{"id":"https://openalex.org/W3205404527","doi":"https://doi.org/10.1109/igarss47720.2021.9554224","title":"Initial Onboard Calibration Results of the HISUI Hyperspectral Sensor","display_name":"Initial Onboard Calibration Results of the HISUI Hyperspectral Sensor","publication_year":2021,"publication_date":"2021-07-11","ids":{"openalex":"https://openalex.org/W3205404527","doi":"https://doi.org/10.1109/igarss47720.2021.9554224","mag":"3205404527"},"language":"en","primary_location":{"id":"doi:10.1109/igarss47720.2021.9554224","is_oa":false,"landing_page_url":"https://doi.org/10.1109/igarss47720.2021.9554224","pdf_url":null,"source":null,"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"2021 IEEE International Geoscience and Remote Sensing Symposium IGARSS","raw_type":"proceedings-article"},"type":"article","indexed_in":["crossref"],"open_access":{"is_oa":false,"oa_status":"closed","oa_url":null,"any_repository_has_fulltext":false},"authorships":[{"author_position":"first","author":{"id":"https://openalex.org/A5046659922","display_name":"Minoru Urai","orcid":"https://orcid.org/0000-0002-5391-5584"},"institutions":[{"id":"https://openalex.org/I73613424","display_name":"National Institute of Advanced Industrial Science and Technology","ror":"https://ror.org/01703db54","country_code":"JP","type":"government","lineage":["https://openalex.org/I73613424"]}],"countries":["JP"],"is_corresponding":true,"raw_author_name":"M. Urai","raw_affiliation_strings":["National Institute of Advanced Industrial Science and Technology (AIST), Tsukuba, Ibaraki, Japan"],"affiliations":[{"raw_affiliation_string":"National Institute of Advanced Industrial Science and Technology (AIST), Tsukuba, Ibaraki, Japan","institution_ids":["https://openalex.org/I73613424"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5013052276","display_name":"Satoshi Tsuchida","orcid":"https://orcid.org/0000-0003-3752-9402"},"institutions":[{"id":"https://openalex.org/I73613424","display_name":"National Institute of Advanced Industrial Science and Technology","ror":"https://ror.org/01703db54","country_code":"JP","type":"government","lineage":["https://openalex.org/I73613424"]}],"countries":["JP"],"is_corresponding":false,"raw_author_name":"S. Tsuchida","raw_affiliation_strings":["National Institute of Advanced Industrial Science and Technology (AIST), Tsukuba, Ibaraki, Japan"],"affiliations":[{"raw_affiliation_string":"National Institute of Advanced Industrial Science and Technology (AIST), Tsukuba, Ibaraki, Japan","institution_ids":["https://openalex.org/I73613424"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5069916579","display_name":"S. Yamamoto","orcid":"https://orcid.org/0000-0002-0086-8227"},"institutions":[{"id":"https://openalex.org/I73613424","display_name":"National Institute of Advanced Industrial Science and Technology","ror":"https://ror.org/01703db54","country_code":"JP","type":"government","lineage":["https://openalex.org/I73613424"]}],"countries":["JP"],"is_corresponding":false,"raw_author_name":"S. Yamamoto","raw_affiliation_strings":["National Institute of Advanced Industrial Science and Technology (AIST), Tsukuba, Ibaraki, Japan"],"affiliations":[{"raw_affiliation_string":"National Institute of Advanced Industrial Science and Technology (AIST), Tsukuba, Ibaraki, Japan","institution_ids":["https://openalex.org/I73613424"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5112553529","display_name":"Tetsushi Tachikawa","orcid":null},"institutions":[],"countries":[],"is_corresponding":false,"raw_author_name":"T. Tachikawa","raw_affiliation_strings":["Japan Space Systems (J-spacesystems), Tokyo, Japan"],"affiliations":[{"raw_affiliation_string":"Japan Space Systems (J-spacesystems), Tokyo, Japan","institution_ids":[]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5005014399","display_name":"Akira Iwasaki","orcid":"https://orcid.org/0000-0002-1603-8041"},"institutions":[{"id":"https://openalex.org/I74801974","display_name":"The University of Tokyo","ror":"https://ror.org/057zh3y96","country_code":"JP","type":"education","lineage":["https://openalex.org/I74801974"]}],"countries":["JP"],"is_corresponding":false,"raw_author_name":"A. Iwasaki","raw_affiliation_strings":["Graduate School of Engineering, The University of Tokyo, Tokyo, Japan"],"affiliations":[{"raw_affiliation_string":"Graduate School of Engineering, The University of Tokyo, Tokyo, Japan","institution_ids":["https://openalex.org/I74801974"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5089005740","display_name":"M.","orcid":null},"institutions":[{"id":"https://openalex.org/I73613424","display_name":"National Institute of Advanced Industrial Science and Technology","ror":"https://ror.org/01703db54","country_code":"JP","type":"government","lineage":["https://openalex.org/I73613424"]}],"countries":["JP"],"is_corresponding":false,"raw_author_name":"M.","raw_affiliation_strings":["National Institute of Advanced Industrial Science and Technology (AIST), Tsukuba, Ibaraki, Japan"],"affiliations":[{"raw_affiliation_string":"National Institute of Advanced Industrial Science and Technology (AIST), Tsukuba, Ibaraki, Japan","institution_ids":["https://openalex.org/I73613424"]}]},{"author_position":"last","author":{"id":"https://openalex.org/A5085142595","display_name":"J. Ishii","orcid":"https://orcid.org/0000-0002-4650-7216"},"institutions":[{"id":"https://openalex.org/I73613424","display_name":"National Institute of Advanced Industrial Science and Technology","ror":"https://ror.org/01703db54","country_code":"JP","type":"government","lineage":["https://openalex.org/I73613424"]}],"countries":["JP"],"is_corresponding":false,"raw_author_name":"J. Ishii","raw_affiliation_strings":["National Institute of Advanced Industrial Science and Technology (AIST), Tsukuba, Ibaraki, Japan"],"affiliations":[{"raw_affiliation_string":"National Institute of Advanced Industrial Science and Technology (AIST), Tsukuba, Ibaraki, Japan","institution_ids":["https://openalex.org/I73613424"]}]}],"institutions":[],"countries_distinct_count":1,"institutions_distinct_count":7,"corresponding_author_ids":["https://openalex.org/A5046659922"],"corresponding_institution_ids":["https://openalex.org/I73613424"],"apc_list":null,"apc_paid":null,"fwci":0.7551,"has_fulltext":false,"cited_by_count":9,"citation_normalized_percentile":{"value":0.75476872,"is_in_top_1_percent":false,"is_in_top_10_percent":false},"cited_by_percentile_year":{"min":93,"max":99},"biblio":{"volume":null,"issue":null,"first_page":"1608","last_page":"1610"},"is_retracted":false,"is_paratext":false,"is_xpac":false,"primary_topic":{"id":"https://openalex.org/T10689","display_name":"Remote-Sensing Image Classification","score":0.9947999715805054,"subfield":{"id":"https://openalex.org/subfields/2214","display_name":"Media Technology"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},"topics":[{"id":"https://openalex.org/T10689","display_name":"Remote-Sensing Image Classification","score":0.9947999715805054,"subfield":{"id":"https://openalex.org/subfields/2214","display_name":"Media Technology"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T12019","display_name":"Calibration and Measurement Techniques","score":0.9805999994277954,"subfield":{"id":"https://openalex.org/subfields/2202","display_name":"Aerospace Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T12389","display_name":"Infrared Target Detection Methodologies","score":0.9627000093460083,"subfield":{"id":"https://openalex.org/subfields/2202","display_name":"Aerospace Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"keywords":[{"id":"https://openalex.org/keywords/vnir","display_name":"VNIR","score":0.8950034379959106},{"id":"https://openalex.org/keywords/hyperspectral-imaging","display_name":"Hyperspectral imaging","score":0.8590117692947388},{"id":"https://openalex.org/keywords/radiance","display_name":"Radiance","score":0.8586072325706482},{"id":"https://openalex.org/keywords/remote-sensing","display_name":"Remote sensing","score":0.8096802830696106},{"id":"https://openalex.org/keywords/calibration","display_name":"Calibration","score":0.7594895958900452},{"id":"https://openalex.org/keywords/radiometric-calibration","display_name":"Radiometric calibration","score":0.6460721492767334},{"id":"https://openalex.org/keywords/sensitivity","display_name":"Sensitivity (control systems)","score":0.5454121828079224},{"id":"https://openalex.org/keywords/environmental-science","display_name":"Environmental science","score":0.5089213848114014},{"id":"https://openalex.org/keywords/wavelength","display_name":"Wavelength","score":0.438789427280426},{"id":"https://openalex.org/keywords/filter","display_name":"Filter (signal processing)","score":0.4214750826358795},{"id":"https://openalex.org/keywords/image-sensor","display_name":"Image sensor","score":0.4150315225124359},{"id":"https://openalex.org/keywords/computer-science","display_name":"Computer science","score":0.3563311696052551},{"id":"https://openalex.org/keywords/optics","display_name":"Optics","score":0.29218941926956177},{"id":"https://openalex.org/keywords/artificial-intelligence","display_name":"Artificial intelligence","score":0.23510512709617615},{"id":"https://openalex.org/keywords/geology","display_name":"Geology","score":0.20078149437904358},{"id":"https://openalex.org/keywords/computer-vision","display_name":"Computer vision","score":0.19563955068588257},{"id":"https://openalex.org/keywords/physics","display_name":"Physics","score":0.15936517715454102},{"id":"https://openalex.org/keywords/engineering","display_name":"Engineering","score":0.11775016784667969}],"concepts":[{"id":"https://openalex.org/C5457282","wikidata":"https://www.wikidata.org/wiki/Q7907352","display_name":"VNIR","level":3,"score":0.8950034379959106},{"id":"https://openalex.org/C159078339","wikidata":"https://www.wikidata.org/wiki/Q959005","display_name":"Hyperspectral imaging","level":2,"score":0.8590117692947388},{"id":"https://openalex.org/C23690007","wikidata":"https://www.wikidata.org/wiki/Q1411145","display_name":"Radiance","level":2,"score":0.8586072325706482},{"id":"https://openalex.org/C62649853","wikidata":"https://www.wikidata.org/wiki/Q199687","display_name":"Remote sensing","level":1,"score":0.8096802830696106},{"id":"https://openalex.org/C165838908","wikidata":"https://www.wikidata.org/wiki/Q736777","display_name":"Calibration","level":2,"score":0.7594895958900452},{"id":"https://openalex.org/C2778522173","wikidata":"https://www.wikidata.org/wiki/Q7281293","display_name":"Radiometric calibration","level":3,"score":0.6460721492767334},{"id":"https://openalex.org/C21200559","wikidata":"https://www.wikidata.org/wiki/Q7451068","display_name":"Sensitivity (control systems)","level":2,"score":0.5454121828079224},{"id":"https://openalex.org/C39432304","wikidata":"https://www.wikidata.org/wiki/Q188847","display_name":"Environmental science","level":0,"score":0.5089213848114014},{"id":"https://openalex.org/C6260449","wikidata":"https://www.wikidata.org/wiki/Q41364","display_name":"Wavelength","level":2,"score":0.438789427280426},{"id":"https://openalex.org/C106131492","wikidata":"https://www.wikidata.org/wiki/Q3072260","display_name":"Filter (signal processing)","level":2,"score":0.4214750826358795},{"id":"https://openalex.org/C76935873","wikidata":"https://www.wikidata.org/wiki/Q209121","display_name":"Image sensor","level":2,"score":0.4150315225124359},{"id":"https://openalex.org/C41008148","wikidata":"https://www.wikidata.org/wiki/Q21198","display_name":"Computer science","level":0,"score":0.3563311696052551},{"id":"https://openalex.org/C120665830","wikidata":"https://www.wikidata.org/wiki/Q14620","display_name":"Optics","level":1,"score":0.29218941926956177},{"id":"https://openalex.org/C154945302","wikidata":"https://www.wikidata.org/wiki/Q11660","display_name":"Artificial intelligence","level":1,"score":0.23510512709617615},{"id":"https://openalex.org/C127313418","wikidata":"https://www.wikidata.org/wiki/Q1069","display_name":"Geology","level":0,"score":0.20078149437904358},{"id":"https://openalex.org/C31972630","wikidata":"https://www.wikidata.org/wiki/Q844240","display_name":"Computer vision","level":1,"score":0.19563955068588257},{"id":"https://openalex.org/C121332964","wikidata":"https://www.wikidata.org/wiki/Q413","display_name":"Physics","level":0,"score":0.15936517715454102},{"id":"https://openalex.org/C127413603","wikidata":"https://www.wikidata.org/wiki/Q11023","display_name":"Engineering","level":0,"score":0.11775016784667969},{"id":"https://openalex.org/C24326235","wikidata":"https://www.wikidata.org/wiki/Q126095","display_name":"Electronic engineering","level":1,"score":0.0},{"id":"https://openalex.org/C62520636","wikidata":"https://www.wikidata.org/wiki/Q944","display_name":"Quantum mechanics","level":1,"score":0.0}],"mesh":[],"locations_count":1,"locations":[{"id":"doi:10.1109/igarss47720.2021.9554224","is_oa":false,"landing_page_url":"https://doi.org/10.1109/igarss47720.2021.9554224","pdf_url":null,"source":null,"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"2021 IEEE International Geoscience and Remote Sensing Symposium IGARSS","raw_type":"proceedings-article"}],"best_oa_location":null,"sustainable_development_goals":[{"id":"https://metadata.un.org/sdg/7","score":0.699999988079071,"display_name":"Affordable and clean energy"}],"awards":[],"funders":[],"has_content":{"pdf":false,"grobid_xml":false},"content_urls":null,"referenced_works_count":2,"referenced_works":["https://openalex.org/W2547110604","https://openalex.org/W2984092036"],"related_works":["https://openalex.org/W2412485884","https://openalex.org/W2809209827","https://openalex.org/W4387802641","https://openalex.org/W2027460042","https://openalex.org/W2045337428","https://openalex.org/W2044082451","https://openalex.org/W2801095402","https://openalex.org/W804912648","https://openalex.org/W1965942415","https://openalex.org/W2371834794"],"abstract_inverted_index":{"HISUI,":[0],"the":[1,12,41,68,80],"Japanese":[2],"hyperspectral":[3],"sensor,":[4],"was":[5,15,25],"launched":[6],"on":[7,17,27],"December":[8],"6,":[9],"2019":[10],"and":[11,31,48,55],"first":[13,22],"image":[14],"taken":[16],"September":[18,28],"4,":[19],"2020.":[20],"The":[21],"HISUI":[23,62],"calibration":[24,33,63],"conducted":[26,35],"11.":[29],"Wavelength":[30],"radiance":[32],"were":[34,71],"to":[36],"evaluate":[37],"characteristic":[38],"change":[39],"during":[40,67],"launch":[42,69],"process.":[43],"We":[44],"found":[45],"2.3":[46],"nm":[47,50],"5.5":[49],"wavelength":[51],"shifts":[52],"for":[53],"VNIR":[54],"SWIR,":[56],"respectively":[57],"using":[58],"SRM2025a":[59],"filter":[60],"onboard":[61],"system.":[64],"Sensitivity":[65],"changes":[66],"process":[70],"less":[72],"than":[73,79],"1.0":[74],"%":[75],"that":[76],"is":[77],"smaller":[78],"radiometric":[81],"accuracy":[82],"specifications.":[83]},"counts_by_year":[{"year":2026,"cited_by_count":1},{"year":2025,"cited_by_count":2},{"year":2024,"cited_by_count":2},{"year":2022,"cited_by_count":2},{"year":2021,"cited_by_count":2}],"updated_date":"2026-03-10T14:07:55.174380","created_date":"2025-10-10T00:00:00"}