{"id":"https://openalex.org/W7118280970","doi":"https://doi.org/10.1109/indin64977.2025.11278918","title":"Surface Roughness Measurement for Aeroengine Blades Based on 3D Visual Measurement","display_name":"Surface Roughness Measurement for Aeroengine Blades Based on 3D Visual Measurement","publication_year":2025,"publication_date":"2025-07-12","ids":{"openalex":"https://openalex.org/W7118280970","doi":"https://doi.org/10.1109/indin64977.2025.11278918"},"language":null,"primary_location":{"id":"doi:10.1109/indin64977.2025.11278918","is_oa":false,"landing_page_url":"https://doi.org/10.1109/indin64977.2025.11278918","pdf_url":null,"source":null,"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"2025 IEEE 23rd International Conference on Industrial Informatics (INDIN)","raw_type":"proceedings-article"},"type":"article","indexed_in":["crossref"],"open_access":{"is_oa":false,"oa_status":"closed","oa_url":null,"any_repository_has_fulltext":false},"authorships":[{"author_position":"first","author":{"id":"https://openalex.org/A5020100948","display_name":"Yue Xu","orcid":null},"institutions":[{"id":"https://openalex.org/I157507598","display_name":"Shenyang University of Technology","ror":"https://ror.org/00d7f8730","country_code":"CN","type":"education","lineage":["https://openalex.org/I157507598"]}],"countries":["CN"],"is_corresponding":true,"raw_author_name":"Yue Xu","raw_affiliation_strings":["Shenyang University of Technology,Shenyang,China"],"affiliations":[{"raw_affiliation_string":"Shenyang University of Technology,Shenyang,China","institution_ids":["https://openalex.org/I157507598"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5121811509","display_name":"Yinlong Zhang","orcid":null},"institutions":[{"id":"https://openalex.org/I19820366","display_name":"Chinese Academy of Sciences","ror":"https://ror.org/034t30j35","country_code":"CN","type":"funder","lineage":["https://openalex.org/I19820366"]},{"id":"https://openalex.org/I142078773","display_name":"Shenyang Institute of Automation","ror":"https://ror.org/00ft6nj33","country_code":"CN","type":"facility","lineage":["https://openalex.org/I142078773","https://openalex.org/I19820366"]}],"countries":["CN"],"is_corresponding":false,"raw_author_name":"Yinlong Zhang","raw_affiliation_strings":["Chinese Academy of Sciences,State Key Laboratory of Robotics Shenyang Institute of Automation,Shenyang,China"],"affiliations":[{"raw_affiliation_string":"Chinese Academy of Sciences,State Key Laboratory of Robotics Shenyang Institute of Automation,Shenyang,China","institution_ids":["https://openalex.org/I142078773","https://openalex.org/I19820366"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5122262577","display_name":"Tianyu Wang","orcid":null},"institutions":[{"id":"https://openalex.org/I48780066","display_name":"Shenyang University of Chemical Technology","ror":"https://ror.org/03dbpdh75","country_code":"CN","type":"education","lineage":["https://openalex.org/I48780066"]}],"countries":["CN"],"is_corresponding":false,"raw_author_name":"Tianyu Wang","raw_affiliation_strings":["Shenyang University Of Chemical Technology,Shenyang,China"],"affiliations":[{"raw_affiliation_string":"Shenyang University Of Chemical Technology,Shenyang,China","institution_ids":["https://openalex.org/I48780066"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5086177555","display_name":"Mingsen Chen","orcid":"https://orcid.org/0000-0003-3324-4215"},"institutions":[{"id":"https://openalex.org/I4210129955","display_name":"General Hospital of Shenyang Military Region","ror":"https://ror.org/0340t0585","country_code":"CN","type":"healthcare","lineage":["https://openalex.org/I4210129955"]}],"countries":["CN"],"is_corresponding":false,"raw_author_name":"Mingsen Chen","raw_affiliation_strings":["General Hospital of Northern Theater Command,Shenyang,China"],"affiliations":[{"raw_affiliation_string":"General Hospital of Northern Theater Command,Shenyang,China","institution_ids":["https://openalex.org/I4210129955"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5122147158","display_name":"Chu Wang","orcid":null},"institutions":[{"id":"https://openalex.org/I142078773","display_name":"Shenyang Institute of Automation","ror":"https://ror.org/00ft6nj33","country_code":"CN","type":"facility","lineage":["https://openalex.org/I142078773","https://openalex.org/I19820366"]},{"id":"https://openalex.org/I19820366","display_name":"Chinese Academy of Sciences","ror":"https://ror.org/034t30j35","country_code":"CN","type":"funder","lineage":["https://openalex.org/I19820366"]}],"countries":["CN"],"is_corresponding":false,"raw_author_name":"Chu Wang","raw_affiliation_strings":["Chinese Academy of Sciences,State Key Laboratory of Robotics Shenyang Institute of Automation,Shenyang,China"],"affiliations":[{"raw_affiliation_string":"Chinese Academy of Sciences,State Key Laboratory of Robotics Shenyang Institute of Automation,Shenyang,China","institution_ids":["https://openalex.org/I142078773","https://openalex.org/I19820366"]}]},{"author_position":"last","author":{"id":"https://openalex.org/A5122058850","display_name":"Yang Li","orcid":null},"institutions":[{"id":"https://openalex.org/I1328775524","display_name":"Zhejiang Sci-Tech University","ror":"https://ror.org/03893we55","country_code":"CN","type":"education","lineage":["https://openalex.org/I1328775524"]}],"countries":["CN"],"is_corresponding":false,"raw_author_name":"Yang Li","raw_affiliation_strings":["Zhejiang Sci-Tech University,Hangzhou,China"],"affiliations":[{"raw_affiliation_string":"Zhejiang Sci-Tech University,Hangzhou,China","institution_ids":["https://openalex.org/I1328775524"]}]}],"institutions":[],"countries_distinct_count":1,"institutions_distinct_count":6,"corresponding_author_ids":["https://openalex.org/A5020100948"],"corresponding_institution_ids":["https://openalex.org/I157507598"],"apc_list":null,"apc_paid":null,"fwci":0.0,"has_fulltext":false,"cited_by_count":0,"citation_normalized_percentile":{"value":0.68114883,"is_in_top_1_percent":false,"is_in_top_10_percent":false},"cited_by_percentile_year":null,"biblio":{"volume":null,"issue":null,"first_page":"1","last_page":"6"},"is_retracted":false,"is_paratext":false,"is_xpac":false,"primary_topic":{"id":"https://openalex.org/T13049","display_name":"Surface Roughness and Optical Measurements","score":0.4609000086784363,"subfield":{"id":"https://openalex.org/subfields/2206","display_name":"Computational Mechanics"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},"topics":[{"id":"https://openalex.org/T13049","display_name":"Surface Roughness and Optical Measurements","score":0.4609000086784363,"subfield":{"id":"https://openalex.org/subfields/2206","display_name":"Computational Mechanics"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T12111","display_name":"Industrial Vision Systems and Defect Detection","score":0.0674000009894371,"subfield":{"id":"https://openalex.org/subfields/2209","display_name":"Industrial and Manufacturing Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T10360","display_name":"Fluid Dynamics and Turbulent Flows","score":0.039900001138448715,"subfield":{"id":"https://openalex.org/subfields/2206","display_name":"Computational Mechanics"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"keywords":[{"id":"https://openalex.org/keywords/curvature","display_name":"Curvature","score":0.5873000025749207},{"id":"https://openalex.org/keywords/surface-roughness","display_name":"Surface roughness","score":0.5722000002861023},{"id":"https://openalex.org/keywords/reliability","display_name":"Reliability (semiconductor)","score":0.4641000032424927},{"id":"https://openalex.org/keywords/surface-finish","display_name":"Surface finish","score":0.4406000077724457},{"id":"https://openalex.org/keywords/decoupling","display_name":"Decoupling (probability)","score":0.4399000108242035},{"id":"https://openalex.org/keywords/noise","display_name":"Noise (video)","score":0.435699999332428},{"id":"https://openalex.org/keywords/leading-edge","display_name":"Leading edge","score":0.423799991607666},{"id":"https://openalex.org/keywords/aerodynamics","display_name":"Aerodynamics","score":0.39160001277923584}],"concepts":[{"id":"https://openalex.org/C195065555","wikidata":"https://www.wikidata.org/wiki/Q214881","display_name":"Curvature","level":2,"score":0.5873000025749207},{"id":"https://openalex.org/C107365816","wikidata":"https://www.wikidata.org/wiki/Q114817","display_name":"Surface roughness","level":2,"score":0.5722000002861023},{"id":"https://openalex.org/C43214815","wikidata":"https://www.wikidata.org/wiki/Q7310987","display_name":"Reliability (semiconductor)","level":3,"score":0.4641000032424927},{"id":"https://openalex.org/C127413603","wikidata":"https://www.wikidata.org/wiki/Q11023","display_name":"Engineering","level":0,"score":0.44600000977516174},{"id":"https://openalex.org/C71039073","wikidata":"https://www.wikidata.org/wiki/Q3439090","display_name":"Surface finish","level":2,"score":0.4406000077724457},{"id":"https://openalex.org/C205606062","wikidata":"https://www.wikidata.org/wiki/Q5249645","display_name":"Decoupling (probability)","level":2,"score":0.4399000108242035},{"id":"https://openalex.org/C99498987","wikidata":"https://www.wikidata.org/wiki/Q2210247","display_name":"Noise (video)","level":3,"score":0.435699999332428},{"id":"https://openalex.org/C2779570065","wikidata":"https://www.wikidata.org/wiki/Q1754137","display_name":"Leading edge","level":2,"score":0.423799991607666},{"id":"https://openalex.org/C13393347","wikidata":"https://www.wikidata.org/wiki/Q8424","display_name":"Aerodynamics","level":2,"score":0.39160001277923584},{"id":"https://openalex.org/C37649242","wikidata":"https://www.wikidata.org/wiki/Q932268","display_name":"System of measurement","level":2,"score":0.3806000053882599},{"id":"https://openalex.org/C162307627","wikidata":"https://www.wikidata.org/wiki/Q204833","display_name":"Enhanced Data Rates for GSM Evolution","level":2,"score":0.36329999566078186},{"id":"https://openalex.org/C2780513914","wikidata":"https://www.wikidata.org/wiki/Q18210350","display_name":"Bottleneck","level":2,"score":0.3546000123023987},{"id":"https://openalex.org/C202799725","wikidata":"https://www.wikidata.org/wiki/Q272035","display_name":"Accuracy and precision","level":2,"score":0.3465000092983246},{"id":"https://openalex.org/C24890656","wikidata":"https://www.wikidata.org/wiki/Q82811","display_name":"Acoustics","level":1,"score":0.34060001373291016},{"id":"https://openalex.org/C78519656","wikidata":"https://www.wikidata.org/wiki/Q101333","display_name":"Mechanical engineering","level":1,"score":0.3400000035762787},{"id":"https://openalex.org/C154945302","wikidata":"https://www.wikidata.org/wiki/Q11660","display_name":"Artificial intelligence","level":1,"score":0.33090001344680786},{"id":"https://openalex.org/C66938386","wikidata":"https://www.wikidata.org/wiki/Q633538","display_name":"Structural engineering","level":1,"score":0.32910001277923584},{"id":"https://openalex.org/C41008148","wikidata":"https://www.wikidata.org/wiki/Q21198","display_name":"Computer science","level":0,"score":0.323199987411499},{"id":"https://openalex.org/C89600930","wikidata":"https://www.wikidata.org/wiki/Q1423946","display_name":"Segmentation","level":2,"score":0.3172999918460846},{"id":"https://openalex.org/C50644808","wikidata":"https://www.wikidata.org/wiki/Q192776","display_name":"Artificial neural network","level":2,"score":0.30250000953674316},{"id":"https://openalex.org/C2776132848","wikidata":"https://www.wikidata.org/wiki/Q3045036","display_name":"Blade (archaeology)","level":2,"score":0.2831000089645386},{"id":"https://openalex.org/C31972630","wikidata":"https://www.wikidata.org/wiki/Q844240","display_name":"Computer vision","level":1,"score":0.2818000018596649},{"id":"https://openalex.org/C19619285","wikidata":"https://www.wikidata.org/wiki/Q196372","display_name":"Observational error","level":2,"score":0.2754000127315521},{"id":"https://openalex.org/C171635847","wikidata":"https://www.wikidata.org/wiki/Q406983","display_name":"Micrometer","level":2,"score":0.26579999923706055},{"id":"https://openalex.org/C24326235","wikidata":"https://www.wikidata.org/wiki/Q126095","display_name":"Electronic engineering","level":1,"score":0.2621999979019165},{"id":"https://openalex.org/C47422493","wikidata":"https://www.wikidata.org/wiki/Q2755127","display_name":"Wedge (geometry)","level":2,"score":0.2517000138759613}],"mesh":[],"locations_count":1,"locations":[{"id":"doi:10.1109/indin64977.2025.11278918","is_oa":false,"landing_page_url":"https://doi.org/10.1109/indin64977.2025.11278918","pdf_url":null,"source":null,"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"2025 IEEE 23rd International Conference on Industrial Informatics (INDIN)","raw_type":"proceedings-article"}],"best_oa_location":null,"sustainable_development_goals":[],"awards":[],"funders":[],"has_content":{"grobid_xml":false,"pdf":false},"content_urls":null,"referenced_works_count":11,"referenced_works":["https://openalex.org/W1987449424","https://openalex.org/W1999478155","https://openalex.org/W2049981393","https://openalex.org/W2085261163","https://openalex.org/W2960986959","https://openalex.org/W2981024507","https://openalex.org/W3012494314","https://openalex.org/W4214755140","https://openalex.org/W4255471874","https://openalex.org/W4386076422","https://openalex.org/W4399206244"],"related_works":[],"abstract_inverted_index":{"To":[0],"address":[1],"the":[2,23,33,75],"reliability":[3],"requirements":[4],"of":[5,11,36],"aeroengine":[6],"blades":[7],"under":[8],"extreme":[9],"conditions":[10],"high":[12,14],"temperature,":[13],"pressure,":[15],"and":[16,54,106],"severe":[17],"aerodynamic":[18],"loads,":[19],"this":[20],"study":[21],"presents":[22],"PointCurNor":[24],"network":[25,49],"architecture":[26],"based":[27],"on":[28],"edge":[29],"awareness.":[30],"It":[31],"targets":[32],"technology":[34],"bottleneck":[35],"limited":[37],"measurement":[38,89,105],"accuracy":[39,98],"due":[40],"to":[41],"under-segmentation":[42],"in":[43,96],"blade":[44],"surface":[45],"roughness":[46,104],"detection.":[47],"The":[48],"integrates":[50],"multi-scale":[51],"curvature":[52,84],"features":[53],"normal":[55],"vector":[56],"representations,":[57],"creating":[58],"a":[59],"decoupling":[60],"mechanism":[61],"for":[62,71],"sub-component":[63],"boundaries.":[64],"By":[65],"using":[66],"an":[67],"equal":[68],"block-based":[69],"algorithm":[70],"abnormal":[72],"region":[73],"removal,":[74],"method":[76],"effectively":[77],"suppresses":[78],"noise":[79],"from":[80],"areas":[81],"with":[82],"abrupt":[83],"changes,":[85],"achieving":[86],"micrometer":[87],"level":[88],"accuracy.":[90],"Experimental":[91],"results":[92],"show":[93],"obvious":[94],"improvements":[95],"segmentation":[97],"at":[99],"complex":[100],"interfaces,":[101],"ensuring":[102],"precise":[103],"enhancing":[107],"overall":[108],"detection":[109],"efficiency.":[110]},"counts_by_year":[],"updated_date":"2026-01-08T20:10:11.968330","created_date":"2026-01-08T00:00:00"}