{"id":"https://openalex.org/W3166167780","doi":"https://doi.org/10.1109/imw51353.2021.9439627","title":"Scaling Potential Analysis for the CMOS Compatible Ox-RRAM","display_name":"Scaling Potential Analysis for the CMOS Compatible Ox-RRAM","publication_year":2021,"publication_date":"2021-05-01","ids":{"openalex":"https://openalex.org/W3166167780","doi":"https://doi.org/10.1109/imw51353.2021.9439627","mag":"3166167780"},"language":"en","primary_location":{"id":"doi:10.1109/imw51353.2021.9439627","is_oa":false,"landing_page_url":"https://doi.org/10.1109/imw51353.2021.9439627","pdf_url":null,"source":null,"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"2021 IEEE International Memory Workshop (IMW)","raw_type":"proceedings-article"},"type":"article","indexed_in":["crossref"],"open_access":{"is_oa":false,"oa_status":"closed","oa_url":null,"any_repository_has_fulltext":false},"authorships":[{"author_position":"first","author":{"id":"https://openalex.org/A5049920459","display_name":"Xiaoxin Xu","orcid":"https://orcid.org/0000-0002-0277-1314"},"institutions":[{"id":"https://openalex.org/I4210119392","display_name":"Institute of Microelectronics","ror":"https://ror.org/02s6gs133","country_code":"CN","type":"facility","lineage":["https://openalex.org/I19820366","https://openalex.org/I4210119392"]},{"id":"https://openalex.org/I19820366","display_name":"Chinese Academy of Sciences","ror":"https://ror.org/034t30j35","country_code":"CN","type":"funder","lineage":["https://openalex.org/I19820366"]}],"countries":["CN"],"is_corresponding":true,"raw_author_name":"Xiaoxin Xu","raw_affiliation_strings":["Key Laboratory of Microelectronics, Devices and Integrated Technology Institute of Microelectronics, Chinese Academy of Sciences, Beijing, China"],"affiliations":[{"raw_affiliation_string":"Key Laboratory of Microelectronics, Devices and Integrated Technology Institute of Microelectronics, Chinese Academy of Sciences, Beijing, China","institution_ids":["https://openalex.org/I19820366","https://openalex.org/I4210119392"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5105519078","display_name":"Wenxuan Sun","orcid":"https://orcid.org/0000-0002-9723-4844"},"institutions":[{"id":"https://openalex.org/I4210119392","display_name":"Institute of Microelectronics","ror":"https://ror.org/02s6gs133","country_code":"CN","type":"facility","lineage":["https://openalex.org/I19820366","https://openalex.org/I4210119392"]},{"id":"https://openalex.org/I19820366","display_name":"Chinese Academy of Sciences","ror":"https://ror.org/034t30j35","country_code":"CN","type":"funder","lineage":["https://openalex.org/I19820366"]}],"countries":["CN"],"is_corresponding":false,"raw_author_name":"Wenxuan Sun","raw_affiliation_strings":["Key Laboratory of Microelectronics, Devices and Integrated Technology Institute of Microelectronics, Chinese Academy of Sciences, Beijing, China"],"affiliations":[{"raw_affiliation_string":"Key Laboratory of Microelectronics, Devices and Integrated Technology Institute of Microelectronics, Chinese Academy of Sciences, Beijing, China","institution_ids":["https://openalex.org/I19820366","https://openalex.org/I4210119392"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5107868685","display_name":"Jie Yu","orcid":"https://orcid.org/0009-0006-5415-4891"},"institutions":[{"id":"https://openalex.org/I19820366","display_name":"Chinese Academy of Sciences","ror":"https://ror.org/034t30j35","country_code":"CN","type":"funder","lineage":["https://openalex.org/I19820366"]},{"id":"https://openalex.org/I4210119392","display_name":"Institute of Microelectronics","ror":"https://ror.org/02s6gs133","country_code":"CN","type":"facility","lineage":["https://openalex.org/I19820366","https://openalex.org/I4210119392"]}],"countries":["CN"],"is_corresponding":false,"raw_author_name":"Jie Yu","raw_affiliation_strings":["Key Laboratory of Microelectronics, Devices and Integrated Technology Institute of Microelectronics, Chinese Academy of Sciences, Beijing, China"],"affiliations":[{"raw_affiliation_string":"Key Laboratory of Microelectronics, Devices and Integrated Technology Institute of Microelectronics, Chinese Academy of Sciences, Beijing, China","institution_ids":["https://openalex.org/I19820366","https://openalex.org/I4210119392"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5053665482","display_name":"Jinru Lai","orcid":null},"institutions":[{"id":"https://openalex.org/I126520041","display_name":"University of Science and Technology of China","ror":"https://ror.org/04c4dkn09","country_code":"CN","type":"education","lineage":["https://openalex.org/I126520041","https://openalex.org/I19820366"]}],"countries":["CN"],"is_corresponding":false,"raw_author_name":"Jinru Lai","raw_affiliation_strings":["School of Microelectronics, The University of Science and Technology of China, HeFei, China"],"affiliations":[{"raw_affiliation_string":"School of Microelectronics, The University of Science and Technology of China, HeFei, China","institution_ids":["https://openalex.org/I126520041"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5049715624","display_name":"Danian Dong","orcid":"https://orcid.org/0000-0002-9740-687X"},"institutions":[{"id":"https://openalex.org/I19820366","display_name":"Chinese Academy of Sciences","ror":"https://ror.org/034t30j35","country_code":"CN","type":"funder","lineage":["https://openalex.org/I19820366"]},{"id":"https://openalex.org/I4210119392","display_name":"Institute of Microelectronics","ror":"https://ror.org/02s6gs133","country_code":"CN","type":"facility","lineage":["https://openalex.org/I19820366","https://openalex.org/I4210119392"]}],"countries":["CN"],"is_corresponding":false,"raw_author_name":"Danian Dong","raw_affiliation_strings":["Key Laboratory of Microelectronics, Devices and Integrated Technology Institute of Microelectronics, Chinese Academy of Sciences, Beijing, China"],"affiliations":[{"raw_affiliation_string":"Key Laboratory of Microelectronics, Devices and Integrated Technology Institute of Microelectronics, Chinese Academy of Sciences, Beijing, China","institution_ids":["https://openalex.org/I19820366","https://openalex.org/I4210119392"]}]},{"author_position":"last","author":{"id":"https://openalex.org/A5111976023","display_name":"Hangbing Lv","orcid":null},"institutions":[{"id":"https://openalex.org/I19820366","display_name":"Chinese Academy of Sciences","ror":"https://ror.org/034t30j35","country_code":"CN","type":"funder","lineage":["https://openalex.org/I19820366"]},{"id":"https://openalex.org/I4210119392","display_name":"Institute of Microelectronics","ror":"https://ror.org/02s6gs133","country_code":"CN","type":"facility","lineage":["https://openalex.org/I19820366","https://openalex.org/I4210119392"]}],"countries":["CN"],"is_corresponding":false,"raw_author_name":"Hangbing Lv","raw_affiliation_strings":["Key Laboratory of Microelectronics, Devices and Integrated Technology Institute of Microelectronics, Chinese Academy of Sciences, Beijing, China"],"affiliations":[{"raw_affiliation_string":"Key Laboratory of Microelectronics, Devices and Integrated Technology Institute of Microelectronics, Chinese Academy of Sciences, Beijing, China","institution_ids":["https://openalex.org/I19820366","https://openalex.org/I4210119392"]}]}],"institutions":[],"countries_distinct_count":1,"institutions_distinct_count":6,"corresponding_author_ids":["https://openalex.org/A5049920459"],"corresponding_institution_ids":["https://openalex.org/I19820366","https://openalex.org/I4210119392"],"apc_list":null,"apc_paid":null,"fwci":0.0,"has_fulltext":false,"cited_by_count":0,"citation_normalized_percentile":{"value":0.04678096,"is_in_top_1_percent":false,"is_in_top_10_percent":false},"cited_by_percentile_year":null,"biblio":{"volume":null,"issue":null,"first_page":"1","last_page":"4"},"is_retracted":false,"is_paratext":false,"is_xpac":false,"primary_topic":{"id":"https://openalex.org/T10502","display_name":"Advanced Memory and Neural Computing","score":1.0,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},"topics":[{"id":"https://openalex.org/T10502","display_name":"Advanced Memory and Neural Computing","score":1.0,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T12808","display_name":"Ferroelectric and Negative Capacitance Devices","score":0.9998000264167786,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T10472","display_name":"Semiconductor materials and devices","score":0.9994999766349792,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"keywords":[{"id":"https://openalex.org/keywords/resistive-random-access-memory","display_name":"Resistive random-access memory","score":0.8798317909240723},{"id":"https://openalex.org/keywords/miniaturization","display_name":"Miniaturization","score":0.7178988456726074},{"id":"https://openalex.org/keywords/scalability","display_name":"Scalability","score":0.659441351890564},{"id":"https://openalex.org/keywords/cmos","display_name":"CMOS","score":0.6142261028289795},{"id":"https://openalex.org/keywords/reliability","display_name":"Reliability (semiconductor)","score":0.6125036478042603},{"id":"https://openalex.org/keywords/computer-science","display_name":"Computer science","score":0.5980935096740723},{"id":"https://openalex.org/keywords/electronic-engineering","display_name":"Electronic engineering","score":0.5342580080032349},{"id":"https://openalex.org/keywords/transistor","display_name":"Transistor","score":0.5320846438407898},{"id":"https://openalex.org/keywords/limiting","display_name":"Limiting","score":0.4774751663208008},{"id":"https://openalex.org/keywords/scaling","display_name":"Scaling","score":0.47228485345840454},{"id":"https://openalex.org/keywords/voltage","display_name":"Voltage","score":0.4689193367958069},{"id":"https://openalex.org/keywords/electrical-engineering","display_name":"Electrical engineering","score":0.4265875220298767},{"id":"https://openalex.org/keywords/chip","display_name":"Chip","score":0.42012834548950195},{"id":"https://openalex.org/keywords/engineering","display_name":"Engineering","score":0.19240030646324158},{"id":"https://openalex.org/keywords/telecommunications","display_name":"Telecommunications","score":0.10730969905853271},{"id":"https://openalex.org/keywords/physics","display_name":"Physics","score":0.0904916524887085},{"id":"https://openalex.org/keywords/mathematics","display_name":"Mathematics","score":0.06983587145805359}],"concepts":[{"id":"https://openalex.org/C182019814","wikidata":"https://www.wikidata.org/wiki/Q1143830","display_name":"Resistive random-access memory","level":3,"score":0.8798317909240723},{"id":"https://openalex.org/C57528182","wikidata":"https://www.wikidata.org/wiki/Q1271842","display_name":"Miniaturization","level":2,"score":0.7178988456726074},{"id":"https://openalex.org/C48044578","wikidata":"https://www.wikidata.org/wiki/Q727490","display_name":"Scalability","level":2,"score":0.659441351890564},{"id":"https://openalex.org/C46362747","wikidata":"https://www.wikidata.org/wiki/Q173431","display_name":"CMOS","level":2,"score":0.6142261028289795},{"id":"https://openalex.org/C43214815","wikidata":"https://www.wikidata.org/wiki/Q7310987","display_name":"Reliability (semiconductor)","level":3,"score":0.6125036478042603},{"id":"https://openalex.org/C41008148","wikidata":"https://www.wikidata.org/wiki/Q21198","display_name":"Computer science","level":0,"score":0.5980935096740723},{"id":"https://openalex.org/C24326235","wikidata":"https://www.wikidata.org/wiki/Q126095","display_name":"Electronic engineering","level":1,"score":0.5342580080032349},{"id":"https://openalex.org/C172385210","wikidata":"https://www.wikidata.org/wiki/Q5339","display_name":"Transistor","level":3,"score":0.5320846438407898},{"id":"https://openalex.org/C188198153","wikidata":"https://www.wikidata.org/wiki/Q1613840","display_name":"Limiting","level":2,"score":0.4774751663208008},{"id":"https://openalex.org/C99844830","wikidata":"https://www.wikidata.org/wiki/Q102441924","display_name":"Scaling","level":2,"score":0.47228485345840454},{"id":"https://openalex.org/C165801399","wikidata":"https://www.wikidata.org/wiki/Q25428","display_name":"Voltage","level":2,"score":0.4689193367958069},{"id":"https://openalex.org/C119599485","wikidata":"https://www.wikidata.org/wiki/Q43035","display_name":"Electrical engineering","level":1,"score":0.4265875220298767},{"id":"https://openalex.org/C165005293","wikidata":"https://www.wikidata.org/wiki/Q1074500","display_name":"Chip","level":2,"score":0.42012834548950195},{"id":"https://openalex.org/C127413603","wikidata":"https://www.wikidata.org/wiki/Q11023","display_name":"Engineering","level":0,"score":0.19240030646324158},{"id":"https://openalex.org/C76155785","wikidata":"https://www.wikidata.org/wiki/Q418","display_name":"Telecommunications","level":1,"score":0.10730969905853271},{"id":"https://openalex.org/C121332964","wikidata":"https://www.wikidata.org/wiki/Q413","display_name":"Physics","level":0,"score":0.0904916524887085},{"id":"https://openalex.org/C33923547","wikidata":"https://www.wikidata.org/wiki/Q395","display_name":"Mathematics","level":0,"score":0.06983587145805359},{"id":"https://openalex.org/C2524010","wikidata":"https://www.wikidata.org/wiki/Q8087","display_name":"Geometry","level":1,"score":0.0},{"id":"https://openalex.org/C62520636","wikidata":"https://www.wikidata.org/wiki/Q944","display_name":"Quantum mechanics","level":1,"score":0.0},{"id":"https://openalex.org/C163258240","wikidata":"https://www.wikidata.org/wiki/Q25342","display_name":"Power (physics)","level":2,"score":0.0},{"id":"https://openalex.org/C77088390","wikidata":"https://www.wikidata.org/wiki/Q8513","display_name":"Database","level":1,"score":0.0},{"id":"https://openalex.org/C78519656","wikidata":"https://www.wikidata.org/wiki/Q101333","display_name":"Mechanical engineering","level":1,"score":0.0}],"mesh":[],"locations_count":1,"locations":[{"id":"doi:10.1109/imw51353.2021.9439627","is_oa":false,"landing_page_url":"https://doi.org/10.1109/imw51353.2021.9439627","pdf_url":null,"source":null,"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"2021 IEEE International Memory Workshop (IMW)","raw_type":"proceedings-article"}],"best_oa_location":null,"sustainable_development_goals":[],"awards":[{"id":"https://openalex.org/G3981925221","display_name":null,"funder_award_id":"2016YFA0201800,2018YFA0701500","funder_id":"https://openalex.org/F4320309618","funder_display_name":"Ministry of Science and Technology"},{"id":"https://openalex.org/G4589813752","display_name":null,"funder_award_id":"XDB44000000","funder_id":"https://openalex.org/F4320337515","funder_display_name":"Center for Advanced Study, University of Illinois at Urbana-Champaign"},{"id":"https://openalex.org/G7080642432","display_name":null,"funder_award_id":"61804173,61834009,62025406,62025406,61904197","funder_id":"https://openalex.org/F4320321001","funder_display_name":"National Natural Science Foundation of China"}],"funders":[{"id":"https://openalex.org/F4320309618","display_name":"Ministry of Science and Technology","ror":"https://ror.org/02b207r52"},{"id":"https://openalex.org/F4320321001","display_name":"National Natural Science Foundation of China","ror":"https://ror.org/01h0zpd94"},{"id":"https://openalex.org/F4320337515","display_name":"Center for Advanced Study, University of Illinois at Urbana-Champaign","ror":"https://ror.org/047426m28"}],"has_content":{"grobid_xml":false,"pdf":false},"content_urls":null,"referenced_works_count":10,"referenced_works":["https://openalex.org/W1908389539","https://openalex.org/W2786091100","https://openalex.org/W2794194363","https://openalex.org/W2808967576","https://openalex.org/W2913335973","https://openalex.org/W2965096498","https://openalex.org/W3048446883","https://openalex.org/W3120756728","https://openalex.org/W3138812221","https://openalex.org/W6791686832"],"related_works":["https://openalex.org/W2545245183","https://openalex.org/W2054635671","https://openalex.org/W2348807422","https://openalex.org/W2361025757","https://openalex.org/W2017425642","https://openalex.org/W2350916061","https://openalex.org/W2050837474","https://openalex.org/W1970117475","https://openalex.org/W4396815615","https://openalex.org/W2926730772"],"abstract_inverted_index":{"This":[0],"paper":[1],"investigated":[2],"the":[3,14,29,57,62,65,68,72,80,93],"scalability":[4],"potential":[5],"of":[6,64,71,82],"Ox-RRAM":[7],"at":[8],"advance":[9],"technology":[10,30],"nodes":[11],"by":[12],"considering":[13],"programing":[15],"voltage,":[16],"current":[17,70],"and":[18,37,52,97],"stability":[19,63],"factors.":[20],"The":[21,45,85],"voltage":[22],"mismatch":[23],"issue":[24],"become":[25,31],"more":[26],"serious":[27],"as":[28],"advance.":[32],"High":[33],"temperature":[34,54],"forming":[35],"scheme":[36],"array":[38],"architecture":[39,87],"optimization":[40],"could":[41],"alleviate":[42],"this":[43],"issue.":[44],"tail":[46],"bit":[47],"occurs":[48],"during":[49],"reading":[50],"operation":[51],"high":[53],"retention,":[55],"making":[56],"bit-error-rate":[58],"increase.":[59],"To":[60],"ensure":[61],"memory":[66],"chip,":[67],"programming":[69],"device":[73],"needs":[74],"larger":[75],"than":[76],"100":[77],"\u03bcA,":[78],"limiting":[79],"miniaturization":[81],"transistor":[83],"size.":[84],"novel":[86],"should":[88],"be":[89],"designed":[90],"to":[91],"solve":[92],"tradeoff":[94],"between":[95],"reliability":[96],"density.":[98]},"counts_by_year":[],"updated_date":"2025-11-06T03:46:38.306776","created_date":"2025-10-10T00:00:00"}