{"id":"https://openalex.org/W2170262928","doi":"https://doi.org/10.1109/iolts.2009.5195994","title":"Panel: Realistic low power design: Let errors occur and correct them later or mitigate errors via design guardbanding and process control?","display_name":"Panel: Realistic low power design: Let errors occur and correct them later or mitigate errors via design guardbanding and process control?","publication_year":2009,"publication_date":"2009-06-01","ids":{"openalex":"https://openalex.org/W2170262928","doi":"https://doi.org/10.1109/iolts.2009.5195994","mag":"2170262928"},"language":"en","primary_location":{"id":"doi:10.1109/iolts.2009.5195994","is_oa":false,"landing_page_url":"https://doi.org/10.1109/iolts.2009.5195994","pdf_url":null,"source":null,"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"2009 15th IEEE International On-Line Testing Symposium","raw_type":"proceedings-article"},"type":"article","indexed_in":["crossref"],"open_access":{"is_oa":false,"oa_status":"closed","oa_url":null,"any_repository_has_fulltext":false},"authorships":[{"author_position":"first","author":{"id":"https://openalex.org/A5069579193","display_name":"Abhijit Chatterjee","orcid":"https://orcid.org/0000-0003-1553-4470"},"institutions":[{"id":"https://openalex.org/I2800444561","display_name":"Atlanta Technical College","ror":"https://ror.org/01s3vfp47","country_code":"US","type":"education","lineage":["https://openalex.org/I2800444561"]},{"id":"https://openalex.org/I130701444","display_name":"Georgia Institute of Technology","ror":"https://ror.org/01zkghx44","country_code":"US","type":"education","lineage":["https://openalex.org/I130701444"]}],"countries":["US"],"is_corresponding":true,"raw_author_name":"Abhijit Chatterjee","raw_affiliation_strings":["Georgia Tech., USA"],"affiliations":[{"raw_affiliation_string":"Georgia Tech., USA","institution_ids":["https://openalex.org/I2800444561","https://openalex.org/I130701444"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5068070739","display_name":"Jacob A. Abraham","orcid":"https://orcid.org/0000-0002-5336-5631"},"institutions":[{"id":"https://openalex.org/I86519309","display_name":"The University of Texas at Austin","ror":"https://ror.org/00hj54h04","country_code":"US","type":"education","lineage":["https://openalex.org/I86519309"]}],"countries":["US"],"is_corresponding":false,"raw_author_name":"Jacob Abraham","raw_affiliation_strings":["University of Texas at Austin, USA"],"affiliations":[{"raw_affiliation_string":"University of Texas at Austin, USA","institution_ids":["https://openalex.org/I86519309"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5104362993","display_name":"Adit D. Singh","orcid":null},"institutions":[{"id":"https://openalex.org/I82497590","display_name":"Auburn University","ror":"https://ror.org/02v80fc35","country_code":"US","type":"education","lineage":["https://openalex.org/I82497590"]}],"countries":["US"],"is_corresponding":false,"raw_author_name":"Adit Singh","raw_affiliation_strings":["Auburn University, USA"],"affiliations":[{"raw_affiliation_string":"Auburn University, USA","institution_ids":["https://openalex.org/I82497590"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5023516811","display_name":"Elie Maricau","orcid":null},"institutions":[{"id":"https://openalex.org/I99464096","display_name":"KU Leuven","ror":"https://ror.org/05f950310","country_code":"BE","type":"education","lineage":["https://openalex.org/I99464096"]}],"countries":["BE"],"is_corresponding":false,"raw_author_name":"Elie Maricau","raw_affiliation_strings":["KU Leuven, Belgium"],"affiliations":[{"raw_affiliation_string":"KU Leuven, Belgium","institution_ids":["https://openalex.org/I99464096"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5067547869","display_name":"Rakesh Kumar","orcid":"https://orcid.org/0000-0002-3290-2629"},"institutions":[{"id":"https://openalex.org/I157725225","display_name":"University of Illinois Urbana-Champaign","ror":"https://ror.org/047426m28","country_code":"US","type":"education","lineage":["https://openalex.org/I157725225"]}],"countries":["US"],"is_corresponding":false,"raw_author_name":"Rakesh Kumar","raw_affiliation_strings":["University of Illinois at Urbana-Champaign, USA"],"affiliations":[{"raw_affiliation_string":"University of Illinois at Urbana-Champaign, USA","institution_ids":["https://openalex.org/I157725225"]}]},{"author_position":"last","author":{"id":"https://openalex.org/A5046620750","display_name":"C. Papachristou","orcid":"https://orcid.org/0000-0002-5399-3208"},"institutions":[{"id":"https://openalex.org/I58956616","display_name":"Case Western Reserve University","ror":"https://ror.org/051fd9666","country_code":"US","type":"education","lineage":["https://openalex.org/I58956616"]}],"countries":["US"],"is_corresponding":false,"raw_author_name":"Christos Papachristou","raw_affiliation_strings":["Case Western Reserve University, USA"],"affiliations":[{"raw_affiliation_string":"Case Western Reserve University, USA","institution_ids":["https://openalex.org/I58956616"]}]}],"institutions":[],"countries_distinct_count":2,"institutions_distinct_count":6,"corresponding_author_ids":["https://openalex.org/A5069579193"],"corresponding_institution_ids":["https://openalex.org/I130701444","https://openalex.org/I2800444561"],"apc_list":null,"apc_paid":null,"fwci":0.0,"has_fulltext":false,"cited_by_count":0,"citation_normalized_percentile":{"value":0.18717316,"is_in_top_1_percent":false,"is_in_top_10_percent":false},"cited_by_percentile_year":null,"biblio":{"volume":null,"issue":null,"first_page":"129","last_page":"129"},"is_retracted":false,"is_paratext":false,"is_xpac":false,"primary_topic":{"id":"https://openalex.org/T11032","display_name":"VLSI and Analog Circuit Testing","score":0.9993000030517578,"subfield":{"id":"https://openalex.org/subfields/1708","display_name":"Hardware and Architecture"},"field":{"id":"https://openalex.org/fields/17","display_name":"Computer Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},"topics":[{"id":"https://openalex.org/T11032","display_name":"VLSI and Analog Circuit Testing","score":0.9993000030517578,"subfield":{"id":"https://openalex.org/subfields/1708","display_name":"Hardware and Architecture"},"field":{"id":"https://openalex.org/fields/17","display_name":"Computer Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T10558","display_name":"Advancements in Semiconductor Devices and Circuit Design","score":0.9991999864578247,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T10363","display_name":"Low-power high-performance VLSI design","score":0.9987000226974487,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"keywords":[{"id":"https://openalex.org/keywords/computer-science","display_name":"Computer science","score":0.7099334001541138},{"id":"https://openalex.org/keywords/resilience","display_name":"Resilience (materials science)","score":0.678575336933136},{"id":"https://openalex.org/keywords/cmos","display_name":"CMOS","score":0.5642171502113342},{"id":"https://openalex.org/keywords/error-detection-and-correction","display_name":"Error detection and correction","score":0.5550746917724609},{"id":"https://openalex.org/keywords/process","display_name":"Process (computing)","score":0.529260516166687},{"id":"https://openalex.org/keywords/margin","display_name":"Margin (machine learning)","score":0.524802565574646},{"id":"https://openalex.org/keywords/power","display_name":"Power (physics)","score":0.5178375840187073},{"id":"https://openalex.org/keywords/voltage","display_name":"Voltage","score":0.5064429044723511},{"id":"https://openalex.org/keywords/reliability-engineering","display_name":"Reliability engineering","score":0.4779527187347412},{"id":"https://openalex.org/keywords/scaling","display_name":"Scaling","score":0.47124913334846497},{"id":"https://openalex.org/keywords/control","display_name":"Control (management)","score":0.43285757303237915},{"id":"https://openalex.org/keywords/soft-error","display_name":"Soft error","score":0.4274408221244812},{"id":"https://openalex.org/keywords/computer-engineering","display_name":"Computer engineering","score":0.4181348383426666},{"id":"https://openalex.org/keywords/electronic-engineering","display_name":"Electronic engineering","score":0.36913537979125977},{"id":"https://openalex.org/keywords/electrical-engineering","display_name":"Electrical engineering","score":0.2544706463813782},{"id":"https://openalex.org/keywords/algorithm","display_name":"Algorithm","score":0.21258971095085144},{"id":"https://openalex.org/keywords/engineering","display_name":"Engineering","score":0.1619313657283783}],"concepts":[{"id":"https://openalex.org/C41008148","wikidata":"https://www.wikidata.org/wiki/Q21198","display_name":"Computer science","level":0,"score":0.7099334001541138},{"id":"https://openalex.org/C2779585090","wikidata":"https://www.wikidata.org/wiki/Q3457762","display_name":"Resilience (materials science)","level":2,"score":0.678575336933136},{"id":"https://openalex.org/C46362747","wikidata":"https://www.wikidata.org/wiki/Q173431","display_name":"CMOS","level":2,"score":0.5642171502113342},{"id":"https://openalex.org/C103088060","wikidata":"https://www.wikidata.org/wiki/Q1062839","display_name":"Error detection and correction","level":2,"score":0.5550746917724609},{"id":"https://openalex.org/C98045186","wikidata":"https://www.wikidata.org/wiki/Q205663","display_name":"Process (computing)","level":2,"score":0.529260516166687},{"id":"https://openalex.org/C774472","wikidata":"https://www.wikidata.org/wiki/Q6760393","display_name":"Margin (machine learning)","level":2,"score":0.524802565574646},{"id":"https://openalex.org/C163258240","wikidata":"https://www.wikidata.org/wiki/Q25342","display_name":"Power (physics)","level":2,"score":0.5178375840187073},{"id":"https://openalex.org/C165801399","wikidata":"https://www.wikidata.org/wiki/Q25428","display_name":"Voltage","level":2,"score":0.5064429044723511},{"id":"https://openalex.org/C200601418","wikidata":"https://www.wikidata.org/wiki/Q2193887","display_name":"Reliability engineering","level":1,"score":0.4779527187347412},{"id":"https://openalex.org/C99844830","wikidata":"https://www.wikidata.org/wiki/Q102441924","display_name":"Scaling","level":2,"score":0.47124913334846497},{"id":"https://openalex.org/C2775924081","wikidata":"https://www.wikidata.org/wiki/Q55608371","display_name":"Control (management)","level":2,"score":0.43285757303237915},{"id":"https://openalex.org/C154474529","wikidata":"https://www.wikidata.org/wiki/Q1658917","display_name":"Soft error","level":2,"score":0.4274408221244812},{"id":"https://openalex.org/C113775141","wikidata":"https://www.wikidata.org/wiki/Q428691","display_name":"Computer engineering","level":1,"score":0.4181348383426666},{"id":"https://openalex.org/C24326235","wikidata":"https://www.wikidata.org/wiki/Q126095","display_name":"Electronic engineering","level":1,"score":0.36913537979125977},{"id":"https://openalex.org/C119599485","wikidata":"https://www.wikidata.org/wiki/Q43035","display_name":"Electrical engineering","level":1,"score":0.2544706463813782},{"id":"https://openalex.org/C11413529","wikidata":"https://www.wikidata.org/wiki/Q8366","display_name":"Algorithm","level":1,"score":0.21258971095085144},{"id":"https://openalex.org/C127413603","wikidata":"https://www.wikidata.org/wiki/Q11023","display_name":"Engineering","level":0,"score":0.1619313657283783},{"id":"https://openalex.org/C111919701","wikidata":"https://www.wikidata.org/wiki/Q9135","display_name":"Operating system","level":1,"score":0.0},{"id":"https://openalex.org/C62520636","wikidata":"https://www.wikidata.org/wiki/Q944","display_name":"Quantum mechanics","level":1,"score":0.0},{"id":"https://openalex.org/C119857082","wikidata":"https://www.wikidata.org/wiki/Q2539","display_name":"Machine learning","level":1,"score":0.0},{"id":"https://openalex.org/C33923547","wikidata":"https://www.wikidata.org/wiki/Q395","display_name":"Mathematics","level":0,"score":0.0},{"id":"https://openalex.org/C121332964","wikidata":"https://www.wikidata.org/wiki/Q413","display_name":"Physics","level":0,"score":0.0},{"id":"https://openalex.org/C2524010","wikidata":"https://www.wikidata.org/wiki/Q8087","display_name":"Geometry","level":1,"score":0.0},{"id":"https://openalex.org/C154945302","wikidata":"https://www.wikidata.org/wiki/Q11660","display_name":"Artificial intelligence","level":1,"score":0.0},{"id":"https://openalex.org/C97355855","wikidata":"https://www.wikidata.org/wiki/Q11473","display_name":"Thermodynamics","level":1,"score":0.0}],"mesh":[],"locations_count":1,"locations":[{"id":"doi:10.1109/iolts.2009.5195994","is_oa":false,"landing_page_url":"https://doi.org/10.1109/iolts.2009.5195994","pdf_url":null,"source":null,"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"2009 15th IEEE International On-Line Testing Symposium","raw_type":"proceedings-article"}],"best_oa_location":null,"sustainable_development_goals":[],"awards":[],"funders":[],"has_content":{"pdf":false,"grobid_xml":false},"content_urls":null,"referenced_works_count":0,"referenced_works":[],"related_works":["https://openalex.org/W2110991008","https://openalex.org/W2061536619","https://openalex.org/W2149051075","https://openalex.org/W3079537800","https://openalex.org/W2141072664","https://openalex.org/W1927459197","https://openalex.org/W2554735846","https://openalex.org/W2394408226","https://openalex.org/W3041678444","https://openalex.org/W4389168214"],"abstract_inverted_index":{"There":[0],"has":[1],"been":[2,70],"ongoing":[3],"debate":[4],"regarding":[5],"the":[6,44,49,111,140,145,154,162,205],"use":[7,163],"of":[8,21,46,48,133,139,153,164],"voltage":[9,89,165],"overscaling":[10,166],"along":[11,167],"with":[12,168,183],"error":[13,62,169],"resilience":[14,170],"techniques":[15,171],"for":[16,181,213],"ultra":[17],"low":[18,114,150],"power":[19,115,151],"operation":[20],"scaled":[22,158],"CMOS":[23,159],"logic.":[24],"The":[25,105],"issue":[26],"is":[27,107,144,209],"whether":[28],"to":[29,53,56,72,76,92,120,128,148,177],"build":[30,149],"enough":[31],"design":[32,116,190],"margin":[33],"into":[34],"future":[35,155],"electronic":[36],"systems":[37,152],"so":[38],"that":[39,113],"errors":[40,55,86,176,199],"do":[41,197],"not":[42],"impact":[43],"Quality":[45],"Service":[47],"end":[50],"application":[51],"or":[52,102],"allow":[54,175],"occur":[57,178,200],"and":[58,97,179,208],"correct":[59],"them":[60,182],"using":[61,156],"tolerance":[63],"mechanisms.":[64],"Specific":[65],"signal":[66],"processing":[67],"algorithms":[68],"have":[69],"shown":[71],"be":[73,121,192],"inherently":[74],"tolerant":[75],"errors.":[77],"However,":[78],"large":[79,131],"general":[80],"purpose":[81],"processors":[82],"experience":[83],"virtually":[84],"zero":[85],"under":[87],"supply":[88],"scaling":[90,95],"up":[91],"a":[93,125,130,211],"certain":[94],"level":[96],"then":[98],"exhibit":[99],"\u201cmassive":[100],"errors\u201d":[101],"\u201ccomplete":[103],"breakdown\u201d.":[104],"problem":[106],"made":[108],"worse":[109],"by":[110],"fact":[112],"methodologies":[117],"force":[118],"devices":[119],"sized":[122],"in":[123],"such":[124,214],"way":[126,147],"as":[127],"make":[129],"number":[132],"circuit":[134],"paths":[135],"\u201ccritical\u201d.":[136],"Under":[137,186],"all":[138],"above":[141],"constraints,":[142],"what":[143,187],"best":[146],"deeply":[157],"technologies?":[160],"Is":[161],"realistic?":[172],"Can":[173],"we":[174,196],"compensate":[180],"high":[184],"confidence?":[185],"conditions":[188],"will":[189,202],"guardbanding":[191],"absolutely":[193],"necessary?":[194],"If":[195],"let":[198],"periodically,":[201],"customers":[203],"buy":[204],"associated":[206],"products":[207],"there":[210],"marketplace":[212],"error-resilient":[215],"ICs?":[216]},"counts_by_year":[],"updated_date":"2025-11-06T03:46:38.306776","created_date":"2025-10-10T00:00:00"}