{"id":"https://openalex.org/W4416252181","doi":"https://doi.org/10.1109/ijcnn64981.2025.11227379","title":"Automated Graph-level Passes for TinyML Fault Tolerance","display_name":"Automated Graph-level Passes for TinyML Fault Tolerance","publication_year":2025,"publication_date":"2025-06-30","ids":{"openalex":"https://openalex.org/W4416252181","doi":"https://doi.org/10.1109/ijcnn64981.2025.11227379"},"language":null,"primary_location":{"id":"doi:10.1109/ijcnn64981.2025.11227379","is_oa":false,"landing_page_url":"https://doi.org/10.1109/ijcnn64981.2025.11227379","pdf_url":null,"source":null,"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"2025 International Joint Conference on Neural Networks (IJCNN)","raw_type":"proceedings-article"},"type":"conference-paper","indexed_in":["crossref"],"open_access":{"is_oa":false,"oa_status":"closed","oa_url":null,"any_repository_has_fulltext":false},"authorships":[{"author_position":"first","author":{"id":"https://openalex.org/A5109838781","display_name":"JC Kappes","orcid":null},"institutions":[{"id":"https://openalex.org/I145847075","display_name":"TU Wien","ror":"https://ror.org/04d836q62","country_code":"AT","type":"education","lineage":["https://openalex.org/I145847075"]}],"countries":["AT"],"is_corresponding":false,"raw_author_name":"Johannes Kappes","raw_affiliation_strings":["TU Wien,Institute of Computer Engineering,Vienna,Austria"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"TU Wien,Institute of Computer Engineering,Vienna,Austria","institution_ids":["https://openalex.org/I145847075"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5048166222","display_name":"Johannes Geier","orcid":"https://orcid.org/0000-0002-9439-3890"},"institutions":[{"id":"https://openalex.org/I62916508","display_name":"Technical University of Munich","ror":"https://ror.org/02kkvpp62","country_code":"DE","type":"education","lineage":["https://openalex.org/I62916508"]}],"countries":["DE"],"is_corresponding":false,"raw_author_name":"Johannes Geier","raw_affiliation_strings":["Technical University of Munich,Chair of Electronic Design Automation,Munich,Germany"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Technical University of Munich,Chair of Electronic Design Automation,Munich,Germany","institution_ids":["https://openalex.org/I62916508"]}]},{"author_position":"middle","author":{"id":null,"display_name":"Philipp van Kempen","orcid":null},"institutions":[{"id":"https://openalex.org/I62916508","display_name":"Technical University of Munich","ror":"https://ror.org/02kkvpp62","country_code":"DE","type":"education","lineage":["https://openalex.org/I62916508"]}],"countries":["DE"],"is_corresponding":false,"raw_author_name":"Philipp van Kempen","raw_affiliation_strings":["Technical University of Munich,Chair of Electronic Design Automation,Munich,Germany"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Technical University of Munich,Chair of Electronic Design Automation,Munich,Germany","institution_ids":["https://openalex.org/I62916508"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5011419637","display_name":"Daniel Mueller-Gritschneder","orcid":"https://orcid.org/0000-0003-0903-631X"},"institutions":[{"id":"https://openalex.org/I145847075","display_name":"TU Wien","ror":"https://ror.org/04d836q62","country_code":"AT","type":"education","lineage":["https://openalex.org/I145847075"]}],"countries":["AT"],"is_corresponding":false,"raw_author_name":"Daniel Mueller-Gritschneder","raw_affiliation_strings":["TU Wien,Institute of Computer Engineering,Vienna,Austria"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"TU Wien,Institute of Computer Engineering,Vienna,Austria","institution_ids":["https://openalex.org/I145847075"]}]},{"author_position":"last","author":{"id":"https://openalex.org/A5017567485","display_name":"Ulf Schlichtmann","orcid":"https://orcid.org/0000-0003-4431-7619"},"institutions":[{"id":"https://openalex.org/I62916508","display_name":"Technical University of Munich","ror":"https://ror.org/02kkvpp62","country_code":"DE","type":"education","lineage":["https://openalex.org/I62916508"]}],"countries":["DE"],"is_corresponding":false,"raw_author_name":"Ulf Schlichtmann","raw_affiliation_strings":["Technical University of Munich,Chair of Electronic Design Automation,Munich,Germany"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Technical University of Munich,Chair of Electronic Design Automation,Munich,Germany","institution_ids":["https://openalex.org/I62916508"]}]}],"institutions":[],"countries_distinct_count":2,"institutions_distinct_count":2,"corresponding_author_ids":[],"corresponding_institution_ids":[],"apc_list":null,"apc_paid":null,"fwci":1.5151,"has_fulltext":false,"cited_by_count":1,"citation_normalized_percentile":{"value":0.83843402,"is_in_top_1_percent":false,"is_in_top_10_percent":false},"cited_by_percentile_year":{"min":94,"max":97},"biblio":{"volume":null,"issue":null,"first_page":"1","last_page":"9"},"is_retracted":false,"is_paratext":false,"is_xpac":false,"primary_topic":{"id":"https://openalex.org/T10054","display_name":"Parallel Computing and Optimization Techniques","score":0.19740000367164612,"subfield":{"id":"https://openalex.org/subfields/1708","display_name":"Hardware and Architecture"},"field":{"id":"https://openalex.org/fields/17","display_name":"Computer Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},"topics":[{"id":"https://openalex.org/T10054","display_name":"Parallel Computing and Optimization Techniques","score":0.19740000367164612,"subfield":{"id":"https://openalex.org/subfields/1708","display_name":"Hardware and Architecture"},"field":{"id":"https://openalex.org/fields/17","display_name":"Computer Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T11005","display_name":"Radiation Effects in Electronics","score":0.16220000386238098,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T12127","display_name":"Software System Performance and Reliability","score":0.12530000507831573,"subfield":{"id":"https://openalex.org/subfields/1705","display_name":"Computer Networks and Communications"},"field":{"id":"https://openalex.org/fields/17","display_name":"Computer Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"keywords":[{"id":"https://openalex.org/keywords/redundancy","display_name":"Redundancy (engineering)","score":0.7810999751091003},{"id":"https://openalex.org/keywords/fault-tolerance","display_name":"Fault tolerance","score":0.7317000031471252},{"id":"https://openalex.org/keywords/fault-injection","display_name":"Fault injection","score":0.40130001306533813},{"id":"https://openalex.org/keywords/compiler","display_name":"Compiler","score":0.3781000077724457},{"id":"https://openalex.org/keywords/resilience","display_name":"Resilience (materials science)","score":0.37389999628067017},{"id":"https://openalex.org/keywords/overhead","display_name":"Overhead (engineering)","score":0.350600004196167},{"id":"https://openalex.org/keywords/software-fault-tolerance","display_name":"Software fault tolerance","score":0.3199000060558319},{"id":"https://openalex.org/keywords/graph","display_name":"Graph","score":0.3183000087738037}],"concepts":[{"id":"https://openalex.org/C152124472","wikidata":"https://www.wikidata.org/wiki/Q1204361","display_name":"Redundancy (engineering)","level":2,"score":0.7810999751091003},{"id":"https://openalex.org/C41008148","wikidata":"https://www.wikidata.org/wiki/Q21198","display_name":"Computer science","level":0,"score":0.7706999778747559},{"id":"https://openalex.org/C63540848","wikidata":"https://www.wikidata.org/wiki/Q3140932","display_name":"Fault tolerance","level":2,"score":0.7317000031471252},{"id":"https://openalex.org/C149635348","wikidata":"https://www.wikidata.org/wiki/Q193040","display_name":"Embedded system","level":1,"score":0.4869000017642975},{"id":"https://openalex.org/C120314980","wikidata":"https://www.wikidata.org/wiki/Q180634","display_name":"Distributed computing","level":1,"score":0.47189998626708984},{"id":"https://openalex.org/C2775928411","wikidata":"https://www.wikidata.org/wiki/Q2041312","display_name":"Fault injection","level":3,"score":0.40130001306533813},{"id":"https://openalex.org/C169590947","wikidata":"https://www.wikidata.org/wiki/Q47506","display_name":"Compiler","level":2,"score":0.3781000077724457},{"id":"https://openalex.org/C2779585090","wikidata":"https://www.wikidata.org/wiki/Q3457762","display_name":"Resilience (materials science)","level":2,"score":0.37389999628067017},{"id":"https://openalex.org/C2779960059","wikidata":"https://www.wikidata.org/wiki/Q7113681","display_name":"Overhead (engineering)","level":2,"score":0.350600004196167},{"id":"https://openalex.org/C113775141","wikidata":"https://www.wikidata.org/wiki/Q428691","display_name":"Computer engineering","level":1,"score":0.34139999747276306},{"id":"https://openalex.org/C50712370","wikidata":"https://www.wikidata.org/wiki/Q4269346","display_name":"Software fault tolerance","level":3,"score":0.3199000060558319},{"id":"https://openalex.org/C132525143","wikidata":"https://www.wikidata.org/wiki/Q141488","display_name":"Graph","level":2,"score":0.3183000087738037},{"id":"https://openalex.org/C196371267","wikidata":"https://www.wikidata.org/wiki/Q3998979","display_name":"Triple modular redundancy","level":3,"score":0.313400000333786},{"id":"https://openalex.org/C173018170","wikidata":"https://www.wikidata.org/wiki/Q165678","display_name":"Microcontroller","level":2,"score":0.3075999915599823},{"id":"https://openalex.org/C168065819","wikidata":"https://www.wikidata.org/wiki/Q845566","display_name":"Debugging","level":2,"score":0.30239999294281006},{"id":"https://openalex.org/C79403827","wikidata":"https://www.wikidata.org/wiki/Q3988","display_name":"Real-time computing","level":1,"score":0.29319998621940613},{"id":"https://openalex.org/C190902152","wikidata":"https://www.wikidata.org/wiki/Q1325106","display_name":"Optimizing compiler","level":3,"score":0.2913999855518341},{"id":"https://openalex.org/C152745839","wikidata":"https://www.wikidata.org/wiki/Q5438153","display_name":"Fault detection and isolation","level":3,"score":0.2849000096321106},{"id":"https://openalex.org/C124304363","wikidata":"https://www.wikidata.org/wiki/Q673661","display_name":"Abstraction","level":2,"score":0.2766000032424927},{"id":"https://openalex.org/C111335779","wikidata":"https://www.wikidata.org/wiki/Q3454686","display_name":"Reduction (mathematics)","level":2,"score":0.26100000739097595},{"id":"https://openalex.org/C126953365","wikidata":"https://www.wikidata.org/wiki/Q5438152","display_name":"Fault coverage","level":3,"score":0.259799987077713},{"id":"https://openalex.org/C167391956","wikidata":"https://www.wikidata.org/wiki/Q1401211","display_name":"Fault model","level":3,"score":0.25699999928474426},{"id":"https://openalex.org/C50644808","wikidata":"https://www.wikidata.org/wiki/Q192776","display_name":"Artificial neural network","level":2,"score":0.2502000033855438}],"mesh":[],"locations_count":1,"locations":[{"id":"doi:10.1109/ijcnn64981.2025.11227379","is_oa":false,"landing_page_url":"https://doi.org/10.1109/ijcnn64981.2025.11227379","pdf_url":null,"source":null,"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"2025 International Joint Conference on Neural Networks (IJCNN)","raw_type":"proceedings-article"}],"best_oa_location":null,"sustainable_development_goals":[],"awards":[],"funders":[{"id":"https://openalex.org/F4320321408","display_name":"Ministry of Education","ror":"https://ror.org/01p262204"}],"has_content":{"pdf":false,"grobid_xml":false},"content_urls":null,"referenced_works_count":19,"referenced_works":["https://openalex.org/W1487279492","https://openalex.org/W2083613288","https://openalex.org/W2538867637","https://openalex.org/W2767260595","https://openalex.org/W2951691654","https://openalex.org/W2963114857","https://openalex.org/W2963122961","https://openalex.org/W3011997511","https://openalex.org/W3014034225","https://openalex.org/W3135074210","https://openalex.org/W3149134903","https://openalex.org/W3174529902","https://openalex.org/W3187862527","https://openalex.org/W3208231137","https://openalex.org/W4379115983","https://openalex.org/W4390576801","https://openalex.org/W4399496684","https://openalex.org/W4399496737","https://openalex.org/W4399497125"],"related_works":[],"abstract_inverted_index":{"Deploying":[0],"Machine":[1,113],"Learning":[2],"(ML)":[3],"applications":[4],"on":[5,51,119,169],"Microcontroller":[6],"Unit":[7],"(MCU)-type":[8],"devices,":[9],"known":[10],"as":[11,65],"TinyML,":[12],"poses":[13],"significant":[14],"challenges":[15],"due":[16],"to":[17,142],"constrained":[18],"resources.":[19,38],"Consequently,":[20],"this":[21,60],"restricts":[22],"the":[23,57,110,125,133,164],"integration":[24],"of":[25,35,153],"fault":[26,138],"tolerance":[27],"mechanisms.":[28],"Many":[29],"redundancy":[30,96],"techniques":[31],"consume":[32],"substantial":[33],"amounts":[34],"already":[36],"limited":[37],"To":[39],"address":[40],"this,":[41],"Algorithm-Based":[42],"Fault":[43],"Tolerance":[44],"(ABFT)":[45],"methods":[46],"for":[47,155,174],"ML":[48],"workloads":[49],"focus":[50],"resource-intensive":[52],"neural":[53],"network":[54],"operators":[55,67],"at":[56],"kernel-level.":[58],"However,":[59],"abstraction":[61],"level":[62],"introduces":[63,77],"challenges,":[64],"these":[66],"are":[68,107],"often":[69],"encapsulated":[70],"within":[71],"vendor-specific":[72],"proprietary":[73],"libraries.":[74],"This":[75],"work":[76],"automated":[78],"and":[79,117,160],"universal":[80],"graph-level":[81],"Data":[82],"Flow":[83],"Graph":[84],"(DFG)":[85],"passes":[86,106],"supporting":[87],"common":[88],"kernel-level":[89,143],"ABFT":[90,144,159],"methods,":[91,145],"along":[92],"with":[93,124,157],"a":[94,120,148],"sophisticated":[95],"mechanism":[97],"called":[98],"Dual":[99],"Module":[100],"Redundancy":[101],"Island":[102],"(DMRland).":[103],"These":[104],"DFG":[105],"implemented":[108],"in":[109,140,147],"Tensor":[111],"Virtual":[112],"(TVM)":[114],"compiler":[115],"framework":[116],"evaluated":[118],"CPU-only":[121],"execution":[122],"platform":[123],"MLPerf\u2122Tiny":[126],"benchmark.":[127],"Our":[128],"experimental":[129],"results":[130],"demonstrate":[131],"that":[132],"proposed":[134],"approach":[135],"achieves":[136],"competitive":[137],"resilience":[139],"comparison":[141],"resulting":[146],"reduction":[149],"by":[150],"two":[151],"orders":[152],"magnitude":[154],"misclassification":[156],"combined":[158],"DMRland":[161],"methods.":[162],"Further,":[163],"run-time":[165],"overhead":[166],"(RTO)":[167],"remains,":[168],"average,":[170],"19%":[171],"lower":[172],"than":[173],"comparable":[175],"kernel-based":[176],"implementations.":[177]},"counts_by_year":[{"year":2026,"cited_by_count":1}],"updated_date":"2026-07-29T14:22:42.915294","created_date":"2025-11-14T00:00:00"}