{"id":"https://openalex.org/W2771618718","doi":"https://doi.org/10.1109/igarss.2017.8128103","title":"An ultra-wideband measurement method of rock permittivity","display_name":"An ultra-wideband measurement method of rock permittivity","publication_year":2017,"publication_date":"2017-07-01","ids":{"openalex":"https://openalex.org/W2771618718","doi":"https://doi.org/10.1109/igarss.2017.8128103","mag":"2771618718"},"language":"en","primary_location":{"id":"doi:10.1109/igarss.2017.8128103","is_oa":false,"landing_page_url":"https://doi.org/10.1109/igarss.2017.8128103","pdf_url":null,"source":null,"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"2017 IEEE International Geoscience and Remote Sensing Symposium (IGARSS)","raw_type":"proceedings-article"},"type":"conference-paper","indexed_in":["crossref"],"open_access":{"is_oa":false,"oa_status":"closed","oa_url":null,"any_repository_has_fulltext":false},"authorships":[{"author_position":"first","author":{"id":"https://openalex.org/A5045525540","display_name":"Chen Guo","orcid":"https://orcid.org/0000-0001-7049-4403"},"institutions":[{"id":"https://openalex.org/I25355098","display_name":"Chang'an University","ror":"https://ror.org/05mxya461","country_code":"CN","type":"education","lineage":["https://openalex.org/I25355098"]}],"countries":["CN"],"is_corresponding":false,"raw_author_name":"Chen Guo","raw_affiliation_strings":["Chang' an University, Information Engineering Department, Xi' an 710064","Information Engineering Department, Chang' an University, Xi'an"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Chang' an University, Information Engineering Department, Xi' an 710064","institution_ids":["https://openalex.org/I25355098"]},{"raw_affiliation_string":"Information Engineering Department, Chang' an University, Xi'an","institution_ids":["https://openalex.org/I25355098"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5035163413","display_name":"Hang Dong","orcid":"https://orcid.org/0000-0001-6828-6891"},"institutions":[{"id":"https://openalex.org/I25355098","display_name":"Chang'an University","ror":"https://ror.org/05mxya461","country_code":"CN","type":"education","lineage":["https://openalex.org/I25355098"]}],"countries":["CN"],"is_corresponding":false,"raw_author_name":"Hang Dong","raw_affiliation_strings":["Chang' an University, Information Engineering Department, Xi' an 710064","Information Engineering Department, Chang' an University, Xi'an"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Chang' an University, Information Engineering Department, Xi' an 710064","institution_ids":["https://openalex.org/I25355098"]},{"raw_affiliation_string":"Information Engineering Department, Chang' an University, Xi'an","institution_ids":["https://openalex.org/I25355098"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5012365110","display_name":"Gary Mavko","orcid":"https://orcid.org/0000-0001-6750-2652"},"institutions":[{"id":"https://openalex.org/I97018004","display_name":"Stanford University","ror":"https://ror.org/00f54p054","country_code":"US","type":"education","lineage":["https://openalex.org/I97018004"]}],"countries":["US"],"is_corresponding":false,"raw_author_name":"Gary Mavko","raw_affiliation_strings":["Stanford University, Geophysics Department, Stanford, CA 94305","Geophysics Department, Stanford University, Stanford, CA"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Stanford University, Geophysics Department, Stanford, CA 94305","institution_ids":["https://openalex.org/I97018004"]},{"raw_affiliation_string":"Geophysics Department, Stanford University, Stanford, CA","institution_ids":["https://openalex.org/I97018004"]}]},{"author_position":"last","author":{"id":"https://openalex.org/A5101726789","display_name":"Richard Liu","orcid":"https://orcid.org/0000-0002-3986-2308"},"institutions":[{"id":"https://openalex.org/I25355098","display_name":"Chang'an University","ror":"https://ror.org/05mxya461","country_code":"CN","type":"education","lineage":["https://openalex.org/I25355098"]}],"countries":["CN"],"is_corresponding":false,"raw_author_name":"Richard Liu","raw_affiliation_strings":["Chang' an University, Information Engineering Department, Xi' an 710064","Information Engineering Department, Chang' an University, Xi'an"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Chang' an University, Information Engineering Department, Xi' an 710064","institution_ids":["https://openalex.org/I25355098"]},{"raw_affiliation_string":"Information Engineering Department, Chang' an University, Xi'an","institution_ids":["https://openalex.org/I25355098"]}]}],"institutions":[],"countries_distinct_count":2,"institutions_distinct_count":2,"corresponding_author_ids":[],"corresponding_institution_ids":[],"apc_list":null,"apc_paid":null,"fwci":0.0,"has_fulltext":false,"cited_by_count":0,"citation_normalized_percentile":{"value":0.18944197,"is_in_top_1_percent":false,"is_in_top_10_percent":false},"cited_by_percentile_year":null,"biblio":{"volume":null,"issue":null,"first_page":"4904","last_page":"4907"},"is_retracted":false,"is_paratext":false,"is_xpac":false,"primary_topic":{"id":"https://openalex.org/T11607","display_name":"Microwave and Dielectric Measurement Techniques","score":0.9991000294685364,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},"topics":[{"id":"https://openalex.org/T11607","display_name":"Microwave and Dielectric Measurement Techniques","score":0.9991000294685364,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T11312","display_name":"Soil Moisture and Remote Sensing","score":0.9986000061035156,"subfield":{"id":"https://openalex.org/subfields/2305","display_name":"Environmental Engineering"},"field":{"id":"https://openalex.org/fields/23","display_name":"Environmental Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T11609","display_name":"Geophysical Methods and Applications","score":0.9983999729156494,"subfield":{"id":"https://openalex.org/subfields/2212","display_name":"Ocean Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"keywords":[{"id":"https://openalex.org/keywords/capacitor","display_name":"Capacitor","score":0.7351741790771484},{"id":"https://openalex.org/keywords/wideband","display_name":"Wideband","score":0.7240554690361023},{"id":"https://openalex.org/keywords/permittivity","display_name":"Permittivity","score":0.6872955560684204},{"id":"https://openalex.org/keywords/electronic-engineering","display_name":"Electronic engineering","score":0.5154657959938049},{"id":"https://openalex.org/keywords/system-of-measurement","display_name":"System of measurement","score":0.514313817024231},{"id":"https://openalex.org/keywords/limit","display_name":"Limit (mathematics)","score":0.46828171610832214},{"id":"https://openalex.org/keywords/observational-error","display_name":"Observational error","score":0.4651504456996918},{"id":"https://openalex.org/keywords/acoustics","display_name":"Acoustics","score":0.4627220034599304},{"id":"https://openalex.org/keywords/materials-science","display_name":"Materials science","score":0.4422374963760376},{"id":"https://openalex.org/keywords/computer-science","display_name":"Computer science","score":0.3967171311378479},{"id":"https://openalex.org/keywords/electrical-engineering","display_name":"Electrical engineering","score":0.3633161783218384},{"id":"https://openalex.org/keywords/voltage","display_name":"Voltage","score":0.29895806312561035},{"id":"https://openalex.org/keywords/engineering","display_name":"Engineering","score":0.2607651948928833},{"id":"https://openalex.org/keywords/optoelectronics","display_name":"Optoelectronics","score":0.2577916979789734},{"id":"https://openalex.org/keywords/dielectric","display_name":"Dielectric","score":0.23844748735427856},{"id":"https://openalex.org/keywords/physics","display_name":"Physics","score":0.17928874492645264},{"id":"https://openalex.org/keywords/mathematics","display_name":"Mathematics","score":0.08564507961273193}],"concepts":[{"id":"https://openalex.org/C52192207","wikidata":"https://www.wikidata.org/wiki/Q5322","display_name":"Capacitor","level":3,"score":0.7351741790771484},{"id":"https://openalex.org/C2780202535","wikidata":"https://www.wikidata.org/wiki/Q4524457","display_name":"Wideband","level":2,"score":0.7240554690361023},{"id":"https://openalex.org/C168651791","wikidata":"https://www.wikidata.org/wiki/Q211569","display_name":"Permittivity","level":3,"score":0.6872955560684204},{"id":"https://openalex.org/C24326235","wikidata":"https://www.wikidata.org/wiki/Q126095","display_name":"Electronic engineering","level":1,"score":0.5154657959938049},{"id":"https://openalex.org/C37649242","wikidata":"https://www.wikidata.org/wiki/Q932268","display_name":"System of measurement","level":2,"score":0.514313817024231},{"id":"https://openalex.org/C151201525","wikidata":"https://www.wikidata.org/wiki/Q177239","display_name":"Limit (mathematics)","level":2,"score":0.46828171610832214},{"id":"https://openalex.org/C19619285","wikidata":"https://www.wikidata.org/wiki/Q196372","display_name":"Observational error","level":2,"score":0.4651504456996918},{"id":"https://openalex.org/C24890656","wikidata":"https://www.wikidata.org/wiki/Q82811","display_name":"Acoustics","level":1,"score":0.4627220034599304},{"id":"https://openalex.org/C192562407","wikidata":"https://www.wikidata.org/wiki/Q228736","display_name":"Materials science","level":0,"score":0.4422374963760376},{"id":"https://openalex.org/C41008148","wikidata":"https://www.wikidata.org/wiki/Q21198","display_name":"Computer science","level":0,"score":0.3967171311378479},{"id":"https://openalex.org/C119599485","wikidata":"https://www.wikidata.org/wiki/Q43035","display_name":"Electrical engineering","level":1,"score":0.3633161783218384},{"id":"https://openalex.org/C165801399","wikidata":"https://www.wikidata.org/wiki/Q25428","display_name":"Voltage","level":2,"score":0.29895806312561035},{"id":"https://openalex.org/C127413603","wikidata":"https://www.wikidata.org/wiki/Q11023","display_name":"Engineering","level":0,"score":0.2607651948928833},{"id":"https://openalex.org/C49040817","wikidata":"https://www.wikidata.org/wiki/Q193091","display_name":"Optoelectronics","level":1,"score":0.2577916979789734},{"id":"https://openalex.org/C133386390","wikidata":"https://www.wikidata.org/wiki/Q184996","display_name":"Dielectric","level":2,"score":0.23844748735427856},{"id":"https://openalex.org/C121332964","wikidata":"https://www.wikidata.org/wiki/Q413","display_name":"Physics","level":0,"score":0.17928874492645264},{"id":"https://openalex.org/C33923547","wikidata":"https://www.wikidata.org/wiki/Q395","display_name":"Mathematics","level":0,"score":0.08564507961273193},{"id":"https://openalex.org/C105795698","wikidata":"https://www.wikidata.org/wiki/Q12483","display_name":"Statistics","level":1,"score":0.0},{"id":"https://openalex.org/C1276947","wikidata":"https://www.wikidata.org/wiki/Q333","display_name":"Astronomy","level":1,"score":0.0},{"id":"https://openalex.org/C134306372","wikidata":"https://www.wikidata.org/wiki/Q7754","display_name":"Mathematical analysis","level":1,"score":0.0}],"mesh":[],"locations_count":1,"locations":[{"id":"doi:10.1109/igarss.2017.8128103","is_oa":false,"landing_page_url":"https://doi.org/10.1109/igarss.2017.8128103","pdf_url":null,"source":null,"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"2017 IEEE International Geoscience and Remote Sensing Symposium (IGARSS)","raw_type":"proceedings-article"}],"best_oa_location":null,"sustainable_development_goals":[],"awards":[],"funders":[],"has_content":{"grobid_xml":false,"pdf":false},"content_urls":null,"referenced_works_count":4,"referenced_works":["https://openalex.org/W2073672327","https://openalex.org/W2157364536","https://openalex.org/W2369559475","https://openalex.org/W2379693347"],"related_works":["https://openalex.org/W784500383","https://openalex.org/W2907071475","https://openalex.org/W2046140837","https://openalex.org/W58405548","https://openalex.org/W2319925036","https://openalex.org/W2579692449","https://openalex.org/W3128781877","https://openalex.org/W2363883345","https://openalex.org/W4200489765","https://openalex.org/W2102894630"],"abstract_inverted_index":{"Electrical":[0],"properties":[1],"of":[2,11,34,53,70],"sediment":[3],"rocks":[4],"is":[5,22,39],"essential":[6],"to":[7,24],"the":[8,26,35,54,61,67],"data":[9],"interpretation":[10],"electrical":[12,27],"and":[13,32,51],"electromagnetic":[14],"logging.":[15],"An":[16],"optimized":[17,62],"ultra-wideband":[18],"parallel-plate":[19,63],"capacitor":[20,64],"device":[21],"proposed":[23,36],"achieve":[25],"parameters":[28],"measurement.":[29],"The":[30,44],"validity":[31],"accuracy":[33,50],"measurement":[37,55,71],"system":[38,56],"verified":[40],"by":[41],"experimental":[42],"results.":[43],"results":[45],"show":[46],"that":[47],"a":[48],"better":[49],"stability":[52],"can":[57,73],"be":[58],"achieved":[59],"with":[60],"model":[65],"while":[66],"upper":[68],"limit":[69],"frequency":[72],"reach":[74],"1.5":[75],"GHz.":[76]},"counts_by_year":[],"updated_date":"2026-07-29T14:22:42.915294","created_date":"2025-10-10T00:00:00"}