{"id":"https://openalex.org/W2121119362","doi":"https://doi.org/10.1109/iolts.2009.5196021","title":"Designing fault tolerant FSM by nano-PLA","display_name":"Designing fault tolerant FSM by nano-PLA","publication_year":2009,"publication_date":"2009-06-01","ids":{"openalex":"https://openalex.org/W2121119362","doi":"https://doi.org/10.1109/iolts.2009.5196021","mag":"2121119362"},"language":"en","primary_location":{"id":"doi:10.1109/iolts.2009.5196021","is_oa":false,"landing_page_url":"https://doi.org/10.1109/iolts.2009.5196021","pdf_url":null,"source":null,"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"2009 15th IEEE International On-Line Testing Symposium","raw_type":"proceedings-article"},"type":"article","indexed_in":["crossref"],"open_access":{"is_oa":false,"oa_status":"closed","oa_url":null,"any_repository_has_fulltext":false},"authorships":[{"author_position":"first","author":{"id":"https://openalex.org/A5083574075","display_name":"Samary Baranov","orcid":null},"institutions":[{"id":"https://openalex.org/I13955877","display_name":"Bar-Ilan University","ror":"https://ror.org/03kgsv495","country_code":"IL","type":"education","lineage":["https://openalex.org/I13955877"]}],"countries":["IL"],"is_corresponding":true,"raw_author_name":"S. Baranov","raw_affiliation_strings":["School of Engineering, Bar-llan University, Ramat-Gan, Israel","Bar\u2010Ilan University School of Engineering Ramat\u2010Gan Israel"],"affiliations":[{"raw_affiliation_string":"School of Engineering, Bar-llan University, Ramat-Gan, Israel","institution_ids":["https://openalex.org/I13955877"]},{"raw_affiliation_string":"Bar\u2010Ilan University School of Engineering Ramat\u2010Gan Israel","institution_ids":["https://openalex.org/I13955877"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5018635318","display_name":"Ilya Levin","orcid":"https://orcid.org/0000-0002-0298-4547"},"institutions":[{"id":"https://openalex.org/I16391192","display_name":"Tel Aviv University","ror":"https://ror.org/04mhzgx49","country_code":"IL","type":"education","lineage":["https://openalex.org/I16391192"]}],"countries":["IL"],"is_corresponding":false,"raw_author_name":"I. Levin","raw_affiliation_strings":["School of Education, Tel-Aviv University, Tel-Aviv, Israel","Tel Aviv University/School of Education, Israel"],"affiliations":[{"raw_affiliation_string":"School of Education, Tel-Aviv University, Tel-Aviv, Israel","institution_ids":["https://openalex.org/I16391192"]},{"raw_affiliation_string":"Tel Aviv University/School of Education, Israel","institution_ids":["https://openalex.org/I16391192"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5071090334","display_name":"Osnat Keren","orcid":"https://orcid.org/0000-0002-3101-9551"},"institutions":[{"id":"https://openalex.org/I13955877","display_name":"Bar-Ilan University","ror":"https://ror.org/03kgsv495","country_code":"IL","type":"education","lineage":["https://openalex.org/I13955877"]}],"countries":["IL"],"is_corresponding":false,"raw_author_name":"O. Keren","raw_affiliation_strings":["School of Engineering, Bar-llan University, Ramat-Gan, Israel","Bar\u2010Ilan University School of Engineering Ramat\u2010Gan Israel"],"affiliations":[{"raw_affiliation_string":"School of Engineering, Bar-llan University, Ramat-Gan, Israel","institution_ids":["https://openalex.org/I13955877"]},{"raw_affiliation_string":"Bar\u2010Ilan University School of Engineering Ramat\u2010Gan Israel","institution_ids":["https://openalex.org/I13955877"]}]},{"author_position":"last","author":{"id":"https://openalex.org/A5010084548","display_name":"Mark G. Karpovsky","orcid":null},"institutions":[{"id":"https://openalex.org/I111088046","display_name":"Boston University","ror":"https://ror.org/05qwgg493","country_code":"US","type":"education","lineage":["https://openalex.org/I111088046"]}],"countries":["US"],"is_corresponding":false,"raw_author_name":"M. Karpovsky","raw_affiliation_strings":["Department of Electrical, Computer and System Engineering, Boston University, Boston, USA","Boston University/Department of Electrical, Computer and System Engineering, USA"],"affiliations":[{"raw_affiliation_string":"Department of Electrical, Computer and System Engineering, Boston University, Boston, USA","institution_ids":["https://openalex.org/I111088046"]},{"raw_affiliation_string":"Boston University/Department of Electrical, Computer and System Engineering, USA","institution_ids":["https://openalex.org/I111088046"]}]}],"institutions":[],"countries_distinct_count":2,"institutions_distinct_count":4,"corresponding_author_ids":["https://openalex.org/A5083574075"],"corresponding_institution_ids":["https://openalex.org/I13955877"],"apc_list":null,"apc_paid":null,"fwci":0.9144,"has_fulltext":false,"cited_by_count":21,"citation_normalized_percentile":{"value":0.7784309,"is_in_top_1_percent":false,"is_in_top_10_percent":false},"cited_by_percentile_year":{"min":90,"max":98},"biblio":{"volume":null,"issue":null,"first_page":"229","last_page":"234"},"is_retracted":false,"is_paratext":false,"is_xpac":false,"primary_topic":{"id":"https://openalex.org/T11005","display_name":"Radiation Effects in Electronics","score":0.9977999925613403,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},"topics":[{"id":"https://openalex.org/T11005","display_name":"Radiation Effects in Electronics","score":0.9977999925613403,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T10502","display_name":"Advanced Memory and Neural Computing","score":0.9965999722480774,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T10472","display_name":"Semiconductor materials and devices","score":0.9962000250816345,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"keywords":[{"id":"https://openalex.org/keywords/finite-state-machine","display_name":"Finite-state machine","score":0.6607915163040161},{"id":"https://openalex.org/keywords/fault-tolerance","display_name":"Fault tolerance","score":0.6557133197784424},{"id":"https://openalex.org/keywords/programmable-logic-device","display_name":"Programmable logic device","score":0.61156165599823},{"id":"https://openalex.org/keywords/computer-science","display_name":"Computer science","score":0.6113976240158081},{"id":"https://openalex.org/keywords/fault","display_name":"Fault (geology)","score":0.47627562284469604},{"id":"https://openalex.org/keywords/logic-synthesis","display_name":"Logic synthesis","score":0.4189608693122864},{"id":"https://openalex.org/keywords/nano","display_name":"Nano-","score":0.41647469997406006},{"id":"https://openalex.org/keywords/logic-gate","display_name":"Logic gate","score":0.4150792062282562},{"id":"https://openalex.org/keywords/parallel-computing","display_name":"Parallel computing","score":0.4146067202091217},{"id":"https://openalex.org/keywords/embedded-system","display_name":"Embedded system","score":0.3946242034435272},{"id":"https://openalex.org/keywords/algorithm","display_name":"Algorithm","score":0.31768298149108887},{"id":"https://openalex.org/keywords/engineering","display_name":"Engineering","score":0.24150562286376953},{"id":"https://openalex.org/keywords/distributed-computing","display_name":"Distributed computing","score":0.18207645416259766}],"concepts":[{"id":"https://openalex.org/C167822520","wikidata":"https://www.wikidata.org/wiki/Q176452","display_name":"Finite-state machine","level":2,"score":0.6607915163040161},{"id":"https://openalex.org/C63540848","wikidata":"https://www.wikidata.org/wiki/Q3140932","display_name":"Fault tolerance","level":2,"score":0.6557133197784424},{"id":"https://openalex.org/C206274596","wikidata":"https://www.wikidata.org/wiki/Q1063837","display_name":"Programmable logic device","level":2,"score":0.61156165599823},{"id":"https://openalex.org/C41008148","wikidata":"https://www.wikidata.org/wiki/Q21198","display_name":"Computer science","level":0,"score":0.6113976240158081},{"id":"https://openalex.org/C175551986","wikidata":"https://www.wikidata.org/wiki/Q47089","display_name":"Fault (geology)","level":2,"score":0.47627562284469604},{"id":"https://openalex.org/C157922185","wikidata":"https://www.wikidata.org/wiki/Q173198","display_name":"Logic synthesis","level":3,"score":0.4189608693122864},{"id":"https://openalex.org/C2780357685","wikidata":"https://www.wikidata.org/wiki/Q154357","display_name":"Nano-","level":2,"score":0.41647469997406006},{"id":"https://openalex.org/C131017901","wikidata":"https://www.wikidata.org/wiki/Q170451","display_name":"Logic gate","level":2,"score":0.4150792062282562},{"id":"https://openalex.org/C173608175","wikidata":"https://www.wikidata.org/wiki/Q232661","display_name":"Parallel computing","level":1,"score":0.4146067202091217},{"id":"https://openalex.org/C149635348","wikidata":"https://www.wikidata.org/wiki/Q193040","display_name":"Embedded system","level":1,"score":0.3946242034435272},{"id":"https://openalex.org/C11413529","wikidata":"https://www.wikidata.org/wiki/Q8366","display_name":"Algorithm","level":1,"score":0.31768298149108887},{"id":"https://openalex.org/C127413603","wikidata":"https://www.wikidata.org/wiki/Q11023","display_name":"Engineering","level":0,"score":0.24150562286376953},{"id":"https://openalex.org/C120314980","wikidata":"https://www.wikidata.org/wiki/Q180634","display_name":"Distributed computing","level":1,"score":0.18207645416259766},{"id":"https://openalex.org/C165205528","wikidata":"https://www.wikidata.org/wiki/Q83371","display_name":"Seismology","level":1,"score":0.0},{"id":"https://openalex.org/C127313418","wikidata":"https://www.wikidata.org/wiki/Q1069","display_name":"Geology","level":0,"score":0.0},{"id":"https://openalex.org/C42360764","wikidata":"https://www.wikidata.org/wiki/Q83588","display_name":"Chemical engineering","level":1,"score":0.0}],"mesh":[],"locations_count":2,"locations":[{"id":"doi:10.1109/iolts.2009.5196021","is_oa":false,"landing_page_url":"https://doi.org/10.1109/iolts.2009.5196021","pdf_url":null,"source":null,"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"2009 15th IEEE International On-Line Testing Symposium","raw_type":"proceedings-article"},{"id":"pmh:oai:CiteSeerX.psu:10.1.1.156.396","is_oa":false,"landing_page_url":"http://citeseerx.ist.psu.edu/viewdoc/summary?doi=10.1.1.156.396","pdf_url":null,"source":null,"license":null,"license_id":null,"version":"submittedVersion","is_accepted":false,"is_published":false,"raw_source_name":"http://mark.bu.edu/papers/214.pdf","raw_type":"text"}],"best_oa_location":null,"sustainable_development_goals":[],"awards":[],"funders":[],"has_content":{"pdf":false,"grobid_xml":false},"content_urls":null,"referenced_works_count":18,"referenced_works":["https://openalex.org/W33607802","https://openalex.org/W62484767","https://openalex.org/W1483975589","https://openalex.org/W1489025655","https://openalex.org/W1554266377","https://openalex.org/W1978758733","https://openalex.org/W2098021226","https://openalex.org/W2100903675","https://openalex.org/W2121382270","https://openalex.org/W2122386818","https://openalex.org/W2154130651","https://openalex.org/W2156146865","https://openalex.org/W2503011814","https://openalex.org/W2991693656","https://openalex.org/W4213095369","https://openalex.org/W6602513443","https://openalex.org/W6724326208","https://openalex.org/W6770827648"],"related_works":["https://openalex.org/W3014744767","https://openalex.org/W2742562413","https://openalex.org/W2147419146","https://openalex.org/W2135636985","https://openalex.org/W2197466303","https://openalex.org/W2462231960","https://openalex.org/W1607849496","https://openalex.org/W4283076579","https://openalex.org/W2170504327","https://openalex.org/W2526300902"],"abstract_inverted_index":{"The":[0,42,54,72],"paper":[1,43],"deals":[2],"with":[3,92],"designing":[4,108],"fault":[5,23,49],"tolerant":[6,24,50],"finite":[7],"state":[8],"machines":[9],"(FSMs)":[10],"by":[11,110],"nanoelectronic":[12],"programmable":[13],"logic":[14],"arrays":[15],"(PLAs).":[16],"Two":[17],"main":[18],"critical":[19],"parameters":[20],"of":[21,31,64,78,84,87,105],"the":[22,26,29,40,65,79,100,103],"nano-PLAs,":[25],"area":[27,80,101],"and":[28,95,102],"number":[30,86,104],"crosspoint":[32,88],"devices,":[33],"are":[34],"considered":[35],"as":[36],"optimization":[37],"criteria":[38],"for":[39,47],"synthesis.":[41],"introduces":[44],"a":[45,68,85,97],"method":[46,55],"synthesizing":[48],"nano-PLA":[51],"based":[52,57],"FSMs.":[53],"is":[56],"on":[58],"decomposing":[59],"an":[60],"initial":[61],"PLA":[62],"description":[63],"FSM":[66],"into":[67],"three":[69],"interacting":[70],"portions.":[71],"proposed":[73],"solution":[74],"provides":[75,96],"significant":[76],"reduction":[77],"without":[81],"meaningful":[82],"increasing":[83],"devices":[89,106],"in":[90,107],"comparison":[91],"known":[93],"solutions":[94],"trade-off":[98],"between":[99],"FSMs":[109],"PLAs.":[111]},"counts_by_year":[{"year":2022,"cited_by_count":1},{"year":2020,"cited_by_count":4},{"year":2018,"cited_by_count":4},{"year":2017,"cited_by_count":4},{"year":2016,"cited_by_count":1},{"year":2014,"cited_by_count":1},{"year":2013,"cited_by_count":3}],"updated_date":"2026-04-05T17:49:38.594831","created_date":"2025-10-10T00:00:00"}