{"id":"https://openalex.org/W2900459010","doi":"https://doi.org/10.1109/igarss.2018.8518254","title":"Influence of Different Formation Parameters on Electromagnetic Response of Micro-Cylindrically Focused Logging","display_name":"Influence of Different Formation Parameters on Electromagnetic Response of Micro-Cylindrically Focused Logging","publication_year":2018,"publication_date":"2018-07-01","ids":{"openalex":"https://openalex.org/W2900459010","doi":"https://doi.org/10.1109/igarss.2018.8518254","mag":"2900459010"},"language":"en","primary_location":{"id":"doi:10.1109/igarss.2018.8518254","is_oa":false,"landing_page_url":"https://doi.org/10.1109/igarss.2018.8518254","pdf_url":null,"source":null,"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"IGARSS 2018 - 2018 IEEE International Geoscience and Remote Sensing Symposium","raw_type":"proceedings-article"},"type":"article","indexed_in":["crossref"],"open_access":{"is_oa":false,"oa_status":"closed","oa_url":null,"any_repository_has_fulltext":false},"authorships":[{"author_position":"first","author":{"id":"https://openalex.org/A5044183417","display_name":"Hao Peng","orcid":"https://orcid.org/0000-0002-4865-5511"},"institutions":[{"id":"https://openalex.org/I150229711","display_name":"University of Electronic Science and Technology of China","ror":"https://ror.org/04qr3zq92","country_code":"CN","type":"education","lineage":["https://openalex.org/I150229711"]}],"countries":["CN"],"is_corresponding":false,"raw_author_name":"Peng Hao","raw_affiliation_strings":["School of Electronic Engineering, University of Electronic Science and Technology of China (UESTC), Chengdu, 611731, P.R. China","School of Electronic Engineering, University of Electronic Science and Technology of China (UESTC), Chengdu, P.R. China"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"School of Electronic Engineering, University of Electronic Science and Technology of China (UESTC), Chengdu, 611731, P.R. China","institution_ids":["https://openalex.org/I150229711"]},{"raw_affiliation_string":"School of Electronic Engineering, University of Electronic Science and Technology of China (UESTC), Chengdu, P.R. China","institution_ids":["https://openalex.org/I150229711"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5101967815","display_name":"Xiangyang Sun","orcid":"https://orcid.org/0000-0003-1047-0391"},"institutions":[{"id":"https://openalex.org/I150229711","display_name":"University of Electronic Science and Technology of China","ror":"https://ror.org/04qr3zq92","country_code":"CN","type":"education","lineage":["https://openalex.org/I150229711"]}],"countries":["CN"],"is_corresponding":false,"raw_author_name":"Xiangyang Sun","raw_affiliation_strings":["School of Electronic Engineering, University of Electronic Science and Technology of China (UESTC), Chengdu, 611731, P.R. China","School of Electronic Engineering, University of Electronic Science and Technology of China (UESTC), Chengdu, P.R. China"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"School of Electronic Engineering, University of Electronic Science and Technology of China (UESTC), Chengdu, 611731, P.R. China","institution_ids":["https://openalex.org/I150229711"]},{"raw_affiliation_string":"School of Electronic Engineering, University of Electronic Science and Technology of China (UESTC), Chengdu, P.R. China","institution_ids":["https://openalex.org/I150229711"]}]},{"author_position":"last","author":{"id":"https://openalex.org/A5077498008","display_name":"Zaiping Nie","orcid":"https://orcid.org/0000-0002-9563-4115"},"institutions":[{"id":"https://openalex.org/I150229711","display_name":"University of Electronic Science and Technology of China","ror":"https://ror.org/04qr3zq92","country_code":"CN","type":"education","lineage":["https://openalex.org/I150229711"]}],"countries":["CN"],"is_corresponding":false,"raw_author_name":"Zaiping Nie","raw_affiliation_strings":["School of Electronic Engineering, University of Electronic Science and Technology of China (UESTC), Chengdu, 611731, P.R. China","School of Electronic Engineering, University of Electronic Science and Technology of China (UESTC), Chengdu, P.R. China"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"School of Electronic Engineering, University of Electronic Science and Technology of China (UESTC), Chengdu, 611731, P.R. China","institution_ids":["https://openalex.org/I150229711"]},{"raw_affiliation_string":"School of Electronic Engineering, University of Electronic Science and Technology of China (UESTC), Chengdu, P.R. China","institution_ids":["https://openalex.org/I150229711"]}]}],"institutions":[],"countries_distinct_count":1,"institutions_distinct_count":3,"corresponding_author_ids":[],"corresponding_institution_ids":[],"apc_list":null,"apc_paid":null,"fwci":0.0,"has_fulltext":false,"cited_by_count":2,"citation_normalized_percentile":{"value":0.09945627,"is_in_top_1_percent":false,"is_in_top_10_percent":false},"cited_by_percentile_year":{"min":90,"max":95},"biblio":{"volume":null,"issue":null,"first_page":"1308","last_page":"1311"},"is_retracted":false,"is_paratext":false,"is_xpac":false,"primary_topic":{"id":"https://openalex.org/T10572","display_name":"Geophysical and Geoelectrical Methods","score":0.9997000098228455,"subfield":{"id":"https://openalex.org/subfields/1908","display_name":"Geophysics"},"field":{"id":"https://openalex.org/fields/19","display_name":"Earth and Planetary Sciences"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},"topics":[{"id":"https://openalex.org/T10572","display_name":"Geophysical and Geoelectrical Methods","score":0.9997000098228455,"subfield":{"id":"https://openalex.org/subfields/1908","display_name":"Geophysics"},"field":{"id":"https://openalex.org/fields/19","display_name":"Earth and Planetary Sciences"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T11609","display_name":"Geophysical Methods and Applications","score":0.9995999932289124,"subfield":{"id":"https://openalex.org/subfields/2212","display_name":"Ocean Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T11757","display_name":"Seismic Waves and Analysis","score":0.9929999709129333,"subfield":{"id":"https://openalex.org/subfields/1908","display_name":"Geophysics"},"field":{"id":"https://openalex.org/fields/19","display_name":"Earth and Planetary Sciences"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"keywords":[{"id":"https://openalex.org/keywords/electrical-resistivity-and-conductivity","display_name":"Electrical resistivity and conductivity","score":0.5537720918655396},{"id":"https://openalex.org/keywords/logging","display_name":"Logging","score":0.5537623763084412},{"id":"https://openalex.org/keywords/finite-element-method","display_name":"Finite element method","score":0.5421913266181946},{"id":"https://openalex.org/keywords/acoustics","display_name":"Acoustics","score":0.5417457818984985},{"id":"https://openalex.org/keywords/well-logging","display_name":"Well logging","score":0.5117754340171814},{"id":"https://openalex.org/keywords/measure","display_name":"Measure (data warehouse)","score":0.501863956451416},{"id":"https://openalex.org/keywords/slurry","display_name":"Slurry","score":0.47400081157684326},{"id":"https://openalex.org/keywords/electromagnetic-radiation","display_name":"Electromagnetic radiation","score":0.4560752213001251},{"id":"https://openalex.org/keywords/electromagnetic-field","display_name":"Electromagnetic field","score":0.42799198627471924},{"id":"https://openalex.org/keywords/geology","display_name":"Geology","score":0.371005117893219},{"id":"https://openalex.org/keywords/materials-science","display_name":"Materials science","score":0.3451809287071228},{"id":"https://openalex.org/keywords/engineering","display_name":"Engineering","score":0.29872947931289673},{"id":"https://openalex.org/keywords/computer-science","display_name":"Computer science","score":0.28017377853393555},{"id":"https://openalex.org/keywords/optics","display_name":"Optics","score":0.25533658266067505},{"id":"https://openalex.org/keywords/petroleum-engineering","display_name":"Petroleum engineering","score":0.22971099615097046},{"id":"https://openalex.org/keywords/physics","display_name":"Physics","score":0.2256508469581604},{"id":"https://openalex.org/keywords/electrical-engineering","display_name":"Electrical engineering","score":0.18481537699699402},{"id":"https://openalex.org/keywords/structural-engineering","display_name":"Structural engineering","score":0.1565367877483368},{"id":"https://openalex.org/keywords/composite-material","display_name":"Composite material","score":0.07789358496665955}],"concepts":[{"id":"https://openalex.org/C69990965","wikidata":"https://www.wikidata.org/wiki/Q65402698","display_name":"Electrical resistivity and conductivity","level":2,"score":0.5537720918655396},{"id":"https://openalex.org/C125620115","wikidata":"https://www.wikidata.org/wiki/Q845249","display_name":"Logging","level":2,"score":0.5537623763084412},{"id":"https://openalex.org/C135628077","wikidata":"https://www.wikidata.org/wiki/Q220184","display_name":"Finite element method","level":2,"score":0.5421913266181946},{"id":"https://openalex.org/C24890656","wikidata":"https://www.wikidata.org/wiki/Q82811","display_name":"Acoustics","level":1,"score":0.5417457818984985},{"id":"https://openalex.org/C35817400","wikidata":"https://www.wikidata.org/wiki/Q2383566","display_name":"Well logging","level":2,"score":0.5117754340171814},{"id":"https://openalex.org/C2780009758","wikidata":"https://www.wikidata.org/wiki/Q6804172","display_name":"Measure (data warehouse)","level":2,"score":0.501863956451416},{"id":"https://openalex.org/C94293008","wikidata":"https://www.wikidata.org/wiki/Q23925154","display_name":"Slurry","level":2,"score":0.47400081157684326},{"id":"https://openalex.org/C149773537","wikidata":"https://www.wikidata.org/wiki/Q12969754","display_name":"Electromagnetic radiation","level":2,"score":0.4560752213001251},{"id":"https://openalex.org/C28843909","wikidata":"https://www.wikidata.org/wiki/Q177625","display_name":"Electromagnetic field","level":2,"score":0.42799198627471924},{"id":"https://openalex.org/C127313418","wikidata":"https://www.wikidata.org/wiki/Q1069","display_name":"Geology","level":0,"score":0.371005117893219},{"id":"https://openalex.org/C192562407","wikidata":"https://www.wikidata.org/wiki/Q228736","display_name":"Materials science","level":0,"score":0.3451809287071228},{"id":"https://openalex.org/C127413603","wikidata":"https://www.wikidata.org/wiki/Q11023","display_name":"Engineering","level":0,"score":0.29872947931289673},{"id":"https://openalex.org/C41008148","wikidata":"https://www.wikidata.org/wiki/Q21198","display_name":"Computer science","level":0,"score":0.28017377853393555},{"id":"https://openalex.org/C120665830","wikidata":"https://www.wikidata.org/wiki/Q14620","display_name":"Optics","level":1,"score":0.25533658266067505},{"id":"https://openalex.org/C78762247","wikidata":"https://www.wikidata.org/wiki/Q1273174","display_name":"Petroleum engineering","level":1,"score":0.22971099615097046},{"id":"https://openalex.org/C121332964","wikidata":"https://www.wikidata.org/wiki/Q413","display_name":"Physics","level":0,"score":0.2256508469581604},{"id":"https://openalex.org/C119599485","wikidata":"https://www.wikidata.org/wiki/Q43035","display_name":"Electrical engineering","level":1,"score":0.18481537699699402},{"id":"https://openalex.org/C66938386","wikidata":"https://www.wikidata.org/wiki/Q633538","display_name":"Structural engineering","level":1,"score":0.1565367877483368},{"id":"https://openalex.org/C159985019","wikidata":"https://www.wikidata.org/wiki/Q181790","display_name":"Composite material","level":1,"score":0.07789358496665955},{"id":"https://openalex.org/C77088390","wikidata":"https://www.wikidata.org/wiki/Q8513","display_name":"Database","level":1,"score":0.0},{"id":"https://openalex.org/C62520636","wikidata":"https://www.wikidata.org/wiki/Q944","display_name":"Quantum mechanics","level":1,"score":0.0},{"id":"https://openalex.org/C86803240","wikidata":"https://www.wikidata.org/wiki/Q420","display_name":"Biology","level":0,"score":0.0},{"id":"https://openalex.org/C18903297","wikidata":"https://www.wikidata.org/wiki/Q7150","display_name":"Ecology","level":1,"score":0.0}],"mesh":[],"locations_count":1,"locations":[{"id":"doi:10.1109/igarss.2018.8518254","is_oa":false,"landing_page_url":"https://doi.org/10.1109/igarss.2018.8518254","pdf_url":null,"source":null,"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"IGARSS 2018 - 2018 IEEE International Geoscience and Remote Sensing Symposium","raw_type":"proceedings-article"}],"best_oa_location":null,"sustainable_development_goals":[],"awards":[],"funders":[],"has_content":{"pdf":false,"grobid_xml":false},"content_urls":null,"referenced_works_count":6,"referenced_works":["https://openalex.org/W1964106907","https://openalex.org/W2124303483","https://openalex.org/W2149660480","https://openalex.org/W2161231655","https://openalex.org/W2270576805","https://openalex.org/W2390946391"],"related_works":["https://openalex.org/W2365338673","https://openalex.org/W3141837860","https://openalex.org/W2056114932","https://openalex.org/W2378520239","https://openalex.org/W2030923182","https://openalex.org/W2355423019","https://openalex.org/W2388521818","https://openalex.org/W38497042","https://openalex.org/W2385227882","https://openalex.org/W2393030256"],"abstract_inverted_index":{"Micro-cylindrically":[0],"focused":[1],"logging":[2,10,71],"(MCFL)":[3],"is":[4,31,37,65,102],"a":[5],"focusing":[6],"type":[7],"of":[8,17,29,60,69,83,94],"resistivity":[9,16],"method":[11],"which":[12,101],"can":[13],"measure":[14],"the":[15,26,45,57,70,106,110],"shallow":[18],"formations":[19],"at":[20],"different":[21,74],"depths.":[22],"In":[23,55],"this":[24],"paper,":[25],"measurement":[27],"principle":[28],"MCFL":[30,61],"introduced":[32],"and":[33,51,67,79,88,92,108],"three-dimensional":[34],"electromagnetic":[35,58],"modeling":[36],"realized":[38],"by":[39],"FEM.":[40],"Simulation":[41],"results":[42],"show":[43],"that":[44],"instrument":[46],"has":[47],"excellent":[48],"detection":[49],"performance":[50],"high":[52],"axial":[53],"resolution.":[54],"addition,":[56],"response":[59,72],"in":[62,99],"inhomogeneous":[63],"media":[64],"simulated":[66],"variations":[68],"with":[73],"formation":[75],"parameters":[76],"are":[77,90,97],"investigated":[78],"analyzed.":[80],"The":[81],"influences":[82],"flushed":[84],"zone,":[85],"mud":[86],"cake,":[87],"slurry":[89],"summarized":[91],"explanations":[93],"peculiar":[95],"phenomena":[96],"given":[98],"detail,":[100],"helpful":[103],"to":[104],"guide":[105],"production":[107],"optimize":[109],"instrument.":[111]},"counts_by_year":[{"year":2025,"cited_by_count":1},{"year":2023,"cited_by_count":1}],"updated_date":"2026-06-11T09:08:48.828518","created_date":"2025-10-10T00:00:00"}