{"id":"https://openalex.org/W2086517953","doi":"https://doi.org/10.1109/indin.2012.6301224","title":"An Electronic Pod and its finite element analysis","display_name":"An Electronic Pod and its finite element analysis","publication_year":2012,"publication_date":"2012-07-01","ids":{"openalex":"https://openalex.org/W2086517953","doi":"https://doi.org/10.1109/indin.2012.6301224","mag":"2086517953"},"language":"en","primary_location":{"id":"doi:10.1109/indin.2012.6301224","is_oa":false,"landing_page_url":"https://doi.org/10.1109/indin.2012.6301224","pdf_url":null,"source":null,"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"IEEE 10th International Conference on Industrial Informatics","raw_type":"proceedings-article"},"type":"article","indexed_in":["crossref"],"open_access":{"is_oa":false,"oa_status":"closed","oa_url":null,"any_repository_has_fulltext":false},"authorships":[{"author_position":"first","author":{"id":"https://openalex.org/A5011922024","display_name":"Dungong Yan","orcid":null},"institutions":[{"id":"https://openalex.org/I82880672","display_name":"Beihang University","ror":"https://ror.org/00wk2mp56","country_code":"CN","type":"education","lineage":["https://openalex.org/I82880672"]}],"countries":["CN"],"is_corresponding":true,"raw_author_name":"Dungong Yan","raw_affiliation_strings":["School of Automation Science and Electrical Engineering, Beihang University, 100191, Beijing, China"],"affiliations":[{"raw_affiliation_string":"School of Automation Science and Electrical Engineering, Beihang University, 100191, Beijing, China","institution_ids":["https://openalex.org/I82880672"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5081455498","display_name":"Jian Shi","orcid":"https://orcid.org/0000-0002-0366-0085"},"institutions":[{"id":"https://openalex.org/I82880672","display_name":"Beihang University","ror":"https://ror.org/00wk2mp56","country_code":"CN","type":"education","lineage":["https://openalex.org/I82880672"]}],"countries":["CN"],"is_corresponding":false,"raw_author_name":"Jian Shi","raw_affiliation_strings":["School of Automation Science and Electrical Engineering, Beihang University, 100191, Beijing, China"],"affiliations":[{"raw_affiliation_string":"School of Automation Science and Electrical Engineering, Beihang University, 100191, Beijing, China","institution_ids":["https://openalex.org/I82880672"]}]},{"author_position":"last","author":{"id":"https://openalex.org/A5055163407","display_name":"Shaoping Wang","orcid":"https://orcid.org/0000-0002-8102-3436"},"institutions":[{"id":"https://openalex.org/I82880672","display_name":"Beihang University","ror":"https://ror.org/00wk2mp56","country_code":"CN","type":"education","lineage":["https://openalex.org/I82880672"]}],"countries":["CN"],"is_corresponding":false,"raw_author_name":"Shaoping Wang","raw_affiliation_strings":["School of Automation Science and Electrical Engineering, Beihang University, 100191, Beijing, China"],"affiliations":[{"raw_affiliation_string":"School of Automation Science and Electrical Engineering, Beihang University, 100191, Beijing, China","institution_ids":["https://openalex.org/I82880672"]}]}],"institutions":[],"countries_distinct_count":1,"institutions_distinct_count":3,"corresponding_author_ids":["https://openalex.org/A5011922024"],"corresponding_institution_ids":["https://openalex.org/I82880672"],"apc_list":null,"apc_paid":null,"fwci":0.0,"has_fulltext":false,"cited_by_count":0,"citation_normalized_percentile":{"value":0.54321006,"is_in_top_1_percent":false,"is_in_top_10_percent":false},"cited_by_percentile_year":null,"biblio":{"volume":null,"issue":null,"first_page":"570","last_page":"573"},"is_retracted":false,"is_paratext":false,"is_xpac":false,"primary_topic":{"id":"https://openalex.org/T13257","display_name":"Advanced Control and Stabilization in Aerospace Systems","score":0.9991999864578247,"subfield":{"id":"https://openalex.org/subfields/2202","display_name":"Aerospace Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},"topics":[{"id":"https://openalex.org/T13257","display_name":"Advanced Control and Stabilization in Aerospace Systems","score":0.9991999864578247,"subfield":{"id":"https://openalex.org/subfields/2202","display_name":"Aerospace Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T14158","display_name":"Optical Systems and Laser Technology","score":0.9966999888420105,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T14257","display_name":"Advanced Measurement and Detection Methods","score":0.9937000274658203,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"keywords":[{"id":"https://openalex.org/keywords/point-of-delivery","display_name":"Point of delivery","score":0.9428977966308594},{"id":"https://openalex.org/keywords/finite-element-method","display_name":"Finite element method","score":0.7294245958328247},{"id":"https://openalex.org/keywords/reliability","display_name":"Reliability (semiconductor)","score":0.6305007338523865},{"id":"https://openalex.org/keywords/stiffness","display_name":"Stiffness","score":0.5628629922866821},{"id":"https://openalex.org/keywords/computer-science","display_name":"Computer science","score":0.5243668556213379},{"id":"https://openalex.org/keywords/electronic-engineering","display_name":"Electronic engineering","score":0.39522606134414673},{"id":"https://openalex.org/keywords/reliability-engineering","display_name":"Reliability engineering","score":0.3942704200744629},{"id":"https://openalex.org/keywords/engineering","display_name":"Engineering","score":0.3725685179233551},{"id":"https://openalex.org/keywords/structural-engineering","display_name":"Structural engineering","score":0.35099971294403076},{"id":"https://openalex.org/keywords/power","display_name":"Power (physics)","score":0.2978535294532776},{"id":"https://openalex.org/keywords/physics","display_name":"Physics","score":0.07588788866996765}],"concepts":[{"id":"https://openalex.org/C137776501","wikidata":"https://www.wikidata.org/wiki/Q7208270","display_name":"Point of delivery","level":2,"score":0.9428977966308594},{"id":"https://openalex.org/C135628077","wikidata":"https://www.wikidata.org/wiki/Q220184","display_name":"Finite element method","level":2,"score":0.7294245958328247},{"id":"https://openalex.org/C43214815","wikidata":"https://www.wikidata.org/wiki/Q7310987","display_name":"Reliability (semiconductor)","level":3,"score":0.6305007338523865},{"id":"https://openalex.org/C2779372316","wikidata":"https://www.wikidata.org/wiki/Q569057","display_name":"Stiffness","level":2,"score":0.5628629922866821},{"id":"https://openalex.org/C41008148","wikidata":"https://www.wikidata.org/wiki/Q21198","display_name":"Computer science","level":0,"score":0.5243668556213379},{"id":"https://openalex.org/C24326235","wikidata":"https://www.wikidata.org/wiki/Q126095","display_name":"Electronic engineering","level":1,"score":0.39522606134414673},{"id":"https://openalex.org/C200601418","wikidata":"https://www.wikidata.org/wiki/Q2193887","display_name":"Reliability engineering","level":1,"score":0.3942704200744629},{"id":"https://openalex.org/C127413603","wikidata":"https://www.wikidata.org/wiki/Q11023","display_name":"Engineering","level":0,"score":0.3725685179233551},{"id":"https://openalex.org/C66938386","wikidata":"https://www.wikidata.org/wiki/Q633538","display_name":"Structural engineering","level":1,"score":0.35099971294403076},{"id":"https://openalex.org/C163258240","wikidata":"https://www.wikidata.org/wiki/Q25342","display_name":"Power (physics)","level":2,"score":0.2978535294532776},{"id":"https://openalex.org/C121332964","wikidata":"https://www.wikidata.org/wiki/Q413","display_name":"Physics","level":0,"score":0.07588788866996765},{"id":"https://openalex.org/C6557445","wikidata":"https://www.wikidata.org/wiki/Q173113","display_name":"Agronomy","level":1,"score":0.0},{"id":"https://openalex.org/C86803240","wikidata":"https://www.wikidata.org/wiki/Q420","display_name":"Biology","level":0,"score":0.0},{"id":"https://openalex.org/C62520636","wikidata":"https://www.wikidata.org/wiki/Q944","display_name":"Quantum mechanics","level":1,"score":0.0}],"mesh":[],"locations_count":1,"locations":[{"id":"doi:10.1109/indin.2012.6301224","is_oa":false,"landing_page_url":"https://doi.org/10.1109/indin.2012.6301224","pdf_url":null,"source":null,"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"IEEE 10th International Conference on Industrial Informatics","raw_type":"proceedings-article"}],"best_oa_location":null,"sustainable_development_goals":[],"awards":[],"funders":[],"has_content":{"grobid_xml":false,"pdf":false},"content_urls":null,"referenced_works_count":7,"referenced_works":["https://openalex.org/W2085689611","https://openalex.org/W2119745013","https://openalex.org/W2348039715","https://openalex.org/W2349927787","https://openalex.org/W2355568373","https://openalex.org/W2369527241","https://openalex.org/W2383757361"],"related_works":["https://openalex.org/W2033512842","https://openalex.org/W4322734194","https://openalex.org/W1607054433","https://openalex.org/W3005535424","https://openalex.org/W4233600955","https://openalex.org/W2913665393","https://openalex.org/W2369695847","https://openalex.org/W2994319598","https://openalex.org/W2110842462","https://openalex.org/W4233757488"],"abstract_inverted_index":{"A":[0],"special":[1],"detection":[2,17],"device,":[3],"or":[4],"an":[5],"E-Pod":[6],"is":[7],"generally":[8],"installed":[9],"in":[10],"a":[11,24,34,57],"plane":[12],"to":[13,32,46,61],"perform":[14],"the":[15,30,48,63,66],"target":[16],"and":[18,39,44],"track":[19],"mission.":[20],"Aimed":[21],"at":[22],"designing":[23],"reliable":[25],"E-Pod,":[26,38],"This":[27],"paper":[28,55],"adopts":[29],"SolidWorks":[31],"build":[33],"physical":[35],"model":[36],"of":[37,59,65],"analyze":[40],"its":[41],"strength,":[42],"stiffness":[43],"frequency":[45],"assess":[47],"feasibility":[49],"for":[50],"further":[51],"improvement.":[52],"Then":[53],"this":[54],"offers":[56],"way":[58],"optimization":[60],"ensure":[62],"reliability":[64],"E-Pod.":[67]},"counts_by_year":[],"updated_date":"2026-03-25T13:04:00.132906","created_date":"2025-10-10T00:00:00"}