{"id":"https://openalex.org/W2113231297","doi":"https://doi.org/10.1109/iolts.2010.5560228","title":"Wavelet analysis of measurements for on-line testing analog &amp;amp; mixed-signal circuits","display_name":"Wavelet analysis of measurements for on-line testing analog &amp;amp; mixed-signal circuits","publication_year":2010,"publication_date":"2010-07-01","ids":{"openalex":"https://openalex.org/W2113231297","doi":"https://doi.org/10.1109/iolts.2010.5560228","mag":"2113231297"},"language":"en","primary_location":{"id":"doi:10.1109/iolts.2010.5560228","is_oa":false,"landing_page_url":"https://doi.org/10.1109/iolts.2010.5560228","pdf_url":null,"source":null,"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"2010 IEEE 16th International On-Line Testing Symposium","raw_type":"proceedings-article"},"type":"article","indexed_in":["crossref"],"open_access":{"is_oa":false,"oa_status":"closed","oa_url":null,"any_repository_has_fulltext":false},"authorships":[{"author_position":"first","author":{"id":"https://openalex.org/A5060678776","display_name":"Michael G. Dimopoulos","orcid":null},"institutions":[{"id":"https://openalex.org/I77990126","display_name":"Alexander Technological Educational Institute of Thessaloniki","ror":"https://ror.org/04h36ea57","country_code":"GR","type":"education","lineage":["https://openalex.org/I77990126"]}],"countries":["GR"],"is_corresponding":true,"raw_author_name":"Michael G. Dimopoulos","raw_affiliation_strings":["Department of Electronics, Alexander Technological Educational Institute of Thessaloniki, Thessaloniki, Greece","Department of Electronics Alexander Technological Educat. Inst. of Thessaloniki Thessaloniki, Greece"],"affiliations":[{"raw_affiliation_string":"Department of Electronics, Alexander Technological Educational Institute of Thessaloniki, Thessaloniki, Greece","institution_ids":["https://openalex.org/I77990126"]},{"raw_affiliation_string":"Department of Electronics Alexander Technological Educat. Inst. of Thessaloniki Thessaloniki, Greece","institution_ids":["https://openalex.org/I77990126"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5048785491","display_name":"Alexios D. Spyronasios","orcid":null},"institutions":[{"id":"https://openalex.org/I21370196","display_name":"Aristotle University of Thessaloniki","ror":"https://ror.org/02j61yw88","country_code":"GR","type":"education","lineage":["https://openalex.org/I21370196"]}],"countries":["GR"],"is_corresponding":false,"raw_author_name":"Alexios D. Spyronasios","raw_affiliation_strings":["Department of Electrical & Computer Engineering, Aristotle University of Thessaloniki, Thessaloniki, Greece","Department of Electrical and Computer Engineering, Aristotle University of Thessaloniki, Thessaloniki, Greece"],"affiliations":[{"raw_affiliation_string":"Department of Electrical & Computer Engineering, Aristotle University of Thessaloniki, Thessaloniki, Greece","institution_ids":["https://openalex.org/I21370196"]},{"raw_affiliation_string":"Department of Electrical and Computer Engineering, Aristotle University of Thessaloniki, Thessaloniki, Greece","institution_ids":["https://openalex.org/I21370196"]}]},{"author_position":"last","author":{"id":"https://openalex.org/A5009584271","display_name":"Alkis Hatzopoulos","orcid":"https://orcid.org/0000-0002-4030-8355"},"institutions":[{"id":"https://openalex.org/I21370196","display_name":"Aristotle University of Thessaloniki","ror":"https://ror.org/02j61yw88","country_code":"GR","type":"education","lineage":["https://openalex.org/I21370196"]}],"countries":["GR"],"is_corresponding":false,"raw_author_name":"Alkis A. Hatzopoulos","raw_affiliation_strings":["Department of Electrical & Computer Engineering, Aristotle University of Thessaloniki, Thessaloniki, Greece","Department of Electrical and Computer Engineering, Aristotle University of Thessaloniki, Thessaloniki, Greece"],"affiliations":[{"raw_affiliation_string":"Department of Electrical & Computer Engineering, Aristotle University of Thessaloniki, Thessaloniki, Greece","institution_ids":["https://openalex.org/I21370196"]},{"raw_affiliation_string":"Department of Electrical and Computer Engineering, Aristotle University of Thessaloniki, Thessaloniki, Greece","institution_ids":["https://openalex.org/I21370196"]}]}],"institutions":[],"countries_distinct_count":1,"institutions_distinct_count":3,"corresponding_author_ids":["https://openalex.org/A5060678776"],"corresponding_institution_ids":["https://openalex.org/I77990126"],"apc_list":null,"apc_paid":null,"fwci":0.0,"has_fulltext":false,"cited_by_count":0,"citation_normalized_percentile":{"value":0.15464835,"is_in_top_1_percent":false,"is_in_top_10_percent":false},"cited_by_percentile_year":null,"biblio":{"volume":null,"issue":null,"first_page":"83","last_page":"87"},"is_retracted":false,"is_paratext":false,"is_xpac":false,"primary_topic":{"id":"https://openalex.org/T14117","display_name":"Integrated Circuits and Semiconductor Failure Analysis","score":0.9998000264167786,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},"topics":[{"id":"https://openalex.org/T14117","display_name":"Integrated Circuits and Semiconductor Failure Analysis","score":0.9998000264167786,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T11032","display_name":"VLSI and Analog Circuit Testing","score":0.9994999766349792,"subfield":{"id":"https://openalex.org/subfields/1708","display_name":"Hardware and Architecture"},"field":{"id":"https://openalex.org/fields/17","display_name":"Computer Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T12300","display_name":"Advanced Electrical Measurement Techniques","score":0.9965000152587891,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"keywords":[{"id":"https://openalex.org/keywords/wavelet","display_name":"Wavelet","score":0.7331857085227966},{"id":"https://openalex.org/keywords/metric","display_name":"Metric (unit)","score":0.6429449319839478},{"id":"https://openalex.org/keywords/signal","display_name":"SIGNAL (programming language)","score":0.6243377923965454},{"id":"https://openalex.org/keywords/waveform","display_name":"Waveform","score":0.5815221667289734},{"id":"https://openalex.org/keywords/transformation","display_name":"Transformation (genetics)","score":0.5699493885040283},{"id":"https://openalex.org/keywords/signal-processing","display_name":"Signal processing","score":0.45918482542037964},{"id":"https://openalex.org/keywords/computer-science","display_name":"Computer science","score":0.4587955176830292},{"id":"https://openalex.org/keywords/algorithm","display_name":"Algorithm","score":0.4327915608882904},{"id":"https://openalex.org/keywords/mathematics","display_name":"Mathematics","score":0.3806750774383545},{"id":"https://openalex.org/keywords/electronic-engineering","display_name":"Electronic engineering","score":0.3377649784088135},{"id":"https://openalex.org/keywords/voltage","display_name":"Voltage","score":0.22918003797531128},{"id":"https://openalex.org/keywords/artificial-intelligence","display_name":"Artificial intelligence","score":0.22285470366477966},{"id":"https://openalex.org/keywords/electrical-engineering","display_name":"Electrical engineering","score":0.18393465876579285},{"id":"https://openalex.org/keywords/engineering","display_name":"Engineering","score":0.18147191405296326},{"id":"https://openalex.org/keywords/digital-signal-processing","display_name":"Digital signal processing","score":0.10183250904083252}],"concepts":[{"id":"https://openalex.org/C47432892","wikidata":"https://www.wikidata.org/wiki/Q831390","display_name":"Wavelet","level":2,"score":0.7331857085227966},{"id":"https://openalex.org/C176217482","wikidata":"https://www.wikidata.org/wiki/Q860554","display_name":"Metric (unit)","level":2,"score":0.6429449319839478},{"id":"https://openalex.org/C2779843651","wikidata":"https://www.wikidata.org/wiki/Q7390335","display_name":"SIGNAL (programming language)","level":2,"score":0.6243377923965454},{"id":"https://openalex.org/C197424946","wikidata":"https://www.wikidata.org/wiki/Q1165717","display_name":"Waveform","level":3,"score":0.5815221667289734},{"id":"https://openalex.org/C204241405","wikidata":"https://www.wikidata.org/wiki/Q461499","display_name":"Transformation (genetics)","level":3,"score":0.5699493885040283},{"id":"https://openalex.org/C104267543","wikidata":"https://www.wikidata.org/wiki/Q208163","display_name":"Signal processing","level":3,"score":0.45918482542037964},{"id":"https://openalex.org/C41008148","wikidata":"https://www.wikidata.org/wiki/Q21198","display_name":"Computer science","level":0,"score":0.4587955176830292},{"id":"https://openalex.org/C11413529","wikidata":"https://www.wikidata.org/wiki/Q8366","display_name":"Algorithm","level":1,"score":0.4327915608882904},{"id":"https://openalex.org/C33923547","wikidata":"https://www.wikidata.org/wiki/Q395","display_name":"Mathematics","level":0,"score":0.3806750774383545},{"id":"https://openalex.org/C24326235","wikidata":"https://www.wikidata.org/wiki/Q126095","display_name":"Electronic engineering","level":1,"score":0.3377649784088135},{"id":"https://openalex.org/C165801399","wikidata":"https://www.wikidata.org/wiki/Q25428","display_name":"Voltage","level":2,"score":0.22918003797531128},{"id":"https://openalex.org/C154945302","wikidata":"https://www.wikidata.org/wiki/Q11660","display_name":"Artificial intelligence","level":1,"score":0.22285470366477966},{"id":"https://openalex.org/C119599485","wikidata":"https://www.wikidata.org/wiki/Q43035","display_name":"Electrical engineering","level":1,"score":0.18393465876579285},{"id":"https://openalex.org/C127413603","wikidata":"https://www.wikidata.org/wiki/Q11023","display_name":"Engineering","level":0,"score":0.18147191405296326},{"id":"https://openalex.org/C84462506","wikidata":"https://www.wikidata.org/wiki/Q173142","display_name":"Digital signal processing","level":2,"score":0.10183250904083252},{"id":"https://openalex.org/C185592680","wikidata":"https://www.wikidata.org/wiki/Q2329","display_name":"Chemistry","level":0,"score":0.0},{"id":"https://openalex.org/C55493867","wikidata":"https://www.wikidata.org/wiki/Q7094","display_name":"Biochemistry","level":1,"score":0.0},{"id":"https://openalex.org/C199360897","wikidata":"https://www.wikidata.org/wiki/Q9143","display_name":"Programming language","level":1,"score":0.0},{"id":"https://openalex.org/C21547014","wikidata":"https://www.wikidata.org/wiki/Q1423657","display_name":"Operations management","level":1,"score":0.0},{"id":"https://openalex.org/C104317684","wikidata":"https://www.wikidata.org/wiki/Q7187","display_name":"Gene","level":2,"score":0.0}],"mesh":[],"locations_count":1,"locations":[{"id":"doi:10.1109/iolts.2010.5560228","is_oa":false,"landing_page_url":"https://doi.org/10.1109/iolts.2010.5560228","pdf_url":null,"source":null,"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"2010 IEEE 16th International On-Line Testing Symposium","raw_type":"proceedings-article"}],"best_oa_location":null,"sustainable_development_goals":[{"score":0.5099999904632568,"display_name":"Reduced inequalities","id":"https://metadata.un.org/sdg/10"},{"score":0.4399999976158142,"display_name":"Peace, Justice and strong institutions","id":"https://metadata.un.org/sdg/16"}],"awards":[],"funders":[],"has_content":{"pdf":false,"grobid_xml":false},"content_urls":null,"referenced_works_count":12,"referenced_works":["https://openalex.org/W1924227955","https://openalex.org/W2039374652","https://openalex.org/W2050977993","https://openalex.org/W2056452239","https://openalex.org/W2113397480","https://openalex.org/W2115076188","https://openalex.org/W2115755118","https://openalex.org/W2136953527","https://openalex.org/W2147290865","https://openalex.org/W2171742960","https://openalex.org/W6677096703","https://openalex.org/W6677399427"],"related_works":["https://openalex.org/W1974895211","https://openalex.org/W2129841057","https://openalex.org/W3040712279","https://openalex.org/W2176409448","https://openalex.org/W2364769705","https://openalex.org/W2056136368","https://openalex.org/W2374664672","https://openalex.org/W4367555392","https://openalex.org/W3090113802","https://openalex.org/W2367940508"],"abstract_inverted_index":{"In":[0,35],"this":[1],"paper":[2],"a":[3,39,83,95,109],"test":[4,40,84,96],"method":[5,85,97,110],"based":[6,86,111],"on":[7,87,112],"the":[8,12,36,55,62,73,80,88,92,99,104,113,117,123,126],"wavelet":[9,37,114],"transformation":[10,115],"of":[11,54,91,103,116,125],"measured":[13,56,93,105,118],"signal,":[14,94],"be":[15],"it":[16],"supply":[17],"current":[18],"(I":[19],"<sub":[20,28],"xmlns:mml=\"http://www.w3.org/1998/Math/MathML\"":[21,29],"xmlns:xlink=\"http://www.w3.org/1999/xlink\">PS</sub>":[22],")":[23,31],"or":[24],"output":[25],"voltage":[26],"(V":[27],"xmlns:xlink=\"http://www.w3.org/1999/xlink\">OUT</sub>":[30],"waveform,":[32],"is":[33,45,65],"presented.":[34],"analysis,":[38],"metric":[41],"named":[42],"discrimination":[43],"factor":[44],"introduced":[46],"utilizing":[47,98],"information":[48],"from":[49,72],"initial":[50],"two":[51],"decomposition":[52],"levels":[53],"signal.":[57],"The":[58],"tolerance":[59],"limit":[60],"for":[61],"good":[63],"circuit":[64],"set":[66],"by":[67],"statistical":[68],"processing":[69],"data":[70],"obtained":[71],"fault-free":[74],"circuit.":[75],"Experimental":[76],"comparative":[77],"results":[78],"between":[79],"proposed":[81,127],"method,":[82],"RMS":[89],"value":[90],"harmonic":[100],"magnitude":[101],"components":[102],"signal":[106,119],"spectrum":[107],"and":[108],"are":[120],"presented":[121],"showing":[122],"effectiveness":[124],"testing":[128],"scheme.":[129]},"counts_by_year":[],"updated_date":"2025-11-06T03:46:38.306776","created_date":"2025-10-10T00:00:00"}