{"id":"https://openalex.org/W4380302700","doi":"https://doi.org/10.1109/imw56887.2023.10145966","title":"Comprehensive Study of Endurance Fatigue in the Scaled Si FeFET by in-situ V<sub>th</sub> Measurement and Endurance Enhancement Strategy","display_name":"Comprehensive Study of Endurance Fatigue in the Scaled Si FeFET by in-situ V<sub>th</sub> Measurement and Endurance Enhancement Strategy","publication_year":2023,"publication_date":"2023-05-01","ids":{"openalex":"https://openalex.org/W4380302700","doi":"https://doi.org/10.1109/imw56887.2023.10145966"},"language":"en","primary_location":{"id":"doi:10.1109/imw56887.2023.10145966","is_oa":false,"landing_page_url":"https://doi.org/10.1109/imw56887.2023.10145966","pdf_url":null,"source":null,"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"2023 IEEE International Memory Workshop (IMW)","raw_type":"proceedings-article"},"type":"article","indexed_in":["crossref"],"open_access":{"is_oa":false,"oa_status":"closed","oa_url":null,"any_repository_has_fulltext":false},"authorships":[{"author_position":"first","author":{"id":"https://openalex.org/A5089028688","display_name":"Xianzhou Shao","orcid":"https://orcid.org/0000-0003-3033-0396"},"institutions":[{"id":"https://openalex.org/I4210119392","display_name":"Institute of Microelectronics","ror":"https://ror.org/02s6gs133","country_code":"CN","type":"facility","lineage":["https://openalex.org/I19820366","https://openalex.org/I4210119392"]},{"id":"https://openalex.org/I4210165038","display_name":"University of Chinese Academy of Sciences","ror":"https://ror.org/05qbk4x57","country_code":"CN","type":"education","lineage":["https://openalex.org/I19820366","https://openalex.org/I4210165038"]},{"id":"https://openalex.org/I19820366","display_name":"Chinese Academy of Sciences","ror":"https://ror.org/034t30j35","country_code":"CN","type":"funder","lineage":["https://openalex.org/I19820366"]}],"countries":["CN"],"is_corresponding":true,"raw_author_name":"Xianzhou Shao","raw_affiliation_strings":["Institute of Microelectronics of the Chinese Academy of Sciences,Beijing,China","Institute of Microelectronics of the Chinese Academy of Sciences, Beijing, China","University of Chinese Academy of Sciences, Beijing, China"],"affiliations":[{"raw_affiliation_string":"Institute of Microelectronics of the Chinese Academy of Sciences,Beijing,China","institution_ids":["https://openalex.org/I4210119392","https://openalex.org/I19820366"]},{"raw_affiliation_string":"Institute of Microelectronics of the Chinese Academy of Sciences, Beijing, China","institution_ids":["https://openalex.org/I4210119392","https://openalex.org/I19820366"]},{"raw_affiliation_string":"University of Chinese Academy of Sciences, Beijing, China","institution_ids":["https://openalex.org/I4210165038"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5087520414","display_name":"Junshuai Chai","orcid":"https://orcid.org/0000-0001-5569-5071"},"institutions":[{"id":"https://openalex.org/I4210119392","display_name":"Institute of Microelectronics","ror":"https://ror.org/02s6gs133","country_code":"CN","type":"facility","lineage":["https://openalex.org/I19820366","https://openalex.org/I4210119392"]},{"id":"https://openalex.org/I19820366","display_name":"Chinese Academy of Sciences","ror":"https://ror.org/034t30j35","country_code":"CN","type":"funder","lineage":["https://openalex.org/I19820366"]}],"countries":["CN"],"is_corresponding":false,"raw_author_name":"Junshuai Chai","raw_affiliation_strings":["Institute of Microelectronics of the Chinese Academy of Sciences,Beijing,China","Institute of Microelectronics of the Chinese Academy of Sciences, Beijing, China"],"affiliations":[{"raw_affiliation_string":"Institute of Microelectronics of the Chinese Academy of Sciences,Beijing,China","institution_ids":["https://openalex.org/I4210119392","https://openalex.org/I19820366"]},{"raw_affiliation_string":"Institute of Microelectronics of the Chinese Academy of Sciences, Beijing, China","institution_ids":["https://openalex.org/I4210119392","https://openalex.org/I19820366"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5001581174","display_name":"Min Liao","orcid":"https://orcid.org/0000-0001-6777-8579"},"institutions":[{"id":"https://openalex.org/I4210119392","display_name":"Institute of Microelectronics","ror":"https://ror.org/02s6gs133","country_code":"CN","type":"facility","lineage":["https://openalex.org/I19820366","https://openalex.org/I4210119392"]},{"id":"https://openalex.org/I4210165038","display_name":"University of Chinese Academy of Sciences","ror":"https://ror.org/05qbk4x57","country_code":"CN","type":"education","lineage":["https://openalex.org/I19820366","https://openalex.org/I4210165038"]},{"id":"https://openalex.org/I19820366","display_name":"Chinese Academy of Sciences","ror":"https://ror.org/034t30j35","country_code":"CN","type":"funder","lineage":["https://openalex.org/I19820366"]}],"countries":["CN"],"is_corresponding":false,"raw_author_name":"Min Liao","raw_affiliation_strings":["Institute of Microelectronics of the Chinese Academy of Sciences,Beijing,China","Institute of Microelectronics of the Chinese Academy of Sciences, Beijing, China","University of Chinese Academy of Sciences, Beijing, China"],"affiliations":[{"raw_affiliation_string":"Institute of Microelectronics of the Chinese Academy of Sciences,Beijing,China","institution_ids":["https://openalex.org/I4210119392","https://openalex.org/I19820366"]},{"raw_affiliation_string":"Institute of Microelectronics of the Chinese Academy of Sciences, Beijing, China","institution_ids":["https://openalex.org/I4210119392","https://openalex.org/I19820366"]},{"raw_affiliation_string":"University of Chinese Academy of Sciences, Beijing, China","institution_ids":["https://openalex.org/I4210165038"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5040023626","display_name":"Jiahui Duan","orcid":"https://orcid.org/0000-0003-1097-5170"},"institutions":[{"id":"https://openalex.org/I4210165038","display_name":"University of Chinese Academy of Sciences","ror":"https://ror.org/05qbk4x57","country_code":"CN","type":"education","lineage":["https://openalex.org/I19820366","https://openalex.org/I4210165038"]},{"id":"https://openalex.org/I19820366","display_name":"Chinese Academy of Sciences","ror":"https://ror.org/034t30j35","country_code":"CN","type":"funder","lineage":["https://openalex.org/I19820366"]},{"id":"https://openalex.org/I4210119392","display_name":"Institute of Microelectronics","ror":"https://ror.org/02s6gs133","country_code":"CN","type":"facility","lineage":["https://openalex.org/I19820366","https://openalex.org/I4210119392"]}],"countries":["CN"],"is_corresponding":false,"raw_author_name":"Jiahui Duan","raw_affiliation_strings":["Institute of Microelectronics of the Chinese Academy of Sciences,Beijing,China","Institute of Microelectronics of the Chinese Academy of Sciences, Beijing, China","University of Chinese Academy of Sciences, Beijing, China"],"affiliations":[{"raw_affiliation_string":"Institute of Microelectronics of the Chinese Academy of Sciences,Beijing,China","institution_ids":["https://openalex.org/I4210119392","https://openalex.org/I19820366"]},{"raw_affiliation_string":"Institute of Microelectronics of the Chinese Academy of Sciences, Beijing, China","institution_ids":["https://openalex.org/I4210119392","https://openalex.org/I19820366"]},{"raw_affiliation_string":"University of Chinese Academy of Sciences, Beijing, China","institution_ids":["https://openalex.org/I4210165038"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5068759400","display_name":"Fengbin Tian","orcid":"https://orcid.org/0000-0002-0271-9815"},"institutions":[{"id":"https://openalex.org/I4210165038","display_name":"University of Chinese Academy of Sciences","ror":"https://ror.org/05qbk4x57","country_code":"CN","type":"education","lineage":["https://openalex.org/I19820366","https://openalex.org/I4210165038"]},{"id":"https://openalex.org/I19820366","display_name":"Chinese Academy of Sciences","ror":"https://ror.org/034t30j35","country_code":"CN","type":"funder","lineage":["https://openalex.org/I19820366"]},{"id":"https://openalex.org/I4210119392","display_name":"Institute of Microelectronics","ror":"https://ror.org/02s6gs133","country_code":"CN","type":"facility","lineage":["https://openalex.org/I19820366","https://openalex.org/I4210119392"]}],"countries":["CN"],"is_corresponding":false,"raw_author_name":"Fengbin Tian","raw_affiliation_strings":["Institute of Microelectronics of the Chinese Academy of Sciences,Beijing,China","University of Chinese Academy of Sciences, Beijing, China","Institute of Microelectronics of the Chinese Academy of Sciences, Beijing, China"],"affiliations":[{"raw_affiliation_string":"Institute of Microelectronics of the Chinese Academy of Sciences,Beijing,China","institution_ids":["https://openalex.org/I4210119392","https://openalex.org/I19820366"]},{"raw_affiliation_string":"University of Chinese Academy of Sciences, Beijing, China","institution_ids":["https://openalex.org/I4210165038"]},{"raw_affiliation_string":"Institute of Microelectronics of the Chinese Academy of Sciences, Beijing, China","institution_ids":["https://openalex.org/I4210119392","https://openalex.org/I19820366"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5017243775","display_name":"Xiaoyu Ke","orcid":null},"institutions":[{"id":"https://openalex.org/I4210165038","display_name":"University of Chinese Academy of Sciences","ror":"https://ror.org/05qbk4x57","country_code":"CN","type":"education","lineage":["https://openalex.org/I19820366","https://openalex.org/I4210165038"]},{"id":"https://openalex.org/I19820366","display_name":"Chinese Academy of Sciences","ror":"https://ror.org/034t30j35","country_code":"CN","type":"funder","lineage":["https://openalex.org/I19820366"]},{"id":"https://openalex.org/I4210119392","display_name":"Institute of Microelectronics","ror":"https://ror.org/02s6gs133","country_code":"CN","type":"facility","lineage":["https://openalex.org/I19820366","https://openalex.org/I4210119392"]}],"countries":["CN"],"is_corresponding":false,"raw_author_name":"Xiaoyu Ke","raw_affiliation_strings":["Institute of Microelectronics of the Chinese Academy of Sciences,Beijing,China","University of Chinese Academy of Sciences, Beijing, China","Institute of Microelectronics of the Chinese Academy of Sciences, Beijing, China"],"affiliations":[{"raw_affiliation_string":"Institute of Microelectronics of the Chinese Academy of Sciences,Beijing,China","institution_ids":["https://openalex.org/I4210119392","https://openalex.org/I19820366"]},{"raw_affiliation_string":"University of Chinese Academy of Sciences, Beijing, China","institution_ids":["https://openalex.org/I4210165038"]},{"raw_affiliation_string":"Institute of Microelectronics of the Chinese Academy of Sciences, Beijing, China","institution_ids":["https://openalex.org/I4210119392","https://openalex.org/I19820366"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5071115916","display_name":"Xiaoqing Sun","orcid":"https://orcid.org/0000-0002-9497-7634"},"institutions":[{"id":"https://openalex.org/I19820366","display_name":"Chinese Academy of Sciences","ror":"https://ror.org/034t30j35","country_code":"CN","type":"funder","lineage":["https://openalex.org/I19820366"]},{"id":"https://openalex.org/I4210119392","display_name":"Institute of Microelectronics","ror":"https://ror.org/02s6gs133","country_code":"CN","type":"facility","lineage":["https://openalex.org/I19820366","https://openalex.org/I4210119392"]},{"id":"https://openalex.org/I4210165038","display_name":"University of Chinese Academy of Sciences","ror":"https://ror.org/05qbk4x57","country_code":"CN","type":"education","lineage":["https://openalex.org/I19820366","https://openalex.org/I4210165038"]}],"countries":["CN"],"is_corresponding":false,"raw_author_name":"Xiaoqing Sun","raw_affiliation_strings":["Institute of Microelectronics of the Chinese Academy of Sciences,Beijing,China","University of Chinese Academy of Sciences, Beijing, China","Institute of Microelectronics of the Chinese Academy of Sciences, Beijing, China"],"affiliations":[{"raw_affiliation_string":"Institute of Microelectronics of the Chinese Academy of Sciences,Beijing,China","institution_ids":["https://openalex.org/I4210119392","https://openalex.org/I19820366"]},{"raw_affiliation_string":"University of Chinese Academy of Sciences, Beijing, China","institution_ids":["https://openalex.org/I4210165038"]},{"raw_affiliation_string":"Institute of Microelectronics of the Chinese Academy of Sciences, Beijing, China","institution_ids":["https://openalex.org/I4210119392","https://openalex.org/I19820366"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5100684858","display_name":"Hao Xu","orcid":"https://orcid.org/0000-0001-8682-5430"},"institutions":[{"id":"https://openalex.org/I19820366","display_name":"Chinese Academy of Sciences","ror":"https://ror.org/034t30j35","country_code":"CN","type":"funder","lineage":["https://openalex.org/I19820366"]},{"id":"https://openalex.org/I4210119392","display_name":"Institute of Microelectronics","ror":"https://ror.org/02s6gs133","country_code":"CN","type":"facility","lineage":["https://openalex.org/I19820366","https://openalex.org/I4210119392"]}],"countries":["CN"],"is_corresponding":false,"raw_author_name":"Hao Xu","raw_affiliation_strings":["Institute of Microelectronics of the Chinese Academy of Sciences,Beijing,China","Institute of Microelectronics of the Chinese Academy of Sciences, Beijing, China"],"affiliations":[{"raw_affiliation_string":"Institute of Microelectronics of the Chinese Academy of Sciences,Beijing,China","institution_ids":["https://openalex.org/I4210119392","https://openalex.org/I19820366"]},{"raw_affiliation_string":"Institute of Microelectronics of the Chinese Academy of Sciences, Beijing, China","institution_ids":["https://openalex.org/I4210119392","https://openalex.org/I19820366"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5102981003","display_name":"Jinjuan Xiang","orcid":"https://orcid.org/0000-0001-9728-5994"},"institutions":[],"countries":[],"is_corresponding":false,"raw_author_name":"Jinjuan Xiang","raw_affiliation_strings":["Beijing Superstring Academy of Memory Technology,Beijing,China","Beijing Superstring Academy of Memory Technology, Beijing, China"],"affiliations":[{"raw_affiliation_string":"Beijing Superstring Academy of Memory Technology,Beijing,China","institution_ids":[]},{"raw_affiliation_string":"Beijing Superstring Academy of Memory Technology, Beijing, China","institution_ids":[]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5100676716","display_name":"Xiaolei Wang","orcid":"https://orcid.org/0000-0002-4909-2511"},"institutions":[{"id":"https://openalex.org/I4210119392","display_name":"Institute of Microelectronics","ror":"https://ror.org/02s6gs133","country_code":"CN","type":"facility","lineage":["https://openalex.org/I19820366","https://openalex.org/I4210119392"]},{"id":"https://openalex.org/I19820366","display_name":"Chinese Academy of Sciences","ror":"https://ror.org/034t30j35","country_code":"CN","type":"funder","lineage":["https://openalex.org/I19820366"]}],"countries":["CN"],"is_corresponding":false,"raw_author_name":"Xiaolei Wang","raw_affiliation_strings":["Institute of Microelectronics of the Chinese Academy of Sciences,Beijing,China","Institute of Microelectronics of the Chinese Academy of Sciences, Beijing, China"],"affiliations":[{"raw_affiliation_string":"Institute of Microelectronics of the Chinese Academy of Sciences,Beijing,China","institution_ids":["https://openalex.org/I4210119392","https://openalex.org/I19820366"]},{"raw_affiliation_string":"Institute of Microelectronics of the Chinese Academy of Sciences, Beijing, China","institution_ids":["https://openalex.org/I4210119392","https://openalex.org/I19820366"]}]},{"author_position":"last","author":{"id":"https://openalex.org/A5110090531","display_name":"Wenwu Wang","orcid":null},"institutions":[{"id":"https://openalex.org/I19820366","display_name":"Chinese Academy of Sciences","ror":"https://ror.org/034t30j35","country_code":"CN","type":"funder","lineage":["https://openalex.org/I19820366"]},{"id":"https://openalex.org/I4210119392","display_name":"Institute of Microelectronics","ror":"https://ror.org/02s6gs133","country_code":"CN","type":"facility","lineage":["https://openalex.org/I19820366","https://openalex.org/I4210119392"]}],"countries":["CN"],"is_corresponding":false,"raw_author_name":"Wenwu Wang","raw_affiliation_strings":["Institute of Microelectronics of the Chinese Academy of Sciences,Beijing,China","Institute of Microelectronics of the Chinese Academy of Sciences, Beijing, China"],"affiliations":[{"raw_affiliation_string":"Institute of Microelectronics of the Chinese Academy of Sciences,Beijing,China","institution_ids":["https://openalex.org/I4210119392","https://openalex.org/I19820366"]},{"raw_affiliation_string":"Institute of Microelectronics of the Chinese Academy of Sciences, Beijing, China","institution_ids":["https://openalex.org/I4210119392","https://openalex.org/I19820366"]}]}],"institutions":[],"countries_distinct_count":1,"institutions_distinct_count":11,"corresponding_author_ids":["https://openalex.org/A5089028688"],"corresponding_institution_ids":["https://openalex.org/I19820366","https://openalex.org/I4210119392","https://openalex.org/I4210165038"],"apc_list":null,"apc_paid":null,"fwci":0.4016,"has_fulltext":false,"cited_by_count":3,"citation_normalized_percentile":{"value":0.59046957,"is_in_top_1_percent":false,"is_in_top_10_percent":false},"cited_by_percentile_year":{"min":91,"max":96},"biblio":{"volume":null,"issue":null,"first_page":"1","last_page":"4"},"is_retracted":false,"is_paratext":false,"is_xpac":false,"primary_topic":{"id":"https://openalex.org/T12808","display_name":"Ferroelectric and Negative Capacitance Devices","score":1.0,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},"topics":[{"id":"https://openalex.org/T12808","display_name":"Ferroelectric and Negative Capacitance Devices","score":1.0,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T10472","display_name":"Semiconductor materials and devices","score":0.9991999864578247,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T10558","display_name":"Advancements in Semiconductor Devices and Circuit Design","score":0.9897000193595886,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"keywords":[{"id":"https://openalex.org/keywords/trapping","display_name":"Trapping","score":0.5738253593444824},{"id":"https://openalex.org/keywords/electrical-engineering","display_name":"Electrical engineering","score":0.35954946279525757},{"id":"https://openalex.org/keywords/physics","display_name":"Physics","score":0.35939162969589233},{"id":"https://openalex.org/keywords/materials-science","display_name":"Materials science","score":0.3523353934288025},{"id":"https://openalex.org/keywords/computer-science","display_name":"Computer science","score":0.34084421396255493},{"id":"https://openalex.org/keywords/topology","display_name":"Topology (electrical circuits)","score":0.336284875869751},{"id":"https://openalex.org/keywords/engineering","display_name":"Engineering","score":0.18255656957626343},{"id":"https://openalex.org/keywords/biology","display_name":"Biology","score":0.11996307969093323}],"concepts":[{"id":"https://openalex.org/C2777924906","wikidata":"https://www.wikidata.org/wiki/Q34168","display_name":"Trapping","level":2,"score":0.5738253593444824},{"id":"https://openalex.org/C119599485","wikidata":"https://www.wikidata.org/wiki/Q43035","display_name":"Electrical engineering","level":1,"score":0.35954946279525757},{"id":"https://openalex.org/C121332964","wikidata":"https://www.wikidata.org/wiki/Q413","display_name":"Physics","level":0,"score":0.35939162969589233},{"id":"https://openalex.org/C192562407","wikidata":"https://www.wikidata.org/wiki/Q228736","display_name":"Materials science","level":0,"score":0.3523353934288025},{"id":"https://openalex.org/C41008148","wikidata":"https://www.wikidata.org/wiki/Q21198","display_name":"Computer science","level":0,"score":0.34084421396255493},{"id":"https://openalex.org/C184720557","wikidata":"https://www.wikidata.org/wiki/Q7825049","display_name":"Topology (electrical circuits)","level":2,"score":0.336284875869751},{"id":"https://openalex.org/C127413603","wikidata":"https://www.wikidata.org/wiki/Q11023","display_name":"Engineering","level":0,"score":0.18255656957626343},{"id":"https://openalex.org/C86803240","wikidata":"https://www.wikidata.org/wiki/Q420","display_name":"Biology","level":0,"score":0.11996307969093323},{"id":"https://openalex.org/C18903297","wikidata":"https://www.wikidata.org/wiki/Q7150","display_name":"Ecology","level":1,"score":0.0}],"mesh":[],"locations_count":1,"locations":[{"id":"doi:10.1109/imw56887.2023.10145966","is_oa":false,"landing_page_url":"https://doi.org/10.1109/imw56887.2023.10145966","pdf_url":null,"source":null,"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"2023 IEEE International Memory Workshop (IMW)","raw_type":"proceedings-article"}],"best_oa_location":null,"sustainable_development_goals":[],"awards":[],"funders":[{"id":"https://openalex.org/F4320321001","display_name":"National Natural Science Foundation of China","ror":"https://ror.org/01h0zpd94"}],"has_content":{"pdf":false,"grobid_xml":false},"content_urls":null,"referenced_works_count":2,"referenced_works":["https://openalex.org/W3082791943","https://openalex.org/W4252026737"],"related_works":["https://openalex.org/W4391375266","https://openalex.org/W2899084033","https://openalex.org/W2748952813","https://openalex.org/W2935759653","https://openalex.org/W3105167352","https://openalex.org/W54078636","https://openalex.org/W2954470139","https://openalex.org/W1501425562","https://openalex.org/W2902782467","https://openalex.org/W3084825885"],"abstract_inverted_index":{"The":[0,95,138],"endurance":[1,36,76,150],"degradation":[2,37],"mechanism":[3,38],"in":[4,39,69,152],"Si":[5],"FeFET":[6],"has":[7],"attracted":[8],"great":[9],"research":[10],"interest.":[11],"However,":[12],"the":[13,22,35,40,52,70,75,79,85,111,127,146,153],"reports":[14],"mainly":[15],"focused":[16],"on":[17],"large-scale":[18],"devices,":[19],"owing":[20],"to":[21,50,91,106,119,135],"external":[23],"current":[24],"measurement":[25,49],"limitations":[26],"of":[27,149],"modern":[28],"equipment.":[29],"In":[30],"this":[31],"work,":[32],"we":[33],"study":[34],"scaled":[41,154],"n-FeFET":[42],"by":[43],"in-situ":[44],"V":[45,80,96,112,128],"<inf":[46,81,97,113,129],"xmlns:mml=\"http://www.w3.org/1998/Math/MathML\"":[47,82,98,114,130],"xmlns:xlink=\"http://www.w3.org/1999/xlink\">th</inf>":[48,83,99],"overcome":[51],"size":[53],"limitation.":[54],"We":[55],"find":[56],"that":[57],"excess":[58],"electron":[59,93],"injection":[60,64],"rather":[61],"than":[62],"hole":[63,108,123,143],"plays":[65],"a":[66],"key":[67],"role":[68],"charge":[71],"trapping":[72,109,144],"behavior.":[73],"As":[74],"cycles":[77],"increase,":[78],"after":[84,100],"program":[86],"pulse":[87,102],"positively":[88],"shifts":[89,104],"due":[90,105],"less":[92],"de-trapping.":[94],"erase":[101],"negatively":[103],"more":[107],"when":[110,126],"xmlns:xlink=\"http://www.w3.org/1999/xlink\">g</inf>":[115,131],"changes":[116,132],"from":[117,133],"-1V":[118],"-4V":[120,134],"and":[121,142],"no":[122],"de-trapping":[124],"occurs":[125],"0":[136],"V.":[137],"donor":[139],"trap":[140],"generation":[141],"are":[145],"dominant":[147],"factors":[148],"failure":[151],"nFeFET.":[155]},"counts_by_year":[{"year":2025,"cited_by_count":1},{"year":2024,"cited_by_count":2}],"updated_date":"2025-11-06T03:46:38.306776","created_date":"2025-10-10T00:00:00"}