{"id":"https://openalex.org/W2124283346","doi":"https://doi.org/10.1109/iolts.2010.5560211","title":"A new framework for the automatic insertion of mitigation structures in circuits netlists","display_name":"A new framework for the automatic insertion of mitigation structures in circuits netlists","publication_year":2010,"publication_date":"2010-07-01","ids":{"openalex":"https://openalex.org/W2124283346","doi":"https://doi.org/10.1109/iolts.2010.5560211","mag":"2124283346"},"language":"en","primary_location":{"id":"doi:10.1109/iolts.2010.5560211","is_oa":false,"landing_page_url":"https://doi.org/10.1109/iolts.2010.5560211","pdf_url":null,"source":null,"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"2010 IEEE 16th International On-Line Testing Symposium","raw_type":"proceedings-article"},"type":"article","indexed_in":["crossref"],"open_access":{"is_oa":false,"oa_status":"closed","oa_url":null,"any_repository_has_fulltext":false},"authorships":[{"author_position":"first","author":{"id":"https://openalex.org/A5080823596","display_name":"Niccol\u00f2 Battezzati","orcid":null},"institutions":[{"id":"https://openalex.org/I177477856","display_name":"Polytechnic University of Turin","ror":"https://ror.org/00bgk9508","country_code":"IT","type":"education","lineage":["https://openalex.org/I177477856"]}],"countries":["IT"],"is_corresponding":true,"raw_author_name":"Niccolo Battezzati","raw_affiliation_strings":["Politecnico di Torino, Italy","Polit\u00e9cnico di Torino"],"affiliations":[{"raw_affiliation_string":"Politecnico di Torino, Italy","institution_ids":["https://openalex.org/I177477856"]},{"raw_affiliation_string":"Polit\u00e9cnico di Torino","institution_ids":["https://openalex.org/I177477856"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5090631418","display_name":"Davide Serrone","orcid":null},"institutions":[{"id":"https://openalex.org/I177477856","display_name":"Polytechnic University of Turin","ror":"https://ror.org/00bgk9508","country_code":"IT","type":"education","lineage":["https://openalex.org/I177477856"]}],"countries":["IT"],"is_corresponding":false,"raw_author_name":"Davide Serrone","raw_affiliation_strings":["Politecnico di Torino, Italy","Polit\u00e9cnico di Torino"],"affiliations":[{"raw_affiliation_string":"Politecnico di Torino, Italy","institution_ids":["https://openalex.org/I177477856"]},{"raw_affiliation_string":"Polit\u00e9cnico di Torino","institution_ids":["https://openalex.org/I177477856"]}]},{"author_position":"last","author":{"id":"https://openalex.org/A5087219426","display_name":"M. Violante","orcid":"https://orcid.org/0000-0002-5821-3418"},"institutions":[{"id":"https://openalex.org/I177477856","display_name":"Polytechnic University of Turin","ror":"https://ror.org/00bgk9508","country_code":"IT","type":"education","lineage":["https://openalex.org/I177477856"]}],"countries":["IT"],"is_corresponding":false,"raw_author_name":"Massimo Violante","raw_affiliation_strings":["Politecnico di Torino, Italy","Polit\u00e9cnico di Torino"],"affiliations":[{"raw_affiliation_string":"Politecnico di Torino, Italy","institution_ids":["https://openalex.org/I177477856"]},{"raw_affiliation_string":"Polit\u00e9cnico di Torino","institution_ids":["https://openalex.org/I177477856"]}]}],"institutions":[],"countries_distinct_count":1,"institutions_distinct_count":3,"corresponding_author_ids":["https://openalex.org/A5080823596"],"corresponding_institution_ids":["https://openalex.org/I177477856"],"apc_list":null,"apc_paid":null,"fwci":0.2939,"has_fulltext":false,"cited_by_count":1,"citation_normalized_percentile":{"value":0.65829986,"is_in_top_1_percent":false,"is_in_top_10_percent":false},"cited_by_percentile_year":null,"biblio":{"volume":"1 0","issue":null,"first_page":"190","last_page":"191"},"is_retracted":false,"is_paratext":false,"is_xpac":false,"primary_topic":{"id":"https://openalex.org/T11005","display_name":"Radiation Effects in Electronics","score":1.0,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},"topics":[{"id":"https://openalex.org/T11005","display_name":"Radiation Effects in Electronics","score":1.0,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T10363","display_name":"Low-power high-performance VLSI design","score":0.9998999834060669,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T11032","display_name":"VLSI and Analog Circuit Testing","score":0.9994999766349792,"subfield":{"id":"https://openalex.org/subfields/1708","display_name":"Hardware and Architecture"},"field":{"id":"https://openalex.org/fields/17","display_name":"Computer Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"keywords":[{"id":"https://openalex.org/keywords/computer-science","display_name":"Computer science","score":0.7528175115585327},{"id":"https://openalex.org/keywords/electronic-circuit","display_name":"Electronic circuit","score":0.6486889123916626},{"id":"https://openalex.org/keywords/software","display_name":"Software","score":0.58624666929245},{"id":"https://openalex.org/keywords/digital-electronics","display_name":"Digital electronics","score":0.5324519872665405},{"id":"https://openalex.org/keywords/computer-architecture","display_name":"Computer architecture","score":0.43774956464767456},{"id":"https://openalex.org/keywords/computer-engineering","display_name":"Computer engineering","score":0.36045145988464355},{"id":"https://openalex.org/keywords/embedded-system","display_name":"Embedded system","score":0.33675438165664673},{"id":"https://openalex.org/keywords/engineering","display_name":"Engineering","score":0.16854825615882874},{"id":"https://openalex.org/keywords/electrical-engineering","display_name":"Electrical engineering","score":0.150557279586792},{"id":"https://openalex.org/keywords/programming-language","display_name":"Programming language","score":0.1344432234764099}],"concepts":[{"id":"https://openalex.org/C41008148","wikidata":"https://www.wikidata.org/wiki/Q21198","display_name":"Computer science","level":0,"score":0.7528175115585327},{"id":"https://openalex.org/C134146338","wikidata":"https://www.wikidata.org/wiki/Q1815901","display_name":"Electronic circuit","level":2,"score":0.6486889123916626},{"id":"https://openalex.org/C2777904410","wikidata":"https://www.wikidata.org/wiki/Q7397","display_name":"Software","level":2,"score":0.58624666929245},{"id":"https://openalex.org/C81843906","wikidata":"https://www.wikidata.org/wiki/Q173156","display_name":"Digital electronics","level":3,"score":0.5324519872665405},{"id":"https://openalex.org/C118524514","wikidata":"https://www.wikidata.org/wiki/Q173212","display_name":"Computer architecture","level":1,"score":0.43774956464767456},{"id":"https://openalex.org/C113775141","wikidata":"https://www.wikidata.org/wiki/Q428691","display_name":"Computer engineering","level":1,"score":0.36045145988464355},{"id":"https://openalex.org/C149635348","wikidata":"https://www.wikidata.org/wiki/Q193040","display_name":"Embedded system","level":1,"score":0.33675438165664673},{"id":"https://openalex.org/C127413603","wikidata":"https://www.wikidata.org/wiki/Q11023","display_name":"Engineering","level":0,"score":0.16854825615882874},{"id":"https://openalex.org/C119599485","wikidata":"https://www.wikidata.org/wiki/Q43035","display_name":"Electrical engineering","level":1,"score":0.150557279586792},{"id":"https://openalex.org/C199360897","wikidata":"https://www.wikidata.org/wiki/Q9143","display_name":"Programming language","level":1,"score":0.1344432234764099}],"mesh":[],"locations_count":2,"locations":[{"id":"doi:10.1109/iolts.2010.5560211","is_oa":false,"landing_page_url":"https://doi.org/10.1109/iolts.2010.5560211","pdf_url":null,"source":null,"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"2010 IEEE 16th International On-Line Testing Symposium","raw_type":"proceedings-article"},{"id":"pmh:oai:porto.polito.it:2380189","is_oa":false,"landing_page_url":"http://porto.polito.it/2380189/","pdf_url":null,"source":{"id":"https://openalex.org/S4306402038","display_name":"PORTO Publications Open Repository TOrino (Politecnico di Torino)","issn_l":null,"issn":null,"is_oa":false,"is_in_doaj":false,"is_core":false,"host_organization":"https://openalex.org/I177477856","host_organization_name":"Politecnico di Torino","host_organization_lineage":["https://openalex.org/I177477856"],"host_organization_lineage_names":[],"type":"repository"},"license":null,"license_id":null,"version":"submittedVersion","is_accepted":false,"is_published":false,"raw_source_name":"","raw_type":"info:eu-repo/semantics/conferenceObject"}],"best_oa_location":null,"sustainable_development_goals":[],"awards":[],"funders":[],"has_content":{"pdf":false,"grobid_xml":false},"content_urls":null,"referenced_works_count":5,"referenced_works":["https://openalex.org/W1505815303","https://openalex.org/W2063406991","https://openalex.org/W2119745128","https://openalex.org/W2122995125","https://openalex.org/W2153421476"],"related_works":["https://openalex.org/W2796521923","https://openalex.org/W95651076","https://openalex.org/W2770163697","https://openalex.org/W2110521006","https://openalex.org/W3114476551","https://openalex.org/W2698469377","https://openalex.org/W2016076352","https://openalex.org/W4320915609","https://openalex.org/W2133361634","https://openalex.org/W2071152039"],"abstract_inverted_index":{"In":[0],"this":[1],"paper":[2],"we":[3],"present":[4],"a":[5,39],"new":[6],"software":[7,41],"framework":[8],"to":[9,32,43],"analyze":[10],"and":[11],"modify":[12],"circuits":[13],"netlists":[14],"in":[15,52],"an":[16,21],"automatic":[17,62],"fashion.":[18],"We":[19,36],"developed":[20,38],"API":[22],"that":[23],"implements":[24],"low-level":[25],"functionalities":[26],"above":[27],"which":[28],"it":[29],"is":[30],"possible":[31],"create":[33],"complex":[34],"algorithms.":[35],"then":[37],"second":[40],"layer":[42],"implement":[44],"hardening":[45],"techniques":[46],"for":[47],"Single":[48],"Event":[49],"Effects":[50],"(SEEs)":[51],"digital":[53],"microcircuits.":[54],"Experimental":[55],"results":[56],"prove":[57],"the":[58,61],"effectiveness":[59],"of":[60,64],"introduction":[63],"mitigation":[65],"techniques.":[66]},"counts_by_year":[],"updated_date":"2026-04-04T16:13:02.066488","created_date":"2025-10-10T00:00:00"}