{"id":"https://openalex.org/W2095728459","doi":"https://doi.org/10.1109/ijcnn.2004.1381064","title":"Tools and techniques for evaluating reliability of defect-tolerant nano architectures","display_name":"Tools and techniques for evaluating reliability of defect-tolerant nano architectures","publication_year":2005,"publication_date":"2005-02-28","ids":{"openalex":"https://openalex.org/W2095728459","doi":"https://doi.org/10.1109/ijcnn.2004.1381064","mag":"2095728459"},"language":"en","primary_location":{"id":"doi:10.1109/ijcnn.2004.1381064","is_oa":false,"landing_page_url":"https://doi.org/10.1109/ijcnn.2004.1381064","pdf_url":null,"source":null,"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"2004 IEEE International Joint Conference on Neural Networks (IEEE Cat. No.04CH37541)","raw_type":"proceedings-article"},"type":"article","indexed_in":["crossref"],"open_access":{"is_oa":false,"oa_status":"closed","oa_url":null,"any_repository_has_fulltext":false},"authorships":[{"author_position":"first","author":{"id":"https://openalex.org/A5013306533","display_name":"D. Bhaduri","orcid":null},"institutions":[{"id":"https://openalex.org/I859038795","display_name":"Virginia Tech","ror":"https://ror.org/02smfhw86","country_code":"US","type":"education","lineage":["https://openalex.org/I859038795"]}],"countries":["US"],"is_corresponding":true,"raw_author_name":"D. Bhaduri","raw_affiliation_strings":["Fermat Lab, Bradley Department of Electrical and Computer Engineering, Virginia Technology, Blacksburg, VA, USA","[Bradley Dept. of Electr. & Comput. Eng., Virginia Tech, Blacksburg, VA, USA]"],"affiliations":[{"raw_affiliation_string":"Fermat Lab, Bradley Department of Electrical and Computer Engineering, Virginia Technology, Blacksburg, VA, USA","institution_ids":["https://openalex.org/I859038795"]},{"raw_affiliation_string":"[Bradley Dept. of Electr. & Comput. Eng., Virginia Tech, Blacksburg, VA, USA]","institution_ids":["https://openalex.org/I859038795"]}]},{"author_position":"last","author":{"id":"https://openalex.org/A5021517996","display_name":"Sandeep K. Shukla","orcid":"https://orcid.org/0000-0001-5525-7426"},"institutions":[{"id":"https://openalex.org/I859038795","display_name":"Virginia Tech","ror":"https://ror.org/02smfhw86","country_code":"US","type":"education","lineage":["https://openalex.org/I859038795"]}],"countries":["US"],"is_corresponding":false,"raw_author_name":"S. Shukla","raw_affiliation_strings":["Fermat Lab, Bradley Department of Electrical and Computer Engineering, Virginia Technology, Blacksburg, VA, USA","[Bradley Dept. of Electr. & Comput. Eng., Virginia Tech, Blacksburg, VA, USA]"],"affiliations":[{"raw_affiliation_string":"Fermat Lab, Bradley Department of Electrical and Computer Engineering, Virginia Technology, Blacksburg, VA, USA","institution_ids":["https://openalex.org/I859038795"]},{"raw_affiliation_string":"[Bradley Dept. of Electr. & Comput. Eng., Virginia Tech, Blacksburg, VA, USA]","institution_ids":["https://openalex.org/I859038795"]}]}],"institutions":[],"countries_distinct_count":1,"institutions_distinct_count":2,"corresponding_author_ids":["https://openalex.org/A5013306533"],"corresponding_institution_ids":["https://openalex.org/I859038795"],"apc_list":null,"apc_paid":null,"fwci":1.7784,"has_fulltext":false,"cited_by_count":8,"citation_normalized_percentile":{"value":0.85505478,"is_in_top_1_percent":false,"is_in_top_10_percent":false},"cited_by_percentile_year":{"min":89,"max":94},"biblio":{"volume":"4","issue":null,"first_page":"2641","last_page":"2646"},"is_retracted":false,"is_paratext":false,"is_xpac":false,"primary_topic":{"id":"https://openalex.org/T11005","display_name":"Radiation Effects in Electronics","score":0.9873999953269958,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},"topics":[{"id":"https://openalex.org/T11005","display_name":"Radiation Effects in Electronics","score":0.9873999953269958,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T10558","display_name":"Advancements in Semiconductor Devices and Circuit Design","score":0.9343000054359436,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T11948","display_name":"Machine Learning in Materials Science","score":0.9304999709129333,"subfield":{"id":"https://openalex.org/subfields/2505","display_name":"Materials Chemistry"},"field":{"id":"https://openalex.org/fields/25","display_name":"Materials Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"keywords":[{"id":"https://openalex.org/keywords/reliability","display_name":"Reliability (semiconductor)","score":0.6820076704025269},{"id":"https://openalex.org/keywords/computer-science","display_name":"Computer science","score":0.6299693584442139},{"id":"https://openalex.org/keywords/reliability-engineering","display_name":"Reliability engineering","score":0.5934468507766724},{"id":"https://openalex.org/keywords/nano","display_name":"Nano-","score":0.5535380244255066},{"id":"https://openalex.org/keywords/engineering","display_name":"Engineering","score":0.19999054074287415}],"concepts":[{"id":"https://openalex.org/C43214815","wikidata":"https://www.wikidata.org/wiki/Q7310987","display_name":"Reliability (semiconductor)","level":3,"score":0.6820076704025269},{"id":"https://openalex.org/C41008148","wikidata":"https://www.wikidata.org/wiki/Q21198","display_name":"Computer science","level":0,"score":0.6299693584442139},{"id":"https://openalex.org/C200601418","wikidata":"https://www.wikidata.org/wiki/Q2193887","display_name":"Reliability engineering","level":1,"score":0.5934468507766724},{"id":"https://openalex.org/C2780357685","wikidata":"https://www.wikidata.org/wiki/Q154357","display_name":"Nano-","level":2,"score":0.5535380244255066},{"id":"https://openalex.org/C127413603","wikidata":"https://www.wikidata.org/wiki/Q11023","display_name":"Engineering","level":0,"score":0.19999054074287415},{"id":"https://openalex.org/C163258240","wikidata":"https://www.wikidata.org/wiki/Q25342","display_name":"Power (physics)","level":2,"score":0.0},{"id":"https://openalex.org/C62520636","wikidata":"https://www.wikidata.org/wiki/Q944","display_name":"Quantum mechanics","level":1,"score":0.0},{"id":"https://openalex.org/C42360764","wikidata":"https://www.wikidata.org/wiki/Q83588","display_name":"Chemical engineering","level":1,"score":0.0},{"id":"https://openalex.org/C121332964","wikidata":"https://www.wikidata.org/wiki/Q413","display_name":"Physics","level":0,"score":0.0}],"mesh":[],"locations_count":1,"locations":[{"id":"doi:10.1109/ijcnn.2004.1381064","is_oa":false,"landing_page_url":"https://doi.org/10.1109/ijcnn.2004.1381064","pdf_url":null,"source":null,"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"2004 IEEE International Joint Conference on Neural Networks (IEEE Cat. No.04CH37541)","raw_type":"proceedings-article"}],"best_oa_location":null,"sustainable_development_goals":[],"awards":[],"funders":[{"id":"https://openalex.org/F4320306076","display_name":"National Science Foundation","ror":"https://ror.org/021nxhr62"}],"has_content":{"pdf":false,"grobid_xml":false},"content_urls":null,"referenced_works_count":10,"referenced_works":["https://openalex.org/W1507028917","https://openalex.org/W2005998857","https://openalex.org/W2019599312","https://openalex.org/W2119147938","https://openalex.org/W2122386818","https://openalex.org/W2149158279","https://openalex.org/W2153295660","https://openalex.org/W2161165912","https://openalex.org/W4285719527","https://openalex.org/W6655383422"],"related_works":["https://openalex.org/W2033512842","https://openalex.org/W4322734194","https://openalex.org/W3005535424","https://openalex.org/W4233600955","https://openalex.org/W2913665393","https://openalex.org/W2369695847","https://openalex.org/W2994319598","https://openalex.org/W1607054433","https://openalex.org/W2110842462","https://openalex.org/W4233757488"],"abstract_inverted_index":{"Nano-computing":[0],"in":[1,36,94,263],"the":[2,37,45,54,74,96,105,167,206,220,267,273],"form":[3],"of":[4,34,88,107,121,156,170,196,222,275],"quantum,":[5],"molecular":[6],"and":[7,28,39,77,104,146,148,162,174,183,205,260,271],"other":[8,207],"computing":[9],"models":[10,138],"is":[11,23,68,93,102,198,208],"proliferating":[12],"as":[13,124],"we":[14,191],"scale":[15,151],"down":[16],"to":[17,43,73,109,139,178],"nano-meter":[18],"fabrication":[19],"technologies.":[20],"However,":[21,66],"it":[22],"expected":[24],"that":[25,164,253],"nano-scale":[26],"devices":[27],"interconnections":[29],"will":[30,256],"introduce":[31],"unprecedented":[32],"level":[33,106,134],"defects":[35],"substrates":[38],"architectural":[40,58,187],"designs":[41],"need":[42],"accommodate":[44],"uncertainty":[46],"inherent":[47],"at":[48,98,118],"such":[49,123],"scales.":[50],"This":[51],"consideration":[52],"motivates":[53],"search":[55],"for":[56,153,185],"new":[57],"paradigms":[59],"based":[60,63,201,213],"on":[61],"redundancy":[62,67,84,108,114,184],"defect-tolerant":[64,248],"designs.":[65],"not":[69,150],"always":[70],"a":[71,199,209],"solution":[72],"reliability":[75,168,182,224,268],"problem,":[76],"often":[78],"too":[79,82],"much":[80],"or":[81],"little":[83],"may":[85],"cause":[86],"lack":[87],"reliability.":[89,112],"The":[90],"key":[91],"challenge":[92],"determining":[95],"granularity":[97],"which":[99,197,232],"defect":[100],"tolerance":[101],"designed,":[103],"achieve":[110],"optimal":[111],"Also,":[113],"has":[115],"been":[116],"applied":[117],"different":[119,160,186],"levels":[120,142],"granularity,":[122],"gate":[125],"level,":[126,129,132],"logic":[127,130,172],"block":[128],"function":[131],"unit":[133],"etc.":[135],"Analytical":[136],"probabilistic":[137,210],"evaluate":[140,166],"these":[141,241,254],"are":[143,233],"error":[144],"prone":[145],"cumbersome,":[147],"do":[149],"well":[152],"complex":[154],"network":[155],"gates.":[157],"We":[158,217,251],"develop":[159],"tools":[161,226,255],"techniques":[163],"can":[165,175,236],"measures":[169],"combinational":[171],"blocks,":[173],"be":[176,237],"used":[177],"analyze":[179],"trade-offs":[180],"between":[181],"configurations.":[188],"In":[189],"particular,":[190],"report":[192],"two":[193],"tools,":[194,242],"one":[195],"Matlab":[200],"tool":[202,214],"called":[203],"Nanolab":[204],"model":[211],"checking":[212],"named":[215],"Nanoprism.":[216],"also":[218],"illustrate":[219],"effectiveness":[221],"our":[223],"analysis":[225,269],"by":[227,240],"pointing":[228],"out":[229],"certain":[230],"anomalies":[231],"counter-intuitive":[234],"but":[235],"easily":[238],"discovered":[239],"thereby":[243],"providing":[244],"better":[245],"insight":[246],"into":[247],"design":[249],"decisions.":[250],"foresee":[252],"help":[257],"furthering":[258],"research":[259],"pedagogical":[261],"interests":[262],"this":[264],"area,":[265],"expedite":[266],"process":[270],"enhance":[272],"accuracy":[274],"establishing":[276],"reliability-redundancy":[277],"trade-off":[278],"points.":[279]},"counts_by_year":[{"year":2012,"cited_by_count":1}],"updated_date":"2025-11-06T03:46:38.306776","created_date":"2025-10-10T00:00:00"}