{"id":"https://openalex.org/W7119051354","doi":"https://doi.org/10.1109/indin64977.2025.11278971","title":"FD-MLLM: Fault Diagnosis Framework Based on Multimodal Data and Large Language Model","display_name":"FD-MLLM: Fault Diagnosis Framework Based on Multimodal Data and Large Language Model","publication_year":2025,"publication_date":"2025-07-12","ids":{"openalex":"https://openalex.org/W7119051354","doi":"https://doi.org/10.1109/indin64977.2025.11278971"},"language":null,"primary_location":{"id":"doi:10.1109/indin64977.2025.11278971","is_oa":false,"landing_page_url":"https://doi.org/10.1109/indin64977.2025.11278971","pdf_url":null,"source":null,"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"2025 IEEE 23rd International Conference on Industrial Informatics (INDIN)","raw_type":"proceedings-article"},"type":"article","indexed_in":["crossref"],"open_access":{"is_oa":false,"oa_status":"closed","oa_url":null,"any_repository_has_fulltext":false},"authorships":[{"author_position":"first","author":{"id":"https://openalex.org/A5102828049","display_name":"Dayang Li","orcid":"https://orcid.org/0000-0002-6931-7677"},"institutions":[{"id":"https://openalex.org/I196699116","display_name":"Wuhan University of Technology","ror":"https://ror.org/03fe7t173","country_code":"CN","type":"education","lineage":["https://openalex.org/I196699116"]}],"countries":["CN"],"is_corresponding":true,"raw_author_name":"Dayang Li","raw_affiliation_strings":["Wuhan University of Technology,School of Transportation and Logistics Engineering,Wuhan,China"],"affiliations":[{"raw_affiliation_string":"Wuhan University of Technology,School of Transportation and Logistics Engineering,Wuhan,China","institution_ids":["https://openalex.org/I196699116"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5121989609","display_name":"Zhibo Pang","orcid":null},"institutions":[{"id":"https://openalex.org/I86987016","display_name":"KTH Royal Institute of Technology","ror":"https://ror.org/026vcq606","country_code":"SE","type":"education","lineage":["https://openalex.org/I86987016"]}],"countries":["SE"],"is_corresponding":false,"raw_author_name":"Zhibo Pang","raw_affiliation_strings":["KTH Royal Institute of Technology,Department of Intelligent Systems,Stockholm,Sweden"],"affiliations":[{"raw_affiliation_string":"KTH Royal Institute of Technology,Department of Intelligent Systems,Stockholm,Sweden","institution_ids":["https://openalex.org/I86987016"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5100634445","display_name":"Kun Yang","orcid":"https://orcid.org/0000-0002-9956-2200"},"institutions":[{"id":"https://openalex.org/I196699116","display_name":"Wuhan University of Technology","ror":"https://ror.org/03fe7t173","country_code":"CN","type":"education","lineage":["https://openalex.org/I196699116"]}],"countries":["CN"],"is_corresponding":false,"raw_author_name":"Kun Yang","raw_affiliation_strings":["Wuhan University of Technology,School of Transportation and Logistics Engineering,Wuhan,China"],"affiliations":[{"raw_affiliation_string":"Wuhan University of Technology,School of Transportation and Logistics Engineering,Wuhan,China","institution_ids":["https://openalex.org/I196699116"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5122169098","display_name":"Yichen Luo","orcid":null},"institutions":[{"id":"https://openalex.org/I86987016","display_name":"KTH Royal Institute of Technology","ror":"https://ror.org/026vcq606","country_code":"SE","type":"education","lineage":["https://openalex.org/I86987016"]}],"countries":["SE"],"is_corresponding":false,"raw_author_name":"Yichen Luo","raw_affiliation_strings":["KTH Royal Institute of Technology,Department of Intelligent Systems,Stockholm,Sweden"],"affiliations":[{"raw_affiliation_string":"KTH Royal Institute of Technology,Department of Intelligent Systems,Stockholm,Sweden","institution_ids":["https://openalex.org/I86987016"]}]},{"author_position":"last","author":{"id":"https://openalex.org/A5122117655","display_name":"Yanghang Zeng","orcid":null},"institutions":[{"id":"https://openalex.org/I86987016","display_name":"KTH Royal Institute of Technology","ror":"https://ror.org/026vcq606","country_code":"SE","type":"education","lineage":["https://openalex.org/I86987016"]}],"countries":["SE"],"is_corresponding":false,"raw_author_name":"Yanghang Zeng","raw_affiliation_strings":["KTH Royal Institute of Technology,Department of Intelligent Systems,Stockholm,Sweden"],"affiliations":[{"raw_affiliation_string":"KTH Royal Institute of Technology,Department of Intelligent Systems,Stockholm,Sweden","institution_ids":["https://openalex.org/I86987016"]}]}],"institutions":[],"countries_distinct_count":2,"institutions_distinct_count":5,"corresponding_author_ids":["https://openalex.org/A5102828049"],"corresponding_institution_ids":["https://openalex.org/I196699116"],"apc_list":null,"apc_paid":null,"fwci":0.0,"has_fulltext":false,"cited_by_count":0,"citation_normalized_percentile":{"value":0.67065771,"is_in_top_1_percent":false,"is_in_top_10_percent":false},"cited_by_percentile_year":null,"biblio":{"volume":null,"issue":null,"first_page":"1","last_page":"7"},"is_retracted":false,"is_paratext":false,"is_xpac":false,"primary_topic":{"id":"https://openalex.org/T10220","display_name":"Machine Fault Diagnosis Techniques","score":0.7652999758720398,"subfield":{"id":"https://openalex.org/subfields/2207","display_name":"Control and Systems Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},"topics":[{"id":"https://openalex.org/T10220","display_name":"Machine Fault Diagnosis Techniques","score":0.7652999758720398,"subfield":{"id":"https://openalex.org/subfields/2207","display_name":"Control and Systems Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T10876","display_name":"Fault Detection and Control Systems","score":0.023099999874830246,"subfield":{"id":"https://openalex.org/subfields/2207","display_name":"Control and Systems Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T11512","display_name":"Anomaly Detection Techniques and Applications","score":0.011800000444054604,"subfield":{"id":"https://openalex.org/subfields/1702","display_name":"Artificial Intelligence"},"field":{"id":"https://openalex.org/fields/17","display_name":"Computer Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"keywords":[{"id":"https://openalex.org/keywords/fault","display_name":"Fault (geology)","score":0.5830000042915344},{"id":"https://openalex.org/keywords/key","display_name":"Key (lock)","score":0.5002999901771545},{"id":"https://openalex.org/keywords/feature","display_name":"Feature (linguistics)","score":0.3921999931335449},{"id":"https://openalex.org/keywords/natural-language","display_name":"Natural language","score":0.34369999170303345},{"id":"https://openalex.org/keywords/reliability","display_name":"Reliability (semiconductor)","score":0.3336000144481659}],"concepts":[{"id":"https://openalex.org/C41008148","wikidata":"https://www.wikidata.org/wiki/Q21198","display_name":"Computer science","level":0,"score":0.6503999829292297},{"id":"https://openalex.org/C175551986","wikidata":"https://www.wikidata.org/wiki/Q47089","display_name":"Fault (geology)","level":2,"score":0.5830000042915344},{"id":"https://openalex.org/C26517878","wikidata":"https://www.wikidata.org/wiki/Q228039","display_name":"Key (lock)","level":2,"score":0.5002999901771545},{"id":"https://openalex.org/C2522767166","wikidata":"https://www.wikidata.org/wiki/Q2374463","display_name":"Data science","level":1,"score":0.4115999937057495},{"id":"https://openalex.org/C2776401178","wikidata":"https://www.wikidata.org/wiki/Q12050496","display_name":"Feature (linguistics)","level":2,"score":0.3921999931335449},{"id":"https://openalex.org/C154945302","wikidata":"https://www.wikidata.org/wiki/Q11660","display_name":"Artificial intelligence","level":1,"score":0.3646000027656555},{"id":"https://openalex.org/C195324797","wikidata":"https://www.wikidata.org/wiki/Q33742","display_name":"Natural language","level":2,"score":0.34369999170303345},{"id":"https://openalex.org/C43214815","wikidata":"https://www.wikidata.org/wiki/Q7310987","display_name":"Reliability (semiconductor)","level":3,"score":0.3336000144481659},{"id":"https://openalex.org/C112930515","wikidata":"https://www.wikidata.org/wiki/Q4389547","display_name":"Risk analysis (engineering)","level":1,"score":0.31520000100135803},{"id":"https://openalex.org/C167391956","wikidata":"https://www.wikidata.org/wiki/Q1401211","display_name":"Fault model","level":3,"score":0.30379998683929443},{"id":"https://openalex.org/C33954974","wikidata":"https://www.wikidata.org/wiki/Q486494","display_name":"Sensor fusion","level":2,"score":0.2935999929904938},{"id":"https://openalex.org/C119857082","wikidata":"https://www.wikidata.org/wiki/Q2539","display_name":"Machine learning","level":1,"score":0.2759000062942505}],"mesh":[],"locations_count":1,"locations":[{"id":"doi:10.1109/indin64977.2025.11278971","is_oa":false,"landing_page_url":"https://doi.org/10.1109/indin64977.2025.11278971","pdf_url":null,"source":null,"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"2025 IEEE 23rd International Conference on Industrial Informatics (INDIN)","raw_type":"proceedings-article"}],"best_oa_location":null,"sustainable_development_goals":[{"display_name":"Industry, innovation and infrastructure","id":"https://metadata.un.org/sdg/9","score":0.613793671131134}],"awards":[],"funders":[],"has_content":{"pdf":false,"grobid_xml":false},"content_urls":null,"referenced_works_count":45,"referenced_works":["https://openalex.org/W1965491739","https://openalex.org/W1971730535","https://openalex.org/W2035115427","https://openalex.org/W2079558517","https://openalex.org/W2117691915","https://openalex.org/W2158958729","https://openalex.org/W2219903032","https://openalex.org/W2258884143","https://openalex.org/W2793454459","https://openalex.org/W3082288737","https://openalex.org/W3127166206","https://openalex.org/W3154236835","https://openalex.org/W3162930711","https://openalex.org/W3178234265","https://openalex.org/W3183895848","https://openalex.org/W3197050061","https://openalex.org/W3212568677","https://openalex.org/W4210521233","https://openalex.org/W4214900601","https://openalex.org/W4224035554","https://openalex.org/W4225949809","https://openalex.org/W4295857769","https://openalex.org/W4385164090","https://openalex.org/W4389166736","https://openalex.org/W4389352646","https://openalex.org/W4389664922","https://openalex.org/W4392607872","https://openalex.org/W4393110777","https://openalex.org/W4393185911","https://openalex.org/W4400111168","https://openalex.org/W4401856300","https://openalex.org/W4402277737","https://openalex.org/W4402515744","https://openalex.org/W4402721707","https://openalex.org/W4402978641","https://openalex.org/W4403841197","https://openalex.org/W4404343884","https://openalex.org/W4404634756","https://openalex.org/W4404690698","https://openalex.org/W4405305844","https://openalex.org/W4405317693","https://openalex.org/W4405645597","https://openalex.org/W4405844927","https://openalex.org/W4407312842","https://openalex.org/W4409792443"],"related_works":[],"abstract_inverted_index":{"As":[0],"industrial":[1],"equipment":[2],"becomes":[3],"increasingly":[4],"complex":[5],"and":[6,22,43,60,105,114,123,127,138,153,159,173,181,185,193,211,217],"intelligent,":[7],"fault":[8,34,77,128,141,179,200,221],"diagnosis":[9,35,78,142,180,222],"(FD)":[10],"technology":[11],"has":[12],"emerged":[13],"as":[14,148],"a":[15,75],"critical":[16],"means":[17],"to":[18,50,109,120,205],"ensure":[19],"system":[20],"reliability":[21],"safety,":[23],"spurring":[24],"the":[25,53,63,70,134,161,171,190,215],"development":[26,135],"of":[27,66,117,136,175,195,219],"various":[28],"real-time":[29],"online":[30],"monitoring":[31],"techniques.":[32],"Traditional":[33],"methods":[36,90],"primarily":[37],"rely":[38],"on":[39,189],"single":[40],"data":[41,55],"sources":[42],"specific":[44],"algorithms,":[45],"which":[46],"makes":[47],"it":[48],"challenging":[49],"effectively":[51],"integrate":[52],"multimodal":[54,87,118,139,199],"captured":[56],"by":[57,165],"diverse":[58],"sensors":[59],"often":[61],"overlooks":[62],"vital":[64],"role":[65],"human":[67],"expertise":[68],"in":[69,99,178,198],"diagnostic":[71],"process.":[72],"By":[73],"leveraging":[74],"universal":[76],"framework":[79],"that":[80],"combines":[81],"Large":[82],"Language":[83],"Models":[84],"(LLMs)":[85],"with":[86],"data,":[88],"existing":[89],"can":[91],"be":[92],"seamlessly":[93],"integrated.":[94],"LLMs":[95,197],"possess":[96],"powerful":[97],"capabilities":[98],"natural":[100],"language":[101],"understanding,":[102],"knowledge":[103,125],"integration,":[104],"reasoning,":[106],"enabling":[107],"them":[108],"analyze":[110],"text,":[111],"images,":[112],"signals,":[113],"other":[115],"types":[116],"information":[119],"facilitate":[121],"zero-shot":[122],"few-shot":[124],"reasoning":[126],"diagnosis.":[129,201],"This":[130],"paper":[131],"systematically":[132],"reviews":[133],"LLM-":[137],"data-based":[140],"technologies,":[143],"outlines":[144],"key":[145],"techniques":[146],"such":[147],"data-driven":[149],"processing,":[150],"feature":[151,154],"extraction,":[152],"fusion":[155],"within":[156],"LLM":[157],"frameworks,":[158],"analyzes":[160],"technological":[162],"advancements":[163],"fostered":[164],"these":[166],"methods.":[167],"It":[168],"also":[169],"summarizes":[170],"advantages":[172],"limitations":[174],"this":[176],"approach":[177],"health":[182],"state":[183],"assessment,":[184],"offers":[186],"an":[187],"outlook":[188],"future":[191],"trends":[192],"challenges":[194],"applying":[196],"The":[202],"aim":[203],"is":[204],"provide":[206],"technical":[207],"guidance":[208],"for":[209],"researchers":[210],"engineers,":[212],"thereby":[213],"accelerating":[214],"innovation":[216],"application":[218],"intelligent":[220],"technologies.":[223]},"counts_by_year":[],"updated_date":"2026-01-08T20:10:11.968330","created_date":"2026-01-08T00:00:00"}