{"id":"https://openalex.org/W4398765263","doi":"https://doi.org/10.1109/imw59701.2024.10536975","title":"Enhanced reliability and trapping behavior in ferroelectric FETs under cryogenic conditions","display_name":"Enhanced reliability and trapping behavior in ferroelectric FETs under cryogenic conditions","publication_year":2024,"publication_date":"2024-05-12","ids":{"openalex":"https://openalex.org/W4398765263","doi":"https://doi.org/10.1109/imw59701.2024.10536975"},"language":"en","primary_location":{"id":"doi:10.1109/imw59701.2024.10536975","is_oa":false,"landing_page_url":"https://doi.org/10.1109/imw59701.2024.10536975","pdf_url":null,"source":null,"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"2024 IEEE International Memory Workshop (IMW)","raw_type":"proceedings-article"},"type":"article","indexed_in":["crossref"],"open_access":{"is_oa":false,"oa_status":"closed","oa_url":null,"any_repository_has_fulltext":false},"authorships":[{"author_position":"first","author":{"id":"https://openalex.org/A5029087712","display_name":"Maximilian Lederer","orcid":"https://orcid.org/0000-0002-1739-2747"},"institutions":[{"id":"https://openalex.org/I4210110247","display_name":"Fraunhofer Institute for Photonic Microsystems","ror":"https://ror.org/020n3fw10","country_code":"DE","type":"facility","lineage":["https://openalex.org/I4210110247","https://openalex.org/I4923324"]}],"countries":["DE"],"is_corresponding":true,"raw_author_name":"Maximilian Lederer","raw_affiliation_strings":["Fraunhofer Institute for Photonic Microsystems IPMS,Center Nanoelectronic Technologies CNT,Dresden,Germany","Center Nanoelectronic Technologies CNT, Fraunhofer Institute for Photonic Microsystems IPMS, Dresden, Germany"],"affiliations":[{"raw_affiliation_string":"Fraunhofer Institute for Photonic Microsystems IPMS,Center Nanoelectronic Technologies CNT,Dresden,Germany","institution_ids":["https://openalex.org/I4210110247"]},{"raw_affiliation_string":"Center Nanoelectronic Technologies CNT, Fraunhofer Institute for Photonic Microsystems IPMS, Dresden, Germany","institution_ids":["https://openalex.org/I4210110247"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5002630852","display_name":"Franz M\u00fcller","orcid":"https://orcid.org/0000-0002-6564-9121"},"institutions":[{"id":"https://openalex.org/I4210110247","display_name":"Fraunhofer Institute for Photonic Microsystems","ror":"https://ror.org/020n3fw10","country_code":"DE","type":"facility","lineage":["https://openalex.org/I4210110247","https://openalex.org/I4923324"]}],"countries":["DE"],"is_corresponding":false,"raw_author_name":"Franz M\u00fcller","raw_affiliation_strings":["Fraunhofer Institute for Photonic Microsystems IPMS,Center Nanoelectronic Technologies CNT,Dresden,Germany","Center Nanoelectronic Technologies CNT, Fraunhofer Institute for Photonic Microsystems IPMS, Dresden, Germany"],"affiliations":[{"raw_affiliation_string":"Fraunhofer Institute for Photonic Microsystems IPMS,Center Nanoelectronic Technologies CNT,Dresden,Germany","institution_ids":["https://openalex.org/I4210110247"]},{"raw_affiliation_string":"Center Nanoelectronic Technologies CNT, Fraunhofer Institute for Photonic Microsystems IPMS, Dresden, Germany","institution_ids":["https://openalex.org/I4210110247"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5071642444","display_name":"Raik Hoffmann","orcid":"https://orcid.org/0009-0007-9464-6185"},"institutions":[{"id":"https://openalex.org/I4210110247","display_name":"Fraunhofer Institute for Photonic Microsystems","ror":"https://ror.org/020n3fw10","country_code":"DE","type":"facility","lineage":["https://openalex.org/I4210110247","https://openalex.org/I4923324"]}],"countries":["DE"],"is_corresponding":false,"raw_author_name":"Raik Hoffmann","raw_affiliation_strings":["Fraunhofer Institute for Photonic Microsystems IPMS,Center Nanoelectronic Technologies CNT,Dresden,Germany","Center Nanoelectronic Technologies CNT, Fraunhofer Institute for Photonic Microsystems IPMS, Dresden, Germany"],"affiliations":[{"raw_affiliation_string":"Fraunhofer Institute for Photonic Microsystems IPMS,Center Nanoelectronic Technologies CNT,Dresden,Germany","institution_ids":["https://openalex.org/I4210110247"]},{"raw_affiliation_string":"Center Nanoelectronic Technologies CNT, Fraunhofer Institute for Photonic Microsystems IPMS, Dresden, Germany","institution_ids":["https://openalex.org/I4210110247"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5081350080","display_name":"Ricardo Olivo","orcid":null},"institutions":[{"id":"https://openalex.org/I4210110247","display_name":"Fraunhofer Institute for Photonic Microsystems","ror":"https://ror.org/020n3fw10","country_code":"DE","type":"facility","lineage":["https://openalex.org/I4210110247","https://openalex.org/I4923324"]}],"countries":["DE"],"is_corresponding":false,"raw_author_name":"Ricardo Olivo","raw_affiliation_strings":["Fraunhofer Institute for Photonic Microsystems IPMS,Center Nanoelectronic Technologies CNT,Dresden,Germany","Center Nanoelectronic Technologies CNT, Fraunhofer Institute for Photonic Microsystems IPMS, Dresden, Germany"],"affiliations":[{"raw_affiliation_string":"Fraunhofer Institute for Photonic Microsystems IPMS,Center Nanoelectronic Technologies CNT,Dresden,Germany","institution_ids":["https://openalex.org/I4210110247"]},{"raw_affiliation_string":"Center Nanoelectronic Technologies CNT, Fraunhofer Institute for Photonic Microsystems IPMS, Dresden, Germany","institution_ids":["https://openalex.org/I4210110247"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5014928705","display_name":"Yannick Raffel","orcid":"https://orcid.org/0000-0001-8629-5206"},"institutions":[{"id":"https://openalex.org/I4210110247","display_name":"Fraunhofer Institute for Photonic Microsystems","ror":"https://ror.org/020n3fw10","country_code":"DE","type":"facility","lineage":["https://openalex.org/I4210110247","https://openalex.org/I4923324"]}],"countries":["DE"],"is_corresponding":false,"raw_author_name":"Yannick Raffel","raw_affiliation_strings":["Fraunhofer Institute for Photonic Microsystems IPMS,Center Nanoelectronic Technologies CNT,Dresden,Germany","Center Nanoelectronic Technologies CNT, Fraunhofer Institute for Photonic Microsystems IPMS, Dresden, Germany"],"affiliations":[{"raw_affiliation_string":"Fraunhofer Institute for Photonic Microsystems IPMS,Center Nanoelectronic Technologies CNT,Dresden,Germany","institution_ids":["https://openalex.org/I4210110247"]},{"raw_affiliation_string":"Center Nanoelectronic Technologies CNT, Fraunhofer Institute for Photonic Microsystems IPMS, Dresden, Germany","institution_ids":["https://openalex.org/I4210110247"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5003684815","display_name":"Shouzhuo Yang","orcid":"https://orcid.org/0009-0000-1911-4647"},"institutions":[{"id":"https://openalex.org/I4210110247","display_name":"Fraunhofer Institute for Photonic Microsystems","ror":"https://ror.org/020n3fw10","country_code":"DE","type":"facility","lineage":["https://openalex.org/I4210110247","https://openalex.org/I4923324"]}],"countries":["DE"],"is_corresponding":false,"raw_author_name":"Shouzhuo Yang","raw_affiliation_strings":["Fraunhofer Institute for Photonic Microsystems IPMS,Center Nanoelectronic Technologies CNT,Dresden,Germany","Center Nanoelectronic Technologies CNT, Fraunhofer Institute for Photonic Microsystems IPMS, Dresden, Germany"],"affiliations":[{"raw_affiliation_string":"Fraunhofer Institute for Photonic Microsystems IPMS,Center Nanoelectronic Technologies CNT,Dresden,Germany","institution_ids":["https://openalex.org/I4210110247"]},{"raw_affiliation_string":"Center Nanoelectronic Technologies CNT, Fraunhofer Institute for Photonic Microsystems IPMS, Dresden, Germany","institution_ids":["https://openalex.org/I4210110247"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5064120844","display_name":"Sourav De","orcid":"https://orcid.org/0000-0002-1930-8799"},"institutions":[{"id":"https://openalex.org/I4210110247","display_name":"Fraunhofer Institute for Photonic Microsystems","ror":"https://ror.org/020n3fw10","country_code":"DE","type":"facility","lineage":["https://openalex.org/I4210110247","https://openalex.org/I4923324"]}],"countries":["DE"],"is_corresponding":false,"raw_author_name":"Sourav De","raw_affiliation_strings":["Fraunhofer Institute for Photonic Microsystems IPMS,Center Nanoelectronic Technologies CNT,Dresden,Germany","Center Nanoelectronic Technologies CNT, Fraunhofer Institute for Photonic Microsystems IPMS, Dresden, Germany"],"affiliations":[{"raw_affiliation_string":"Fraunhofer Institute for Photonic Microsystems IPMS,Center Nanoelectronic Technologies CNT,Dresden,Germany","institution_ids":["https://openalex.org/I4210110247"]},{"raw_affiliation_string":"Center Nanoelectronic Technologies CNT, Fraunhofer Institute for Photonic Microsystems IPMS, Dresden, Germany","institution_ids":["https://openalex.org/I4210110247"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5093131451","display_name":"Roman Potjan","orcid":"https://orcid.org/0000-0002-7547-4257"},"institutions":[{"id":"https://openalex.org/I4210110247","display_name":"Fraunhofer Institute for Photonic Microsystems","ror":"https://ror.org/020n3fw10","country_code":"DE","type":"facility","lineage":["https://openalex.org/I4210110247","https://openalex.org/I4923324"]}],"countries":["DE"],"is_corresponding":false,"raw_author_name":"Roman Potjan","raw_affiliation_strings":["Fraunhofer Institute for Photonic Microsystems IPMS,Center Nanoelectronic Technologies CNT,Dresden,Germany","Center Nanoelectronic Technologies CNT, Fraunhofer Institute for Photonic Microsystems IPMS, Dresden, Germany"],"affiliations":[{"raw_affiliation_string":"Fraunhofer Institute for Photonic Microsystems IPMS,Center Nanoelectronic Technologies CNT,Dresden,Germany","institution_ids":["https://openalex.org/I4210110247"]},{"raw_affiliation_string":"Center Nanoelectronic Technologies CNT, Fraunhofer Institute for Photonic Microsystems IPMS, Dresden, Germany","institution_ids":["https://openalex.org/I4210110247"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5093131452","display_name":"Oliver Ostien","orcid":"https://orcid.org/0009-0006-8402-8503"},"institutions":[{"id":"https://openalex.org/I4210110247","display_name":"Fraunhofer Institute for Photonic Microsystems","ror":"https://ror.org/020n3fw10","country_code":"DE","type":"facility","lineage":["https://openalex.org/I4210110247","https://openalex.org/I4923324"]}],"countries":["DE"],"is_corresponding":false,"raw_author_name":"Oliver Ostien","raw_affiliation_strings":["Fraunhofer Institute for Photonic Microsystems IPMS,Center Nanoelectronic Technologies CNT,Dresden,Germany","Center Nanoelectronic Technologies CNT, Fraunhofer Institute for Photonic Microsystems IPMS, Dresden, Germany"],"affiliations":[{"raw_affiliation_string":"Fraunhofer Institute for Photonic Microsystems IPMS,Center Nanoelectronic Technologies CNT,Dresden,Germany","institution_ids":["https://openalex.org/I4210110247"]},{"raw_affiliation_string":"Center Nanoelectronic Technologies CNT, Fraunhofer Institute for Photonic Microsystems IPMS, Dresden, Germany","institution_ids":["https://openalex.org/I4210110247"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5083008317","display_name":"Abdelrahman Y. A. Altawil","orcid":"https://orcid.org/0009-0006-4016-4335"},"institutions":[{"id":"https://openalex.org/I4210110247","display_name":"Fraunhofer Institute for Photonic Microsystems","ror":"https://ror.org/020n3fw10","country_code":"DE","type":"facility","lineage":["https://openalex.org/I4210110247","https://openalex.org/I4923324"]}],"countries":["DE"],"is_corresponding":false,"raw_author_name":"Abdelrahman Altawil","raw_affiliation_strings":["Fraunhofer Institute for Photonic Microsystems IPMS,Center Nanoelectronic Technologies CNT,Dresden,Germany","Center Nanoelectronic Technologies CNT, Fraunhofer Institute for Photonic Microsystems IPMS, Dresden, Germany"],"affiliations":[{"raw_affiliation_string":"Fraunhofer Institute for Photonic Microsystems IPMS,Center Nanoelectronic Technologies CNT,Dresden,Germany","institution_ids":["https://openalex.org/I4210110247"]},{"raw_affiliation_string":"Center Nanoelectronic Technologies CNT, Fraunhofer Institute for Photonic Microsystems IPMS, Dresden, Germany","institution_ids":["https://openalex.org/I4210110247"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5040090182","display_name":"Ayse S\u00fcnb\u00fcl","orcid":"https://orcid.org/0000-0003-0464-8739"},"institutions":[{"id":"https://openalex.org/I4210110247","display_name":"Fraunhofer Institute for Photonic Microsystems","ror":"https://ror.org/020n3fw10","country_code":"DE","type":"facility","lineage":["https://openalex.org/I4210110247","https://openalex.org/I4923324"]}],"countries":["DE"],"is_corresponding":false,"raw_author_name":"Ayse S\u00fcnb\u00fcl","raw_affiliation_strings":["Fraunhofer Institute for Photonic Microsystems IPMS,Center Nanoelectronic Technologies CNT,Dresden,Germany","Center Nanoelectronic Technologies CNT, Fraunhofer Institute for Photonic Microsystems IPMS, Dresden, Germany"],"affiliations":[{"raw_affiliation_string":"Fraunhofer Institute for Photonic Microsystems IPMS,Center Nanoelectronic Technologies CNT,Dresden,Germany","institution_ids":["https://openalex.org/I4210110247"]},{"raw_affiliation_string":"Center Nanoelectronic Technologies CNT, Fraunhofer Institute for Photonic Microsystems IPMS, Dresden, Germany","institution_ids":["https://openalex.org/I4210110247"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5077632577","display_name":"David Lehninger","orcid":"https://orcid.org/0000-0002-1545-5177"},"institutions":[{"id":"https://openalex.org/I4210110247","display_name":"Fraunhofer Institute for Photonic Microsystems","ror":"https://ror.org/020n3fw10","country_code":"DE","type":"facility","lineage":["https://openalex.org/I4210110247","https://openalex.org/I4923324"]}],"countries":["DE"],"is_corresponding":false,"raw_author_name":"David Lehninger","raw_affiliation_strings":["Fraunhofer Institute for Photonic Microsystems IPMS,Center Nanoelectronic Technologies CNT,Dresden,Germany","Center Nanoelectronic Technologies CNT, Fraunhofer Institute for Photonic Microsystems IPMS, Dresden, Germany"],"affiliations":[{"raw_affiliation_string":"Fraunhofer Institute for Photonic Microsystems IPMS,Center Nanoelectronic Technologies CNT,Dresden,Germany","institution_ids":["https://openalex.org/I4210110247"]},{"raw_affiliation_string":"Center Nanoelectronic Technologies CNT, Fraunhofer Institute for Photonic Microsystems IPMS, Dresden, Germany","institution_ids":["https://openalex.org/I4210110247"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5079324627","display_name":"Thomas K\u00e4mpfe","orcid":"https://orcid.org/0000-0002-4672-8676"},"institutions":[{"id":"https://openalex.org/I4210110247","display_name":"Fraunhofer Institute for Photonic Microsystems","ror":"https://ror.org/020n3fw10","country_code":"DE","type":"facility","lineage":["https://openalex.org/I4210110247","https://openalex.org/I4923324"]}],"countries":["DE"],"is_corresponding":false,"raw_author_name":"Thomas K\u00e4mpfe","raw_affiliation_strings":["Fraunhofer Institute for Photonic Microsystems IPMS,Center Nanoelectronic Technologies CNT,Dresden,Germany","Center Nanoelectronic Technologies CNT, Fraunhofer Institute for Photonic Microsystems IPMS, Dresden, Germany"],"affiliations":[{"raw_affiliation_string":"Fraunhofer Institute for Photonic Microsystems IPMS,Center Nanoelectronic Technologies CNT,Dresden,Germany","institution_ids":["https://openalex.org/I4210110247"]},{"raw_affiliation_string":"Center Nanoelectronic Technologies CNT, Fraunhofer Institute for Photonic Microsystems IPMS, Dresden, Germany","institution_ids":["https://openalex.org/I4210110247"]}]},{"author_position":"last","author":{"id":"https://openalex.org/A5081066909","display_name":"Konrad Seidel","orcid":"https://orcid.org/0009-0003-5889-4414"},"institutions":[{"id":"https://openalex.org/I4210110247","display_name":"Fraunhofer Institute for Photonic Microsystems","ror":"https://ror.org/020n3fw10","country_code":"DE","type":"facility","lineage":["https://openalex.org/I4210110247","https://openalex.org/I4923324"]}],"countries":["DE"],"is_corresponding":false,"raw_author_name":"Konrad Seidel","raw_affiliation_strings":["Fraunhofer Institute for Photonic Microsystems IPMS,Center Nanoelectronic Technologies CNT,Dresden,Germany","Center Nanoelectronic Technologies CNT, Fraunhofer Institute for Photonic Microsystems IPMS, Dresden, Germany"],"affiliations":[{"raw_affiliation_string":"Fraunhofer Institute for Photonic Microsystems IPMS,Center Nanoelectronic Technologies CNT,Dresden,Germany","institution_ids":["https://openalex.org/I4210110247"]},{"raw_affiliation_string":"Center Nanoelectronic Technologies CNT, Fraunhofer Institute for Photonic Microsystems IPMS, Dresden, Germany","institution_ids":["https://openalex.org/I4210110247"]}]}],"institutions":[],"countries_distinct_count":1,"institutions_distinct_count":14,"corresponding_author_ids":["https://openalex.org/A5029087712"],"corresponding_institution_ids":["https://openalex.org/I4210110247"],"apc_list":null,"apc_paid":null,"fwci":1.2504,"has_fulltext":false,"cited_by_count":6,"citation_normalized_percentile":{"value":0.79058348,"is_in_top_1_percent":false,"is_in_top_10_percent":false},"cited_by_percentile_year":{"min":95,"max":99},"biblio":{"volume":null,"issue":null,"first_page":"1","last_page":"4"},"is_retracted":false,"is_paratext":false,"is_xpac":false,"primary_topic":{"id":"https://openalex.org/T12808","display_name":"Ferroelectric and Negative Capacitance Devices","score":1.0,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},"topics":[{"id":"https://openalex.org/T12808","display_name":"Ferroelectric and Negative Capacitance Devices","score":1.0,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T10472","display_name":"Semiconductor materials and devices","score":0.9994999766349792,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T12046","display_name":"MXene and MAX Phase Materials","score":0.9968000054359436,"subfield":{"id":"https://openalex.org/subfields/2505","display_name":"Materials Chemistry"},"field":{"id":"https://openalex.org/fields/25","display_name":"Materials Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"keywords":[{"id":"https://openalex.org/keywords/ferroelectricity","display_name":"Ferroelectricity","score":0.7549585103988647},{"id":"https://openalex.org/keywords/reliability","display_name":"Reliability (semiconductor)","score":0.7185544371604919},{"id":"https://openalex.org/keywords/materials-science","display_name":"Materials science","score":0.703242838382721},{"id":"https://openalex.org/keywords/optoelectronics","display_name":"Optoelectronics","score":0.6207343339920044},{"id":"https://openalex.org/keywords/non-volatile-memory","display_name":"Non-volatile memory","score":0.6071348786354065},{"id":"https://openalex.org/keywords/trapping","display_name":"Trapping","score":0.5154346227645874},{"id":"https://openalex.org/keywords/hafnium","display_name":"Hafnium","score":0.4936438798904419},{"id":"https://openalex.org/keywords/characterization","display_name":"Characterization (materials science)","score":0.41772258281707764},{"id":"https://openalex.org/keywords/doping","display_name":"Doping","score":0.41673752665519714},{"id":"https://openalex.org/keywords/computer-science","display_name":"Computer science","score":0.3576834201812744},{"id":"https://openalex.org/keywords/nanotechnology","display_name":"Nanotechnology","score":0.3421015441417694},{"id":"https://openalex.org/keywords/electronic-engineering","display_name":"Electronic engineering","score":0.32292330265045166},{"id":"https://openalex.org/keywords/engineering","display_name":"Engineering","score":0.1431526243686676},{"id":"https://openalex.org/keywords/physics","display_name":"Physics","score":0.13527891039848328},{"id":"https://openalex.org/keywords/dielectric","display_name":"Dielectric","score":0.08470073342323303}],"concepts":[{"id":"https://openalex.org/C79090758","wikidata":"https://www.wikidata.org/wiki/Q1045739","display_name":"Ferroelectricity","level":3,"score":0.7549585103988647},{"id":"https://openalex.org/C43214815","wikidata":"https://www.wikidata.org/wiki/Q7310987","display_name":"Reliability (semiconductor)","level":3,"score":0.7185544371604919},{"id":"https://openalex.org/C192562407","wikidata":"https://www.wikidata.org/wiki/Q228736","display_name":"Materials science","level":0,"score":0.703242838382721},{"id":"https://openalex.org/C49040817","wikidata":"https://www.wikidata.org/wiki/Q193091","display_name":"Optoelectronics","level":1,"score":0.6207343339920044},{"id":"https://openalex.org/C177950962","wikidata":"https://www.wikidata.org/wiki/Q10997658","display_name":"Non-volatile memory","level":2,"score":0.6071348786354065},{"id":"https://openalex.org/C2777924906","wikidata":"https://www.wikidata.org/wiki/Q34168","display_name":"Trapping","level":2,"score":0.5154346227645874},{"id":"https://openalex.org/C546638069","wikidata":"https://www.wikidata.org/wiki/Q1119","display_name":"Hafnium","level":3,"score":0.4936438798904419},{"id":"https://openalex.org/C2780841128","wikidata":"https://www.wikidata.org/wiki/Q5073781","display_name":"Characterization (materials science)","level":2,"score":0.41772258281707764},{"id":"https://openalex.org/C57863236","wikidata":"https://www.wikidata.org/wiki/Q1130571","display_name":"Doping","level":2,"score":0.41673752665519714},{"id":"https://openalex.org/C41008148","wikidata":"https://www.wikidata.org/wiki/Q21198","display_name":"Computer science","level":0,"score":0.3576834201812744},{"id":"https://openalex.org/C171250308","wikidata":"https://www.wikidata.org/wiki/Q11468","display_name":"Nanotechnology","level":1,"score":0.3421015441417694},{"id":"https://openalex.org/C24326235","wikidata":"https://www.wikidata.org/wiki/Q126095","display_name":"Electronic engineering","level":1,"score":0.32292330265045166},{"id":"https://openalex.org/C127413603","wikidata":"https://www.wikidata.org/wiki/Q11023","display_name":"Engineering","level":0,"score":0.1431526243686676},{"id":"https://openalex.org/C121332964","wikidata":"https://www.wikidata.org/wiki/Q413","display_name":"Physics","level":0,"score":0.13527891039848328},{"id":"https://openalex.org/C133386390","wikidata":"https://www.wikidata.org/wiki/Q184996","display_name":"Dielectric","level":2,"score":0.08470073342323303},{"id":"https://openalex.org/C62520636","wikidata":"https://www.wikidata.org/wiki/Q944","display_name":"Quantum mechanics","level":1,"score":0.0},{"id":"https://openalex.org/C86803240","wikidata":"https://www.wikidata.org/wiki/Q420","display_name":"Biology","level":0,"score":0.0},{"id":"https://openalex.org/C163258240","wikidata":"https://www.wikidata.org/wiki/Q25342","display_name":"Power (physics)","level":2,"score":0.0},{"id":"https://openalex.org/C534791751","wikidata":"https://www.wikidata.org/wiki/Q1038","display_name":"Zirconium","level":2,"score":0.0},{"id":"https://openalex.org/C191897082","wikidata":"https://www.wikidata.org/wiki/Q11467","display_name":"Metallurgy","level":1,"score":0.0},{"id":"https://openalex.org/C18903297","wikidata":"https://www.wikidata.org/wiki/Q7150","display_name":"Ecology","level":1,"score":0.0}],"mesh":[],"locations_count":1,"locations":[{"id":"doi:10.1109/imw59701.2024.10536975","is_oa":false,"landing_page_url":"https://doi.org/10.1109/imw59701.2024.10536975","pdf_url":null,"source":null,"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"2024 IEEE International Memory Workshop (IMW)","raw_type":"proceedings-article"}],"best_oa_location":null,"sustainable_development_goals":[],"awards":[],"funders":[],"has_content":{"pdf":false,"grobid_xml":false},"content_urls":null,"referenced_works_count":20,"referenced_works":["https://openalex.org/W1490077279","https://openalex.org/W1983604260","https://openalex.org/W1986143613","https://openalex.org/W1995071972","https://openalex.org/W2033982036","https://openalex.org/W2078482863","https://openalex.org/W2083648673","https://openalex.org/W2487018225","https://openalex.org/W2786159202","https://openalex.org/W3032970034","https://openalex.org/W3033330790","https://openalex.org/W3039968079","https://openalex.org/W3119510376","https://openalex.org/W3119539814","https://openalex.org/W3145277244","https://openalex.org/W3166948729","https://openalex.org/W4213017408","https://openalex.org/W4307720929","https://openalex.org/W4307723995","https://openalex.org/W6650294176"],"related_works":["https://openalex.org/W1791348549","https://openalex.org/W4234942579","https://openalex.org/W4236657633","https://openalex.org/W4245256776","https://openalex.org/W4232958457","https://openalex.org/W156653976","https://openalex.org/W2054209616","https://openalex.org/W1495023640","https://openalex.org/W2166508075","https://openalex.org/W4376612721"],"abstract_inverted_index":{"Quantum":[0],"computing,":[1],"space":[2],"and":[3,37,46],"coolCMOS":[4],"applications":[5],"drive":[6],"the":[7,43,50],"demand":[8],"for":[9],"reliable":[10,17],"embedded":[11],"non-volatile":[12],"memories.":[13],"Here,":[14],"we":[15],"demonstrate":[16],"ferroelectric":[18],"FETs":[19],"with":[20],"2.3":[21],"V":[22],"memory":[23],"window":[24],"based":[25],"on":[26],"hafnium":[27],"oxide":[28],"at":[29],"cryogenic":[30],"temperatures":[31],"(2.5K":[32],"to":[33,41,63],"77K).":[34],"Defect":[35],"characterization":[36],"device":[38],"simulations":[39],"allow":[40],"explain":[42],"observed":[44],"behavior":[45],"provide":[47],"insights":[48],"into":[49],"defect":[51],"dynamics":[52],"in":[53],"FeFET":[54],"devices":[55],"as":[56,58],"well":[57],"a":[59],"fast":[60],"measurement":[61],"methodology":[62],"estimate":[64],"retention":[65],"behavior.":[66]},"counts_by_year":[{"year":2026,"cited_by_count":1},{"year":2025,"cited_by_count":2},{"year":2024,"cited_by_count":3}],"updated_date":"2026-04-01T17:29:45.350535","created_date":"2025-10-10T00:00:00"}