{"id":"https://openalex.org/W2966744251","doi":"https://doi.org/10.1109/inista.2019.8778419","title":"Anomaly Detection in Aluminium Production with Unsupervised Machine Learning Classifiers","display_name":"Anomaly Detection in Aluminium Production with Unsupervised Machine Learning Classifiers","publication_year":2019,"publication_date":"2019-07-01","ids":{"openalex":"https://openalex.org/W2966744251","doi":"https://doi.org/10.1109/inista.2019.8778419","mag":"2966744251"},"language":"en","primary_location":{"id":"doi:10.1109/inista.2019.8778419","is_oa":false,"landing_page_url":"https://doi.org/10.1109/inista.2019.8778419","pdf_url":null,"source":null,"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"2019 IEEE International Symposium on INnovations in Intelligent SysTems and Applications (INISTA)","raw_type":"proceedings-article"},"type":"article","indexed_in":["crossref"],"open_access":{"is_oa":false,"oa_status":"closed","oa_url":null,"any_repository_has_fulltext":false},"authorships":[{"author_position":"first","author":{"id":"https://openalex.org/A5005936969","display_name":"Nikolaos Kolokas","orcid":"https://orcid.org/0000-0002-4571-9954"},"institutions":[{"id":"https://openalex.org/I4210134249","display_name":"Centre for Research and Technology Hellas","ror":"https://ror.org/03bndpq63","country_code":"GR","type":"facility","lineage":["https://openalex.org/I4210134249"]}],"countries":["GR"],"is_corresponding":true,"raw_author_name":"Nikolaos Kolokas","raw_affiliation_strings":["Center for Research and Technology Hellas, Thessaloniki, Greece"],"affiliations":[{"raw_affiliation_string":"Center for Research and Technology Hellas, Thessaloniki, Greece","institution_ids":["https://openalex.org/I4210134249"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5065741295","display_name":"Thanasis Vafeiadis","orcid":"https://orcid.org/0000-0003-3682-7539"},"institutions":[{"id":"https://openalex.org/I4210134249","display_name":"Centre for Research and Technology Hellas","ror":"https://ror.org/03bndpq63","country_code":"GR","type":"facility","lineage":["https://openalex.org/I4210134249"]}],"countries":["GR"],"is_corresponding":false,"raw_author_name":"Thanasis Vafeiadis","raw_affiliation_strings":["Center for Research and Technology Hellas, Thessaloniki, Greece"],"affiliations":[{"raw_affiliation_string":"Center for Research and Technology Hellas, Thessaloniki, Greece","institution_ids":["https://openalex.org/I4210134249"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5000323469","display_name":"Dimosthenis Ioannidis","orcid":"https://orcid.org/0000-0002-5747-2186"},"institutions":[{"id":"https://openalex.org/I4210134249","display_name":"Centre for Research and Technology Hellas","ror":"https://ror.org/03bndpq63","country_code":"GR","type":"facility","lineage":["https://openalex.org/I4210134249"]}],"countries":["GR"],"is_corresponding":false,"raw_author_name":"Dimosthenis Ioannidis","raw_affiliation_strings":["Center for Research and Technology Hellas, Thessaloniki, Greece"],"affiliations":[{"raw_affiliation_string":"Center for Research and Technology Hellas, Thessaloniki, Greece","institution_ids":["https://openalex.org/I4210134249"]}]},{"author_position":"last","author":{"id":"https://openalex.org/A5087452615","display_name":"Dimitrios Tzovaras","orcid":"https://orcid.org/0000-0001-6915-6722"},"institutions":[{"id":"https://openalex.org/I4210134249","display_name":"Centre for Research and Technology Hellas","ror":"https://ror.org/03bndpq63","country_code":"GR","type":"facility","lineage":["https://openalex.org/I4210134249"]}],"countries":["GR"],"is_corresponding":false,"raw_author_name":"Dimitrios Tzovaras","raw_affiliation_strings":["Center for Research and Technology Hellas, Thessaloniki, Greece"],"affiliations":[{"raw_affiliation_string":"Center for Research and Technology Hellas, Thessaloniki, Greece","institution_ids":["https://openalex.org/I4210134249"]}]}],"institutions":[],"countries_distinct_count":1,"institutions_distinct_count":4,"corresponding_author_ids":["https://openalex.org/A5005936969"],"corresponding_institution_ids":["https://openalex.org/I4210134249"],"apc_list":null,"apc_paid":null,"fwci":0.4989,"has_fulltext":false,"cited_by_count":5,"citation_normalized_percentile":{"value":0.65179529,"is_in_top_1_percent":false,"is_in_top_10_percent":false},"cited_by_percentile_year":{"min":89,"max":96},"biblio":{"volume":null,"issue":null,"first_page":"1","last_page":"6"},"is_retracted":false,"is_paratext":false,"is_xpac":false,"primary_topic":{"id":"https://openalex.org/T10876","display_name":"Fault Detection and Control Systems","score":0.9991000294685364,"subfield":{"id":"https://openalex.org/subfields/2207","display_name":"Control and Systems Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},"topics":[{"id":"https://openalex.org/T10876","display_name":"Fault Detection and Control Systems","score":0.9991000294685364,"subfield":{"id":"https://openalex.org/subfields/2207","display_name":"Control and Systems Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T11443","display_name":"Advanced Statistical Process Monitoring","score":0.988099992275238,"subfield":{"id":"https://openalex.org/subfields/1804","display_name":"Statistics, Probability and Uncertainty"},"field":{"id":"https://openalex.org/fields/18","display_name":"Decision Sciences"},"domain":{"id":"https://openalex.org/domains/2","display_name":"Social Sciences"}},{"id":"https://openalex.org/T12111","display_name":"Industrial Vision Systems and Defect Detection","score":0.9858999848365784,"subfield":{"id":"https://openalex.org/subfields/2209","display_name":"Industrial and Manufacturing Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"keywords":[{"id":"https://openalex.org/keywords/computer-science","display_name":"Computer science","score":0.7296204566955566},{"id":"https://openalex.org/keywords/anomaly-detection","display_name":"Anomaly detection","score":0.6145460605621338},{"id":"https://openalex.org/keywords/unsupervised-learning","display_name":"Unsupervised learning","score":0.5869321823120117},{"id":"https://openalex.org/keywords/timestamp","display_name":"Timestamp","score":0.5809978246688843},{"id":"https://openalex.org/keywords/artificial-intelligence","display_name":"Artificial intelligence","score":0.575915515422821},{"id":"https://openalex.org/keywords/fault-detection-and-isolation","display_name":"Fault detection and isolation","score":0.5175966024398804},{"id":"https://openalex.org/keywords/machine-learning","display_name":"Machine learning","score":0.4554360508918762},{"id":"https://openalex.org/keywords/fault","display_name":"Fault (geology)","score":0.45257750153541565},{"id":"https://openalex.org/keywords/autoencoder","display_name":"Autoencoder","score":0.45162951946258545},{"id":"https://openalex.org/keywords/warning-system","display_name":"Warning system","score":0.45047271251678467},{"id":"https://openalex.org/keywords/process","display_name":"Process (computing)","score":0.44661444425582886},{"id":"https://openalex.org/keywords/frame","display_name":"Frame (networking)","score":0.4315551817417145},{"id":"https://openalex.org/keywords/feature-selection","display_name":"Feature selection","score":0.42859211564064026},{"id":"https://openalex.org/keywords/pattern-recognition","display_name":"Pattern recognition (psychology)","score":0.33674073219299316},{"id":"https://openalex.org/keywords/deep-learning","display_name":"Deep learning","score":0.26205894351005554},{"id":"https://openalex.org/keywords/real-time-computing","display_name":"Real-time computing","score":0.2410833239555359}],"concepts":[{"id":"https://openalex.org/C41008148","wikidata":"https://www.wikidata.org/wiki/Q21198","display_name":"Computer science","level":0,"score":0.7296204566955566},{"id":"https://openalex.org/C739882","wikidata":"https://www.wikidata.org/wiki/Q3560506","display_name":"Anomaly detection","level":2,"score":0.6145460605621338},{"id":"https://openalex.org/C8038995","wikidata":"https://www.wikidata.org/wiki/Q1152135","display_name":"Unsupervised learning","level":2,"score":0.5869321823120117},{"id":"https://openalex.org/C113954288","wikidata":"https://www.wikidata.org/wiki/Q186885","display_name":"Timestamp","level":2,"score":0.5809978246688843},{"id":"https://openalex.org/C154945302","wikidata":"https://www.wikidata.org/wiki/Q11660","display_name":"Artificial intelligence","level":1,"score":0.575915515422821},{"id":"https://openalex.org/C152745839","wikidata":"https://www.wikidata.org/wiki/Q5438153","display_name":"Fault detection and isolation","level":3,"score":0.5175966024398804},{"id":"https://openalex.org/C119857082","wikidata":"https://www.wikidata.org/wiki/Q2539","display_name":"Machine learning","level":1,"score":0.4554360508918762},{"id":"https://openalex.org/C175551986","wikidata":"https://www.wikidata.org/wiki/Q47089","display_name":"Fault (geology)","level":2,"score":0.45257750153541565},{"id":"https://openalex.org/C101738243","wikidata":"https://www.wikidata.org/wiki/Q786435","display_name":"Autoencoder","level":3,"score":0.45162951946258545},{"id":"https://openalex.org/C29825287","wikidata":"https://www.wikidata.org/wiki/Q1427940","display_name":"Warning system","level":2,"score":0.45047271251678467},{"id":"https://openalex.org/C98045186","wikidata":"https://www.wikidata.org/wiki/Q205663","display_name":"Process (computing)","level":2,"score":0.44661444425582886},{"id":"https://openalex.org/C126042441","wikidata":"https://www.wikidata.org/wiki/Q1324888","display_name":"Frame (networking)","level":2,"score":0.4315551817417145},{"id":"https://openalex.org/C148483581","wikidata":"https://www.wikidata.org/wiki/Q446488","display_name":"Feature selection","level":2,"score":0.42859211564064026},{"id":"https://openalex.org/C153180895","wikidata":"https://www.wikidata.org/wiki/Q7148389","display_name":"Pattern recognition (psychology)","level":2,"score":0.33674073219299316},{"id":"https://openalex.org/C108583219","wikidata":"https://www.wikidata.org/wiki/Q197536","display_name":"Deep learning","level":2,"score":0.26205894351005554},{"id":"https://openalex.org/C79403827","wikidata":"https://www.wikidata.org/wiki/Q3988","display_name":"Real-time computing","level":1,"score":0.2410833239555359},{"id":"https://openalex.org/C111919701","wikidata":"https://www.wikidata.org/wiki/Q9135","display_name":"Operating system","level":1,"score":0.0},{"id":"https://openalex.org/C76155785","wikidata":"https://www.wikidata.org/wiki/Q418","display_name":"Telecommunications","level":1,"score":0.0},{"id":"https://openalex.org/C172707124","wikidata":"https://www.wikidata.org/wiki/Q423488","display_name":"Actuator","level":2,"score":0.0},{"id":"https://openalex.org/C165205528","wikidata":"https://www.wikidata.org/wiki/Q83371","display_name":"Seismology","level":1,"score":0.0},{"id":"https://openalex.org/C127313418","wikidata":"https://www.wikidata.org/wiki/Q1069","display_name":"Geology","level":0,"score":0.0}],"mesh":[],"locations_count":1,"locations":[{"id":"doi:10.1109/inista.2019.8778419","is_oa":false,"landing_page_url":"https://doi.org/10.1109/inista.2019.8778419","pdf_url":null,"source":null,"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"2019 IEEE International Symposium on INnovations in Intelligent SysTems and Applications (INISTA)","raw_type":"proceedings-article"}],"best_oa_location":null,"sustainable_development_goals":[{"score":0.49000000953674316,"id":"https://metadata.un.org/sdg/9","display_name":"Industry, innovation and infrastructure"}],"awards":[],"funders":[],"has_content":{"pdf":false,"grobid_xml":false},"content_urls":null,"referenced_works_count":24,"referenced_works":["https://openalex.org/W1501062552","https://openalex.org/W1980262437","https://openalex.org/W1999393241","https://openalex.org/W2008182570","https://openalex.org/W2012079387","https://openalex.org/W2012634158","https://openalex.org/W2032170121","https://openalex.org/W2072525556","https://openalex.org/W2078005292","https://openalex.org/W2089052987","https://openalex.org/W2114131343","https://openalex.org/W2127103870","https://openalex.org/W2158698691","https://openalex.org/W2172064003","https://openalex.org/W2296719434","https://openalex.org/W2317866228","https://openalex.org/W2554110125","https://openalex.org/W2563121585","https://openalex.org/W2578380285","https://openalex.org/W2786086587","https://openalex.org/W2883439300","https://openalex.org/W2890198029","https://openalex.org/W4243563432","https://openalex.org/W4254182148"],"related_works":["https://openalex.org/W2060561905","https://openalex.org/W3186512740","https://openalex.org/W3194885736","https://openalex.org/W4363671829","https://openalex.org/W4285233543","https://openalex.org/W2806873178","https://openalex.org/W2965146396","https://openalex.org/W2770818364","https://openalex.org/W4312416532","https://openalex.org/W4230838436"],"abstract_inverted_index":{"This":[0],"work":[1],"presents":[2],"a":[3,38,104,122,127,145],"predictive":[4],"maintenance":[5],"methodology":[6],"aiming":[7],"at":[8],"forecasting":[9],"specific":[10],"types":[11],"of":[12,14,30,37,73,87,118,121,136],"faults":[13],"an":[15,147],"industrial":[16],"equipment":[17],"for":[18,59,116],"anode":[19],"production,":[20],"utilizing":[21],"process":[22],"sensor":[23],"data":[24,91],"from":[25],"operation":[26],"periods.":[27],"The":[28,93],"challenge":[29],"this":[31],"problem":[32],"is":[33,114,149],"the":[34,46,60,79,88,99,112,119,137],"early":[35],"detection":[36],"fault,":[39],"particularly":[40],"just":[41],"before":[42,111,143],"it":[43],"occurs.":[44],"For":[45],"forecasting,":[47],"some":[48],"unsupervised":[49],"machine":[50],"learning":[51],"architectures":[52],"were":[53,57,70],"tested.":[54],"Several":[55],"considerations":[56],"made":[58],"pre-processing":[61],"steps":[62],"as":[63],"well.":[64],"Finally,":[65],"automatic":[66],"feature":[67],"selection":[68],"methods":[69],"introduced,":[71],"one":[72],"which":[74,96],"was":[75],"used":[76],"to":[77,98],"find":[78],"most":[80],"significant":[81],"features":[82],"within":[83,126],"successive":[84],"time":[85,106],"windows":[86],"evaluated":[89],"historical":[90],"set.":[92],"experimental":[94],"results,":[95],"conform":[97],"visual":[100],"observations,":[101],"show":[102],"that":[103],"warning":[105],"frame":[107],"around":[108],"20":[109],"minutes":[110,142],"incident":[113],"feasible":[115],"43%":[117],"incidents":[120],"particular":[123],"fault":[124,146],"type":[125],"critical":[128],"1.5-month":[129],"period,":[130],"whereas":[131],"only":[132],"in":[133],"about":[134],"0.1%":[135],"timestamps":[138],"more":[139],"than":[140],"75":[141],"such":[144],"alarm":[148],"raised.":[150]},"counts_by_year":[{"year":2024,"cited_by_count":2},{"year":2022,"cited_by_count":2},{"year":2020,"cited_by_count":1}],"updated_date":"2025-11-06T03:46:38.306776","created_date":"2025-10-10T00:00:00"}