{"id":"https://openalex.org/W3169328698","doi":"https://doi.org/10.1109/indin45582.2020.9442204","title":"Semi-supervised Learning Approach to Abnormality Detection with Complementary Features","display_name":"Semi-supervised Learning Approach to Abnormality Detection with Complementary Features","publication_year":2020,"publication_date":"2020-07-20","ids":{"openalex":"https://openalex.org/W3169328698","doi":"https://doi.org/10.1109/indin45582.2020.9442204","mag":"3169328698"},"language":"en","primary_location":{"id":"doi:10.1109/indin45582.2020.9442204","is_oa":false,"landing_page_url":"https://doi.org/10.1109/indin45582.2020.9442204","pdf_url":null,"source":null,"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"2020 IEEE 18th International Conference on Industrial Informatics (INDIN)","raw_type":"proceedings-article"},"type":"article","indexed_in":["crossref"],"open_access":{"is_oa":false,"oa_status":"closed","oa_url":null,"any_repository_has_fulltext":false},"authorships":[{"author_position":"first","author":{"id":"https://openalex.org/A5042740204","display_name":"Shaowen Lu","orcid":"https://orcid.org/0000-0003-3537-8620"},"institutions":[{"id":"https://openalex.org/I9224756","display_name":"Northeastern University","ror":"https://ror.org/03awzbc87","country_code":"CN","type":"education","lineage":["https://openalex.org/I9224756"]}],"countries":["CN"],"is_corresponding":true,"raw_author_name":"Shaowen Lu","raw_affiliation_strings":["State Key Laboratory of Synthetical Automation for Process Industries, Northeastern University, Shenyang, China"],"affiliations":[{"raw_affiliation_string":"State Key Laboratory of Synthetical Automation for Process Industries, Northeastern University, Shenyang, China","institution_ids":["https://openalex.org/I9224756"]}]},{"author_position":"last","author":{"id":"https://openalex.org/A5034563449","display_name":"Yixin Wen","orcid":"https://orcid.org/0000-0003-1618-1208"},"institutions":[{"id":"https://openalex.org/I9224756","display_name":"Northeastern University","ror":"https://ror.org/03awzbc87","country_code":"CN","type":"education","lineage":["https://openalex.org/I9224756"]}],"countries":["CN"],"is_corresponding":false,"raw_author_name":"Yixin Wen","raw_affiliation_strings":["State Key Laboratory of Synthetical Automation for Process Industries, Northeastern University, Shenyang, China"],"affiliations":[{"raw_affiliation_string":"State Key Laboratory of Synthetical Automation for Process Industries, Northeastern University, Shenyang, China","institution_ids":["https://openalex.org/I9224756"]}]}],"institutions":[],"countries_distinct_count":1,"institutions_distinct_count":2,"corresponding_author_ids":["https://openalex.org/A5042740204"],"corresponding_institution_ids":["https://openalex.org/I9224756"],"apc_list":null,"apc_paid":null,"fwci":0.0,"has_fulltext":false,"cited_by_count":1,"citation_normalized_percentile":{"value":0.24900435,"is_in_top_1_percent":false,"is_in_top_10_percent":false},"cited_by_percentile_year":{"min":90,"max":94},"biblio":{"volume":null,"issue":null,"first_page":"110","last_page":"114"},"is_retracted":false,"is_paratext":false,"is_xpac":false,"primary_topic":{"id":"https://openalex.org/T10876","display_name":"Fault Detection and Control Systems","score":0.9865999817848206,"subfield":{"id":"https://openalex.org/subfields/2207","display_name":"Control and Systems Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},"topics":[{"id":"https://openalex.org/T10876","display_name":"Fault Detection and Control Systems","score":0.9865999817848206,"subfield":{"id":"https://openalex.org/subfields/2207","display_name":"Control and Systems Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T12111","display_name":"Industrial Vision Systems and Defect Detection","score":0.9718000292778015,"subfield":{"id":"https://openalex.org/subfields/2209","display_name":"Industrial and Manufacturing Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T12169","display_name":"Non-Destructive Testing Techniques","score":0.9664999842643738,"subfield":{"id":"https://openalex.org/subfields/2210","display_name":"Mechanical Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"keywords":[{"id":"https://openalex.org/keywords/artificial-intelligence","display_name":"Artificial intelligence","score":0.6592916250228882},{"id":"https://openalex.org/keywords/computer-science","display_name":"Computer science","score":0.641521692276001},{"id":"https://openalex.org/keywords/classifier","display_name":"Classifier (UML)","score":0.5873861908912659},{"id":"https://openalex.org/keywords/pattern-recognition","display_name":"Pattern recognition (psychology)","score":0.5499278903007507},{"id":"https://openalex.org/keywords/entropy","display_name":"Entropy (arrow of time)","score":0.5271071195602417},{"id":"https://openalex.org/keywords/machine-learning","display_name":"Machine learning","score":0.4670946002006531},{"id":"https://openalex.org/keywords/abnormality","display_name":"Abnormality","score":0.4365418255329132}],"concepts":[{"id":"https://openalex.org/C154945302","wikidata":"https://www.wikidata.org/wiki/Q11660","display_name":"Artificial intelligence","level":1,"score":0.6592916250228882},{"id":"https://openalex.org/C41008148","wikidata":"https://www.wikidata.org/wiki/Q21198","display_name":"Computer science","level":0,"score":0.641521692276001},{"id":"https://openalex.org/C95623464","wikidata":"https://www.wikidata.org/wiki/Q1096149","display_name":"Classifier (UML)","level":2,"score":0.5873861908912659},{"id":"https://openalex.org/C153180895","wikidata":"https://www.wikidata.org/wiki/Q7148389","display_name":"Pattern recognition (psychology)","level":2,"score":0.5499278903007507},{"id":"https://openalex.org/C106301342","wikidata":"https://www.wikidata.org/wiki/Q4117933","display_name":"Entropy (arrow of time)","level":2,"score":0.5271071195602417},{"id":"https://openalex.org/C119857082","wikidata":"https://www.wikidata.org/wiki/Q2539","display_name":"Machine learning","level":1,"score":0.4670946002006531},{"id":"https://openalex.org/C50965678","wikidata":"https://www.wikidata.org/wiki/Q2724302","display_name":"Abnormality","level":2,"score":0.4365418255329132},{"id":"https://openalex.org/C121332964","wikidata":"https://www.wikidata.org/wiki/Q413","display_name":"Physics","level":0,"score":0.0},{"id":"https://openalex.org/C62520636","wikidata":"https://www.wikidata.org/wiki/Q944","display_name":"Quantum mechanics","level":1,"score":0.0},{"id":"https://openalex.org/C77805123","wikidata":"https://www.wikidata.org/wiki/Q161272","display_name":"Social psychology","level":1,"score":0.0},{"id":"https://openalex.org/C15744967","wikidata":"https://www.wikidata.org/wiki/Q9418","display_name":"Psychology","level":0,"score":0.0}],"mesh":[],"locations_count":1,"locations":[{"id":"doi:10.1109/indin45582.2020.9442204","is_oa":false,"landing_page_url":"https://doi.org/10.1109/indin45582.2020.9442204","pdf_url":null,"source":null,"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"2020 IEEE 18th International Conference on Industrial Informatics (INDIN)","raw_type":"proceedings-article"}],"best_oa_location":null,"sustainable_development_goals":[],"awards":[{"id":"https://openalex.org/G40918233","display_name":null,"funder_award_id":"61833004","funder_id":"https://openalex.org/F4320321001","funder_display_name":"National Natural Science Foundation of China"}],"funders":[{"id":"https://openalex.org/F4320321001","display_name":"National Natural Science Foundation of China","ror":"https://ror.org/01h0zpd94"}],"has_content":{"pdf":false,"grobid_xml":false},"content_urls":null,"referenced_works_count":12,"referenced_works":["https://openalex.org/W1502364872","https://openalex.org/W1522950143","https://openalex.org/W1819608382","https://openalex.org/W1985658808","https://openalex.org/W2007463795","https://openalex.org/W2027225917","https://openalex.org/W2145494108","https://openalex.org/W2293363371","https://openalex.org/W3214304116","https://openalex.org/W4213425930","https://openalex.org/W4253187718","https://openalex.org/W6681588610"],"related_works":["https://openalex.org/W4247543202","https://openalex.org/W4243456421","https://openalex.org/W2417397217","https://openalex.org/W2355857550","https://openalex.org/W3093256375","https://openalex.org/W1841421040","https://openalex.org/W2896815346","https://openalex.org/W3028882978","https://openalex.org/W1487766990","https://openalex.org/W2993814504"],"abstract_inverted_index":{"This":[0,39],"paper":[1],"introduces":[2],"a":[3],"machine":[4],"learning":[5,46],"based":[6,91,98],"solution":[7,107],"to":[8,86],"the":[9,14,28,31,44,54,61,79,83,87],"practical":[10],"task":[11,29],"of":[12,19,33,72,82,89],"identifying":[13],"semi-molten":[15],"abnormal":[16],"working":[17],"condition":[18],"fused":[20],"magnesium":[21],"furnace.":[22],"The":[23,105],"primary":[24],"challenge":[25],"faced":[26],"by":[27,48],"is":[30,41,75,103,108],"insufficiency":[32],"labeled":[34],"samples":[35],"for":[36],"classifier":[37],"training.":[38],"problem":[40],"tackled":[42],"under":[43],"semi-supervised":[45],"framework":[47],"combining":[49],"two":[50],"complementary":[51],"features":[52],"i.e.":[53],"smelting":[55,84],"currents":[56],"which":[57,64,77],"are":[58,65],"unlabeled":[59],"and":[60,93],"monitoring":[62],"images":[63],"partially":[66],"labeled.":[67],"An":[68],"entropy":[69,101],"regularized":[70],"form":[71],"cost":[73],"function":[74],"designed":[76],"brings":[78],"distribution":[80],"pattern":[81],"current":[85],"training":[88],"image":[90],"classifier,":[92],"an":[94],"efficient":[95],"optimization":[96],"algorithm":[97],"on":[99,110],"cross":[100],"method":[102],"presented.":[104],"proposed":[106],"tested":[109],"industrial":[111],"dataset":[112],"showing":[113],"remarkable":[114],"result":[115],"in":[116],"accuracy.":[117]},"counts_by_year":[{"year":2024,"cited_by_count":1}],"updated_date":"2025-11-06T03:46:38.306776","created_date":"2025-10-10T00:00:00"}