{"id":"https://openalex.org/W1964365815","doi":"https://doi.org/10.1109/iolts.2010.5560215","title":"An on-line fault detection technique based on embedded debug features","display_name":"An on-line fault detection technique based on embedded debug features","publication_year":2010,"publication_date":"2010-07-01","ids":{"openalex":"https://openalex.org/W1964365815","doi":"https://doi.org/10.1109/iolts.2010.5560215","mag":"1964365815"},"language":"en","primary_location":{"id":"doi:10.1109/iolts.2010.5560215","is_oa":false,"landing_page_url":"https://doi.org/10.1109/iolts.2010.5560215","pdf_url":null,"source":null,"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"2010 IEEE 16th International On-Line Testing Symposium","raw_type":"proceedings-article"},"type":"article","indexed_in":["crossref"],"open_access":{"is_oa":false,"oa_status":"closed","oa_url":null,"any_repository_has_fulltext":false},"authorships":[{"author_position":"first","author":{"id":"https://openalex.org/A5035251234","display_name":"Michelangelo Grosso","orcid":"https://orcid.org/0000-0002-9726-0356"},"institutions":[{"id":"https://openalex.org/I177477856","display_name":"Politecnico di Torino","ror":"https://ror.org/00bgk9508","country_code":"IT","type":"education","lineage":["https://openalex.org/I177477856"]}],"countries":["IT"],"is_corresponding":false,"raw_author_name":"M. Grosso","raw_affiliation_strings":["Dipartimento di Automatica e Informatica, Politecnico di Torino, Torino, Italy","Dipartimento di Automatica e Informatica, Politecnico di Torino, Torino,Italy#TAB#"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Dipartimento di Automatica e Informatica, Politecnico di Torino, Torino, Italy","institution_ids":["https://openalex.org/I177477856"]},{"raw_affiliation_string":"Dipartimento di Automatica e Informatica, Politecnico di Torino, Torino,Italy#TAB#","institution_ids":["https://openalex.org/I177477856"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5058555274","display_name":"M. Sonza Reorda","orcid":"https://orcid.org/0000-0003-2899-7669"},"institutions":[{"id":"https://openalex.org/I177477856","display_name":"Politecnico di Torino","ror":"https://ror.org/00bgk9508","country_code":"IT","type":"education","lineage":["https://openalex.org/I177477856"]}],"countries":["IT"],"is_corresponding":false,"raw_author_name":"M. Sonza Reorda","raw_affiliation_strings":["Dipartimento di Automatica e Informatica, Politecnico di Torino, Torino, Italy","Dipartimento di Automatica e Informatica, Politecnico di Torino, Torino,Italy#TAB#"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Dipartimento di Automatica e Informatica, Politecnico di Torino, Torino, Italy","institution_ids":["https://openalex.org/I177477856"]},{"raw_affiliation_string":"Dipartimento di Automatica e Informatica, Politecnico di Torino, Torino,Italy#TAB#","institution_ids":["https://openalex.org/I177477856"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5030100022","display_name":"M. Portela-Garc\u00eda","orcid":"https://orcid.org/0000-0002-4103-0519"},"institutions":[{"id":"https://openalex.org/I50357001","display_name":"Universidad Carlos III de Madrid","ror":"https://ror.org/03ths8210","country_code":"ES","type":"education","lineage":["https://openalex.org/I50357001"]}],"countries":["ES"],"is_corresponding":false,"raw_author_name":"M. Portela-Garcia","raw_affiliation_strings":["Electronic Technology Department, Universidad Carlos III de Madrid, Madrid, Spain","[Electronic Technology Department, Universidad Carlos III de Madrid - Madrid, Spain]"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Electronic Technology Department, Universidad Carlos III de Madrid, Madrid, Spain","institution_ids":["https://openalex.org/I50357001"]},{"raw_affiliation_string":"[Electronic Technology Department, Universidad Carlos III de Madrid - Madrid, Spain]","institution_ids":["https://openalex.org/I50357001"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5039590345","display_name":"M. Garc\u00eda-Valderas","orcid":"https://orcid.org/0000-0003-1615-1607"},"institutions":[{"id":"https://openalex.org/I50357001","display_name":"Universidad Carlos III de Madrid","ror":"https://ror.org/03ths8210","country_code":"ES","type":"education","lineage":["https://openalex.org/I50357001"]}],"countries":["ES"],"is_corresponding":false,"raw_author_name":"M. Garcia-Valderas","raw_affiliation_strings":["Electronic Technology Department, Universidad Carlos III de Madrid, Madrid, Spain","[Electronic Technology Department, Universidad Carlos III de Madrid - Madrid, Spain]"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Electronic Technology Department, Universidad Carlos III de Madrid, Madrid, Spain","institution_ids":["https://openalex.org/I50357001"]},{"raw_affiliation_string":"[Electronic Technology Department, Universidad Carlos III de Madrid - Madrid, Spain]","institution_ids":["https://openalex.org/I50357001"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5067423177","display_name":"C. L\u00f3pez-Ongil","orcid":"https://orcid.org/0000-0001-9451-6611"},"institutions":[{"id":"https://openalex.org/I50357001","display_name":"Universidad Carlos III de Madrid","ror":"https://ror.org/03ths8210","country_code":"ES","type":"education","lineage":["https://openalex.org/I50357001"]}],"countries":["ES"],"is_corresponding":false,"raw_author_name":"C. Lopez-Ongil","raw_affiliation_strings":["Electronic Technology Department, Universidad Carlos III de Madrid, Madrid, Spain","[Electronic Technology Department, Universidad Carlos III de Madrid - Madrid, Spain]"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Electronic Technology Department, Universidad Carlos III de Madrid, Madrid, Spain","institution_ids":["https://openalex.org/I50357001"]},{"raw_affiliation_string":"[Electronic Technology Department, Universidad Carlos III de Madrid - Madrid, Spain]","institution_ids":["https://openalex.org/I50357001"]}]},{"author_position":"last","author":{"id":"https://openalex.org/A5022411878","display_name":"Luis Entrena","orcid":"https://orcid.org/0000-0001-6021-165X"},"institutions":[{"id":"https://openalex.org/I50357001","display_name":"Universidad Carlos III de Madrid","ror":"https://ror.org/03ths8210","country_code":"ES","type":"education","lineage":["https://openalex.org/I50357001"]}],"countries":["ES"],"is_corresponding":false,"raw_author_name":"L. Entrena","raw_affiliation_strings":["Electronic Technology Department, Universidad Carlos III de Madrid, Madrid, Spain","[Electronic Technology Department, Universidad Carlos III de Madrid - Madrid, Spain]"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Electronic Technology Department, Universidad Carlos III de Madrid, Madrid, Spain","institution_ids":["https://openalex.org/I50357001"]},{"raw_affiliation_string":"[Electronic Technology Department, Universidad Carlos III de Madrid - Madrid, Spain]","institution_ids":["https://openalex.org/I50357001"]}]}],"institutions":[],"countries_distinct_count":2,"institutions_distinct_count":6,"corresponding_author_ids":[],"corresponding_institution_ids":[],"apc_list":null,"apc_paid":null,"fwci":1.177,"has_fulltext":false,"cited_by_count":23,"citation_normalized_percentile":{"value":0.7982727,"is_in_top_1_percent":false,"is_in_top_10_percent":false},"cited_by_percentile_year":{"min":90,"max":99},"biblio":{"volume":null,"issue":null,"first_page":"167","last_page":"172"},"is_retracted":false,"is_paratext":false,"is_xpac":false,"primary_topic":{"id":"https://openalex.org/T11005","display_name":"Radiation Effects in Electronics","score":0.9998999834060669,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},"topics":[{"id":"https://openalex.org/T11005","display_name":"Radiation Effects in Electronics","score":0.9998999834060669,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T11032","display_name":"VLSI and Analog Circuit Testing","score":0.9993000030517578,"subfield":{"id":"https://openalex.org/subfields/1708","display_name":"Hardware and Architecture"},"field":{"id":"https://openalex.org/fields/17","display_name":"Computer Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T10904","display_name":"Embedded Systems Design Techniques","score":0.9970999956130981,"subfield":{"id":"https://openalex.org/subfields/1708","display_name":"Hardware and Architecture"},"field":{"id":"https://openalex.org/fields/17","display_name":"Computer Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"keywords":[{"id":"https://openalex.org/keywords/debugging","display_name":"Debugging","score":0.7862470149993896},{"id":"https://openalex.org/keywords/exploit","display_name":"Exploit","score":0.7664828300476074},{"id":"https://openalex.org/keywords/computer-science","display_name":"Computer science","score":0.7396116256713867},{"id":"https://openalex.org/keywords/microprocessor","display_name":"Microprocessor","score":0.6555205583572388},{"id":"https://openalex.org/keywords/embedded-system","display_name":"Embedded system","score":0.6106729507446289},{"id":"https://openalex.org/keywords/observability","display_name":"Observability","score":0.5730230808258057},{"id":"https://openalex.org/keywords/fault-detection-and-isolation","display_name":"Fault detection and isolation","score":0.5408371686935425},{"id":"https://openalex.org/keywords/software-bug","display_name":"Software bug","score":0.45568063855171204},{"id":"https://openalex.org/keywords/fault-injection","display_name":"Fault injection","score":0.4226796329021454},{"id":"https://openalex.org/keywords/background-debug-mode-interface","display_name":"Background debug mode interface","score":0.41718822717666626},{"id":"https://openalex.org/keywords/software","display_name":"Software","score":0.26900142431259155},{"id":"https://openalex.org/keywords/operating-system","display_name":"Operating system","score":0.15378111600875854},{"id":"https://openalex.org/keywords/computer-security","display_name":"Computer security","score":0.08534041047096252}],"concepts":[{"id":"https://openalex.org/C168065819","wikidata":"https://www.wikidata.org/wiki/Q845566","display_name":"Debugging","level":2,"score":0.7862470149993896},{"id":"https://openalex.org/C165696696","wikidata":"https://www.wikidata.org/wiki/Q11287","display_name":"Exploit","level":2,"score":0.7664828300476074},{"id":"https://openalex.org/C41008148","wikidata":"https://www.wikidata.org/wiki/Q21198","display_name":"Computer science","level":0,"score":0.7396116256713867},{"id":"https://openalex.org/C2780728072","wikidata":"https://www.wikidata.org/wiki/Q5297","display_name":"Microprocessor","level":2,"score":0.6555205583572388},{"id":"https://openalex.org/C149635348","wikidata":"https://www.wikidata.org/wiki/Q193040","display_name":"Embedded system","level":1,"score":0.6106729507446289},{"id":"https://openalex.org/C36299963","wikidata":"https://www.wikidata.org/wiki/Q1369844","display_name":"Observability","level":2,"score":0.5730230808258057},{"id":"https://openalex.org/C152745839","wikidata":"https://www.wikidata.org/wiki/Q5438153","display_name":"Fault detection and isolation","level":3,"score":0.5408371686935425},{"id":"https://openalex.org/C1009929","wikidata":"https://www.wikidata.org/wiki/Q179550","display_name":"Software bug","level":3,"score":0.45568063855171204},{"id":"https://openalex.org/C2775928411","wikidata":"https://www.wikidata.org/wiki/Q2041312","display_name":"Fault injection","level":3,"score":0.4226796329021454},{"id":"https://openalex.org/C124774103","wikidata":"https://www.wikidata.org/wiki/Q4839640","display_name":"Background debug mode interface","level":3,"score":0.41718822717666626},{"id":"https://openalex.org/C2777904410","wikidata":"https://www.wikidata.org/wiki/Q7397","display_name":"Software","level":2,"score":0.26900142431259155},{"id":"https://openalex.org/C111919701","wikidata":"https://www.wikidata.org/wiki/Q9135","display_name":"Operating system","level":1,"score":0.15378111600875854},{"id":"https://openalex.org/C38652104","wikidata":"https://www.wikidata.org/wiki/Q3510521","display_name":"Computer security","level":1,"score":0.08534041047096252},{"id":"https://openalex.org/C154945302","wikidata":"https://www.wikidata.org/wiki/Q11660","display_name":"Artificial intelligence","level":1,"score":0.0},{"id":"https://openalex.org/C28826006","wikidata":"https://www.wikidata.org/wiki/Q33521","display_name":"Applied mathematics","level":1,"score":0.0},{"id":"https://openalex.org/C172707124","wikidata":"https://www.wikidata.org/wiki/Q423488","display_name":"Actuator","level":2,"score":0.0},{"id":"https://openalex.org/C33923547","wikidata":"https://www.wikidata.org/wiki/Q395","display_name":"Mathematics","level":0,"score":0.0}],"mesh":[],"locations_count":2,"locations":[{"id":"doi:10.1109/iolts.2010.5560215","is_oa":false,"landing_page_url":"https://doi.org/10.1109/iolts.2010.5560215","pdf_url":null,"source":null,"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"2010 IEEE 16th International On-Line Testing Symposium","raw_type":"proceedings-article"},{"id":"pmh:oai:porto.polito.it:2372202","is_oa":false,"landing_page_url":"http://porto.polito.it/2372202/","pdf_url":null,"source":{"id":"https://openalex.org/S4306402038","display_name":"PORTO Publications Open Repository TOrino (Politecnico di Torino)","issn_l":null,"issn":null,"is_oa":false,"is_in_doaj":false,"is_core":false,"host_organization":"https://openalex.org/I177477856","host_organization_name":"Politecnico di Torino","host_organization_lineage":["https://openalex.org/I177477856"],"host_organization_lineage_names":[],"type":"repository"},"license":null,"license_id":null,"version":"submittedVersion","is_accepted":false,"is_published":false,"raw_source_name":"","raw_type":"info:eu-repo/semantics/conferenceObject"}],"best_oa_location":null,"sustainable_development_goals":[],"awards":[],"funders":[],"has_content":{"grobid_xml":false,"pdf":false},"content_urls":null,"referenced_works_count":11,"referenced_works":["https://openalex.org/W1906369229","https://openalex.org/W1968989269","https://openalex.org/W1975481593","https://openalex.org/W1981514768","https://openalex.org/W2099440515","https://openalex.org/W2116059696","https://openalex.org/W2129360963","https://openalex.org/W2133201251","https://openalex.org/W2136263143","https://openalex.org/W2145930995","https://openalex.org/W3035757797"],"related_works":["https://openalex.org/W2046459260","https://openalex.org/W2765830098","https://openalex.org/W2967463586","https://openalex.org/W2074679142","https://openalex.org/W1971989957","https://openalex.org/W2517338020","https://openalex.org/W3157641275","https://openalex.org/W2800017701","https://openalex.org/W2416955034","https://openalex.org/W2787155073"],"abstract_inverted_index":{"An":[0],"increasing":[1,83],"number":[2],"of":[3,17,80,99],"applications":[4],"require":[5],"being":[6],"able":[7],"to":[8],"detect":[9],"possible":[10],"faults":[11,81],"arising":[12],"during":[13],"the":[14,18,66,78,103],"normal":[15],"activity":[16],"electronic":[19],"system:":[20],"for":[21,41],"this":[22],"reason,":[23],"on-line":[24],"fault":[25],"detection":[26,84],"is":[27,39,90],"a":[28,35,51,93],"hot":[29],"topic":[30],"today.":[31],"This":[32],"paper":[33],"proposes":[34],"new":[36,75],"technique":[37,76],"which":[38],"suitable":[40],"microprocessor-based":[42],"systems":[43],"(no":[44],"matter":[45],"whether":[46],"they":[47],"are":[48],"implemented":[49],"in":[50,71,97,102],"single":[52],"device":[53],"or":[54],"with":[55,65],"discrete":[56],"COTS)":[57],"that":[58],"exploit":[59],"hardware":[60],"duplication":[61],"and":[62,86,89],"combines":[63],"it":[64],"On-Chip":[67],"Debug":[68],"features":[69],"existing":[70],"many":[72],"processors.":[73],"The":[74],"increases":[77],"observability":[79],"(thus":[82],"probability":[85],"reducing":[87],"latency)":[88],"characterized":[91],"by":[92],"very":[94],"reduced":[95],"intrusiveness":[96],"terms":[98],"changes":[100],"required":[101],"application":[104],"code.":[105]},"counts_by_year":[{"year":2025,"cited_by_count":2},{"year":2023,"cited_by_count":2},{"year":2019,"cited_by_count":1},{"year":2018,"cited_by_count":1},{"year":2017,"cited_by_count":2},{"year":2016,"cited_by_count":1},{"year":2015,"cited_by_count":3},{"year":2014,"cited_by_count":7},{"year":2013,"cited_by_count":1},{"year":2012,"cited_by_count":3}],"updated_date":"2026-06-11T09:08:48.828518","created_date":"2025-10-10T00:00:00"}