{"id":"https://openalex.org/W1509997443","doi":"https://doi.org/10.1109/inm.2015.7140481","title":"Reduced reference image quality assessment via Boltzmann Machines","display_name":"Reduced reference image quality assessment via Boltzmann Machines","publication_year":2015,"publication_date":"2015-05-01","ids":{"openalex":"https://openalex.org/W1509997443","doi":"https://doi.org/10.1109/inm.2015.7140481","mag":"1509997443"},"language":"en","primary_location":{"id":"doi:10.1109/inm.2015.7140481","is_oa":false,"landing_page_url":"https://doi.org/10.1109/inm.2015.7140481","pdf_url":null,"source":null,"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"2015 IFIP/IEEE International Symposium on Integrated Network Management (IM)","raw_type":"proceedings-article"},"type":"article","indexed_in":["crossref"],"open_access":{"is_oa":true,"oa_status":"green","oa_url":"https://research.tue.nl/en/publications/3144d398-a073-45e6-83fa-376c819422f6","any_repository_has_fulltext":true},"authorships":[{"author_position":"first","author":{"id":"https://openalex.org/A5011045254","display_name":"Decebal Constantin Mocanu","orcid":"https://orcid.org/0000-0002-5636-7683"},"institutions":[{"id":"https://openalex.org/I83019370","display_name":"Eindhoven University of Technology","ror":"https://ror.org/02c2kyt77","country_code":"NL","type":"education","lineage":["https://openalex.org/I83019370"]},{"id":"https://openalex.org/I79576946","display_name":"University of Pennsylvania","ror":"https://ror.org/00b30xv10","country_code":"US","type":"education","lineage":["https://openalex.org/I79576946"]}],"countries":["NL","US"],"is_corresponding":true,"raw_author_name":"Decebal Constantin Mocanu","raw_affiliation_strings":["Department of Electrical Engineering, Eindhoven University of Technology, The Netherlands","Department of computer and information science, University of Pennsylvania, USA"],"affiliations":[{"raw_affiliation_string":"Department of Electrical Engineering, Eindhoven University of Technology, The Netherlands","institution_ids":["https://openalex.org/I83019370"]},{"raw_affiliation_string":"Department of computer and information science, University of Pennsylvania, USA","institution_ids":["https://openalex.org/I79576946"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5091641200","display_name":"Georgios Exarchakos","orcid":"https://orcid.org/0000-0002-5773-0720"},"institutions":[{"id":"https://openalex.org/I83019370","display_name":"Eindhoven University of Technology","ror":"https://ror.org/02c2kyt77","country_code":"NL","type":"education","lineage":["https://openalex.org/I83019370"]}],"countries":["NL"],"is_corresponding":false,"raw_author_name":"Georgios Exarchakos","raw_affiliation_strings":["Department of Electrical Engineering, Eindhoven University of Technology, The Netherlands"],"affiliations":[{"raw_affiliation_string":"Department of Electrical Engineering, Eindhoven University of Technology, The Netherlands","institution_ids":["https://openalex.org/I83019370"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5034334762","display_name":"Haitham Bou Ammar","orcid":"https://orcid.org/0000-0002-6083-6171"},"institutions":[{"id":"https://openalex.org/I79576946","display_name":"University of Pennsylvania","ror":"https://ror.org/00b30xv10","country_code":"US","type":"education","lineage":["https://openalex.org/I79576946"]}],"countries":["US"],"is_corresponding":false,"raw_author_name":"Haitham Bou Ammar","raw_affiliation_strings":["Department of computer and information science, University of Pennsylvania, USA"],"affiliations":[{"raw_affiliation_string":"Department of computer and information science, University of Pennsylvania, USA","institution_ids":["https://openalex.org/I79576946"]}]},{"author_position":"last","author":{"id":"https://openalex.org/A5026941307","display_name":"Antonio Liotta","orcid":"https://orcid.org/0000-0002-2773-4421"},"institutions":[{"id":"https://openalex.org/I83019370","display_name":"Eindhoven University of Technology","ror":"https://ror.org/02c2kyt77","country_code":"NL","type":"education","lineage":["https://openalex.org/I83019370"]}],"countries":["NL"],"is_corresponding":false,"raw_author_name":"Antonio Liotta","raw_affiliation_strings":["Department of Electrical Engineering, Eindhoven University of Technology, The Netherlands"],"affiliations":[{"raw_affiliation_string":"Department of Electrical Engineering, Eindhoven University of Technology, The Netherlands","institution_ids":["https://openalex.org/I83019370"]}]}],"institutions":[],"countries_distinct_count":2,"institutions_distinct_count":4,"corresponding_author_ids":["https://openalex.org/A5011045254"],"corresponding_institution_ids":["https://openalex.org/I79576946","https://openalex.org/I83019370"],"apc_list":null,"apc_paid":null,"fwci":4.115,"has_fulltext":true,"cited_by_count":25,"citation_normalized_percentile":{"value":0.95910927,"is_in_top_1_percent":false,"is_in_top_10_percent":true},"cited_by_percentile_year":{"min":90,"max":99},"biblio":{"volume":null,"issue":null,"first_page":"1278","last_page":"1281"},"is_retracted":false,"is_paratext":false,"is_xpac":false,"primary_topic":{"id":"https://openalex.org/T11165","display_name":"Image and Video Quality Assessment","score":0.9998999834060669,"subfield":{"id":"https://openalex.org/subfields/1707","display_name":"Computer Vision and Pattern Recognition"},"field":{"id":"https://openalex.org/fields/17","display_name":"Computer Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},"topics":[{"id":"https://openalex.org/T11165","display_name":"Image and Video Quality Assessment","score":0.9998999834060669,"subfield":{"id":"https://openalex.org/subfields/1707","display_name":"Computer Vision and Pattern Recognition"},"field":{"id":"https://openalex.org/fields/17","display_name":"Computer Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T10688","display_name":"Image and Signal Denoising Methods","score":0.9995999932289124,"subfield":{"id":"https://openalex.org/subfields/1707","display_name":"Computer Vision and Pattern Recognition"},"field":{"id":"https://openalex.org/fields/17","display_name":"Computer Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T11105","display_name":"Advanced Image Processing Techniques","score":0.9994999766349792,"subfield":{"id":"https://openalex.org/subfields/1707","display_name":"Computer Vision and Pattern Recognition"},"field":{"id":"https://openalex.org/fields/17","display_name":"Computer Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"keywords":[{"id":"https://openalex.org/keywords/computer-science","display_name":"Computer science","score":0.6409962773323059},{"id":"https://openalex.org/keywords/image-quality","display_name":"Image quality","score":0.5212579369544983},{"id":"https://openalex.org/keywords/quality","display_name":"Quality (philosophy)","score":0.5116415619850159},{"id":"https://openalex.org/keywords/boltzmann-machine","display_name":"Boltzmann machine","score":0.5114520788192749},{"id":"https://openalex.org/keywords/artificial-intelligence","display_name":"Artificial intelligence","score":0.3774745464324951},{"id":"https://openalex.org/keywords/image","display_name":"Image (mathematics)","score":0.3513367176055908},{"id":"https://openalex.org/keywords/reliability-engineering","display_name":"Reliability engineering","score":0.33511388301849365},{"id":"https://openalex.org/keywords/artificial-neural-network","display_name":"Artificial neural network","score":0.13693490624427795},{"id":"https://openalex.org/keywords/physics","display_name":"Physics","score":0.10602372884750366},{"id":"https://openalex.org/keywords/engineering","display_name":"Engineering","score":0.08237776160240173}],"concepts":[{"id":"https://openalex.org/C41008148","wikidata":"https://www.wikidata.org/wiki/Q21198","display_name":"Computer science","level":0,"score":0.6409962773323059},{"id":"https://openalex.org/C55020928","wikidata":"https://www.wikidata.org/wiki/Q3813865","display_name":"Image quality","level":3,"score":0.5212579369544983},{"id":"https://openalex.org/C2779530757","wikidata":"https://www.wikidata.org/wiki/Q1207505","display_name":"Quality (philosophy)","level":2,"score":0.5116415619850159},{"id":"https://openalex.org/C192576344","wikidata":"https://www.wikidata.org/wiki/Q194706","display_name":"Boltzmann machine","level":3,"score":0.5114520788192749},{"id":"https://openalex.org/C154945302","wikidata":"https://www.wikidata.org/wiki/Q11660","display_name":"Artificial intelligence","level":1,"score":0.3774745464324951},{"id":"https://openalex.org/C115961682","wikidata":"https://www.wikidata.org/wiki/Q860623","display_name":"Image (mathematics)","level":2,"score":0.3513367176055908},{"id":"https://openalex.org/C200601418","wikidata":"https://www.wikidata.org/wiki/Q2193887","display_name":"Reliability engineering","level":1,"score":0.33511388301849365},{"id":"https://openalex.org/C50644808","wikidata":"https://www.wikidata.org/wiki/Q192776","display_name":"Artificial neural network","level":2,"score":0.13693490624427795},{"id":"https://openalex.org/C121332964","wikidata":"https://www.wikidata.org/wiki/Q413","display_name":"Physics","level":0,"score":0.10602372884750366},{"id":"https://openalex.org/C127413603","wikidata":"https://www.wikidata.org/wiki/Q11023","display_name":"Engineering","level":0,"score":0.08237776160240173},{"id":"https://openalex.org/C62520636","wikidata":"https://www.wikidata.org/wiki/Q944","display_name":"Quantum mechanics","level":1,"score":0.0}],"mesh":[],"locations_count":8,"locations":[{"id":"doi:10.1109/inm.2015.7140481","is_oa":false,"landing_page_url":"https://doi.org/10.1109/inm.2015.7140481","pdf_url":null,"source":null,"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"2015 IFIP/IEEE International Symposium on Integrated Network Management (IM)","raw_type":"proceedings-article"},{"id":"pmh:oai:pure.tue.nl:openaire/3144d398-a073-45e6-83fa-376c819422f6","is_oa":true,"landing_page_url":"https://research.tue.nl/en/publications/3144d398-a073-45e6-83fa-376c819422f6","pdf_url":null,"source":{"id":"https://openalex.org/S4406922641","display_name":"TU/e Research Portal","issn_l":null,"issn":null,"is_oa":false,"is_in_doaj":false,"is_core":false,"host_organization":null,"host_organization_name":null,"host_organization_lineage":[],"host_organization_lineage_names":[],"type":"repository"},"license":"other-oa","license_id":"https://openalex.org/licenses/other-oa","version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"Mocanu, D C, Exarchakos, G, Bou Ammar, H & Liotta, A 2015, Reduced reference image quality assessment via Boltzmann machines. in Proceedings of the 2015 IFIP/IEEE International Symposium on Integrated Network Management (IM), 11-15 May 2015, Ottawa, Canada. Institute of Electrical and Electronics Engineers, Piscataway, pp. 1278-1281, 3rd IEEE/IFIP International Workshop on Quality of Experience Centric Management, at IEEE/IFIP IM 2015; 2015-05-11; 2015-05-15, 11/05/15. https://doi.org/10.1109/INM.2015.7140481","raw_type":"info:eu-repo/semantics/publishedVersion"},{"id":"pmh:tue:oai:pure.tue.nl:publications/3144d398-a073-45e6-83fa-376c819422f6","is_oa":true,"landing_page_url":"https://research.tue.nl/nl/publications/3144d398-a073-45e6-83fa-376c819422f6","pdf_url":"https://research.tue.nl/nl/publications/3144d398-a073-45e6-83fa-376c819422f6","source":{"id":"https://openalex.org/S4306401843","display_name":"Data Archiving and Networked Services (DANS)","issn_l":null,"issn":null,"is_oa":false,"is_in_doaj":false,"is_core":false,"host_organization":"https://openalex.org/I1322597698","host_organization_name":"Royal Netherlands Academy of Arts and Sciences","host_organization_lineage":["https://openalex.org/I1322597698"],"host_organization_lineage_names":[],"type":"repository"},"license":"other-oa","license_id":"https://openalex.org/licenses/other-oa","version":"submittedVersion","is_accepted":false,"is_published":false,"raw_source_name":"Proceedings of the 2015 IFIP/IEEE International Symposium on Integrated Network Management (IM), 11-15 May 2015, Ottawa, Canada, 1278 - 1281","raw_type":"info:eu-repo/semantics/conferencepaper"},{"id":"pmh:789150","is_oa":false,"landing_page_url":"http://library.tue.nl/csp/dare/LinkToRepository.csp?recordnumber=789150","pdf_url":null,"source":{"id":"https://openalex.org/S4406923046","display_name":"TU/e Research Portal (Eindhoven University of Technology)","issn_l":null,"issn":null,"is_oa":false,"is_in_doaj":false,"is_core":false,"host_organization":null,"host_organization_name":null,"host_organization_lineage":[],"host_organization_lineage_names":[],"type":"repository"},"license":null,"license_id":null,"version":"submittedVersion","is_accepted":false,"is_published":false,"raw_source_name":"","raw_type":""},{"id":"pmh:oai:alma.39UBZ_INST:11310498010001241","is_oa":false,"landing_page_url":"https://doi.org/10.1109/INM.2015.7140481","pdf_url":null,"source":{"id":"https://openalex.org/S4210197018","display_name":"View","issn_l":"2688-268X","issn":["2688-268X","2688-3988"],"is_oa":false,"is_in_doaj":true,"is_core":true,"host_organization":"https://openalex.org/P4310320595","host_organization_name":"Wiley","host_organization_lineage":["https://openalex.org/P4310320595"],"host_organization_lineage_names":["Wiley"],"type":"journal"},"license":null,"license_id":null,"version":"submittedVersion","is_accepted":false,"is_published":false,"raw_source_name":"","raw_type":"text"},{"id":"pmh:oai:derby.openrepository.com:10545/622636","is_oa":false,"landing_page_url":"http://hdl.handle.net/10545/622636","pdf_url":null,"source":{"id":"https://openalex.org/S4306402138","display_name":"University of Derby Online Research Archive. (University of Derby)","issn_l":null,"issn":null,"is_oa":false,"is_in_doaj":false,"is_core":false,"host_organization":"https://openalex.org/I22128151","host_organization_name":"University of Derby","host_organization_lineage":["https://openalex.org/I22128151"],"host_organization_lineage_names":[],"type":"repository"},"license":null,"license_id":null,"version":"submittedVersion","is_accepted":false,"is_published":false,"raw_source_name":"","raw_type":"Meetings and Proceedings"},{"id":"pmh:oai:library.tue.nl:789150","is_oa":false,"landing_page_url":"http://repository.tue.nl/789150","pdf_url":null,"source":{"id":"https://openalex.org/S4406923046","display_name":"TU/e Research Portal (Eindhoven University of Technology)","issn_l":null,"issn":null,"is_oa":false,"is_in_doaj":false,"is_core":false,"host_organization":null,"host_organization_name":null,"host_organization_lineage":[],"host_organization_lineage_names":[],"type":"repository"},"license":null,"license_id":null,"version":"submittedVersion","is_accepted":false,"is_published":false,"raw_source_name":"","raw_type":""},{"id":"pmh:oai:unibz.it:11310498010001241","is_oa":false,"landing_page_url":"https://bia.unibz.it/esploro/outputs/conferenceProceeding/Reduced-reference-image-quality-assessment-via/991006679397001241","pdf_url":null,"source":{"id":"https://openalex.org/S4210197018","display_name":"View","issn_l":"2688-268X","issn":["2688-268X","2688-3988"],"is_oa":false,"is_in_doaj":true,"is_core":true,"host_organization":"https://openalex.org/P4310320595","host_organization_name":"Wiley","host_organization_lineage":["https://openalex.org/P4310320595"],"host_organization_lineage_names":["Wiley"],"type":"journal"},"license":null,"license_id":null,"version":"submittedVersion","is_accepted":false,"is_published":false,"raw_source_name":"","raw_type":"text"}],"best_oa_location":{"id":"pmh:oai:pure.tue.nl:openaire/3144d398-a073-45e6-83fa-376c819422f6","is_oa":true,"landing_page_url":"https://research.tue.nl/en/publications/3144d398-a073-45e6-83fa-376c819422f6","pdf_url":null,"source":{"id":"https://openalex.org/S4406922641","display_name":"TU/e Research Portal","issn_l":null,"issn":null,"is_oa":false,"is_in_doaj":false,"is_core":false,"host_organization":null,"host_organization_name":null,"host_organization_lineage":[],"host_organization_lineage_names":[],"type":"repository"},"license":"other-oa","license_id":"https://openalex.org/licenses/other-oa","version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"Mocanu, D C, Exarchakos, G, Bou Ammar, H & Liotta, A 2015, Reduced reference image quality assessment via Boltzmann machines. in Proceedings of the 2015 IFIP/IEEE International Symposium on Integrated Network Management (IM), 11-15 May 2015, Ottawa, Canada. Institute of Electrical and Electronics Engineers, Piscataway, pp. 1278-1281, 3rd IEEE/IFIP International Workshop on Quality of Experience Centric Management, at IEEE/IFIP IM 2015; 2015-05-11; 2015-05-15, 11/05/15. https://doi.org/10.1109/INM.2015.7140481","raw_type":"info:eu-repo/semantics/publishedVersion"},"sustainable_development_goals":[],"awards":[],"funders":[],"has_content":{"pdf":false,"grobid_xml":false},"content_urls":null,"referenced_works_count":33,"referenced_works":["https://openalex.org/W97016928","https://openalex.org/W1813659000","https://openalex.org/W1971155098","https://openalex.org/W1992869494","https://openalex.org/W1997064109","https://openalex.org/W1997953730","https://openalex.org/W2007543255","https://openalex.org/W2033134714","https://openalex.org/W2033255535","https://openalex.org/W2035713052","https://openalex.org/W2072128103","https://openalex.org/W2084880402","https://openalex.org/W2100495367","https://openalex.org/W2106262311","https://openalex.org/W2107995569","https://openalex.org/W2116064496","https://openalex.org/W2117535912","https://openalex.org/W2119512550","https://openalex.org/W2124914669","https://openalex.org/W2141559023","https://openalex.org/W2160115902","https://openalex.org/W2161304138","https://openalex.org/W2170624716","https://openalex.org/W2171349048","https://openalex.org/W2186291271","https://openalex.org/W2546855109","https://openalex.org/W4231109964","https://openalex.org/W4231254085","https://openalex.org/W6603960082","https://openalex.org/W6638304892","https://openalex.org/W6678801095","https://openalex.org/W6680962669","https://openalex.org/W6685004102"],"related_works":["https://openalex.org/W2916681395","https://openalex.org/W2529583158","https://openalex.org/W1575733688","https://openalex.org/W2963348254","https://openalex.org/W1641020902","https://openalex.org/W3128475979","https://openalex.org/W2133316674","https://openalex.org/W1968450737","https://openalex.org/W3121130100","https://openalex.org/W4229814595"],"abstract_inverted_index":{"Monitoring":[0],"and":[1,64,78],"controlling":[2],"the":[3,18,61,85,95,103,115,119,148],"user's":[4],"perceived":[5],"quality,":[6],"in":[7,47,68,123,135,190],"modern":[8],"video":[9],"services":[10],"is":[11,32,112,185],"a":[12,37,57,90,107,140],"challenging":[13],"proposition,":[14],"mainly":[15],"due":[16,101],"to":[17,35,93,102,146],"limitations":[19],"of":[20,29,97,110,150],"current":[21],"Image":[22],"Quality":[23,28],"Assessment":[24],"(IQA)":[25],"algorithms.":[26,178],"Subjective":[27],"Experience":[30],"(QoE)":[31],"widely":[33,194],"used":[34,46],"get":[36],"right":[38],"impression,":[39],"but":[40],"unfortunately":[41],"this":[42,136],"can":[43],"not":[44],"be":[45],"real":[48],"world":[49],"scenarios.":[50],"In":[51],"general,":[52],"objective":[53,176],"QoE":[54,129],"algorithms":[55,130],"represent":[56],"good":[58],"substitution":[59],"for":[60],"subjective":[62,173],"ones,":[63],"they":[65],"are":[66,132],"split":[67],"three":[69],"main":[70],"directions:":[71],"Full":[72],"Reference":[73,76,80],"(FR),":[74],"Reduced":[75],"(RR),":[77],"No":[79],"(NR).":[81],"From":[82],"these":[83],"three,":[84],"RR":[86,143],"IQA":[87,144,177,197],"approach":[88],"offers":[89],"practical":[91],"solution":[92],"assess":[94,147],"quality":[96,149],"an":[98,151],"impaired":[99],"image":[100,152,170],"fact":[104],"that":[105,125,182],"just":[106],"small":[108],"amount":[109],"information":[111],"needed":[113],"from":[114],"original":[116],"image.":[117],"At":[118],"same":[120],"time,":[121],"keeping":[122],"mind":[124],"we":[126,138],"need":[127],"automated":[128],"which":[131],"context":[133],"independent,":[134],"paper":[137],"introduce":[139],"novel":[141],"stochastic":[142],"metric":[145],"based":[153],"on":[154,167],"Deep":[155],"Learning,":[156],"namely":[157],"Restricted":[158],"Boltzmann":[159],"Machine":[160],"Similarity":[161],"Measure":[162],"(RBMSim).":[163],"RBMSim":[164],"was":[165],"evaluated":[166],"two":[168],"benchmarked":[169],"databases":[171],"with":[172,193],"studies,":[174],"against":[175],"The":[179],"results":[180],"show":[181],"its":[183],"performance":[184],"comparable,":[186],"or":[187],"even":[188],"better":[189],"some":[191],"cases,":[192],"known":[195],"FR":[196],"methods.":[198]},"counts_by_year":[{"year":2022,"cited_by_count":2},{"year":2019,"cited_by_count":1},{"year":2018,"cited_by_count":6},{"year":2017,"cited_by_count":2},{"year":2016,"cited_by_count":5},{"year":2015,"cited_by_count":9}],"updated_date":"2026-04-04T16:13:02.066488","created_date":"2025-10-10T00:00:00"}