{"id":"https://openalex.org/W4398775095","doi":"https://doi.org/10.1109/imw59701.2024.10536950","title":"A novel test and analysis scheme to elucidate tail bit characteristics in STT-MRAM arrays","display_name":"A novel test and analysis scheme to elucidate tail bit characteristics in STT-MRAM arrays","publication_year":2024,"publication_date":"2024-05-12","ids":{"openalex":"https://openalex.org/W4398775095","doi":"https://doi.org/10.1109/imw59701.2024.10536950"},"language":"en","primary_location":{"id":"doi:10.1109/imw59701.2024.10536950","is_oa":false,"landing_page_url":"https://doi.org/10.1109/imw59701.2024.10536950","pdf_url":null,"source":null,"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"2024 IEEE International Memory Workshop (IMW)","raw_type":"proceedings-article"},"type":"article","indexed_in":["crossref"],"open_access":{"is_oa":false,"oa_status":"closed","oa_url":null,"any_repository_has_fulltext":false},"authorships":[{"author_position":"first","author":{"id":"https://openalex.org/A5100386555","display_name":"Woojin Kim","orcid":"https://orcid.org/0000-0002-2755-6661"},"institutions":[{"id":"https://openalex.org/I4210114974","display_name":"IMEC","ror":"https://ror.org/02kcbn207","country_code":"BE","type":"nonprofit","lineage":["https://openalex.org/I4210114974"]}],"countries":["BE"],"is_corresponding":true,"raw_author_name":"W. Kim","raw_affiliation_strings":["Imec,Leuven,Belgium,3001"],"affiliations":[{"raw_affiliation_string":"Imec,Leuven,Belgium,3001","institution_ids":["https://openalex.org/I4210114974"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5095959945","display_name":"Valerio Pica","orcid":"https://orcid.org/0009-0004-2468-4029"},"institutions":[{"id":"https://openalex.org/I4210114974","display_name":"IMEC","ror":"https://ror.org/02kcbn207","country_code":"BE","type":"nonprofit","lineage":["https://openalex.org/I4210114974"]}],"countries":["BE"],"is_corresponding":false,"raw_author_name":"V. Pica","raw_affiliation_strings":["Imec,Leuven,Belgium,3001"],"affiliations":[{"raw_affiliation_string":"Imec,Leuven,Belgium,3001","institution_ids":["https://openalex.org/I4210114974"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5004463732","display_name":"N. Jossart","orcid":null},"institutions":[{"id":"https://openalex.org/I4210114974","display_name":"IMEC","ror":"https://ror.org/02kcbn207","country_code":"BE","type":"nonprofit","lineage":["https://openalex.org/I4210114974"]}],"countries":["BE"],"is_corresponding":false,"raw_author_name":"N. Jossart","raw_affiliation_strings":["Imec,Leuven,Belgium,3001"],"affiliations":[{"raw_affiliation_string":"Imec,Leuven,Belgium,3001","institution_ids":["https://openalex.org/I4210114974"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5014711249","display_name":"Faisal Mohd-Yasin","orcid":"https://orcid.org/0000-0002-6030-7480"},"institutions":[{"id":"https://openalex.org/I4210114974","display_name":"IMEC","ror":"https://ror.org/02kcbn207","country_code":"BE","type":"nonprofit","lineage":["https://openalex.org/I4210114974"]}],"countries":["BE"],"is_corresponding":false,"raw_author_name":"F. Yasin","raw_affiliation_strings":["Imec,Leuven,Belgium,3001"],"affiliations":[{"raw_affiliation_string":"Imec,Leuven,Belgium,3001","institution_ids":["https://openalex.org/I4210114974"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5087201919","display_name":"Kurt Wostyn","orcid":"https://orcid.org/0000-0003-3995-0292"},"institutions":[{"id":"https://openalex.org/I4210114974","display_name":"IMEC","ror":"https://ror.org/02kcbn207","country_code":"BE","type":"nonprofit","lineage":["https://openalex.org/I4210114974"]}],"countries":["BE"],"is_corresponding":false,"raw_author_name":"K. Wostyn","raw_affiliation_strings":["Imec,Leuven,Belgium,3001"],"affiliations":[{"raw_affiliation_string":"Imec,Leuven,Belgium,3001","institution_ids":["https://openalex.org/I4210114974"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5022214575","display_name":"S\u00e9bastien Couet","orcid":"https://orcid.org/0000-0001-6436-9593"},"institutions":[{"id":"https://openalex.org/I4210114974","display_name":"IMEC","ror":"https://ror.org/02kcbn207","country_code":"BE","type":"nonprofit","lineage":["https://openalex.org/I4210114974"]}],"countries":["BE"],"is_corresponding":false,"raw_author_name":"S. Couet","raw_affiliation_strings":["Imec,Leuven,Belgium,3001"],"affiliations":[{"raw_affiliation_string":"Imec,Leuven,Belgium,3001","institution_ids":["https://openalex.org/I4210114974"]}]},{"author_position":"last","author":{"id":"https://openalex.org/A5002378343","display_name":"Siddharth Rao","orcid":"https://orcid.org/0000-0001-6161-3052"},"institutions":[{"id":"https://openalex.org/I4210114974","display_name":"IMEC","ror":"https://ror.org/02kcbn207","country_code":"BE","type":"nonprofit","lineage":["https://openalex.org/I4210114974"]}],"countries":["BE"],"is_corresponding":false,"raw_author_name":"S. Rao","raw_affiliation_strings":["Imec,Leuven,Belgium,3001"],"affiliations":[{"raw_affiliation_string":"Imec,Leuven,Belgium,3001","institution_ids":["https://openalex.org/I4210114974"]}]}],"institutions":[],"countries_distinct_count":1,"institutions_distinct_count":7,"corresponding_author_ids":["https://openalex.org/A5100386555"],"corresponding_institution_ids":["https://openalex.org/I4210114974"],"apc_list":null,"apc_paid":null,"fwci":0.2225,"has_fulltext":false,"cited_by_count":1,"citation_normalized_percentile":{"value":0.4904295,"is_in_top_1_percent":false,"is_in_top_10_percent":false},"cited_by_percentile_year":{"min":91,"max":95},"biblio":{"volume":null,"issue":null,"first_page":"1","last_page":"4"},"is_retracted":false,"is_paratext":false,"is_xpac":false,"primary_topic":{"id":"https://openalex.org/T12808","display_name":"Ferroelectric and Negative Capacitance Devices","score":0.9997000098228455,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},"topics":[{"id":"https://openalex.org/T12808","display_name":"Ferroelectric and Negative Capacitance Devices","score":0.9997000098228455,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T10049","display_name":"Magnetic properties of thin films","score":0.9994000196456909,"subfield":{"id":"https://openalex.org/subfields/3107","display_name":"Atomic and Molecular Physics, and Optics"},"field":{"id":"https://openalex.org/fields/31","display_name":"Physics and Astronomy"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T12169","display_name":"Non-Destructive Testing Techniques","score":0.9975000023841858,"subfield":{"id":"https://openalex.org/subfields/2210","display_name":"Mechanical Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"keywords":[{"id":"https://openalex.org/keywords/magnetoresistive-random-access-memory","display_name":"Magnetoresistive random-access memory","score":0.5213414430618286},{"id":"https://openalex.org/keywords/computer-science","display_name":"Computer science","score":0.5120084881782532},{"id":"https://openalex.org/keywords/tunnel-magnetoresistance","display_name":"Tunnel magnetoresistance","score":0.4998037815093994},{"id":"https://openalex.org/keywords/algorithm","display_name":"Algorithm","score":0.4385341703891754},{"id":"https://openalex.org/keywords/reset","display_name":"Reset (finance)","score":0.41986024379730225},{"id":"https://openalex.org/keywords/computer-hardware","display_name":"Computer hardware","score":0.23748233914375305},{"id":"https://openalex.org/keywords/materials-science","display_name":"Materials science","score":0.190277099609375},{"id":"https://openalex.org/keywords/nanotechnology","display_name":"Nanotechnology","score":0.10604819655418396},{"id":"https://openalex.org/keywords/random-access-memory","display_name":"Random access memory","score":0.09075850248336792}],"concepts":[{"id":"https://openalex.org/C46891859","wikidata":"https://www.wikidata.org/wiki/Q1061546","display_name":"Magnetoresistive random-access memory","level":3,"score":0.5213414430618286},{"id":"https://openalex.org/C41008148","wikidata":"https://www.wikidata.org/wiki/Q21198","display_name":"Computer science","level":0,"score":0.5120084881782532},{"id":"https://openalex.org/C56202322","wikidata":"https://www.wikidata.org/wiki/Q1884383","display_name":"Tunnel magnetoresistance","level":3,"score":0.4998037815093994},{"id":"https://openalex.org/C11413529","wikidata":"https://www.wikidata.org/wiki/Q8366","display_name":"Algorithm","level":1,"score":0.4385341703891754},{"id":"https://openalex.org/C2779795794","wikidata":"https://www.wikidata.org/wiki/Q7315343","display_name":"Reset (finance)","level":2,"score":0.41986024379730225},{"id":"https://openalex.org/C9390403","wikidata":"https://www.wikidata.org/wiki/Q3966","display_name":"Computer hardware","level":1,"score":0.23748233914375305},{"id":"https://openalex.org/C192562407","wikidata":"https://www.wikidata.org/wiki/Q228736","display_name":"Materials science","level":0,"score":0.190277099609375},{"id":"https://openalex.org/C171250308","wikidata":"https://www.wikidata.org/wiki/Q11468","display_name":"Nanotechnology","level":1,"score":0.10604819655418396},{"id":"https://openalex.org/C2994168587","wikidata":"https://www.wikidata.org/wiki/Q5295","display_name":"Random access memory","level":2,"score":0.09075850248336792},{"id":"https://openalex.org/C162324750","wikidata":"https://www.wikidata.org/wiki/Q8134","display_name":"Economics","level":0,"score":0.0},{"id":"https://openalex.org/C2779227376","wikidata":"https://www.wikidata.org/wiki/Q6505497","display_name":"Layer (electronics)","level":2,"score":0.0},{"id":"https://openalex.org/C106159729","wikidata":"https://www.wikidata.org/wiki/Q2294553","display_name":"Financial economics","level":1,"score":0.0}],"mesh":[],"locations_count":1,"locations":[{"id":"doi:10.1109/imw59701.2024.10536950","is_oa":false,"landing_page_url":"https://doi.org/10.1109/imw59701.2024.10536950","pdf_url":null,"source":null,"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"2024 IEEE International Memory Workshop (IMW)","raw_type":"proceedings-article"}],"best_oa_location":null,"sustainable_development_goals":[{"id":"https://metadata.un.org/sdg/13","display_name":"Climate action","score":0.41999998688697815}],"awards":[],"funders":[],"has_content":{"pdf":false,"grobid_xml":false},"content_urls":null,"referenced_works_count":0,"referenced_works":[],"related_works":["https://openalex.org/W2160372845","https://openalex.org/W1977755618","https://openalex.org/W1545438037","https://openalex.org/W2897770615","https://openalex.org/W4226197542","https://openalex.org/W4214681414","https://openalex.org/W1890124164","https://openalex.org/W2131964951","https://openalex.org/W2032117939","https://openalex.org/W2034593071"],"abstract_inverted_index":{"We":[0,40,80],"propose":[1],"a":[2,57],"simple":[3],"and":[4,7,12,37,55,99,127,151,157],"efficient":[5],"test":[6,126],"analysis":[8,128],"scheme":[9,129],"to":[10,68,104,133,153],"identify":[11],"categorize":[13],"defective":[14,135],"bits":[15,136],"in":[16,72,85],"large-scale":[17],"STT-MRAM":[18,78,160],"arrays":[19,147],"using":[20],"the":[21,69,105,118,131,146,155],"switching":[22],"voltage":[23],"(V":[24],"<inf":[25,43,60,87],"xmlns:mml=\"http://www.w3.org/1998/Math/MathML\"":[26,44,61,88],"xmlns:xlink=\"http://www.w3.org/1999/xlink\">sw</inf>":[27,45,62,89],")":[28],"distribution":[29,52],"from":[30,93,141,145],"single":[31],"measurement":[32],"sequence":[33],"for":[34],"both":[35],"set":[36],"reset":[38],"operations.":[39],"analyzed":[41],"V":[42,59,86],"with":[46,64,95,111],"statistical":[47],"approach":[48],"of":[49,124,159],"complementary":[50],"cumulative":[51],"function":[53],"(CCDF)":[54],"observed":[56],"high":[58],"tail":[63],"low":[65,97],"probability,":[66],"similar":[67],"ballooning":[70,83],"feature":[71,84],"write":[73],"error":[74],"rate":[75],"analyses":[76],"on":[77],"devices.":[79],"demonstrate":[81],"such":[82,137],"CCDF":[90],"clearly":[91],"originates":[92],"devices":[94,140,143],"relatively":[96],"resistance":[98],"TMR":[100],"ratio,":[101],"generally":[102],"attributed":[103],"magnetic":[106],"tunnel":[107],"junction":[108],"(MTJ)":[109],"pillars":[110],"soft":[112],"shorts":[113],"caused":[114],"by":[115],"re-deposition":[116],"during":[117],"patterning":[119],"process.":[120],"The":[121],"key":[122],"advantage":[123],"present":[125],"is":[130],"ability":[132],"differentiate":[134],"as":[138],"soft-shorted":[139],"normal":[142],"directly":[144],"without":[148],"reading":[149],"resistances":[150],"consequently":[152],"improve":[154],"speed":[156],"efficiency":[158],"product":[161],"development.":[162]},"counts_by_year":[{"year":2025,"cited_by_count":1}],"updated_date":"2025-11-06T03:46:38.306776","created_date":"2025-10-10T00:00:00"}