{"id":"https://openalex.org/W4398775095","doi":"https://doi.org/10.1109/imw59701.2024.10536950","title":"A novel test and analysis scheme to elucidate tail bit characteristics in STT-MRAM arrays","display_name":"A novel test and analysis scheme to elucidate tail bit characteristics in STT-MRAM arrays","publication_year":2024,"publication_date":"2024-05-12","ids":{"openalex":"https://openalex.org/W4398775095","doi":"https://doi.org/10.1109/imw59701.2024.10536950"},"language":"en","primary_location":{"id":"doi:10.1109/imw59701.2024.10536950","is_oa":false,"landing_page_url":"https://doi.org/10.1109/imw59701.2024.10536950","pdf_url":null,"source":null,"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"2024 IEEE International Memory Workshop (IMW)","raw_type":"proceedings-article"},"type":"conference-paper","indexed_in":["crossref"],"open_access":{"is_oa":false,"oa_status":"closed","oa_url":null,"any_repository_has_fulltext":false},"authorships":[{"author_position":"first","author":{"id":"https://openalex.org/A5100386555","display_name":"Woojin Kim","orcid":"https://orcid.org/0000-0002-2755-6661"},"institutions":[{"id":"https://openalex.org/I4210114974","display_name":"IMEC","ror":"https://ror.org/02kcbn207","country_code":"BE","type":"nonprofit","lineage":["https://openalex.org/I4210114974"]}],"countries":["BE"],"is_corresponding":false,"raw_author_name":"W. Kim","raw_affiliation_strings":["Imec,Leuven,Belgium,3001"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Imec,Leuven,Belgium,3001","institution_ids":["https://openalex.org/I4210114974"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5095959945","display_name":"Valerio Pica","orcid":"https://orcid.org/0009-0004-2468-4029"},"institutions":[{"id":"https://openalex.org/I4210114974","display_name":"IMEC","ror":"https://ror.org/02kcbn207","country_code":"BE","type":"nonprofit","lineage":["https://openalex.org/I4210114974"]}],"countries":["BE"],"is_corresponding":false,"raw_author_name":"V. Pica","raw_affiliation_strings":["Imec,Leuven,Belgium,3001"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Imec,Leuven,Belgium,3001","institution_ids":["https://openalex.org/I4210114974"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5004463732","display_name":"N. Jossart","orcid":null},"institutions":[{"id":"https://openalex.org/I4210114974","display_name":"IMEC","ror":"https://ror.org/02kcbn207","country_code":"BE","type":"nonprofit","lineage":["https://openalex.org/I4210114974"]}],"countries":["BE"],"is_corresponding":false,"raw_author_name":"N. Jossart","raw_affiliation_strings":["Imec,Leuven,Belgium,3001"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Imec,Leuven,Belgium,3001","institution_ids":["https://openalex.org/I4210114974"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5014711249","display_name":"Faisal Mohd-Yasin","orcid":"https://orcid.org/0000-0002-6030-7480"},"institutions":[{"id":"https://openalex.org/I4210114974","display_name":"IMEC","ror":"https://ror.org/02kcbn207","country_code":"BE","type":"nonprofit","lineage":["https://openalex.org/I4210114974"]}],"countries":["BE"],"is_corresponding":false,"raw_author_name":"F. Yasin","raw_affiliation_strings":["Imec,Leuven,Belgium,3001"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Imec,Leuven,Belgium,3001","institution_ids":["https://openalex.org/I4210114974"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5087201919","display_name":"Kurt Wostyn","orcid":"https://orcid.org/0000-0003-3995-0292"},"institutions":[{"id":"https://openalex.org/I4210114974","display_name":"IMEC","ror":"https://ror.org/02kcbn207","country_code":"BE","type":"nonprofit","lineage":["https://openalex.org/I4210114974"]}],"countries":["BE"],"is_corresponding":false,"raw_author_name":"K. Wostyn","raw_affiliation_strings":["Imec,Leuven,Belgium,3001"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Imec,Leuven,Belgium,3001","institution_ids":["https://openalex.org/I4210114974"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5022214575","display_name":"S\u00e9bastien Couet","orcid":"https://orcid.org/0000-0001-6436-9593"},"institutions":[{"id":"https://openalex.org/I4210114974","display_name":"IMEC","ror":"https://ror.org/02kcbn207","country_code":"BE","type":"nonprofit","lineage":["https://openalex.org/I4210114974"]}],"countries":["BE"],"is_corresponding":false,"raw_author_name":"S. Couet","raw_affiliation_strings":["Imec,Leuven,Belgium,3001"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Imec,Leuven,Belgium,3001","institution_ids":["https://openalex.org/I4210114974"]}]},{"author_position":"last","author":{"id":"https://openalex.org/A5002378343","display_name":"Siddharth Rao","orcid":"https://orcid.org/0000-0001-6161-3052"},"institutions":[{"id":"https://openalex.org/I4210114974","display_name":"IMEC","ror":"https://ror.org/02kcbn207","country_code":"BE","type":"nonprofit","lineage":["https://openalex.org/I4210114974"]}],"countries":["BE"],"is_corresponding":false,"raw_author_name":"S. Rao","raw_affiliation_strings":["Imec,Leuven,Belgium,3001"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Imec,Leuven,Belgium,3001","institution_ids":["https://openalex.org/I4210114974"]}]}],"institutions":[],"countries_distinct_count":1,"institutions_distinct_count":1,"corresponding_author_ids":[],"corresponding_institution_ids":["https://openalex.org/I4210114974"],"apc_list":null,"apc_paid":null,"fwci":0.9271,"has_fulltext":false,"cited_by_count":1,"citation_normalized_percentile":{"value":0.62369956,"is_in_top_1_percent":false,"is_in_top_10_percent":false},"cited_by_percentile_year":{"min":91,"max":95},"biblio":{"volume":null,"issue":null,"first_page":"1","last_page":"4"},"is_retracted":false,"is_paratext":false,"is_xpac":false,"primary_topic":{"id":"https://openalex.org/T12808","display_name":"Ferroelectric and Negative Capacitance Devices","score":0.9997000098228455,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},"topics":[{"id":"https://openalex.org/T12808","display_name":"Ferroelectric and Negative Capacitance Devices","score":0.9997000098228455,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T10049","display_name":"Magnetic properties of thin films","score":0.9994000196456909,"subfield":{"id":"https://openalex.org/subfields/3107","display_name":"Atomic and Molecular Physics, and Optics"},"field":{"id":"https://openalex.org/fields/31","display_name":"Physics and Astronomy"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T12169","display_name":"Non-Destructive Testing Techniques","score":0.9975000023841858,"subfield":{"id":"https://openalex.org/subfields/2210","display_name":"Mechanical Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"keywords":[{"id":"https://openalex.org/keywords/magnetoresistive-random-access-memory","display_name":"Magnetoresistive random-access memory","score":0.5213414430618286},{"id":"https://openalex.org/keywords/computer-science","display_name":"Computer science","score":0.5120084881782532},{"id":"https://openalex.org/keywords/tunnel-magnetoresistance","display_name":"Tunnel magnetoresistance","score":0.4998037815093994},{"id":"https://openalex.org/keywords/algorithm","display_name":"Algorithm","score":0.4385341703891754},{"id":"https://openalex.org/keywords/reset","display_name":"Reset (finance)","score":0.41986024379730225},{"id":"https://openalex.org/keywords/computer-hardware","display_name":"Computer hardware","score":0.23748233914375305},{"id":"https://openalex.org/keywords/materials-science","display_name":"Materials science","score":0.190277099609375},{"id":"https://openalex.org/keywords/nanotechnology","display_name":"Nanotechnology","score":0.10604819655418396},{"id":"https://openalex.org/keywords/random-access-memory","display_name":"Random access memory","score":0.09075850248336792}],"concepts":[{"id":"https://openalex.org/C46891859","wikidata":"https://www.wikidata.org/wiki/Q1061546","display_name":"Magnetoresistive random-access memory","level":3,"score":0.5213414430618286},{"id":"https://openalex.org/C41008148","wikidata":"https://www.wikidata.org/wiki/Q21198","display_name":"Computer science","level":0,"score":0.5120084881782532},{"id":"https://openalex.org/C56202322","wikidata":"https://www.wikidata.org/wiki/Q1884383","display_name":"Tunnel magnetoresistance","level":3,"score":0.4998037815093994},{"id":"https://openalex.org/C11413529","wikidata":"https://www.wikidata.org/wiki/Q8366","display_name":"Algorithm","level":1,"score":0.4385341703891754},{"id":"https://openalex.org/C2779795794","wikidata":"https://www.wikidata.org/wiki/Q7315343","display_name":"Reset (finance)","level":2,"score":0.41986024379730225},{"id":"https://openalex.org/C9390403","wikidata":"https://www.wikidata.org/wiki/Q3966","display_name":"Computer hardware","level":1,"score":0.23748233914375305},{"id":"https://openalex.org/C192562407","wikidata":"https://www.wikidata.org/wiki/Q228736","display_name":"Materials science","level":0,"score":0.190277099609375},{"id":"https://openalex.org/C171250308","wikidata":"https://www.wikidata.org/wiki/Q11468","display_name":"Nanotechnology","level":1,"score":0.10604819655418396},{"id":"https://openalex.org/C2994168587","wikidata":"https://www.wikidata.org/wiki/Q5295","display_name":"Random access memory","level":2,"score":0.09075850248336792},{"id":"https://openalex.org/C162324750","wikidata":"https://www.wikidata.org/wiki/Q8134","display_name":"Economics","level":0,"score":0.0},{"id":"https://openalex.org/C2779227376","wikidata":"https://www.wikidata.org/wiki/Q6505497","display_name":"Layer (electronics)","level":2,"score":0.0},{"id":"https://openalex.org/C106159729","wikidata":"https://www.wikidata.org/wiki/Q2294553","display_name":"Financial economics","level":1,"score":0.0}],"mesh":[],"locations_count":1,"locations":[{"id":"doi:10.1109/imw59701.2024.10536950","is_oa":false,"landing_page_url":"https://doi.org/10.1109/imw59701.2024.10536950","pdf_url":null,"source":null,"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"2024 IEEE International Memory Workshop (IMW)","raw_type":"proceedings-article"}],"best_oa_location":null,"sustainable_development_goals":[{"display_name":"Climate action","id":"https://metadata.un.org/sdg/13","score":0.41999998688697815}],"awards":[],"funders":[],"has_content":{"pdf":false,"grobid_xml":false},"content_urls":null,"referenced_works_count":0,"referenced_works":[],"related_works":["https://openalex.org/W2160372845","https://openalex.org/W1977755618","https://openalex.org/W1545438037","https://openalex.org/W2897770615","https://openalex.org/W4226197542","https://openalex.org/W4214681414","https://openalex.org/W1890124164","https://openalex.org/W2131964951","https://openalex.org/W2032117939","https://openalex.org/W2034593071"],"abstract_inverted_index":{"We":[0,36,68],"propose":[1],"a":[2,49],"simple":[3],"and":[4,7,12,33,47,83,111,135,141],"efficient":[5],"test":[6,110],"analysis":[8,112],"scheme":[9,113],"to":[10,56,88,117,137],"identify":[11],"categorize":[13],"defective":[14,119],"bits":[15,120],"in":[16,60,73],"large-scale":[17],"STT-MRAM":[18,66,144],"arrays":[19,131],"using":[20],"the":[21,57,89,102,115,130,139],"switching":[22],"voltage":[23],"(Vsw)":[24],"distribution":[25,44],"from":[26,77,125,129],"single":[27],"measurement":[28],"sequence":[29],"for":[30],"both":[31],"set":[32],"reset":[34],"operations.":[35],"analyzed":[37],"Vswwith":[38],"statistical":[39],"approach":[40],"of":[41,108,143],"complementary":[42],"cumulative":[43],"function":[45],"(CCDF)":[46],"observed":[48],"high":[50],"Vswtail":[51],"with":[52,79,95],"low":[53,81],"probability,":[54],"similar":[55],"ballooning":[58,71],"feature":[59,72],"write":[61],"error":[62],"rate":[63],"analyses":[64],"on":[65],"devices.":[67],"demonstrate":[69],"such":[70,121],"VswCCDF":[74],"clearly":[75],"originates":[76],"devices":[78,124,127],"relatively":[80],"resistance":[82],"TMR":[84],"ratio,":[85],"generally":[86],"attributed":[87],"magnetic":[90],"tunnel":[91],"junction":[92],"(MTJ)":[93],"pillars":[94],"soft":[96],"shorts":[97],"caused":[98],"by":[99],"re-deposition":[100],"during":[101],"patterning":[103],"process.":[104],"The":[105],"key":[106],"advantage":[107],"present":[109],"is":[114],"ability":[116],"differentiate":[118],"as":[122],"soft-shorted":[123],"normal":[126],"directly":[128],"without":[132],"reading":[133],"resistances":[134],"consequently":[136],"improve":[138],"speed":[140],"efficiency":[142],"product":[145],"development.":[146]},"counts_by_year":[{"year":2025,"cited_by_count":1}],"updated_date":"2026-07-29T14:22:42.915294","created_date":"2025-10-10T00:00:00"}