{"id":"https://openalex.org/W1652153443","doi":"https://doi.org/10.1109/ijcnn.2015.7280498","title":"Automatic fault detection and diagnosis for photovoltaic systems using combined artificial neural network and analytical based methods","display_name":"Automatic fault detection and diagnosis for photovoltaic systems using combined artificial neural network and analytical based methods","publication_year":2015,"publication_date":"2015-07-01","ids":{"openalex":"https://openalex.org/W1652153443","doi":"https://doi.org/10.1109/ijcnn.2015.7280498","mag":"1652153443"},"language":"en","primary_location":{"id":"doi:10.1109/ijcnn.2015.7280498","is_oa":false,"landing_page_url":"https://doi.org/10.1109/ijcnn.2015.7280498","pdf_url":null,"source":null,"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"2015 International Joint Conference on Neural Networks (IJCNN)","raw_type":"proceedings-article"},"type":"article","indexed_in":["crossref"],"open_access":{"is_oa":false,"oa_status":"closed","oa_url":null,"any_repository_has_fulltext":false},"authorships":[{"author_position":"first","author":{"id":"https://openalex.org/A5100891158","display_name":"Lian Lian Jiang","orcid":null},"institutions":[{"id":"https://openalex.org/I172675005","display_name":"Nanyang Technological University","ror":"https://ror.org/02e7b5302","country_code":"SG","type":"education","lineage":["https://openalex.org/I172675005"]}],"countries":["SG"],"is_corresponding":false,"raw_author_name":"Lian Lian Jiang","raw_affiliation_strings":["School of Computer Engineering, Nanyang Technological University, Singapore","School of Computer Engineering, Nanyang Technological University,,Singapore"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"School of Computer Engineering, Nanyang Technological University, Singapore","institution_ids":["https://openalex.org/I172675005"]},{"raw_affiliation_string":"School of Computer Engineering, Nanyang Technological University,,Singapore","institution_ids":["https://openalex.org/I172675005"]}]},{"author_position":"last","author":{"id":"https://openalex.org/A5059218594","display_name":"Douglas L. Maskell","orcid":"https://orcid.org/0000-0002-6588-4762"},"institutions":[{"id":"https://openalex.org/I172675005","display_name":"Nanyang Technological University","ror":"https://ror.org/02e7b5302","country_code":"SG","type":"education","lineage":["https://openalex.org/I172675005"]}],"countries":["SG"],"is_corresponding":false,"raw_author_name":"Douglas L. Maskell","raw_affiliation_strings":["School of Computer Engineering, Nanyang Technological University, Singapore","School of Computer Engineering, Nanyang Technological University,,Singapore"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"School of Computer Engineering, Nanyang Technological University, Singapore","institution_ids":["https://openalex.org/I172675005"]},{"raw_affiliation_string":"School of Computer Engineering, Nanyang Technological University,,Singapore","institution_ids":["https://openalex.org/I172675005"]}]}],"institutions":[],"countries_distinct_count":1,"institutions_distinct_count":1,"corresponding_author_ids":[],"corresponding_institution_ids":["https://openalex.org/I172675005"],"apc_list":null,"apc_paid":null,"fwci":1.725,"has_fulltext":false,"cited_by_count":93,"citation_normalized_percentile":{"value":0.84429919,"is_in_top_1_percent":false,"is_in_top_10_percent":false},"cited_by_percentile_year":{"min":94,"max":99},"biblio":{"volume":null,"issue":null,"first_page":"1","last_page":"8"},"is_retracted":false,"is_paratext":false,"is_xpac":false,"primary_topic":{"id":"https://openalex.org/T10468","display_name":"Photovoltaic System Optimization Techniques","score":1.0,"subfield":{"id":"https://openalex.org/subfields/2105","display_name":"Renewable Energy, Sustainability and the Environment"},"field":{"id":"https://openalex.org/fields/21","display_name":"Energy"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},"topics":[{"id":"https://openalex.org/T10468","display_name":"Photovoltaic System Optimization Techniques","score":1.0,"subfield":{"id":"https://openalex.org/subfields/2105","display_name":"Renewable Energy, Sustainability and the Environment"},"field":{"id":"https://openalex.org/fields/21","display_name":"Energy"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T11276","display_name":"Solar Radiation and Photovoltaics","score":0.9976999759674072,"subfield":{"id":"https://openalex.org/subfields/1702","display_name":"Artificial Intelligence"},"field":{"id":"https://openalex.org/fields/17","display_name":"Computer Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T12309","display_name":"solar cell performance optimization","score":0.9914000034332275,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"keywords":[{"id":"https://openalex.org/keywords/photovoltaic-system","display_name":"Photovoltaic system","score":0.794609785079956},{"id":"https://openalex.org/keywords/fault","display_name":"Fault (geology)","score":0.7065233588218689},{"id":"https://openalex.org/keywords/fault-detection-and-isolation","display_name":"Fault detection and isolation","score":0.6425800919532776},{"id":"https://openalex.org/keywords/artificial-neural-network","display_name":"Artificial neural network","score":0.6160828471183777},{"id":"https://openalex.org/keywords/computer-science","display_name":"Computer science","score":0.5800979137420654},{"id":"https://openalex.org/keywords/string","display_name":"String (physics)","score":0.5625355839729309},{"id":"https://openalex.org/keywords/electric-power-system","display_name":"Electric power system","score":0.5292122960090637},{"id":"https://openalex.org/keywords/reliability","display_name":"Reliability (semiconductor)","score":0.5135086178779602},{"id":"https://openalex.org/keywords/power","display_name":"Power (physics)","score":0.4791697561740875},{"id":"https://openalex.org/keywords/voltage","display_name":"Voltage","score":0.478536456823349},{"id":"https://openalex.org/keywords/reliability-engineering","display_name":"Reliability engineering","score":0.46934187412261963},{"id":"https://openalex.org/keywords/stuck-at-fault","display_name":"Stuck-at fault","score":0.4306240677833557},{"id":"https://openalex.org/keywords/fault-indicator","display_name":"Fault indicator","score":0.42254722118377686},{"id":"https://openalex.org/keywords/fault-coverage","display_name":"Fault coverage","score":0.41312333941459656},{"id":"https://openalex.org/keywords/real-time-computing","display_name":"Real-time computing","score":0.34951213002204895},{"id":"https://openalex.org/keywords/engineering","display_name":"Engineering","score":0.2860482931137085},{"id":"https://openalex.org/keywords/artificial-intelligence","display_name":"Artificial intelligence","score":0.2836095094680786},{"id":"https://openalex.org/keywords/electronic-circuit","display_name":"Electronic circuit","score":0.12715739011764526},{"id":"https://openalex.org/keywords/electrical-engineering","display_name":"Electrical engineering","score":0.10329174995422363},{"id":"https://openalex.org/keywords/mathematics","display_name":"Mathematics","score":0.07150182127952576}],"concepts":[{"id":"https://openalex.org/C41291067","wikidata":"https://www.wikidata.org/wiki/Q1897785","display_name":"Photovoltaic system","level":2,"score":0.794609785079956},{"id":"https://openalex.org/C175551986","wikidata":"https://www.wikidata.org/wiki/Q47089","display_name":"Fault (geology)","level":2,"score":0.7065233588218689},{"id":"https://openalex.org/C152745839","wikidata":"https://www.wikidata.org/wiki/Q5438153","display_name":"Fault detection and isolation","level":3,"score":0.6425800919532776},{"id":"https://openalex.org/C50644808","wikidata":"https://www.wikidata.org/wiki/Q192776","display_name":"Artificial neural network","level":2,"score":0.6160828471183777},{"id":"https://openalex.org/C41008148","wikidata":"https://www.wikidata.org/wiki/Q21198","display_name":"Computer science","level":0,"score":0.5800979137420654},{"id":"https://openalex.org/C157486923","wikidata":"https://www.wikidata.org/wiki/Q1376436","display_name":"String (physics)","level":2,"score":0.5625355839729309},{"id":"https://openalex.org/C89227174","wikidata":"https://www.wikidata.org/wiki/Q2388981","display_name":"Electric power system","level":3,"score":0.5292122960090637},{"id":"https://openalex.org/C43214815","wikidata":"https://www.wikidata.org/wiki/Q7310987","display_name":"Reliability (semiconductor)","level":3,"score":0.5135086178779602},{"id":"https://openalex.org/C163258240","wikidata":"https://www.wikidata.org/wiki/Q25342","display_name":"Power (physics)","level":2,"score":0.4791697561740875},{"id":"https://openalex.org/C165801399","wikidata":"https://www.wikidata.org/wiki/Q25428","display_name":"Voltage","level":2,"score":0.478536456823349},{"id":"https://openalex.org/C200601418","wikidata":"https://www.wikidata.org/wiki/Q2193887","display_name":"Reliability engineering","level":1,"score":0.46934187412261963},{"id":"https://openalex.org/C13625343","wikidata":"https://www.wikidata.org/wiki/Q7627418","display_name":"Stuck-at fault","level":4,"score":0.4306240677833557},{"id":"https://openalex.org/C21267803","wikidata":"https://www.wikidata.org/wiki/Q5438159","display_name":"Fault indicator","level":4,"score":0.42254722118377686},{"id":"https://openalex.org/C126953365","wikidata":"https://www.wikidata.org/wiki/Q5438152","display_name":"Fault coverage","level":3,"score":0.41312333941459656},{"id":"https://openalex.org/C79403827","wikidata":"https://www.wikidata.org/wiki/Q3988","display_name":"Real-time computing","level":1,"score":0.34951213002204895},{"id":"https://openalex.org/C127413603","wikidata":"https://www.wikidata.org/wiki/Q11023","display_name":"Engineering","level":0,"score":0.2860482931137085},{"id":"https://openalex.org/C154945302","wikidata":"https://www.wikidata.org/wiki/Q11660","display_name":"Artificial intelligence","level":1,"score":0.2836095094680786},{"id":"https://openalex.org/C134146338","wikidata":"https://www.wikidata.org/wiki/Q1815901","display_name":"Electronic circuit","level":2,"score":0.12715739011764526},{"id":"https://openalex.org/C119599485","wikidata":"https://www.wikidata.org/wiki/Q43035","display_name":"Electrical engineering","level":1,"score":0.10329174995422363},{"id":"https://openalex.org/C33923547","wikidata":"https://www.wikidata.org/wiki/Q395","display_name":"Mathematics","level":0,"score":0.07150182127952576},{"id":"https://openalex.org/C62520636","wikidata":"https://www.wikidata.org/wiki/Q944","display_name":"Quantum mechanics","level":1,"score":0.0},{"id":"https://openalex.org/C165205528","wikidata":"https://www.wikidata.org/wiki/Q83371","display_name":"Seismology","level":1,"score":0.0},{"id":"https://openalex.org/C127313418","wikidata":"https://www.wikidata.org/wiki/Q1069","display_name":"Geology","level":0,"score":0.0},{"id":"https://openalex.org/C37914503","wikidata":"https://www.wikidata.org/wiki/Q156495","display_name":"Mathematical physics","level":1,"score":0.0},{"id":"https://openalex.org/C121332964","wikidata":"https://www.wikidata.org/wiki/Q413","display_name":"Physics","level":0,"score":0.0},{"id":"https://openalex.org/C172707124","wikidata":"https://www.wikidata.org/wiki/Q423488","display_name":"Actuator","level":2,"score":0.0}],"mesh":[],"locations_count":1,"locations":[{"id":"doi:10.1109/ijcnn.2015.7280498","is_oa":false,"landing_page_url":"https://doi.org/10.1109/ijcnn.2015.7280498","pdf_url":null,"source":null,"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"2015 International Joint Conference on Neural Networks (IJCNN)","raw_type":"proceedings-article"}],"best_oa_location":null,"sustainable_development_goals":[],"awards":[],"funders":[],"has_content":{"pdf":false,"grobid_xml":false},"content_urls":null,"referenced_works_count":39,"referenced_works":["https://openalex.org/W1554663460","https://openalex.org/W1963613440","https://openalex.org/W1966758067","https://openalex.org/W1980245553","https://openalex.org/W1989661716","https://openalex.org/W1998254168","https://openalex.org/W2009162418","https://openalex.org/W2029149883","https://openalex.org/W2029283899","https://openalex.org/W2029509602","https://openalex.org/W2042919102","https://openalex.org/W2047335908","https://openalex.org/W2051682883","https://openalex.org/W2051730619","https://openalex.org/W2056352423","https://openalex.org/W2057628854","https://openalex.org/W2059636060","https://openalex.org/W2073667763","https://openalex.org/W2088874310","https://openalex.org/W2092296530","https://openalex.org/W2092669910","https://openalex.org/W2094354466","https://openalex.org/W2096991872","https://openalex.org/W2098213624","https://openalex.org/W2102600927","https://openalex.org/W2105734873","https://openalex.org/W2106642194","https://openalex.org/W2124604122","https://openalex.org/W2131841686","https://openalex.org/W2135167853","https://openalex.org/W2151211112","https://openalex.org/W2152918504","https://openalex.org/W2159915844","https://openalex.org/W2160937203","https://openalex.org/W2169498704","https://openalex.org/W2170423728","https://openalex.org/W2527449256","https://openalex.org/W4388297464","https://openalex.org/W6727831344"],"related_works":["https://openalex.org/W2024194466","https://openalex.org/W3148663848","https://openalex.org/W3186790058","https://openalex.org/W2051500795","https://openalex.org/W2163103195","https://openalex.org/W1978303825","https://openalex.org/W4210447066","https://openalex.org/W1974225921","https://openalex.org/W2390533148","https://openalex.org/W2386936363"],"abstract_inverted_index":{"Long":[0],"term":[1],"exposure":[2],"of":[3,36,164,177,205],"photovoltaic":[4],"(PV)":[5],"systems":[6],"under":[7],"relatively":[8],"harsh":[9],"and":[10,45,51,61,92,117,152,160,192,202],"changing":[11],"environmental":[12],"conditions":[13,18],"can":[14],"result":[15],"in":[16,63],"fault":[17,49,75,90,115,181,200],"developing":[19],"during":[20],"the":[21,37,59,108,114,127,135,139,145,148,153,156,165,178,198,206],"operational":[22],"lifetime.":[23],"The":[24,66,183],"present":[25],"solution":[26],"is":[27,42,53,123,131],"for":[28,95],"system":[29],"operators":[30],"to":[31,57,112,125,174],"manually":[32],"perform":[33],"condition":[34],"monitoring":[35],"PV":[38,64,98,141,166],"system.":[39,142],"However,":[40],"it":[41],"time-consuming,":[43],"inaccurate":[44],"dangerous.":[46],"Thus,":[47],"automatic":[48,89],"detection":[50,91,116,201],"diagnosis":[52,93,118,203],"a":[54,187],"critical":[55],"task":[56],"ensure":[58],"reliability":[60],"safety":[62],"systems.":[65,99],"current":[67,163],"state-of-the-art":[68],"techniques":[69],"either":[70],"cannot":[71],"provide":[72],"enough":[73],"detailed":[74],"information":[76],"with":[77,107,134],"high":[78],"accuracy":[79],"or":[80],"have":[81],"too":[82],"much":[83],"complexity.":[84],"This":[85],"work":[86],"presents":[87],"an":[88,102],"method":[94,111,185],"string":[96,167],"based":[97],"It":[100],"combines":[101],"artificial":[103],"neural":[104],"network":[105],"(ANN)":[106],"conventional":[109],"analytical":[110,170],"conduct":[113],"tasks.":[119],"A":[120],"two-layered":[121],"ANN":[122,149],"applied":[124],"predict":[126],"expected":[128],"power":[129,137,151],"which":[130],"then":[132],"compared":[133],"measured":[136,154],"from":[138],"real":[140],"Based":[143],"on":[144],"difference":[146],"between":[147],"estimated":[150],"power,":[155],"open":[157],"circuit":[158,162],"voltage":[159],"short":[161],"determined":[168],"using":[169],"equations":[171],"are":[172],"used":[173],"identify":[175],"any":[176],"six":[179],"defined":[180],"types.":[182],"proposed":[184,207],"has":[186],"fast":[188],"detection,":[189],"compact":[190],"structure":[191],"good":[193],"accuracy.":[194],"Simulation":[195],"results":[196],"show":[197],"effective":[199],"capability":[204],"method.":[208]},"counts_by_year":[{"year":2026,"cited_by_count":4},{"year":2025,"cited_by_count":5},{"year":2024,"cited_by_count":7},{"year":2023,"cited_by_count":9},{"year":2022,"cited_by_count":13},{"year":2021,"cited_by_count":14},{"year":2020,"cited_by_count":14},{"year":2019,"cited_by_count":10},{"year":2018,"cited_by_count":4},{"year":2017,"cited_by_count":11},{"year":2016,"cited_by_count":2}],"updated_date":"2025-11-06T03:46:38.306776","created_date":"2025-10-10T00:00:00"}