{"id":"https://openalex.org/W2285236746","doi":"https://doi.org/10.1109/igcc.2015.7393728","title":"A differential single-port 8T SRAM bitcell for variability tolerance and low voltage operation","display_name":"A differential single-port 8T SRAM bitcell for variability tolerance and low voltage operation","publication_year":2015,"publication_date":"2015-12-01","ids":{"openalex":"https://openalex.org/W2285236746","doi":"https://doi.org/10.1109/igcc.2015.7393728","mag":"2285236746"},"language":"en","primary_location":{"id":"doi:10.1109/igcc.2015.7393728","is_oa":false,"landing_page_url":"https://doi.org/10.1109/igcc.2015.7393728","pdf_url":null,"source":null,"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"2015 Sixth International Green and Sustainable Computing Conference (IGSC)","raw_type":"proceedings-article"},"type":"article","indexed_in":["crossref"],"open_access":{"is_oa":false,"oa_status":"closed","oa_url":null,"any_repository_has_fulltext":false},"authorships":[{"author_position":"first","author":{"id":"https://openalex.org/A5013842248","display_name":"Samira Ataei","orcid":null},"institutions":[],"countries":[],"is_corresponding":false,"raw_author_name":"Samira Ataei","raw_affiliation_strings":["Department of Electrical and Computer Engineering, VLSI Computer Architecture Research Group, OK, USA"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Department of Electrical and Computer Engineering, VLSI Computer Architecture Research Group, OK, USA","institution_ids":[]}]},{"author_position":"last","author":{"id":"https://openalex.org/A5033770307","display_name":"James E. Stine","orcid":"https://orcid.org/0000-0001-8767-390X"},"institutions":[],"countries":[],"is_corresponding":false,"raw_author_name":"James E. Stine","raw_affiliation_strings":["Department of Electrical and Computer Engineering, VLSI Computer Architecture Research Group, OK, USA"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Department of Electrical and Computer Engineering, VLSI Computer Architecture Research Group, OK, USA","institution_ids":[]}]}],"institutions":[],"countries_distinct_count":0,"institutions_distinct_count":2,"corresponding_author_ids":[],"corresponding_institution_ids":[],"apc_list":null,"apc_paid":null,"fwci":0.6025,"has_fulltext":false,"cited_by_count":4,"citation_normalized_percentile":{"value":0.74080235,"is_in_top_1_percent":false,"is_in_top_10_percent":false},"cited_by_percentile_year":{"min":90,"max":96},"biblio":{"volume":null,"issue":null,"first_page":"1","last_page":"6"},"is_retracted":false,"is_paratext":false,"is_xpac":false,"primary_topic":{"id":"https://openalex.org/T10363","display_name":"Low-power high-performance VLSI design","score":1.0,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},"topics":[{"id":"https://openalex.org/T10363","display_name":"Low-power high-performance VLSI design","score":1.0,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T10558","display_name":"Advancements in Semiconductor Devices and Circuit Design","score":0.9998000264167786,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T11005","display_name":"Radiation Effects in Electronics","score":0.9995999932289124,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"keywords":[{"id":"https://openalex.org/keywords/static-random-access-memory","display_name":"Static random-access memory","score":0.852634072303772},{"id":"https://openalex.org/keywords/computer-science","display_name":"Computer science","score":0.6680902242660522},{"id":"https://openalex.org/keywords/transistor","display_name":"Transistor","score":0.6443096399307251},{"id":"https://openalex.org/keywords/voltage","display_name":"Voltage","score":0.6280233860015869},{"id":"https://openalex.org/keywords/port","display_name":"Port (circuit theory)","score":0.5595942139625549},{"id":"https://openalex.org/keywords/low-voltage","display_name":"Low voltage","score":0.5323531627655029},{"id":"https://openalex.org/keywords/process-variation","display_name":"Process variation","score":0.5107036232948303},{"id":"https://openalex.org/keywords/margin","display_name":"Margin (machine learning)","score":0.5054526329040527},{"id":"https://openalex.org/keywords/noise","display_name":"Noise (video)","score":0.4903149902820587},{"id":"https://openalex.org/keywords/electronic-engineering","display_name":"Electronic engineering","score":0.42518705129623413},{"id":"https://openalex.org/keywords/computer-hardware","display_name":"Computer hardware","score":0.32234930992126465},{"id":"https://openalex.org/keywords/electrical-engineering","display_name":"Electrical engineering","score":0.3153621554374695},{"id":"https://openalex.org/keywords/engineering","display_name":"Engineering","score":0.1907901167869568}],"concepts":[{"id":"https://openalex.org/C68043766","wikidata":"https://www.wikidata.org/wiki/Q267416","display_name":"Static random-access memory","level":2,"score":0.852634072303772},{"id":"https://openalex.org/C41008148","wikidata":"https://www.wikidata.org/wiki/Q21198","display_name":"Computer science","level":0,"score":0.6680902242660522},{"id":"https://openalex.org/C172385210","wikidata":"https://www.wikidata.org/wiki/Q5339","display_name":"Transistor","level":3,"score":0.6443096399307251},{"id":"https://openalex.org/C165801399","wikidata":"https://www.wikidata.org/wiki/Q25428","display_name":"Voltage","level":2,"score":0.6280233860015869},{"id":"https://openalex.org/C32802771","wikidata":"https://www.wikidata.org/wiki/Q2443617","display_name":"Port (circuit theory)","level":2,"score":0.5595942139625549},{"id":"https://openalex.org/C128624480","wikidata":"https://www.wikidata.org/wiki/Q1504817","display_name":"Low voltage","level":3,"score":0.5323531627655029},{"id":"https://openalex.org/C93389723","wikidata":"https://www.wikidata.org/wiki/Q7247313","display_name":"Process variation","level":3,"score":0.5107036232948303},{"id":"https://openalex.org/C774472","wikidata":"https://www.wikidata.org/wiki/Q6760393","display_name":"Margin (machine learning)","level":2,"score":0.5054526329040527},{"id":"https://openalex.org/C99498987","wikidata":"https://www.wikidata.org/wiki/Q2210247","display_name":"Noise (video)","level":3,"score":0.4903149902820587},{"id":"https://openalex.org/C24326235","wikidata":"https://www.wikidata.org/wiki/Q126095","display_name":"Electronic engineering","level":1,"score":0.42518705129623413},{"id":"https://openalex.org/C9390403","wikidata":"https://www.wikidata.org/wiki/Q3966","display_name":"Computer hardware","level":1,"score":0.32234930992126465},{"id":"https://openalex.org/C119599485","wikidata":"https://www.wikidata.org/wiki/Q43035","display_name":"Electrical engineering","level":1,"score":0.3153621554374695},{"id":"https://openalex.org/C127413603","wikidata":"https://www.wikidata.org/wiki/Q11023","display_name":"Engineering","level":0,"score":0.1907901167869568},{"id":"https://openalex.org/C119857082","wikidata":"https://www.wikidata.org/wiki/Q2539","display_name":"Machine learning","level":1,"score":0.0},{"id":"https://openalex.org/C115961682","wikidata":"https://www.wikidata.org/wiki/Q860623","display_name":"Image (mathematics)","level":2,"score":0.0},{"id":"https://openalex.org/C154945302","wikidata":"https://www.wikidata.org/wiki/Q11660","display_name":"Artificial intelligence","level":1,"score":0.0}],"mesh":[],"locations_count":1,"locations":[{"id":"doi:10.1109/igcc.2015.7393728","is_oa":false,"landing_page_url":"https://doi.org/10.1109/igcc.2015.7393728","pdf_url":null,"source":null,"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"2015 Sixth International Green and Sustainable Computing Conference (IGSC)","raw_type":"proceedings-article"}],"best_oa_location":null,"sustainable_development_goals":[{"id":"https://metadata.un.org/sdg/7","display_name":"Affordable and clean energy","score":0.8500000238418579}],"awards":[],"funders":[{"id":"https://openalex.org/F4320306076","display_name":"National Science Foundation","ror":"https://ror.org/021nxhr62"}],"has_content":{"pdf":false,"grobid_xml":false},"content_urls":null,"referenced_works_count":9,"referenced_works":["https://openalex.org/W2057899754","https://openalex.org/W2105175332","https://openalex.org/W2106339466","https://openalex.org/W2136045454","https://openalex.org/W2155462892","https://openalex.org/W2160285928","https://openalex.org/W2172173999","https://openalex.org/W6680014225","https://openalex.org/W6683588402"],"related_works":["https://openalex.org/W2119312496","https://openalex.org/W4247460323","https://openalex.org/W2537086382","https://openalex.org/W2107909712","https://openalex.org/W2153162275","https://openalex.org/W2079259690","https://openalex.org/W2310488720","https://openalex.org/W789543267","https://openalex.org/W2075972383","https://openalex.org/W2108986771"],"abstract_inverted_index":{"A":[0],"novel":[1],"single-port,":[2],"fully":[3],"differential":[4,74],"8-transistor":[5],"(8T)":[6],"SRAM":[7,91],"bitcell":[8,32,58,105,129],"that":[9],"is":[10,20],"tolerant":[11],"to":[12,51,135],"process":[13,60],"variations":[14],"and":[15,35,44,68,79,93,115],"suitable":[16],"for":[17],"low-power":[18],"operation":[19],"proposed":[21,30,103],"in":[22,38,65,89,97],"this":[23,128],"paper.":[24],"At":[25],"500mV":[26,109],"supply":[27,110],"voltage,":[28],"the":[29,52],"8T":[31,57,104],"achieves":[33],"44%":[34],"16%":[36],"improvement":[37],"read":[39],"Static":[40],"Noise":[41,46],"Margin":[42,47],"(SNM)":[43],"Write":[45],"(WNM),":[48],"respectively,":[49],"compared":[50],"6-Transistor":[53],"(6T)":[54],"bitcell.":[55],"This":[56],"shows":[59],"variation":[61],"tolerance":[62],"which":[63],"results":[64,119],"tight":[66],"SNM":[67,114],"WNM":[69],"distributions.":[70],"It":[71],"utilizes":[72],"a":[73,108,121],"operation,":[75],"single":[76],"read/write":[77],"port":[78],"one":[80],"wordline":[81],"(WL),":[82],"therefore,":[83],"does":[84],"not":[85],"cause":[86],"any":[87],"changes":[88],"6T":[90,99],"architecture":[92],"can":[94],"be":[95],"used":[96],"current":[98],"memory":[100],"compilers.":[101],"The":[102],"operates":[106],"at":[107,132],"voltage":[111],"with":[112,120],"130mV":[113],"220mV":[116],"WNM.":[117],"Simulation":[118],"an":[122],"IBM":[123],"cmos10lpe":[124],"65nm":[125],"technology":[126],"show":[127],"retains":[130],"data":[131],"voltages":[133],"down":[134],"300":[136],"mV.":[137]},"counts_by_year":[{"year":2025,"cited_by_count":1},{"year":2017,"cited_by_count":2},{"year":2016,"cited_by_count":1}],"updated_date":"2026-06-11T09:08:48.828518","created_date":"2025-10-10T00:00:00"}