{"id":"https://openalex.org/W2129846282","doi":"https://doi.org/10.1109/inss.2010.5573616","title":"Basic VHDL tests conforming to IEC 61508","display_name":"Basic VHDL tests conforming to IEC 61508","publication_year":2010,"publication_date":"2010-06-01","ids":{"openalex":"https://openalex.org/W2129846282","doi":"https://doi.org/10.1109/inss.2010.5573616","mag":"2129846282"},"language":"en","primary_location":{"id":"doi:10.1109/inss.2010.5573616","is_oa":false,"landing_page_url":"https://doi.org/10.1109/inss.2010.5573616","pdf_url":null,"source":null,"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"2010 Seventh International Conference on Networked Sensing Systems (INSS)","raw_type":"proceedings-article"},"type":"article","indexed_in":["crossref"],"open_access":{"is_oa":false,"oa_status":"closed","oa_url":null,"any_repository_has_fulltext":false},"authorships":[{"author_position":"first","author":{"id":"https://openalex.org/A5002287165","display_name":"Ali Hayek","orcid":null},"institutions":[{"id":"https://openalex.org/I106157433","display_name":"University of Kassel","ror":"https://ror.org/04zc7p361","country_code":"DE","type":"education","lineage":["https://openalex.org/I106157433"]}],"countries":["DE"],"is_corresponding":true,"raw_author_name":"Ali Hayek","raw_affiliation_strings":["University of Kassel, Kassel, Germany","Computer Architecture and System Programming, University of Kassel, 34121 Germany"],"affiliations":[{"raw_affiliation_string":"University of Kassel, Kassel, Germany","institution_ids":["https://openalex.org/I106157433"]},{"raw_affiliation_string":"Computer Architecture and System Programming, University of Kassel, 34121 Germany","institution_ids":["https://openalex.org/I106157433"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5072774427","display_name":"Michael Schreiber","orcid":"https://orcid.org/0000-0003-2228-9258"},"institutions":[{"id":"https://openalex.org/I106157433","display_name":"University of Kassel","ror":"https://ror.org/04zc7p361","country_code":"DE","type":"education","lineage":["https://openalex.org/I106157433"]}],"countries":["DE"],"is_corresponding":false,"raw_author_name":"Michael Schreiber","raw_affiliation_strings":["University of Kassel, Kassel, Germany","Computer Architecture and System Programming, University of Kassel, 34121 Germany"],"affiliations":[{"raw_affiliation_string":"University of Kassel, Kassel, Germany","institution_ids":["https://openalex.org/I106157433"]},{"raw_affiliation_string":"Computer Architecture and System Programming, University of Kassel, 34121 Germany","institution_ids":["https://openalex.org/I106157433"]}]},{"author_position":"last","author":{"id":"https://openalex.org/A5005437316","display_name":"Josef B\u00f6rcs\u00f6k","orcid":"https://orcid.org/0000-0003-4394-1305"},"institutions":[{"id":"https://openalex.org/I106157433","display_name":"University of Kassel","ror":"https://ror.org/04zc7p361","country_code":"DE","type":"education","lineage":["https://openalex.org/I106157433"]}],"countries":["DE"],"is_corresponding":false,"raw_author_name":"Josef Borcsok","raw_affiliation_strings":["University of Kassel, Kassel, Germany","Computer Architecture and System Programming, University of Kassel, 34121 Germany"],"affiliations":[{"raw_affiliation_string":"University of Kassel, Kassel, Germany","institution_ids":["https://openalex.org/I106157433"]},{"raw_affiliation_string":"Computer Architecture and System Programming, University of Kassel, 34121 Germany","institution_ids":["https://openalex.org/I106157433"]}]}],"institutions":[],"countries_distinct_count":1,"institutions_distinct_count":3,"corresponding_author_ids":["https://openalex.org/A5002287165"],"corresponding_institution_ids":["https://openalex.org/I106157433"],"apc_list":null,"apc_paid":null,"fwci":0.7491,"has_fulltext":false,"cited_by_count":4,"citation_normalized_percentile":{"value":0.74318204,"is_in_top_1_percent":false,"is_in_top_10_percent":false},"cited_by_percentile_year":{"min":89,"max":96},"biblio":{"volume":null,"issue":null,"first_page":"41","last_page":"44"},"is_retracted":false,"is_paratext":false,"is_xpac":false,"primary_topic":{"id":"https://openalex.org/T10904","display_name":"Embedded Systems Design Techniques","score":0.998199999332428,"subfield":{"id":"https://openalex.org/subfields/1708","display_name":"Hardware and Architecture"},"field":{"id":"https://openalex.org/fields/17","display_name":"Computer Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},"topics":[{"id":"https://openalex.org/T10904","display_name":"Embedded Systems Design Techniques","score":0.998199999332428,"subfield":{"id":"https://openalex.org/subfields/1708","display_name":"Hardware and Architecture"},"field":{"id":"https://openalex.org/fields/17","display_name":"Computer Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T10743","display_name":"Software Testing and Debugging Techniques","score":0.9980000257492065,"subfield":{"id":"https://openalex.org/subfields/1712","display_name":"Software"},"field":{"id":"https://openalex.org/fields/17","display_name":"Computer Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T11032","display_name":"VLSI and Analog Circuit Testing","score":0.9966999888420105,"subfield":{"id":"https://openalex.org/subfields/1708","display_name":"Hardware and Architecture"},"field":{"id":"https://openalex.org/fields/17","display_name":"Computer Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"keywords":[{"id":"https://openalex.org/keywords/vhdl","display_name":"VHDL","score":0.834919810295105},{"id":"https://openalex.org/keywords/computer-science","display_name":"Computer science","score":0.7951928377151489},{"id":"https://openalex.org/keywords/iec-61508","display_name":"IEC 61508","score":0.7171702980995178},{"id":"https://openalex.org/keywords/testability","display_name":"Testability","score":0.6130424737930298},{"id":"https://openalex.org/keywords/embedded-system","display_name":"Embedded system","score":0.4781242907047272},{"id":"https://openalex.org/keywords/hardware-description-language","display_name":"Hardware description language","score":0.4701787531375885},{"id":"https://openalex.org/keywords/process","display_name":"Process (computing)","score":0.41214147210121155},{"id":"https://openalex.org/keywords/reliability-engineering","display_name":"Reliability engineering","score":0.40637117624282837},{"id":"https://openalex.org/keywords/programming-language","display_name":"Programming language","score":0.39969906210899353},{"id":"https://openalex.org/keywords/software-engineering","display_name":"Software engineering","score":0.39701616764068604},{"id":"https://openalex.org/keywords/computer-architecture","display_name":"Computer architecture","score":0.3429466485977173},{"id":"https://openalex.org/keywords/functional-safety","display_name":"Functional safety","score":0.17047426104545593},{"id":"https://openalex.org/keywords/field-programmable-gate-array","display_name":"Field-programmable gate array","score":0.1316719353199005},{"id":"https://openalex.org/keywords/engineering","display_name":"Engineering","score":0.09546411037445068}],"concepts":[{"id":"https://openalex.org/C36941000","wikidata":"https://www.wikidata.org/wiki/Q209455","display_name":"VHDL","level":3,"score":0.834919810295105},{"id":"https://openalex.org/C41008148","wikidata":"https://www.wikidata.org/wiki/Q21198","display_name":"Computer science","level":0,"score":0.7951928377151489},{"id":"https://openalex.org/C138267214","wikidata":"https://www.wikidata.org/wiki/Q1060017","display_name":"IEC 61508","level":3,"score":0.7171702980995178},{"id":"https://openalex.org/C51234621","wikidata":"https://www.wikidata.org/wiki/Q2149495","display_name":"Testability","level":2,"score":0.6130424737930298},{"id":"https://openalex.org/C149635348","wikidata":"https://www.wikidata.org/wiki/Q193040","display_name":"Embedded system","level":1,"score":0.4781242907047272},{"id":"https://openalex.org/C42143788","wikidata":"https://www.wikidata.org/wiki/Q173341","display_name":"Hardware description language","level":3,"score":0.4701787531375885},{"id":"https://openalex.org/C98045186","wikidata":"https://www.wikidata.org/wiki/Q205663","display_name":"Process (computing)","level":2,"score":0.41214147210121155},{"id":"https://openalex.org/C200601418","wikidata":"https://www.wikidata.org/wiki/Q2193887","display_name":"Reliability engineering","level":1,"score":0.40637117624282837},{"id":"https://openalex.org/C199360897","wikidata":"https://www.wikidata.org/wiki/Q9143","display_name":"Programming language","level":1,"score":0.39969906210899353},{"id":"https://openalex.org/C115903868","wikidata":"https://www.wikidata.org/wiki/Q80993","display_name":"Software engineering","level":1,"score":0.39701616764068604},{"id":"https://openalex.org/C118524514","wikidata":"https://www.wikidata.org/wiki/Q173212","display_name":"Computer architecture","level":1,"score":0.3429466485977173},{"id":"https://openalex.org/C148493468","wikidata":"https://www.wikidata.org/wiki/Q2646951","display_name":"Functional safety","level":2,"score":0.17047426104545593},{"id":"https://openalex.org/C42935608","wikidata":"https://www.wikidata.org/wiki/Q190411","display_name":"Field-programmable gate array","level":2,"score":0.1316719353199005},{"id":"https://openalex.org/C127413603","wikidata":"https://www.wikidata.org/wiki/Q11023","display_name":"Engineering","level":0,"score":0.09546411037445068},{"id":"https://openalex.org/C31258907","wikidata":"https://www.wikidata.org/wiki/Q1301371","display_name":"Computer network","level":1,"score":0.0}],"mesh":[],"locations_count":1,"locations":[{"id":"doi:10.1109/inss.2010.5573616","is_oa":false,"landing_page_url":"https://doi.org/10.1109/inss.2010.5573616","pdf_url":null,"source":null,"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"2010 Seventh International Conference on Networked Sensing Systems (INSS)","raw_type":"proceedings-article"}],"best_oa_location":null,"sustainable_development_goals":[],"awards":[],"funders":[],"has_content":{"pdf":false,"grobid_xml":false},"content_urls":null,"referenced_works_count":6,"referenced_works":["https://openalex.org/W32887977","https://openalex.org/W1605390882","https://openalex.org/W1649645444","https://openalex.org/W2341909296","https://openalex.org/W6636125451","https://openalex.org/W6636811135"],"related_works":["https://openalex.org/W2110818533","https://openalex.org/W1917852300","https://openalex.org/W2384838054","https://openalex.org/W2139058049","https://openalex.org/W2376018793","https://openalex.org/W2548456620","https://openalex.org/W2911649771","https://openalex.org/W2148697719","https://openalex.org/W2122949436","https://openalex.org/W78782492"],"abstract_inverted_index":{"The":[0,25],"development":[1,86],"of":[2,14,32,37,46,97],"embedded":[3],"sensing":[4],"applications":[5],"based":[6],"on":[7,105],"integrated":[8],"circuits":[9],"leads":[10],"to":[11,20,50,77,89,117],"ever-growing":[12],"complexity":[13],"VHDL-code":[15],"and":[16,60,69,94,110],"requires":[17],"sophisticated":[18],"testability":[19],"achieve":[21],"high":[22],"diagnostic":[23],"coverage.":[24],"norm":[26],"IEC":[27,51],"61508":[28],"provides":[29],"a":[30,56,85,95,103],"set":[31],"requirements":[33],"for":[34,122],"the":[35,44,90],"implementation":[36],"safety-related":[38],"software.":[39],"This":[40],"paper":[41],"deals":[42],"with":[43,75,115],"testing":[45,67,108],"VHDL":[47,54,98],"modules":[48,99],"according":[49,88],"61508.":[52],"Since":[53],"is":[55,92,100],"hardware":[57],"description":[58],"language":[59],"differs":[61],"from":[62,81],"traditional":[63],"software":[64],"languages,":[65],"new":[66],"aspects":[68],"common":[70,121],"coverage":[71],"criteria":[72],"are":[73],"examined":[74],"respect":[76,116],"basic":[78],"needs":[79],"resulting":[80],"those":[82],"differences.":[83],"Therefore,":[84],"process":[87],"V-Model":[91],"introduced":[93],"classification":[96],"proposed,":[101],"providing":[102],"basis":[104],"which":[106],"several":[107],"methods":[109],"exit-criteria":[111],"can":[112],"be":[113],"evaluated":[114],"specific":[118],"design":[119],"attributes":[120],"each":[123],"class.":[124]},"counts_by_year":[{"year":2014,"cited_by_count":1},{"year":2013,"cited_by_count":2},{"year":2012,"cited_by_count":1}],"updated_date":"2025-11-06T03:46:38.306776","created_date":"2025-10-10T00:00:00"}