{"id":"https://openalex.org/W2604585082","doi":"https://doi.org/10.1109/igcc.2016.7892596","title":"Exploring SSD endurance model based on write amplification and temperature","display_name":"Exploring SSD endurance model based on write amplification and temperature","publication_year":2016,"publication_date":"2016-01-01","ids":{"openalex":"https://openalex.org/W2604585082","doi":"https://doi.org/10.1109/igcc.2016.7892596","mag":"2604585082"},"language":"en","primary_location":{"id":"doi:10.1109/igcc.2016.7892596","is_oa":false,"landing_page_url":"https://doi.org/10.1109/igcc.2016.7892596","pdf_url":null,"source":null,"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"2016 Seventh International Green and Sustainable Computing Conference (IGSC)","raw_type":"proceedings-article"},"type":"conference-paper","indexed_in":["crossref"],"open_access":{"is_oa":false,"oa_status":"closed","oa_url":null,"any_repository_has_fulltext":false},"authorships":[{"author_position":"first","author":{"id":"https://openalex.org/A5035349323","display_name":"Hui Sun","orcid":"https://orcid.org/0000-0003-1811-1318"},"institutions":[{"id":"https://openalex.org/I143868143","display_name":"Anhui University","ror":"https://ror.org/05th6yx34","country_code":"CN","type":"education","lineage":["https://openalex.org/I143868143"]}],"countries":["CN"],"is_corresponding":false,"raw_author_name":"Hui Sun","raw_affiliation_strings":["Institute of Advance Computer System (IACS), Anhui University"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Institute of Advance Computer System (IACS), Anhui University","institution_ids":["https://openalex.org/I143868143"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5100611885","display_name":"Guodong Chen","orcid":"https://orcid.org/0009-0000-1937-5628"},"institutions":[{"id":"https://openalex.org/I143868143","display_name":"Anhui University","ror":"https://ror.org/05th6yx34","country_code":"CN","type":"education","lineage":["https://openalex.org/I143868143"]}],"countries":["CN"],"is_corresponding":false,"raw_author_name":"Guodong Chen","raw_affiliation_strings":["Institute of Advance Computer System (IACS), Anhui University"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Institute of Advance Computer System (IACS), Anhui University","institution_ids":["https://openalex.org/I143868143"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5101026978","display_name":"Liang Xu","orcid":"https://orcid.org/0000-0002-1752-7437"},"institutions":[{"id":"https://openalex.org/I143868143","display_name":"Anhui University","ror":"https://ror.org/05th6yx34","country_code":"CN","type":"education","lineage":["https://openalex.org/I143868143"]}],"countries":["CN"],"is_corresponding":false,"raw_author_name":"Xu Liang","raw_affiliation_strings":["Institute of Advance Computer System (IACS), Anhui University"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Institute of Advance Computer System (IACS), Anhui University","institution_ids":["https://openalex.org/I143868143"]}]},{"author_position":"last","author":{"id":"https://openalex.org/A5062908102","display_name":"Wei Liu","orcid":"https://orcid.org/0000-0003-2968-2888"},"institutions":[{"id":"https://openalex.org/I143868143","display_name":"Anhui University","ror":"https://ror.org/05th6yx34","country_code":"CN","type":"education","lineage":["https://openalex.org/I143868143"]}],"countries":["CN"],"is_corresponding":false,"raw_author_name":"Wei Liu","raw_affiliation_strings":["Institute of Advance Computer System (IACS), Anhui University"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Institute of Advance Computer System (IACS), Anhui University","institution_ids":["https://openalex.org/I143868143"]}]}],"institutions":[],"countries_distinct_count":1,"institutions_distinct_count":1,"corresponding_author_ids":[],"corresponding_institution_ids":["https://openalex.org/I143868143"],"apc_list":null,"apc_paid":null,"fwci":null,"has_fulltext":false,"cited_by_count":2,"citation_normalized_percentile":null,"cited_by_percentile_year":null,"biblio":{"volume":null,"issue":null,"first_page":"1","last_page":"5"},"is_retracted":false,"is_paratext":false,"is_xpac":false,"primary_topic":{"id":"https://openalex.org/T11181","display_name":"Advanced Data Storage Technologies","score":1.0,"subfield":{"id":"https://openalex.org/subfields/1705","display_name":"Computer Networks and Communications"},"field":{"id":"https://openalex.org/fields/17","display_name":"Computer Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},"topics":[{"id":"https://openalex.org/T11181","display_name":"Advanced Data Storage Technologies","score":1.0,"subfield":{"id":"https://openalex.org/subfields/1705","display_name":"Computer Networks and Communications"},"field":{"id":"https://openalex.org/fields/17","display_name":"Computer Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T10472","display_name":"Semiconductor materials and devices","score":0.9397000074386597,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T10049","display_name":"Magnetic properties of thin films","score":0.9302999973297119,"subfield":{"id":"https://openalex.org/subfields/3107","display_name":"Atomic and Molecular Physics, and Optics"},"field":{"id":"https://openalex.org/fields/31","display_name":"Physics and Astronomy"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"keywords":[{"id":"https://openalex.org/keywords/nand-gate","display_name":"NAND gate","score":0.8014973402023315},{"id":"https://openalex.org/keywords/flash","display_name":"Flash (photography)","score":0.70157790184021},{"id":"https://openalex.org/keywords/reliability","display_name":"Reliability (semiconductor)","score":0.6932492852210999},{"id":"https://openalex.org/keywords/computer-science","display_name":"Computer science","score":0.6144701242446899},{"id":"https://openalex.org/keywords/transistor","display_name":"Transistor","score":0.48657310009002686},{"id":"https://openalex.org/keywords/optoelectronics","display_name":"Optoelectronics","score":0.39400309324264526},{"id":"https://openalex.org/keywords/materials-science","display_name":"Materials science","score":0.3887544572353363},{"id":"https://openalex.org/keywords/computer-hardware","display_name":"Computer hardware","score":0.3496682643890381},{"id":"https://openalex.org/keywords/electrical-engineering","display_name":"Electrical engineering","score":0.3114403784275055},{"id":"https://openalex.org/keywords/logic-gate","display_name":"Logic gate","score":0.2587190270423889},{"id":"https://openalex.org/keywords/physics","display_name":"Physics","score":0.18015456199645996},{"id":"https://openalex.org/keywords/power","display_name":"Power (physics)","score":0.10204562544822693},{"id":"https://openalex.org/keywords/engineering","display_name":"Engineering","score":0.09648799896240234},{"id":"https://openalex.org/keywords/optics","display_name":"Optics","score":0.06459572911262512}],"concepts":[{"id":"https://openalex.org/C124296912","wikidata":"https://www.wikidata.org/wiki/Q575178","display_name":"NAND gate","level":3,"score":0.8014973402023315},{"id":"https://openalex.org/C2777526259","wikidata":"https://www.wikidata.org/wiki/Q221836","display_name":"Flash (photography)","level":2,"score":0.70157790184021},{"id":"https://openalex.org/C43214815","wikidata":"https://www.wikidata.org/wiki/Q7310987","display_name":"Reliability (semiconductor)","level":3,"score":0.6932492852210999},{"id":"https://openalex.org/C41008148","wikidata":"https://www.wikidata.org/wiki/Q21198","display_name":"Computer science","level":0,"score":0.6144701242446899},{"id":"https://openalex.org/C172385210","wikidata":"https://www.wikidata.org/wiki/Q5339","display_name":"Transistor","level":3,"score":0.48657310009002686},{"id":"https://openalex.org/C49040817","wikidata":"https://www.wikidata.org/wiki/Q193091","display_name":"Optoelectronics","level":1,"score":0.39400309324264526},{"id":"https://openalex.org/C192562407","wikidata":"https://www.wikidata.org/wiki/Q228736","display_name":"Materials science","level":0,"score":0.3887544572353363},{"id":"https://openalex.org/C9390403","wikidata":"https://www.wikidata.org/wiki/Q3966","display_name":"Computer hardware","level":1,"score":0.3496682643890381},{"id":"https://openalex.org/C119599485","wikidata":"https://www.wikidata.org/wiki/Q43035","display_name":"Electrical engineering","level":1,"score":0.3114403784275055},{"id":"https://openalex.org/C131017901","wikidata":"https://www.wikidata.org/wiki/Q170451","display_name":"Logic gate","level":2,"score":0.2587190270423889},{"id":"https://openalex.org/C121332964","wikidata":"https://www.wikidata.org/wiki/Q413","display_name":"Physics","level":0,"score":0.18015456199645996},{"id":"https://openalex.org/C163258240","wikidata":"https://www.wikidata.org/wiki/Q25342","display_name":"Power (physics)","level":2,"score":0.10204562544822693},{"id":"https://openalex.org/C127413603","wikidata":"https://www.wikidata.org/wiki/Q11023","display_name":"Engineering","level":0,"score":0.09648799896240234},{"id":"https://openalex.org/C120665830","wikidata":"https://www.wikidata.org/wiki/Q14620","display_name":"Optics","level":1,"score":0.06459572911262512},{"id":"https://openalex.org/C165801399","wikidata":"https://www.wikidata.org/wiki/Q25428","display_name":"Voltage","level":2,"score":0.0},{"id":"https://openalex.org/C62520636","wikidata":"https://www.wikidata.org/wiki/Q944","display_name":"Quantum mechanics","level":1,"score":0.0},{"id":"https://openalex.org/C11413529","wikidata":"https://www.wikidata.org/wiki/Q8366","display_name":"Algorithm","level":1,"score":0.0}],"mesh":[],"locations_count":1,"locations":[{"id":"doi:10.1109/igcc.2016.7892596","is_oa":false,"landing_page_url":"https://doi.org/10.1109/igcc.2016.7892596","pdf_url":null,"source":null,"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"2016 Seventh International Green and Sustainable Computing Conference (IGSC)","raw_type":"proceedings-article"}],"best_oa_location":null,"sustainable_development_goals":[{"display_name":"Affordable and clean energy","id":"https://metadata.un.org/sdg/7","score":0.6200000047683716}],"awards":[],"funders":[],"has_content":{"grobid_xml":false,"pdf":false},"content_urls":null,"referenced_works_count":11,"referenced_works":["https://openalex.org/W1980584607","https://openalex.org/W2001936702","https://openalex.org/W2006425633","https://openalex.org/W2062972279","https://openalex.org/W2074435203","https://openalex.org/W2097490816","https://openalex.org/W2135288278","https://openalex.org/W2140008585","https://openalex.org/W2179360174","https://openalex.org/W2186625818","https://openalex.org/W4285719527"],"related_works":["https://openalex.org/W2385875016","https://openalex.org/W2072593933","https://openalex.org/W2376165157","https://openalex.org/W2800677231","https://openalex.org/W2054139911","https://openalex.org/W1577524679","https://openalex.org/W2162027152","https://openalex.org/W2489439822","https://openalex.org/W4237143391","https://openalex.org/W2350469736"],"abstract_inverted_index":{"Write":[0],"endurance":[1,7,35,43,48,77,172,191],"of":[2,49,58,99,132,146,160],"NAND":[3,50,62,69,102],"Flash-based":[4],"SSDs":[5],"(SSD":[6],"for":[8,12],"short)":[9],"is":[10,44],"essential":[11],"data":[13,106,147],"reliability":[14],"in":[15,60,71,101,126,150,192],"storage":[16,148,193],"systems.":[17,194],"Previously,":[18],"studies":[19],"concentrated":[20],"on":[21,37,54,166],"different":[22,158],"approaches":[23],"to":[24,123,156,174,188],"ensure":[25],"SSD":[26,34,42,73,79,110,167,171,190],"endurance.":[27,111],"In":[28],"this":[29,181],"paper,":[30],"we":[31],"explore":[32,157],"the":[33,55,75,96,115,127,144],"based":[36],"write":[38,47,87,92,161],"amplification":[39,88,93,162],"and":[40,89,104,163,169],"temperature.":[41,90],"determined":[45],"by":[46,86],"Flash,":[51],"which":[52,108,119],"depends":[53],"limited":[56],"number":[57,98],"P/Es":[59,67,83,100],"a":[61,68,133,151],"Flash.":[63],"The":[64],"more":[65,177],"available":[66,82,97],"Flash":[70,103],"an":[72,78],"has,":[74],"higher":[76],"characterizes.":[80],"These":[81,139],"are":[84,154],"influenced":[85],"Large":[91],"wears":[94],"down":[95],"causes":[105],"error,":[107],"degrades":[109],"Operating":[112],"temperature":[113,165],"influences":[114],"Fowler-Nordheim":[116],"tunneling":[117],"mechanism,":[118],"can":[120,142,185],"cause":[121],"electrons":[122,141],"be":[124,186],"trapped":[125,140],"tunnel":[128],"insulation":[129],"oxide":[130],"layer":[131],"floating":[134],"gate":[135],"transistor":[136],"(i.e.,":[137],"FGT).":[138],"increase":[143],"probabilities":[145],"failure":[149],"FGT.":[152],"We":[153],"motivated":[155],"impacts":[159],"operating":[164],"endurance,":[168],"propose":[170],"model":[173],"provide":[175],"designer":[176],"useful":[178],"information.":[179],"By":[180],"means,":[182],"new":[183],"methods":[184],"implemented":[187],"guarantee":[189]},"counts_by_year":[{"year":2023,"cited_by_count":1}],"updated_date":"2026-07-14T23:27:15.235271","created_date":"2025-10-10T00:00:00"}