{"id":"https://openalex.org/W2048380190","doi":"https://doi.org/10.1109/ijcnn.2007.4371355","title":"Online Incremental Learning for High Voltage Bushing Condition Monitoring","display_name":"Online Incremental Learning for High Voltage Bushing Condition Monitoring","publication_year":2007,"publication_date":"2007-08-01","ids":{"openalex":"https://openalex.org/W2048380190","doi":"https://doi.org/10.1109/ijcnn.2007.4371355","mag":"2048380190"},"language":"en","primary_location":{"id":"doi:10.1109/ijcnn.2007.4371355","is_oa":false,"landing_page_url":"https://doi.org/10.1109/ijcnn.2007.4371355","pdf_url":null,"source":{"id":"https://openalex.org/S4210195743","display_name":"IEEE International Conference on Neural Networks/IEEE ... International Conference on Neural Networks","issn_l":"1098-7576","issn":["1098-7576","1558-3902"],"is_oa":false,"is_in_doaj":false,"is_core":false,"host_organization":"https://openalex.org/P4310319808","host_organization_name":"Institute of Electrical and Electronics Engineers","host_organization_lineage":["https://openalex.org/P4310319808"],"host_organization_lineage_names":["Institute of Electrical and Electronics Engineers"],"type":"conference"},"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"2007 International Joint Conference on Neural Networks","raw_type":"proceedings-article"},"type":"article","indexed_in":["crossref"],"open_access":{"is_oa":false,"oa_status":"closed","oa_url":null,"any_repository_has_fulltext":false},"authorships":[{"author_position":"first","author":{"id":"https://openalex.org/A5063455065","display_name":"Christina B. Vilakazi","orcid":null},"institutions":[{"id":"https://openalex.org/I192619145","display_name":"University of the Witwatersrand","ror":"https://ror.org/03rp50x72","country_code":"ZA","type":"education","lineage":["https://openalex.org/I192619145"]}],"countries":["ZA"],"is_corresponding":true,"raw_author_name":"Christina B. Vilakazi","raw_affiliation_strings":["School of Electrical and Information Engineering, University of the Witwatersrand, South Africa","University of the Witwatersrand; Johannesburg"],"affiliations":[{"raw_affiliation_string":"School of Electrical and Information Engineering, University of the Witwatersrand, South Africa","institution_ids":["https://openalex.org/I192619145"]},{"raw_affiliation_string":"University of the Witwatersrand; Johannesburg","institution_ids":["https://openalex.org/I192619145"]}]},{"author_position":"last","author":{"id":"https://openalex.org/A5066130528","display_name":"Tshilidzi Marwala","orcid":"https://orcid.org/0000-0001-7372-5510"},"institutions":[{"id":"https://openalex.org/I192619145","display_name":"University of the Witwatersrand","ror":"https://ror.org/03rp50x72","country_code":"ZA","type":"education","lineage":["https://openalex.org/I192619145"]}],"countries":["ZA"],"is_corresponding":false,"raw_author_name":"Tshilidzi Marwala","raw_affiliation_strings":["Head of Center of Control and Systems at the School of Electrical and Information Engineering, University of the Witwatersrand, South Africa","University of the Witwatersrand; Johannesburg"],"affiliations":[{"raw_affiliation_string":"Head of Center of Control and Systems at the School of Electrical and Information Engineering, University of the Witwatersrand, South Africa","institution_ids":["https://openalex.org/I192619145"]},{"raw_affiliation_string":"University of the Witwatersrand; Johannesburg","institution_ids":["https://openalex.org/I192619145"]}]}],"institutions":[],"countries_distinct_count":1,"institutions_distinct_count":2,"corresponding_author_ids":["https://openalex.org/A5063455065"],"corresponding_institution_ids":["https://openalex.org/I192619145"],"apc_list":null,"apc_paid":null,"fwci":0.0,"has_fulltext":false,"cited_by_count":7,"citation_normalized_percentile":{"value":0.11485397,"is_in_top_1_percent":false,"is_in_top_10_percent":false},"cited_by_percentile_year":{"min":89,"max":95},"biblio":{"volume":null,"issue":null,"first_page":"2521","last_page":"2526"},"is_retracted":false,"is_paratext":false,"is_xpac":false,"primary_topic":{"id":"https://openalex.org/T11343","display_name":"Power Transformer Diagnostics and Insulation","score":0.9977999925613403,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},"topics":[{"id":"https://openalex.org/T11343","display_name":"Power Transformer Diagnostics and Insulation","score":0.9977999925613403,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T12111","display_name":"Industrial Vision Systems and Defect Detection","score":0.9915000200271606,"subfield":{"id":"https://openalex.org/subfields/2209","display_name":"Industrial and Manufacturing Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T10511","display_name":"High voltage insulation and dielectric phenomena","score":0.991100013256073,"subfield":{"id":"https://openalex.org/subfields/2505","display_name":"Materials Chemistry"},"field":{"id":"https://openalex.org/fields/25","display_name":"Materials Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"keywords":[{"id":"https://openalex.org/keywords/bushing","display_name":"Bushing","score":0.9468392133712769},{"id":"https://openalex.org/keywords/high-voltage","display_name":"High voltage","score":0.7335193157196045},{"id":"https://openalex.org/keywords/condition-monitoring","display_name":"Condition monitoring","score":0.5621605515480042},{"id":"https://openalex.org/keywords/computer-science","display_name":"Computer science","score":0.556542694568634},{"id":"https://openalex.org/keywords/voltage","display_name":"Voltage","score":0.4829530119895935},{"id":"https://openalex.org/keywords/electrical-engineering","display_name":"Electrical engineering","score":0.328355073928833},{"id":"https://openalex.org/keywords/engineering","display_name":"Engineering","score":0.2777956426143646},{"id":"https://openalex.org/keywords/mechanical-engineering","display_name":"Mechanical engineering","score":0.13104167580604553}],"concepts":[{"id":"https://openalex.org/C30293662","wikidata":"https://www.wikidata.org/wiki/Q2262992","display_name":"Bushing","level":2,"score":0.9468392133712769},{"id":"https://openalex.org/C88182573","wikidata":"https://www.wikidata.org/wiki/Q1139740","display_name":"High voltage","level":3,"score":0.7335193157196045},{"id":"https://openalex.org/C2775846686","wikidata":"https://www.wikidata.org/wiki/Q643012","display_name":"Condition monitoring","level":2,"score":0.5621605515480042},{"id":"https://openalex.org/C41008148","wikidata":"https://www.wikidata.org/wiki/Q21198","display_name":"Computer science","level":0,"score":0.556542694568634},{"id":"https://openalex.org/C165801399","wikidata":"https://www.wikidata.org/wiki/Q25428","display_name":"Voltage","level":2,"score":0.4829530119895935},{"id":"https://openalex.org/C119599485","wikidata":"https://www.wikidata.org/wiki/Q43035","display_name":"Electrical engineering","level":1,"score":0.328355073928833},{"id":"https://openalex.org/C127413603","wikidata":"https://www.wikidata.org/wiki/Q11023","display_name":"Engineering","level":0,"score":0.2777956426143646},{"id":"https://openalex.org/C78519656","wikidata":"https://www.wikidata.org/wiki/Q101333","display_name":"Mechanical engineering","level":1,"score":0.13104167580604553}],"mesh":[],"locations_count":1,"locations":[{"id":"doi:10.1109/ijcnn.2007.4371355","is_oa":false,"landing_page_url":"https://doi.org/10.1109/ijcnn.2007.4371355","pdf_url":null,"source":{"id":"https://openalex.org/S4210195743","display_name":"IEEE International Conference on Neural Networks/IEEE ... International Conference on Neural Networks","issn_l":"1098-7576","issn":["1098-7576","1558-3902"],"is_oa":false,"is_in_doaj":false,"is_core":false,"host_organization":"https://openalex.org/P4310319808","host_organization_name":"Institute of Electrical and Electronics Engineers","host_organization_lineage":["https://openalex.org/P4310319808"],"host_organization_lineage_names":["Institute of Electrical and Electronics Engineers"],"type":"conference"},"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"2007 International Joint Conference on Neural Networks","raw_type":"proceedings-article"}],"best_oa_location":null,"sustainable_development_goals":[],"awards":[],"funders":[],"has_content":{"pdf":false,"grobid_xml":false},"content_urls":null,"referenced_works_count":14,"referenced_works":["https://openalex.org/W652682793","https://openalex.org/W1796562198","https://openalex.org/W1982315076","https://openalex.org/W2094490310","https://openalex.org/W2095822020","https://openalex.org/W2095980522","https://openalex.org/W2103753221","https://openalex.org/W2144287956","https://openalex.org/W2158747337","https://openalex.org/W2166280719","https://openalex.org/W2748729145","https://openalex.org/W4237639151","https://openalex.org/W6621327921","https://openalex.org/W6743252330"],"related_works":["https://openalex.org/W2748952813","https://openalex.org/W2942767629","https://openalex.org/W1996222664","https://openalex.org/W2062855981","https://openalex.org/W2742827818","https://openalex.org/W2001989632","https://openalex.org/W2012090846","https://openalex.org/W2554019664","https://openalex.org/W3007150058","https://openalex.org/W2570111703"],"abstract_inverted_index":{"The":[0,66,89,113],"problem":[1,24,62,85],"of":[2,5,63,74,86,97,110,122],"fault":[3],"diagnosis":[4],"machine":[6,16,27,37],"has":[7],"been":[8,20],"an":[9,120],"ongoing":[10],"research":[11],"in":[12],"various":[13],"industries.":[14],"Many":[15],"learning":[17,28,58,79,95],"tools":[18],"have":[19],"applied":[21,82],"to":[22,41,60,83],"this":[23],"using":[25],"static":[26],"structures":[29],"such":[30],"as":[31,45],"neural":[32],"network":[33],"and":[34,101],"support":[35],"vector":[36],"that":[38,118],"are":[39,81],"unable":[40],"accommodate":[42],"new":[43],"information":[44],"it":[46],"becomes":[47],"available":[48],"into":[49],"their":[50],"existing":[51],"models.":[52],"This":[53],"paper":[54,67],"introduces":[55],"the":[56,61,84,93,108,111],"incremental":[57,75,78,94],"approach":[59,105],"condition":[64,87],"monitoring.":[65,88],"starts":[68],"by":[69],"giving":[70],"a":[71],"brief":[72],"definition":[73],"learning.":[76],"Two":[77],"techniques":[80],"first":[90],"method":[91],"uses":[92,116,119],"ability":[96],"Fuzzy":[98],"ARTMAP":[99],"(FAM)":[100],"explores":[102],"whether":[103],"ensemble":[104,121],"can":[106],"improve":[107],"performance":[109],"FAM.":[112],"second":[114],"technique":[115],"Learn++":[117],"MLP":[123],"classifiers.":[124]},"counts_by_year":[{"year":2025,"cited_by_count":1},{"year":2021,"cited_by_count":1},{"year":2018,"cited_by_count":1},{"year":2014,"cited_by_count":1},{"year":2013,"cited_by_count":1}],"updated_date":"2025-11-06T03:46:38.306776","created_date":"2025-10-10T00:00:00"}