{"id":"https://openalex.org/W4411233442","doi":"https://doi.org/10.1109/imw61990.2025.11026930","title":"Novel Ultrafast Non-Destructive Readout of FeRAM by Low-Voltage Transient Current","display_name":"Novel Ultrafast Non-Destructive Readout of FeRAM by Low-Voltage Transient Current","publication_year":2025,"publication_date":"2025-05-18","ids":{"openalex":"https://openalex.org/W4411233442","doi":"https://doi.org/10.1109/imw61990.2025.11026930"},"language":"en","primary_location":{"id":"doi:10.1109/imw61990.2025.11026930","is_oa":false,"landing_page_url":"https://doi.org/10.1109/imw61990.2025.11026930","pdf_url":null,"source":null,"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"2025 IEEE International Memory Workshop (IMW)","raw_type":"proceedings-article"},"type":"article","indexed_in":["crossref"],"open_access":{"is_oa":false,"oa_status":"closed","oa_url":null,"any_repository_has_fulltext":false},"authorships":[{"author_position":"first","author":{"id":"https://openalex.org/A5073231454","display_name":"Mor M. Dahan","orcid":"https://orcid.org/0000-0002-4558-9002"},"institutions":[{"id":"https://openalex.org/I174306211","display_name":"Technion \u2013 Israel Institute of Technology","ror":"https://ror.org/03qryx823","country_code":"IL","type":"education","lineage":["https://openalex.org/I174306211"]}],"countries":["IL"],"is_corresponding":true,"raw_author_name":"Mor M. Dahan","raw_affiliation_strings":["Technion &#x2013; Israel Institute of Technology,Viterbi Faculty of Electrical and Computer Engineering,Haifa,Israel"],"affiliations":[{"raw_affiliation_string":"Technion &#x2013; Israel Institute of Technology,Viterbi Faculty of Electrical and Computer Engineering,Haifa,Israel","institution_ids":["https://openalex.org/I174306211"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5047752710","display_name":"Emanuel Ber","orcid":"https://orcid.org/0000-0002-2390-5924"},"institutions":[{"id":"https://openalex.org/I174306211","display_name":"Technion \u2013 Israel Institute of Technology","ror":"https://ror.org/03qryx823","country_code":"IL","type":"education","lineage":["https://openalex.org/I174306211"]}],"countries":["IL"],"is_corresponding":false,"raw_author_name":"Emanuel Ber","raw_affiliation_strings":["Technion &#x2013; Israel Institute of Technology,Viterbi Faculty of Electrical and Computer Engineering,Haifa,Israel"],"affiliations":[{"raw_affiliation_string":"Technion &#x2013; Israel Institute of Technology,Viterbi Faculty of Electrical and Computer Engineering,Haifa,Israel","institution_ids":["https://openalex.org/I174306211"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5021607930","display_name":"Florian Wunderwald","orcid":"https://orcid.org/0009-0009-5718-4828"},"institutions":[{"id":"https://openalex.org/I4210122489","display_name":"NaMLab (Germany)","ror":"https://ror.org/028070c57","country_code":"DE","type":"company","lineage":["https://openalex.org/I4210122489","https://openalex.org/I78650965"]},{"id":"https://openalex.org/I78650965","display_name":"TU Dresden","ror":"https://ror.org/042aqky30","country_code":"DE","type":"education","lineage":["https://openalex.org/I78650965"]}],"countries":["DE"],"is_corresponding":false,"raw_author_name":"Florian Wunderwald","raw_affiliation_strings":["TU Dresden,Namlab gGmbH,Dresden,Germany"],"affiliations":[{"raw_affiliation_string":"TU Dresden,Namlab gGmbH,Dresden,Germany","institution_ids":["https://openalex.org/I4210122489","https://openalex.org/I78650965"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5071161833","display_name":"G. A. Zil'berman","orcid":null},"institutions":[{"id":"https://openalex.org/I174306211","display_name":"Technion \u2013 Israel Institute of Technology","ror":"https://ror.org/03qryx823","country_code":"IL","type":"education","lineage":["https://openalex.org/I174306211"]}],"countries":["IL"],"is_corresponding":false,"raw_author_name":"Gilad Zilberman","raw_affiliation_strings":["Technion &#x2013; Israel Institute of Technology,Viterbi Faculty of Electrical and Computer Engineering,Haifa,Israel"],"affiliations":[{"raw_affiliation_string":"Technion &#x2013; Israel Institute of Technology,Viterbi Faculty of Electrical and Computer Engineering,Haifa,Israel","institution_ids":["https://openalex.org/I174306211"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5118130334","display_name":"Guy Orlev","orcid":null},"institutions":[{"id":"https://openalex.org/I174306211","display_name":"Technion \u2013 Israel Institute of Technology","ror":"https://ror.org/03qryx823","country_code":"IL","type":"education","lineage":["https://openalex.org/I174306211"]}],"countries":["IL"],"is_corresponding":false,"raw_author_name":"Guy Orlev","raw_affiliation_strings":["Technion &#x2013; Israel Institute of Technology,Viterbi Faculty of Electrical and Computer Engineering,Haifa,Israel"],"affiliations":[{"raw_affiliation_string":"Technion &#x2013; Israel Institute of Technology,Viterbi Faculty of Electrical and Computer Engineering,Haifa,Israel","institution_ids":["https://openalex.org/I174306211"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5085797665","display_name":"Yair Keller","orcid":null},"institutions":[{"id":"https://openalex.org/I174306211","display_name":"Technion \u2013 Israel Institute of Technology","ror":"https://ror.org/03qryx823","country_code":"IL","type":"education","lineage":["https://openalex.org/I174306211"]}],"countries":["IL"],"is_corresponding":false,"raw_author_name":"Yair Keller","raw_affiliation_strings":["Technion &#x2013; Israel Institute of Technology,Viterbi Faculty of Electrical and Computer Engineering,Haifa,Israel"],"affiliations":[{"raw_affiliation_string":"Technion &#x2013; Israel Institute of Technology,Viterbi Faculty of Electrical and Computer Engineering,Haifa,Israel","institution_ids":["https://openalex.org/I174306211"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5118130335","display_name":"Einav Raveh","orcid":null},"institutions":[{"id":"https://openalex.org/I174306211","display_name":"Technion \u2013 Israel Institute of Technology","ror":"https://ror.org/03qryx823","country_code":"IL","type":"education","lineage":["https://openalex.org/I174306211"]}],"countries":["IL"],"is_corresponding":false,"raw_author_name":"Einav Raveh","raw_affiliation_strings":["Technion &#x2013; Israel Institute of Technology,Viterbi Faculty of Electrical and Computer Engineering,Haifa,Israel"],"affiliations":[{"raw_affiliation_string":"Technion &#x2013; Israel Institute of Technology,Viterbi Faculty of Electrical and Computer Engineering,Haifa,Israel","institution_ids":["https://openalex.org/I174306211"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5008120374","display_name":"Ruben Alcala","orcid":"https://orcid.org/0000-0003-2799-9793"},"institutions":[{"id":"https://openalex.org/I4210122489","display_name":"NaMLab (Germany)","ror":"https://ror.org/028070c57","country_code":"DE","type":"company","lineage":["https://openalex.org/I4210122489","https://openalex.org/I78650965"]},{"id":"https://openalex.org/I78650965","display_name":"TU Dresden","ror":"https://ror.org/042aqky30","country_code":"DE","type":"education","lineage":["https://openalex.org/I78650965"]}],"countries":["DE"],"is_corresponding":false,"raw_author_name":"Ruben Alcala","raw_affiliation_strings":["TU Dresden,Namlab gGmbH,Dresden,Germany"],"affiliations":[{"raw_affiliation_string":"TU Dresden,Namlab gGmbH,Dresden,Germany","institution_ids":["https://openalex.org/I4210122489","https://openalex.org/I78650965"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5003850300","display_name":"Thomas Mikolajick","orcid":"https://orcid.org/0000-0003-3814-0378"},"institutions":[{"id":"https://openalex.org/I78650965","display_name":"TU Dresden","ror":"https://ror.org/042aqky30","country_code":"DE","type":"education","lineage":["https://openalex.org/I78650965"]},{"id":"https://openalex.org/I4210122489","display_name":"NaMLab (Germany)","ror":"https://ror.org/028070c57","country_code":"DE","type":"company","lineage":["https://openalex.org/I4210122489","https://openalex.org/I78650965"]}],"countries":["DE"],"is_corresponding":false,"raw_author_name":"Thomas Mikolajick","raw_affiliation_strings":["TU Dresden,Namlab gGmbH,Dresden,Germany"],"affiliations":[{"raw_affiliation_string":"TU Dresden,Namlab gGmbH,Dresden,Germany","institution_ids":["https://openalex.org/I4210122489","https://openalex.org/I78650965"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5023007303","display_name":"Uwe Schroeder","orcid":"https://orcid.org/0000-0002-6824-2386"},"institutions":[{"id":"https://openalex.org/I4210122489","display_name":"NaMLab (Germany)","ror":"https://ror.org/028070c57","country_code":"DE","type":"company","lineage":["https://openalex.org/I4210122489","https://openalex.org/I78650965"]},{"id":"https://openalex.org/I78650965","display_name":"TU Dresden","ror":"https://ror.org/042aqky30","country_code":"DE","type":"education","lineage":["https://openalex.org/I78650965"]}],"countries":["DE"],"is_corresponding":false,"raw_author_name":"Uwe Schroeder","raw_affiliation_strings":["TU Dresden,Namlab gGmbH,Dresden,Germany"],"affiliations":[{"raw_affiliation_string":"TU Dresden,Namlab gGmbH,Dresden,Germany","institution_ids":["https://openalex.org/I4210122489","https://openalex.org/I78650965"]}]},{"author_position":"last","author":{"id":"https://openalex.org/A5069435335","display_name":"Eilam Yalon","orcid":"https://orcid.org/0000-0001-7965-459X"},"institutions":[{"id":"https://openalex.org/I174306211","display_name":"Technion \u2013 Israel Institute of Technology","ror":"https://ror.org/03qryx823","country_code":"IL","type":"education","lineage":["https://openalex.org/I174306211"]}],"countries":["IL"],"is_corresponding":false,"raw_author_name":"Eilam Yalon","raw_affiliation_strings":["Technion &#x2013; Israel Institute of Technology,Viterbi Faculty of Electrical and Computer Engineering,Haifa,Israel"],"affiliations":[{"raw_affiliation_string":"Technion &#x2013; Israel Institute of Technology,Viterbi Faculty of Electrical and Computer Engineering,Haifa,Israel","institution_ids":["https://openalex.org/I174306211"]}]}],"institutions":[],"countries_distinct_count":2,"institutions_distinct_count":11,"corresponding_author_ids":["https://openalex.org/A5073231454"],"corresponding_institution_ids":["https://openalex.org/I174306211"],"apc_list":null,"apc_paid":null,"fwci":0.0,"has_fulltext":false,"cited_by_count":0,"citation_normalized_percentile":{"value":0.14386353,"is_in_top_1_percent":false,"is_in_top_10_percent":false},"cited_by_percentile_year":null,"biblio":{"volume":null,"issue":null,"first_page":"1","last_page":"4"},"is_retracted":false,"is_paratext":false,"is_xpac":false,"primary_topic":{"id":"https://openalex.org/T10502","display_name":"Advanced Memory and Neural Computing","score":1.0,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},"topics":[{"id":"https://openalex.org/T10502","display_name":"Advanced Memory and Neural Computing","score":1.0,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T12808","display_name":"Ferroelectric and Negative Capacitance Devices","score":1.0,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T10472","display_name":"Semiconductor materials and devices","score":0.9988999962806702,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"keywords":[{"id":"https://openalex.org/keywords/ferroelectric-ram","display_name":"Ferroelectric RAM","score":0.7929654121398926},{"id":"https://openalex.org/keywords/transient","display_name":"Transient (computer programming)","score":0.668878972530365},{"id":"https://openalex.org/keywords/materials-science","display_name":"Materials science","score":0.6524040699005127},{"id":"https://openalex.org/keywords/optoelectronics","display_name":"Optoelectronics","score":0.6512086391448975},{"id":"https://openalex.org/keywords/voltage","display_name":"Voltage","score":0.5561408996582031},{"id":"https://openalex.org/keywords/ultrashort-pulse","display_name":"Ultrashort pulse","score":0.5134769082069397},{"id":"https://openalex.org/keywords/transient-analysis","display_name":"Transient analysis","score":0.4746706485748291},{"id":"https://openalex.org/keywords/electrical-engineering","display_name":"Electrical engineering","score":0.44069844484329224},{"id":"https://openalex.org/keywords/current","display_name":"Current (fluid)","score":0.4122641682624817},{"id":"https://openalex.org/keywords/electronic-engineering","display_name":"Electronic engineering","score":0.3395978808403015},{"id":"https://openalex.org/keywords/transient-response","display_name":"Transient response","score":0.32591456174850464},{"id":"https://openalex.org/keywords/computer-science","display_name":"Computer science","score":0.300037682056427},{"id":"https://openalex.org/keywords/capacitor","display_name":"Capacitor","score":0.27419212460517883},{"id":"https://openalex.org/keywords/physics","display_name":"Physics","score":0.20074382424354553},{"id":"https://openalex.org/keywords/engineering","display_name":"Engineering","score":0.17509368062019348},{"id":"https://openalex.org/keywords/laser","display_name":"Laser","score":0.15501511096954346},{"id":"https://openalex.org/keywords/optics","display_name":"Optics","score":0.11658629775047302}],"concepts":[{"id":"https://openalex.org/C161164327","wikidata":"https://www.wikidata.org/wiki/Q703656","display_name":"Ferroelectric RAM","level":4,"score":0.7929654121398926},{"id":"https://openalex.org/C2780799671","wikidata":"https://www.wikidata.org/wiki/Q17087362","display_name":"Transient (computer programming)","level":2,"score":0.668878972530365},{"id":"https://openalex.org/C192562407","wikidata":"https://www.wikidata.org/wiki/Q228736","display_name":"Materials science","level":0,"score":0.6524040699005127},{"id":"https://openalex.org/C49040817","wikidata":"https://www.wikidata.org/wiki/Q193091","display_name":"Optoelectronics","level":1,"score":0.6512086391448975},{"id":"https://openalex.org/C165801399","wikidata":"https://www.wikidata.org/wiki/Q25428","display_name":"Voltage","level":2,"score":0.5561408996582031},{"id":"https://openalex.org/C178596936","wikidata":"https://www.wikidata.org/wiki/Q844471","display_name":"Ultrashort pulse","level":3,"score":0.5134769082069397},{"id":"https://openalex.org/C2989121073","wikidata":"https://www.wikidata.org/wiki/Q1309019","display_name":"Transient analysis","level":3,"score":0.4746706485748291},{"id":"https://openalex.org/C119599485","wikidata":"https://www.wikidata.org/wiki/Q43035","display_name":"Electrical engineering","level":1,"score":0.44069844484329224},{"id":"https://openalex.org/C148043351","wikidata":"https://www.wikidata.org/wiki/Q4456944","display_name":"Current (fluid)","level":2,"score":0.4122641682624817},{"id":"https://openalex.org/C24326235","wikidata":"https://www.wikidata.org/wiki/Q126095","display_name":"Electronic engineering","level":1,"score":0.3395978808403015},{"id":"https://openalex.org/C85761212","wikidata":"https://www.wikidata.org/wiki/Q1974593","display_name":"Transient response","level":2,"score":0.32591456174850464},{"id":"https://openalex.org/C41008148","wikidata":"https://www.wikidata.org/wiki/Q21198","display_name":"Computer science","level":0,"score":0.300037682056427},{"id":"https://openalex.org/C52192207","wikidata":"https://www.wikidata.org/wiki/Q5322","display_name":"Capacitor","level":3,"score":0.27419212460517883},{"id":"https://openalex.org/C121332964","wikidata":"https://www.wikidata.org/wiki/Q413","display_name":"Physics","level":0,"score":0.20074382424354553},{"id":"https://openalex.org/C127413603","wikidata":"https://www.wikidata.org/wiki/Q11023","display_name":"Engineering","level":0,"score":0.17509368062019348},{"id":"https://openalex.org/C520434653","wikidata":"https://www.wikidata.org/wiki/Q38867","display_name":"Laser","level":2,"score":0.15501511096954346},{"id":"https://openalex.org/C120665830","wikidata":"https://www.wikidata.org/wiki/Q14620","display_name":"Optics","level":1,"score":0.11658629775047302},{"id":"https://openalex.org/C111919701","wikidata":"https://www.wikidata.org/wiki/Q9135","display_name":"Operating system","level":1,"score":0.0}],"mesh":[],"locations_count":1,"locations":[{"id":"doi:10.1109/imw61990.2025.11026930","is_oa":false,"landing_page_url":"https://doi.org/10.1109/imw61990.2025.11026930","pdf_url":null,"source":null,"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"2025 IEEE International Memory Workshop (IMW)","raw_type":"proceedings-article"}],"best_oa_location":null,"sustainable_development_goals":[{"score":0.47999998927116394,"id":"https://metadata.un.org/sdg/13","display_name":"Climate action"}],"awards":[],"funders":[],"has_content":{"grobid_xml":false,"pdf":false},"content_urls":null,"referenced_works_count":8,"referenced_works":["https://openalex.org/W2051157602","https://openalex.org/W4319878033","https://openalex.org/W4377224554","https://openalex.org/W4388240201","https://openalex.org/W4391594315","https://openalex.org/W4391594663","https://openalex.org/W4391622616","https://openalex.org/W4396949993"],"related_works":["https://openalex.org/W2758798772","https://openalex.org/W2081338125","https://openalex.org/W4406350055","https://openalex.org/W4239924455","https://openalex.org/W2001630809","https://openalex.org/W777979701","https://openalex.org/W2014796125","https://openalex.org/W4244925124","https://openalex.org/W2669128877","https://openalex.org/W1985471711"],"abstract_inverted_index":{"Conventional":[0],"FeRAM":[1],"readout":[2,28],"methods":[3],"are":[4],"destructive,":[5],"requiring":[6],"polarization":[7,78],"switching":[8],"of":[9],"the":[10,77,104],"FE":[11],"capacitor":[12],"(FeCAP)":[13],"and":[14,21,39,46,66,99],"write-back,":[15],"which":[16,36,61],"reduces":[17],"endurance,":[18,98],"increases":[19],"latency,":[20],"energy":[22],"consumption.":[23],"Prior":[24],"works":[25],"on":[26,31],"non-destructive":[27],"(NDRO)":[29],"relied":[30],"capacitance":[32],"memory":[33],"window":[34],"(MW),":[35],"is":[37],"slow":[38],"requires":[40],"asymmetric":[41,67],"FeCAP":[42],"structure,":[43],"compromising":[44],"retention":[45,94],"increasing":[47],"circuit":[48],"complexity.":[49],"Here,":[50],"we":[51],"present":[52],"a":[53],"novel":[54],"NDRO":[55],"method":[56,92],"utilizing":[57],"ultrafast":[58],"transient":[59],"response":[60],"applies":[62],"to":[63],"both":[64],"symmetric":[65],"structures.":[68],"We":[69],"experimentally":[70],"demonstrate":[71],"sub-ns":[72],"read":[73,84],"operations":[74],"without":[75],"altering":[76],"state,":[79],"achieving":[80],">10<sup":[81],"xmlns:mml=\"http://www.w3.org/1998/Math/MathML\"":[82],"xmlns:xlink=\"http://www.w3.org/1999/xlink\">13</sup>":[83],"cycles":[85],"(limited":[86],"by":[87],"test":[88],"time).":[89],"This":[90],"structure-agnostic":[91],"improves":[93],"(tested":[95],"at":[96],"125\u00b0C),":[97],"simplifies":[100],"implementation,":[101],"thus":[102],"paving":[103],"way":[105],"for":[106],"fast,":[107],"energy-efficient":[108],"FeRAM-based":[109],"solutions.":[110]},"counts_by_year":[],"updated_date":"2025-11-06T03:46:38.306776","created_date":"2025-10-10T00:00:00"}