{"id":"https://openalex.org/W2115441322","doi":"https://doi.org/10.1109/iolts.2009.5195991","title":"Novel DRAM mitigation technique","display_name":"Novel DRAM mitigation technique","publication_year":2009,"publication_date":"2009-06-01","ids":{"openalex":"https://openalex.org/W2115441322","doi":"https://doi.org/10.1109/iolts.2009.5195991","mag":"2115441322"},"language":"en","primary_location":{"id":"doi:10.1109/iolts.2009.5195991","is_oa":false,"landing_page_url":"https://doi.org/10.1109/iolts.2009.5195991","pdf_url":null,"source":null,"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"2009 15th IEEE International On-Line Testing Symposium","raw_type":"proceedings-article"},"type":"article","indexed_in":["crossref"],"open_access":{"is_oa":false,"oa_status":"closed","oa_url":null,"any_repository_has_fulltext":false},"authorships":[{"author_position":"first","author":{"id":"https://openalex.org/A5054128487","display_name":"A. Bougerol","orcid":null},"institutions":[{"id":"https://openalex.org/I112991645","display_name":"Airbus (France)","ror":"https://ror.org/023qdcg29","country_code":"FR","type":"company","lineage":["https://openalex.org/I112991645","https://openalex.org/I4210121748"]}],"countries":["FR"],"is_corresponding":true,"raw_author_name":"A. Bougerol","raw_affiliation_strings":["Innovation Works, EADS IW the European Aeronautic Defence and Space Company, Suresnes, France","EADS IW, the European Aeronautic Defense and Space Company, Innovation Works, 12 rue Pasteur, 92150, Suresnes, France"],"affiliations":[{"raw_affiliation_string":"Innovation Works, EADS IW the European Aeronautic Defence and Space Company, Suresnes, France","institution_ids":["https://openalex.org/I112991645"]},{"raw_affiliation_string":"EADS IW, the European Aeronautic Defense and Space Company, Innovation Works, 12 rue Pasteur, 92150, Suresnes, France","institution_ids":["https://openalex.org/I112991645"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5075419658","display_name":"F. Miller","orcid":null},"institutions":[{"id":"https://openalex.org/I112991645","display_name":"Airbus (France)","ror":"https://ror.org/023qdcg29","country_code":"FR","type":"company","lineage":["https://openalex.org/I112991645","https://openalex.org/I4210121748"]}],"countries":["FR"],"is_corresponding":false,"raw_author_name":"F. Miller","raw_affiliation_strings":["Innovation Works, EADS IW the European Aeronautic Defence and Space Company, Suresnes, France","EADS IW, the European Aeronautic Defense and Space Company, Innovation Works, 12 rue Pasteur, 92150, Suresnes, France"],"affiliations":[{"raw_affiliation_string":"Innovation Works, EADS IW the European Aeronautic Defence and Space Company, Suresnes, France","institution_ids":["https://openalex.org/I112991645"]},{"raw_affiliation_string":"EADS IW, the European Aeronautic Defense and Space Company, Innovation Works, 12 rue Pasteur, 92150, Suresnes, France","institution_ids":["https://openalex.org/I112991645"]}]},{"author_position":"last","author":{"id":"https://openalex.org/A5014356706","display_name":"N. Buard","orcid":null},"institutions":[{"id":"https://openalex.org/I112991645","display_name":"Airbus (France)","ror":"https://ror.org/023qdcg29","country_code":"FR","type":"company","lineage":["https://openalex.org/I112991645","https://openalex.org/I4210121748"]}],"countries":["FR"],"is_corresponding":false,"raw_author_name":"N. Buard","raw_affiliation_strings":["Innovation Works, EADS IW the European Aeronautic Defence and Space Company, Suresnes, France","EADS IW, the European Aeronautic Defense and Space Company, Innovation Works, 12 rue Pasteur, 92150, Suresnes, France"],"affiliations":[{"raw_affiliation_string":"Innovation Works, EADS IW the European Aeronautic Defence and Space Company, Suresnes, France","institution_ids":["https://openalex.org/I112991645"]},{"raw_affiliation_string":"EADS IW, the European Aeronautic Defense and Space Company, Innovation Works, 12 rue Pasteur, 92150, Suresnes, France","institution_ids":["https://openalex.org/I112991645"]}]}],"institutions":[],"countries_distinct_count":1,"institutions_distinct_count":3,"corresponding_author_ids":["https://openalex.org/A5054128487"],"corresponding_institution_ids":["https://openalex.org/I112991645"],"apc_list":null,"apc_paid":null,"fwci":0.2991,"has_fulltext":false,"cited_by_count":3,"citation_normalized_percentile":{"value":0.63824951,"is_in_top_1_percent":false,"is_in_top_10_percent":false},"cited_by_percentile_year":{"min":89,"max":94},"biblio":{"volume":"33","issue":null,"first_page":"109","last_page":"113"},"is_retracted":false,"is_paratext":false,"is_xpac":false,"primary_topic":{"id":"https://openalex.org/T10472","display_name":"Semiconductor materials and devices","score":0.9998999834060669,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},"topics":[{"id":"https://openalex.org/T10472","display_name":"Semiconductor materials and devices","score":0.9998999834060669,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T11005","display_name":"Radiation Effects in Electronics","score":0.9998999834060669,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T10502","display_name":"Advanced Memory and Neural Computing","score":0.9998000264167786,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"keywords":[{"id":"https://openalex.org/keywords/dram","display_name":"Dram","score":0.9442717432975769},{"id":"https://openalex.org/keywords/computer-science","display_name":"Computer science","score":0.6367584466934204},{"id":"https://openalex.org/keywords/overhead","display_name":"Overhead (engineering)","score":0.581056535243988},{"id":"https://openalex.org/keywords/embedded-system","display_name":"Embedded system","score":0.4801459014415741},{"id":"https://openalex.org/keywords/static-random-access-memory","display_name":"Static random-access memory","score":0.4736795723438263},{"id":"https://openalex.org/keywords/random-access-memory","display_name":"Random access memory","score":0.457514226436615},{"id":"https://openalex.org/keywords/property","display_name":"Property (philosophy)","score":0.4354243874549866},{"id":"https://openalex.org/keywords/computer-hardware","display_name":"Computer hardware","score":0.3357357382774353},{"id":"https://openalex.org/keywords/electronic-engineering","display_name":"Electronic engineering","score":0.3248646855354309},{"id":"https://openalex.org/keywords/engineering","display_name":"Engineering","score":0.22612729668617249},{"id":"https://openalex.org/keywords/operating-system","display_name":"Operating system","score":0.09077906608581543}],"concepts":[{"id":"https://openalex.org/C7366592","wikidata":"https://www.wikidata.org/wiki/Q1255620","display_name":"Dram","level":2,"score":0.9442717432975769},{"id":"https://openalex.org/C41008148","wikidata":"https://www.wikidata.org/wiki/Q21198","display_name":"Computer science","level":0,"score":0.6367584466934204},{"id":"https://openalex.org/C2779960059","wikidata":"https://www.wikidata.org/wiki/Q7113681","display_name":"Overhead (engineering)","level":2,"score":0.581056535243988},{"id":"https://openalex.org/C149635348","wikidata":"https://www.wikidata.org/wiki/Q193040","display_name":"Embedded system","level":1,"score":0.4801459014415741},{"id":"https://openalex.org/C68043766","wikidata":"https://www.wikidata.org/wiki/Q267416","display_name":"Static random-access memory","level":2,"score":0.4736795723438263},{"id":"https://openalex.org/C2994168587","wikidata":"https://www.wikidata.org/wiki/Q5295","display_name":"Random access memory","level":2,"score":0.457514226436615},{"id":"https://openalex.org/C189950617","wikidata":"https://www.wikidata.org/wiki/Q937228","display_name":"Property (philosophy)","level":2,"score":0.4354243874549866},{"id":"https://openalex.org/C9390403","wikidata":"https://www.wikidata.org/wiki/Q3966","display_name":"Computer hardware","level":1,"score":0.3357357382774353},{"id":"https://openalex.org/C24326235","wikidata":"https://www.wikidata.org/wiki/Q126095","display_name":"Electronic engineering","level":1,"score":0.3248646855354309},{"id":"https://openalex.org/C127413603","wikidata":"https://www.wikidata.org/wiki/Q11023","display_name":"Engineering","level":0,"score":0.22612729668617249},{"id":"https://openalex.org/C111919701","wikidata":"https://www.wikidata.org/wiki/Q9135","display_name":"Operating system","level":1,"score":0.09077906608581543},{"id":"https://openalex.org/C111472728","wikidata":"https://www.wikidata.org/wiki/Q9471","display_name":"Epistemology","level":1,"score":0.0},{"id":"https://openalex.org/C138885662","wikidata":"https://www.wikidata.org/wiki/Q5891","display_name":"Philosophy","level":0,"score":0.0}],"mesh":[],"locations_count":1,"locations":[{"id":"doi:10.1109/iolts.2009.5195991","is_oa":false,"landing_page_url":"https://doi.org/10.1109/iolts.2009.5195991","pdf_url":null,"source":null,"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"2009 15th IEEE International On-Line Testing Symposium","raw_type":"proceedings-article"}],"best_oa_location":null,"sustainable_development_goals":[{"display_name":"Climate action","score":0.5099999904632568,"id":"https://metadata.un.org/sdg/13"}],"awards":[],"funders":[],"has_content":{"grobid_xml":false,"pdf":false},"content_urls":null,"referenced_works_count":10,"referenced_works":["https://openalex.org/W2009557890","https://openalex.org/W2023856022","https://openalex.org/W2093436502","https://openalex.org/W2110727350","https://openalex.org/W2115952540","https://openalex.org/W2117614288","https://openalex.org/W2121941287","https://openalex.org/W2138349682","https://openalex.org/W2139563618","https://openalex.org/W2152407222"],"related_works":["https://openalex.org/W1909296377","https://openalex.org/W2094308961","https://openalex.org/W2089002058","https://openalex.org/W3185029353","https://openalex.org/W3116379964","https://openalex.org/W2766443086","https://openalex.org/W2793465010","https://openalex.org/W2967161359","https://openalex.org/W2915176329","https://openalex.org/W2533585248"],"abstract_inverted_index":{"This":[0,25],"paper":[1],"describes":[2],"a":[3,50],"novel":[4],"patented":[5],"radiation":[6],"mitigation":[7,67],"technique":[8],"for":[9],"DRAM":[10],"cell":[11],"memories.":[12],"Because":[13],"of":[14,58],"their":[15],"non-symmetrical":[16],"structure,":[17],"only":[18],"one":[19],"state":[20],"is":[21,28,62],"sensitive":[22],"to":[23,30,43],"radiations.":[24],"particular":[26],"property":[27],"used":[29],"detect":[31,44],"and":[32,45],"correct":[33,46],"upsets.":[34],"Several":[35],"fault-tolerant":[36],"architectures":[37],"are":[38,41],"proposed,":[39],"which":[40],"able":[42],"all":[47],"SEU/MBU":[48],"in":[49,56],"word,":[51],"whatever":[52],"its":[53],"length.":[54],"Overhead":[55],"term":[57],"additional":[59],"memory":[60],"cells":[61],"lower":[63],"than":[64],"other":[65],"classical":[66],"techniques.":[68]},"counts_by_year":[{"year":2017,"cited_by_count":1},{"year":2014,"cited_by_count":1}],"updated_date":"2025-11-06T03:46:38.306776","created_date":"2025-10-10T00:00:00"}