{"id":"https://openalex.org/W1996816854","doi":"https://doi.org/10.1109/iolts.2010.5560225","title":"Configurable serial fault-tolerant link for communication in 3D integrated systems","display_name":"Configurable serial fault-tolerant link for communication in 3D integrated systems","publication_year":2010,"publication_date":"2010-07-01","ids":{"openalex":"https://openalex.org/W1996816854","doi":"https://doi.org/10.1109/iolts.2010.5560225","mag":"1996816854"},"language":"en","primary_location":{"id":"doi:10.1109/iolts.2010.5560225","is_oa":false,"landing_page_url":"https://doi.org/10.1109/iolts.2010.5560225","pdf_url":null,"source":null,"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"2010 IEEE 16th International On-Line Testing Symposium","raw_type":"proceedings-article"},"type":"conference-paper","indexed_in":["crossref"],"open_access":{"is_oa":false,"oa_status":"closed","oa_url":null,"any_repository_has_fulltext":false},"authorships":[{"author_position":"first","author":{"id":"https://openalex.org/A5064147688","display_name":"Vladimir Pa\u015fca","orcid":null},"institutions":[{"id":"https://openalex.org/I4210087012","display_name":"Techniques of Informatics and Microelectronics for Integrated Systems Architecture","ror":"https://ror.org/000063q30","country_code":"FR","type":"facility","lineage":["https://openalex.org/I106785703","https://openalex.org/I1294671590","https://openalex.org/I1294671590","https://openalex.org/I4210087012","https://openalex.org/I4210159245","https://openalex.org/I899635006","https://openalex.org/I899635006"]}],"countries":["FR"],"is_corresponding":false,"raw_author_name":"Vladimir Pasca","raw_affiliation_strings":["TIMA Laboratory, Grenoble, France","TIMA Laboratory, Grenoble"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"TIMA Laboratory, Grenoble, France","institution_ids":["https://openalex.org/I4210087012"]},{"raw_affiliation_string":"TIMA Laboratory, Grenoble","institution_ids":["https://openalex.org/I4210087012"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5053835664","display_name":"Lorena Anghel","orcid":"https://orcid.org/0000-0001-9569-0072"},"institutions":[{"id":"https://openalex.org/I4210087012","display_name":"Techniques of Informatics and Microelectronics for Integrated Systems Architecture","ror":"https://ror.org/000063q30","country_code":"FR","type":"facility","lineage":["https://openalex.org/I106785703","https://openalex.org/I1294671590","https://openalex.org/I1294671590","https://openalex.org/I4210087012","https://openalex.org/I4210159245","https://openalex.org/I899635006","https://openalex.org/I899635006"]}],"countries":["FR"],"is_corresponding":false,"raw_author_name":"Lorena Anghel","raw_affiliation_strings":["TIMA Laboratory, Grenoble, France","TIMA Laboratory, Grenoble"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"TIMA Laboratory, Grenoble, France","institution_ids":["https://openalex.org/I4210087012"]},{"raw_affiliation_string":"TIMA Laboratory, Grenoble","institution_ids":["https://openalex.org/I4210087012"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5076109381","display_name":"Claudia Rusu","orcid":null},"institutions":[{"id":"https://openalex.org/I4210087012","display_name":"Techniques of Informatics and Microelectronics for Integrated Systems Architecture","ror":"https://ror.org/000063q30","country_code":"FR","type":"facility","lineage":["https://openalex.org/I106785703","https://openalex.org/I1294671590","https://openalex.org/I1294671590","https://openalex.org/I4210087012","https://openalex.org/I4210159245","https://openalex.org/I899635006","https://openalex.org/I899635006"]}],"countries":["FR"],"is_corresponding":false,"raw_author_name":"Claudia Rusu","raw_affiliation_strings":["TIMA Laboratory, Grenoble, France","TIMA Laboratory, Grenoble"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"TIMA Laboratory, Grenoble, France","institution_ids":["https://openalex.org/I4210087012"]},{"raw_affiliation_string":"TIMA Laboratory, Grenoble","institution_ids":["https://openalex.org/I4210087012"]}]},{"author_position":"last","author":{"id":"https://openalex.org/A5108093269","display_name":"Mounir Benabdenbi","orcid":"https://orcid.org/0000-0001-9586-3009"},"institutions":[{"id":"https://openalex.org/I4210087012","display_name":"Techniques of Informatics and Microelectronics for Integrated Systems Architecture","ror":"https://ror.org/000063q30","country_code":"FR","type":"facility","lineage":["https://openalex.org/I106785703","https://openalex.org/I1294671590","https://openalex.org/I1294671590","https://openalex.org/I4210087012","https://openalex.org/I4210159245","https://openalex.org/I899635006","https://openalex.org/I899635006"]}],"countries":["FR"],"is_corresponding":false,"raw_author_name":"Mounir Benabdenbi","raw_affiliation_strings":["TIMA Laboratory, Grenoble, France","TIMA Laboratory, Grenoble"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"TIMA Laboratory, Grenoble, France","institution_ids":["https://openalex.org/I4210087012"]},{"raw_affiliation_string":"TIMA Laboratory, Grenoble","institution_ids":["https://openalex.org/I4210087012"]}]}],"institutions":[],"countries_distinct_count":1,"institutions_distinct_count":1,"corresponding_author_ids":[],"corresponding_institution_ids":["https://openalex.org/I4210087012"],"apc_list":null,"apc_paid":null,"fwci":2.6703,"has_fulltext":false,"cited_by_count":19,"citation_normalized_percentile":{"value":0.89624486,"is_in_top_1_percent":false,"is_in_top_10_percent":false},"cited_by_percentile_year":{"min":90,"max":99},"biblio":{"volume":null,"issue":null,"first_page":"115","last_page":"120"},"is_retracted":false,"is_paratext":false,"is_xpac":false,"primary_topic":{"id":"https://openalex.org/T11527","display_name":"3D IC and TSV technologies","score":0.9998999834060669,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},"topics":[{"id":"https://openalex.org/T11527","display_name":"3D IC and TSV technologies","score":0.9998999834060669,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T10829","display_name":"Interconnection Networks and Systems","score":0.9998000264167786,"subfield":{"id":"https://openalex.org/subfields/1705","display_name":"Computer Networks and Communications"},"field":{"id":"https://openalex.org/fields/17","display_name":"Computer Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T10502","display_name":"Advanced Memory and Neural Computing","score":0.9829000234603882,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"keywords":[{"id":"https://openalex.org/keywords/interconnection","display_name":"Interconnection","score":0.7247791290283203},{"id":"https://openalex.org/keywords/serialization","display_name":"Serialization","score":0.6684845089912415},{"id":"https://openalex.org/keywords/computer-science","display_name":"Computer science","score":0.6268885135650635},{"id":"https://openalex.org/keywords/spare-part","display_name":"Spare part","score":0.6000784635543823},{"id":"https://openalex.org/keywords/serial-communication","display_name":"Serial communication","score":0.5676466226577759},{"id":"https://openalex.org/keywords/embedded-system","display_name":"Embedded system","score":0.5538378357887268},{"id":"https://openalex.org/keywords/fault-tolerance","display_name":"Fault tolerance","score":0.5220758318901062},{"id":"https://openalex.org/keywords/fault","display_name":"Fault (geology)","score":0.47055721282958984},{"id":"https://openalex.org/keywords/computer-hardware","display_name":"Computer hardware","score":0.2829643487930298},{"id":"https://openalex.org/keywords/computer-network","display_name":"Computer network","score":0.24354827404022217},{"id":"https://openalex.org/keywords/engineering","display_name":"Engineering","score":0.237189382314682},{"id":"https://openalex.org/keywords/distributed-computing","display_name":"Distributed computing","score":0.1584240198135376}],"concepts":[{"id":"https://openalex.org/C123745756","wikidata":"https://www.wikidata.org/wiki/Q1665949","display_name":"Interconnection","level":2,"score":0.7247791290283203},{"id":"https://openalex.org/C52723943","wikidata":"https://www.wikidata.org/wiki/Q1127410","display_name":"Serialization","level":2,"score":0.6684845089912415},{"id":"https://openalex.org/C41008148","wikidata":"https://www.wikidata.org/wiki/Q21198","display_name":"Computer science","level":0,"score":0.6268885135650635},{"id":"https://openalex.org/C194648553","wikidata":"https://www.wikidata.org/wiki/Q1364774","display_name":"Spare part","level":2,"score":0.6000784635543823},{"id":"https://openalex.org/C51707140","wikidata":"https://www.wikidata.org/wiki/Q518280","display_name":"Serial communication","level":2,"score":0.5676466226577759},{"id":"https://openalex.org/C149635348","wikidata":"https://www.wikidata.org/wiki/Q193040","display_name":"Embedded system","level":1,"score":0.5538378357887268},{"id":"https://openalex.org/C63540848","wikidata":"https://www.wikidata.org/wiki/Q3140932","display_name":"Fault tolerance","level":2,"score":0.5220758318901062},{"id":"https://openalex.org/C175551986","wikidata":"https://www.wikidata.org/wiki/Q47089","display_name":"Fault (geology)","level":2,"score":0.47055721282958984},{"id":"https://openalex.org/C9390403","wikidata":"https://www.wikidata.org/wiki/Q3966","display_name":"Computer hardware","level":1,"score":0.2829643487930298},{"id":"https://openalex.org/C31258907","wikidata":"https://www.wikidata.org/wiki/Q1301371","display_name":"Computer network","level":1,"score":0.24354827404022217},{"id":"https://openalex.org/C127413603","wikidata":"https://www.wikidata.org/wiki/Q11023","display_name":"Engineering","level":0,"score":0.237189382314682},{"id":"https://openalex.org/C120314980","wikidata":"https://www.wikidata.org/wiki/Q180634","display_name":"Distributed computing","level":1,"score":0.1584240198135376},{"id":"https://openalex.org/C78519656","wikidata":"https://www.wikidata.org/wiki/Q101333","display_name":"Mechanical engineering","level":1,"score":0.0},{"id":"https://openalex.org/C111919701","wikidata":"https://www.wikidata.org/wiki/Q9135","display_name":"Operating system","level":1,"score":0.0},{"id":"https://openalex.org/C127313418","wikidata":"https://www.wikidata.org/wiki/Q1069","display_name":"Geology","level":0,"score":0.0},{"id":"https://openalex.org/C165205528","wikidata":"https://www.wikidata.org/wiki/Q83371","display_name":"Seismology","level":1,"score":0.0}],"mesh":[],"locations_count":2,"locations":[{"id":"doi:10.1109/iolts.2010.5560225","is_oa":false,"landing_page_url":"https://doi.org/10.1109/iolts.2010.5560225","pdf_url":null,"source":null,"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"2010 IEEE 16th International On-Line Testing Symposium","raw_type":"proceedings-article"},{"id":"pmh:oai:HAL:hal-00505276v1","is_oa":false,"landing_page_url":"https://hal.science/hal-00505276","pdf_url":null,"source":{"id":"https://openalex.org/S4306402512","display_name":"HAL (Le Centre pour la Communication Scientifique Directe)","issn_l":null,"issn":null,"is_oa":false,"is_in_doaj":false,"is_core":false,"host_organization":"https://openalex.org/I1294671590","host_organization_name":"Centre National de la Recherche Scientifique","host_organization_lineage":["https://openalex.org/I1294671590"],"host_organization_lineage_names":[],"type":"repository"},"license":null,"license_id":null,"version":"submittedVersion","is_accepted":false,"is_published":false,"raw_source_name":"International On-Line Test Symposium (IOLTS'10), Jul 2010, Corfu, Greece. pp.115-120","raw_type":"info:eu-repo/semantics/conferenceObject"}],"best_oa_location":null,"sustainable_development_goals":[{"display_name":"Industry, innovation and infrastructure","score":0.47999998927116394,"id":"https://metadata.un.org/sdg/9"}],"awards":[],"funders":[],"has_content":{"grobid_xml":false,"pdf":false},"content_urls":null,"referenced_works_count":24,"referenced_works":["https://openalex.org/W1501077214","https://openalex.org/W2031933249","https://openalex.org/W2064712157","https://openalex.org/W2071003187","https://openalex.org/W2084805813","https://openalex.org/W2089155985","https://openalex.org/W2096691973","https://openalex.org/W2104386725","https://openalex.org/W2126654611","https://openalex.org/W2126763328","https://openalex.org/W2143555564","https://openalex.org/W2143926454","https://openalex.org/W2159759940","https://openalex.org/W2163569300","https://openalex.org/W2167285764","https://openalex.org/W2169739755","https://openalex.org/W2170509098","https://openalex.org/W2170550019","https://openalex.org/W3144072891","https://openalex.org/W3148328848","https://openalex.org/W6630005587","https://openalex.org/W6678858565","https://openalex.org/W6681121120","https://openalex.org/W6683595467"],"related_works":["https://openalex.org/W2376859990","https://openalex.org/W2912704652","https://openalex.org/W4231356583","https://openalex.org/W1593760324","https://openalex.org/W2381161177","https://openalex.org/W2319226115","https://openalex.org/W830772239","https://openalex.org/W2360313402","https://openalex.org/W2468978622","https://openalex.org/W2351571607"],"abstract_inverted_index":{"Three-dimensional":[0],"(3D)":[1],"Thru-Silicon-Via":[2],"(TSV)":[3],"integration":[4],"is":[5,190],"emerging":[6],"as":[7,35],"a":[8,148],"key":[9],"enabling":[10],"technology":[11],"for":[12,53,77,196],"future":[13],"high":[14,54,85,166],"performance":[15,180],"systems.":[16,83],"The":[17,169,192],"TSV":[18,86],"manufacturing":[19],"defect":[20],"rates":[21,56],"lead":[22,63],"to":[23,48,64,101,206,213],"significant":[24],"interconnect":[25,108,163,199],"yield":[26],"loss.":[27],"For":[28,84],"intra-die":[29],"and":[30,40,62,92,181,208],"inter-die":[31,78,172],"interconnects,":[32],"techniques":[33],"such":[34,121],"via":[36,38,42],"widening,":[37],"spreading":[39],"spare":[41],"insertion":[43],"have":[44],"been":[45],"successfully":[46],"used":[47,100],"improve":[49],"the":[50,107,116,130,154,179,202],"yield.":[51],"However,":[52],"fault":[55,72,87,124,167,175,200],"these":[57],"solutions":[58],"are":[59,75,98,113,127],"less":[60],"effective":[61],"unacceptable":[65],"overheads.":[66],"In":[67,129],"this":[68],"paper,":[69],"configurable":[70,173],"serial":[71,89,174],"tolerant":[73,176],"links":[74,177],"proposed":[76,131],"communication":[79],"in":[80],"3D":[81,185],"integrated":[82],"rates,":[88],"data":[90,104,119,136],"transmission":[91,120],"signal":[93],"remapping":[94],"on":[95,141,178],"fault-free":[96],"wires":[97,112,126],"jointly":[99],"ensure":[102],"correct":[103],"transmission.":[105],"After":[106],"tests,":[109],"if":[110],"faulty":[111],"detected":[114],"then":[115],"link":[117,155,159],"serializes":[118],"that":[122,161,195],"only":[123],"free":[125],"used.":[128],"link,":[132],"any":[133,142],"subset":[134,143],"of":[135,144,171,184],"bits":[137],"can":[138],"be":[139],"mapped":[140],"functional":[145],"wires.":[146],"Selecting":[147],"threshold":[149],"serialization":[150],"rate":[151,201],"above":[152],"which":[153],"fails,":[156],"enables":[157],"optimal":[158],"designs":[160],"target":[162],"technologies":[164],"with":[165],"rates.":[168],"impact":[170],"area":[182,209],"overheads":[183,210],"mesh":[186],"networks-on-chip":[187],"(3D":[188],"NoC)":[189],"analyzed.":[191],"results":[193],"show":[194],"an":[197],"80%":[198],"latency":[203],"degradation":[204],"up":[205,212],"14%":[207],"go":[211],"30%.":[214]},"counts_by_year":[{"year":2021,"cited_by_count":2},{"year":2018,"cited_by_count":1},{"year":2017,"cited_by_count":1},{"year":2016,"cited_by_count":1},{"year":2015,"cited_by_count":6},{"year":2014,"cited_by_count":2},{"year":2013,"cited_by_count":2}],"updated_date":"2026-07-29T14:22:42.915294","created_date":"2025-10-10T00:00:00"}