication_date":"2011-07-01","ids":{"openalex":"https://openalex.org/W2167412132","doi":"https://doi.org/10.1109/iolts.2011.5994539","mag":"2167412132"},"language":"en","primary_location":{"id":"doi:10.1109/iolts.2011.5994539","is_oa":false,"landing_page_url":"https://doi.org/10.1109/iolts.2011.5994539","pdf_url":null,"source":null,"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"2011 IEEE 17th International On-Line Testing Symposium","raw_type":"proceedings-article"},"type":"article","indexed_in":["crossref"],"open_access":{"is_oa":false,"oa_status":"closed","oa_url":null,"any_repository_has_fulltext":false},"authorships":[{"author_position":"first","author":{"id":"https://openalex.org/A5037629907","display_name":"Anna Va\u0161kov\u00e1","orcid":null},"institutions":[{"id":"https://openalex.org/I50357001","display_name":"Universidad Carlos III de Madrid","ror":"https://ror.org/03ths8210","country_code":"ES","type":"education","lineage":["https://openalex.org/I50357001"]},{"id":"https://openalex.org/I88060688","display_name":"Universidad Polit\u00e9cnica de Madrid","ror":"https://ror.org/03n6nwv02","country_code":"ES","type":"education","lineage":["https://openalex.org/I88060688"]}],"countries":["ES"],"is_corresponding":false,"raw_author_name":"Anna Vaskova","raw_affiliation_strings":["Microelectronics Group Electronic Technology Department, Carlos III Technical University of Madrid, Spain"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Microelectronics Group Electronic Technology Department, Carlos III Technical University of Madrid, Spain","institution_ids":["https://openalex.org/I50357001","https://openalex.org/I88060688"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5067423177","display_name":"C. L\u00f3pez-Ongil","orcid":"https://orcid.org/0000-0001-9451-6611"},"institutions":[{"id":"https://openalex.org/I50357001","display_name":"Universidad Carlos III de Madrid","ror":"https://ror.org/03ths8210","country_code":"ES","type":"education","lineage":["https://openalex.org/I50357001"]},{"id":"https://openalex.org/I88060688","display_name":"Universidad Polit\u00e9cnica de Madrid","ror":"https://ror.org/03n6nwv02","country_code":"ES","type":"education","lineage":["https://openalex.org/I88060688"]}],"countries":["ES"],"is_corresponding":false,"raw_author_name":"Celia Lopez-Ongil","raw_affiliation_strings":["Microelectronics Group Electronic Technology Department, Carlos III Technical University of Madrid, Spain"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Microelectronics Group Electronic Technology Department, Carlos III Technical University of Madrid, Spain","institution_ids":["https://openalex.org/I50357001","https://openalex.org/I88060688"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5039590345","display_name":"M. Garc\u00eda-Valderas","orcid":"https://orcid.org/0000-0003-1615-1607"},"institutions":[{"id":"https://openalex.org/I50357001","display_name":"Universidad Carlos III de Madrid","ror":"https://ror.org/03ths8210","country_code":"ES","type":"education","lineage":["https://openalex.org/I50357001"]},{"id":"https://openalex.org/I88060688","display_name":"Universidad Polit\u00e9cnica de Madrid","ror":"https://ror.org/03n6nwv02","country_code":"ES","type":"education","lineage":["https://openalex.org/I88060688"]}],"countries":["ES"],"is_corresponding":false,"raw_author_name":"Mario Garcia-Valderas","raw_affiliation_strings":["Microelectronics Group Electronic Technology Department, Carlos III Technical University of Madrid, Spain"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Microelectronics Group Electronic Technology Department, Carlos III Technical University of Madrid, Spain","institution_ids":["https://openalex.org/I50357001","https://openalex.org/I88060688"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5030100022","display_name":"M. Portela-Garc\u00eda","orcid":"https://orcid.org/0000-0002-4103-0519"},"institutions":[{"id":"https://openalex.org/I50357001","display_name":"Universidad Carlos III de Madrid","ror":"https://ror.org/03ths8210","country_code":"ES","type":"education","lineage":["https://openalex.org/I50357001"]},{"id":"https://openalex.org/I88060688","display_name":"Universidad Polit\u00e9cnica de Madrid","ror":"https://ror.org/03n6nwv02","country_code":"ES","type":"education","lineage":["https://openalex.org/I88060688"]}],"countries":["ES"],"is_corresponding":false,"raw_author_name":"Marta Portela-Garcia","raw_affiliation_strings":["Microelectronics Group Electronic Technology Department, Carlos III Technical University of Madrid, Spain"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Microelectronics Group Electronic Technology Department, Carlos III Technical University of Madrid, Spain","institution_ids":["https://openalex.org/I50357001","https://openalex.org/I88060688"]}]},{"author_position":"last","author":{"id":"https://openalex.org/A5022411878","display_name":"Luis Entrena","orcid":"https://orcid.org/0000-0001-6021-165X"},"institutions":[{"id":"https://openalex.org/I50357001","display_name":"Universidad Carlos III de Madrid","ror":"https://ror.org/03ths8210","country_code":"ES","type":"education","lineage":["https://openalex.org/I50357001"]},{"id":"https://openalex.org/I88060688","display_name":"Universidad Polit\u00e9cnica de Madrid","ror":"https://ror.org/03n6nwv02","country_code":"ES","type":"education","lineage":["https://openalex.org/I88060688"]}],"countries":["ES"],"is_corresponding":false,"raw_author_name":"Luis Entrena","raw_affiliation_strings":["Microelectronics Group Electronic Technology Department, Carlos III Technical University of Madrid, Spain"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Microelectronics Group Electronic Technology Department, Carlos III Technical University of Madrid, Spain","institution_ids":["https://openalex.org/I50357001","https://openalex.org/I88060688"]}]}],"institutions":[],"countries_distinct_count":1,"institutions_distinct_count":5,"corresponding_author_ids":[],"corresponding_institution_ids":[],"apc_list":null,"apc_paid":null,"fwci":0.2703,"has_fulltext":false,"cited_by_count":3,"citation_normalized_percentile":{"value":0.65340445,"is_in_top_1_percent":false,"is_in_top_10_percent":false},"cited_by_percentile_year":{"min":90,"max":94},"biblio":{"volume":null,"issue":null,"first_page":"258","last_page":"263"},"is_retracted":false,"is_paratext":false,"is_xpac":false,"primary_topic":{"id":"https://openalex.org/T11005","display_name":"Radiation Effects in Electronics","score":1.0,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},"topics":[{"id":"https://openalex.org/T11005","display_name":"Radiation Effects in Electronics","score":1.0,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T11032","display_name":"VLSI and Analog Circuit Testing","score":1.0,"subfield":{"id":"https://openalex.org/subfields/1708","display_name":"Hardware and Architecture"},"field":{"id":"https://openalex.org/fields/17","display_name":"Computer Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T10904","display_name":"Embedded Systems Design Techniques","score":0.9993000030517578,"subfield":{"id":"https://openalex.org/subfields/1708","display_name":"Hardware and Architecture"},"field":{"id":"https://openalex.org/fields/17","display_name":"Computer Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"keywords":[{"id":"https://openalex.org/keywords/emulation","display_name":"Emulation","score":0.7834498882293701},{"id":"https://openalex.org/keywords/computer-science","display_name":"Computer science","score":0.6933875679969788},{"id":"https://openalex.org/keywords/reliability-engineering","display_name":"Reliability engineering","score":0.5915688872337341},{"id":"https://openalex.org/keywords/aerospace","display_name":"Aerospace","score":0.5577636957168579},{"id":"https://openalex.org/keywords/software","display_name":"Software","score":0.4750621020793915},{"id":"https://openalex.org/keywords/electronics","display_name":"Electronics","score":0.47103172540664673},{"id":"https://openalex.org/keywords/process","display_name":"Process (computing)","score":0.4632478952407837},{"id":"https://openalex.org/keywords/reliability","display_name":"Reliability (semiconductor)","score":0.45926937460899353},{"id":"https://openalex.org/keywords/sensitivity","display_name":"Sensitivity (control systems)","score":0.447353720664978},{"id":"https://openalex.org/keywords/digital-electronics","display_name":"Digital electronics","score":0.4443175196647644},{"id":"https://openalex.org/keywords/computer-engineering","display_name":"Computer engineering","score":0.3876745104789734},{"id":"https://openalex.org/keywords/embedded-system","display_name":"Embedded system","score":0.37943407893180847},{"id":"https://openalex.org/keywords/electronic-engineering","display_name":"Electronic engineering","score":0.3309410810470581},{"id":"https://openalex.org/keywords/electronic-circuit","display_name":"Electronic circuit","score":0.22132784128189087},{"id":"https://openalex.org/keywords/engineering","display_name":"Engineering","score":0.1793949007987976}],"concepts":[{"id":"https://openalex.org/C149810388","wikidata":"https://www.wikidata.org/wiki/Q5374873","display_name":"Emulation","level":2,"score":0.7834498882293701},{"id":"https://openalex.org/C41008148","wikidata":"https://www.wikidata.org/wiki/Q21198","display_name":"Computer science","level":0,"score":0.6933875679969788},{"id":"https://openalex.org/C200601418","wikidata":"https://www.wikidata.org/wiki/Q2193887","display_name":"Reliability engineering","level":1,"score":0.5915688872337341},{"id":"https://openalex.org/C167740415","wikidata":"https://www.wikidata.org/wiki/Q2876213","display_name":"Aerospace","level":2,"score":0.5577636957168579},{"id":"https://openalex.org/C2777904410","wikidata":"https://www.wikidata.org/wiki/Q7397","display_name":"Software","level":2,"score":0.4750621020793915},{"id":"https://openalex.org/C138331895","wikidata":"https://www.wikidata.org/wiki/Q11650","display_name":"Electronics","level":2,"score":0.47103172540664673},{"id":"https://openalex.org/C98045186","wikidata":"https://www.wikidata.org/wiki/Q205663","display_name":"Process (computing)","level":2,"score":0.4632478952407837},{"id":"https://openalex.org/C43214815","wikidata":"https://www.wikidata.org/wiki/Q7310987","display_name":"Reliability (semiconductor)","level":3,"score":0.45926937460899353},{"id":"https://openalex.org/C21200559","wikidata":"https://www.wikidata.org/wiki/Q7451068","display_name":"Sensitivity (control systems)","level":2,"score":0.447353720664978},{"id":"https://openalex.org/C81843906","wikidata":"https://www.wikidata.org/wiki/Q173156","display_name":"Digital electronics","level":3,"score":0.4443175196647644},{"id":"https://openalex.org/C113775141","wikidata":"https://www.wikidata.org/wiki/Q428691","display_name":"Computer engineering","level":1,"score":0.3876745104789734},{"id":"https://openalex.org/C149635348","wikidata":"https://www.wikidata.org/wiki/Q193040","display_name":"Embedded system","level":1,"score":0.37943407893180847},{"id":"https://openalex.org/C24326235","wikidata":"https://www.wikidata.org/wiki/Q126095","display_name":"Electronic engineering","level":1,"score":0.3309410810470581},{"id":"https://openalex.org/C134146338","wikidata":"https://www.wikidata.org/wiki/Q1815901","display_name":"Electronic circuit","level":2,"score":0.22132784128189087},{"id":"https://openalex.org/C127413603","wikidata":"https://www.wikidata.org/wiki/Q11023","display_name":"Engineering","level":0,"score":0.1793949007987976},{"id":"https://openalex.org/C119599485","wikidata":"https://www.wikidata.org/wiki/Q43035","display_name":"Electrical engineering","level":1,"score":0.0},{"id":"https://openalex.org/C162324750","wikidata":"https://www.wikidata.org/wiki/Q8134","display_name":"Economics","level":0,"score":0.0},{"id":"https://openalex.org/C163258240","wikidata":"https://www.wikidata.org/wiki/Q25342","display_name":"Power (physics)","level":2,"score":0.0},{"id":"https://openalex.org/C50522688","wikidata":"https://www.wikidata.org/wiki/Q189833","display_name":"Economic growth","level":1,"score":0.0},{"id":"https://openalex.org/C111919701","wikidata":"https://www.wikidata.org/wiki/Q9135","display_name":"Operating system","level":1,"score":0.0},{"id":"https://openalex.org/C199360897","wikidata":"https://www.wikidata.org/wiki/Q9143","display_name":"Programming language","level":1,"score":0.0},{"id":"https://openalex.org/C146978453","wikidata":"https://www.wikidata.org/wiki/Q3798668","display_name":"Aerospace engineering","level":1,"score":0.0},{"id":"https://openalex.org/C62520636","wikidata":"https://www.wikidata.org/wiki/Q944","display_name":"Quantum mechanics","level":1,"score":0.0},{"id":"https://openalex.org/C121332964","wikidata":"https://www.wikidata.org/wiki/Q413","display_name":"Physics","level":0,"score":0.0}],"mesh":[],"locations_count":1,"locations":[{"id":"doi:10.1109/iolts.2011.5994539","is_oa":false,"landing_page_url":"https://doi.org/10.1109/iolts.2011.5994539","pdf_url":null,"source":null,"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"2011 IEEE 17th International On-Line Testing Symposium","raw_type":"proceedings-article"}],"best_oa_location":null,"sustainable_development_goals":[],"awards":[],"funders":[],"has_content":{"grobid_xml":false,"pdf":false},"content_urls":null,"referenced_works_count":16,"referenced_works":["https://openalex.org/W14433888","https://openalex.org/W654762514","https://openalex.org/W1480023784","https://openalex.org/W1500893261","https://openalex.org/W1615820927","https://openalex.org/W1821730155","https://openalex.org/W2100317647","https://openalex.org/W2109581582","https://openalex.org/W2116813052","https://openalex.org/W2137435720","https://openalex.org/W2140899683","https://openalex.org/W2143105503","https://openalex.org/W2165229922","https://openalex.org/W2552659879","https://openalex.org/W6600595077","https://openalex.org/W6636389235"],"related_works":["https://openalex.org/W4252661958","https://openalex.org/W2359999068","https://openalex.org/W2062086413","https://openalex.org/W2083648228","https://openalex.org/W2084720890","https://openalex.org/W2532017461","https://openalex.org/W2385361013","https://openalex.org/W2140093774","https://openalex.org/W2588157079","https://openalex.org/W3114476551"],"abstract_inverted_index":{"The":[0],"process":[1,59],"of":[2,16,53,118,135,149],"designing":[3],"robust":[4],"digital":[5,31,120],"systems":[6,32,97,121],"is":[7,46],"getting":[8],"heavier":[9],"and":[10,19,25,40,55,66,75,86,126],"longer":[11],"due":[12],"to":[13,142],"the":[14,57,73,89,112,146,150],"increase":[15],"functional":[17],"complexity":[18],"circuit":[20],"sensitiveness":[21],"[1][2].":[22],"Furthermore,":[23],"aerospace":[24],"automotive":[26],"electronics":[27],"are":[28],"including":[29],"more":[30,61],"with":[33,72,122],"critical":[34,123],"tasks":[35,124],"distribution":[36,125],"among":[37],"several":[38],"single":[39],"cheaper":[41],"modules.":[42],"Although":[43],"collaborative":[44,127],"hardening":[45],"providing":[47],"very":[48],"interesting":[49],"results":[50],"in":[51,95,99,145],"terms":[52],"cost":[54],"reliability,":[56],"design":[58,151],"becomes":[60],"difficult.":[62],"Redundant":[63],"tasks,":[64],"hardware":[65,143],"software,":[67],"must":[68,92],"be":[69,93],"evaluated":[70],"together":[71],"global":[74],"local":[76],"error":[77,84,90],"mitigation":[78],"techniques.":[79],"Also,":[80],"network":[81],"links":[82],"affect":[83],"propagation":[85],"mitigation.":[87],"Finally,":[88],"accumulation":[91],"considered":[94],"these":[96],"working":[98],"harsh":[100],"conditions.":[101],"In":[102],"this":[103],"paper":[104],"we":[105],"present":[106],"a":[107,132],"general":[108],"method":[109,130],"for":[110],"evaluating":[111],"Single":[113],"Bit":[114],"Upsets":[115],"(SBU)":[116],"sensitivity":[117],"complex":[119],"hardening.":[128],"This":[129],"performs":[131],"detailed":[133],"analysis":[134],"signal":[136],"integrity":[137],"along":[138],"system":[139],"operation":[140],"thanks":[141],"emulation":[144],"early":[147],"steps":[148],"cycle.":[152]},"counts_by_year":[{"year":2019,"cited_by_count":1},{"year":2015,"cited_by_count":1}],"updated_date":"2026-06-11T09:08:48.828518","created_date":"2025-10-10T00:00:00"}