{"id":"https://openalex.org/W2088110848","doi":"https://doi.org/10.1109/igarss.2015.7326096","title":"Feature extraction of wobbling rotational symmetry targets","display_name":"Feature extraction of wobbling rotational symmetry targets","publication_year":2015,"publication_date":"2015-07-01","ids":{"openalex":"https://openalex.org/W2088110848","doi":"https://doi.org/10.1109/igarss.2015.7326096","mag":"2088110848"},"language":"en","primary_location":{"id":"doi:10.1109/igarss.2015.7326096","is_oa":false,"landing_page_url":"https://doi.org/10.1109/igarss.2015.7326096","pdf_url":null,"source":null,"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"2015 IEEE International Geoscience and Remote Sensing Symposium (IGARSS)","raw_type":"proceedings-article"},"type":"conference-paper","indexed_in":["crossref"],"open_access":{"is_oa":false,"oa_status":"closed","oa_url":null,"any_repository_has_fulltext":false},"authorships":[{"author_position":"first","author":{"id":"https://openalex.org/A5052846731","display_name":"Xiaofeng Ai","orcid":"https://orcid.org/0000-0002-5080-8126"},"institutions":[{"id":"https://openalex.org/I170215575","display_name":"National University of Defense Technology","ror":"https://ror.org/05d2yfz11","country_code":"CN","type":"education","lineage":["https://openalex.org/I170215575"]}],"countries":["CN"],"is_corresponding":false,"raw_author_name":"Ai Xiaofeng","raw_affiliation_strings":["State Key Laboratory of Complex Electromagnetic Environmental Effects on Electronics&Information System, National University of Defense Technology, Changsha, China","State Key Laboratory of Complex Electromagnetic Environmental Effects on Electronics&Information System, National University of Defense Technology, Changsha 410073, China"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"State Key Laboratory of Complex Electromagnetic Environmental Effects on Electronics&Information System, National University of Defense Technology, Changsha, China","institution_ids":["https://openalex.org/I170215575"]},{"raw_affiliation_string":"State Key Laboratory of Complex Electromagnetic Environmental Effects on Electronics&Information System, National University of Defense Technology, Changsha 410073, China","institution_ids":["https://openalex.org/I170215575"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5100691501","display_name":"Yongzhen Li","orcid":"https://orcid.org/0000-0003-4372-612X"},"institutions":[{"id":"https://openalex.org/I170215575","display_name":"National University of Defense Technology","ror":"https://ror.org/05d2yfz11","country_code":"CN","type":"education","lineage":["https://openalex.org/I170215575"]}],"countries":["CN"],"is_corresponding":false,"raw_author_name":"Li Yongzhen","raw_affiliation_strings":["State Key Laboratory of Complex Electromagnetic Environmental Effects on Electronics&Information System, National University of Defense Technology, Changsha, China","State Key Laboratory of Complex Electromagnetic Environmental Effects on Electronics&Information System, National University of Defense Technology, Changsha 410073, China"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"State Key Laboratory of Complex Electromagnetic Environmental Effects on Electronics&Information System, National University of Defense Technology, Changsha, China","institution_ids":["https://openalex.org/I170215575"]},{"raw_affiliation_string":"State Key Laboratory of Complex Electromagnetic Environmental Effects on Electronics&Information System, National University of Defense Technology, Changsha 410073, China","institution_ids":["https://openalex.org/I170215575"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5103652606","display_name":"Feng De-jun","orcid":null},"institutions":[{"id":"https://openalex.org/I170215575","display_name":"National University of Defense Technology","ror":"https://ror.org/05d2yfz11","country_code":"CN","type":"education","lineage":["https://openalex.org/I170215575"]}],"countries":["CN"],"is_corresponding":false,"raw_author_name":"Feng Dejun","raw_affiliation_strings":["State Key Laboratory of Complex Electromagnetic Environmental Effects on Electronics&Information System, National University of Defense Technology, Changsha, China","State Key Laboratory of Complex Electromagnetic Environmental Effects on Electronics&Information System, National University of Defense Technology, Changsha 410073, China"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"State Key Laboratory of Complex Electromagnetic Environmental Effects on Electronics&Information System, National University of Defense Technology, Changsha, China","institution_ids":["https://openalex.org/I170215575"]},{"raw_affiliation_string":"State Key Laboratory of Complex Electromagnetic Environmental Effects on Electronics&Information System, National University of Defense Technology, Changsha 410073, China","institution_ids":["https://openalex.org/I170215575"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5039451244","display_name":"Feng Zhao","orcid":"https://orcid.org/0000-0003-1275-3352"},"institutions":[{"id":"https://openalex.org/I170215575","display_name":"National University of Defense Technology","ror":"https://ror.org/05d2yfz11","country_code":"CN","type":"education","lineage":["https://openalex.org/I170215575"]}],"countries":["CN"],"is_corresponding":false,"raw_author_name":"Zhao Feng","raw_affiliation_strings":["State Key Laboratory of Complex Electromagnetic Environmental Effects on Electronics&Information System, National University of Defense Technology, Changsha, China","State Key Laboratory of Complex Electromagnetic Environmental Effects on Electronics&Information System, National University of Defense Technology, Changsha 410073, China"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"State Key Laboratory of Complex Electromagnetic Environmental Effects on Electronics&Information System, National University of Defense Technology, Changsha, China","institution_ids":["https://openalex.org/I170215575"]},{"raw_affiliation_string":"State Key Laboratory of Complex Electromagnetic Environmental Effects on Electronics&Information System, National University of Defense Technology, Changsha 410073, China","institution_ids":["https://openalex.org/I170215575"]}]},{"author_position":"last","author":{"id":"https://openalex.org/A5103583164","display_name":"Xiao Shun-ping","orcid":null},"institutions":[{"id":"https://openalex.org/I170215575","display_name":"National University of Defense Technology","ror":"https://ror.org/05d2yfz11","country_code":"CN","type":"education","lineage":["https://openalex.org/I170215575"]}],"countries":["CN"],"is_corresponding":false,"raw_author_name":"Xiao Shunping","raw_affiliation_strings":["State Key Laboratory of Complex Electromagnetic Environmental Effects on Electronics&Information System, National University of Defense Technology, Changsha, China","State Key Laboratory of Complex Electromagnetic Environmental Effects on Electronics&Information System, National University of Defense Technology, Changsha 410073, China"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"State Key Laboratory of Complex Electromagnetic Environmental Effects on Electronics&Information System, National University of Defense Technology, Changsha, China","institution_ids":["https://openalex.org/I170215575"]},{"raw_affiliation_string":"State Key Laboratory of Complex Electromagnetic Environmental Effects on Electronics&Information System, National University of Defense Technology, Changsha 410073, China","institution_ids":["https://openalex.org/I170215575"]}]}],"institutions":[],"countries_distinct_count":1,"institutions_distinct_count":1,"corresponding_author_ids":[],"corresponding_institution_ids":["https://openalex.org/I170215575"],"apc_list":null,"apc_paid":null,"fwci":0.0,"has_fulltext":false,"cited_by_count":2,"citation_normalized_percentile":{"value":0.07811696,"is_in_top_1_percent":false,"is_in_top_10_percent":false},"cited_by_percentile_year":{"min":90,"max":94},"biblio":{"volume":null,"issue":null,"first_page":"1626","last_page":"1629"},"is_retracted":false,"is_paratext":false,"is_xpac":false,"primary_topic":{"id":"https://openalex.org/T11038","display_name":"Advanced SAR Imaging Techniques","score":0.9998999834060669,"subfield":{"id":"https://openalex.org/subfields/2202","display_name":"Aerospace Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},"topics":[{"id":"https://openalex.org/T11038","display_name":"Advanced SAR Imaging Techniques","score":0.9998999834060669,"subfield":{"id":"https://openalex.org/subfields/2202","display_name":"Aerospace Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T10801","display_name":"Synthetic Aperture Radar (SAR) Applications and Techniques","score":0.9987000226974487,"subfield":{"id":"https://openalex.org/subfields/2202","display_name":"Aerospace Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T14158","display_name":"Optical Systems and Laser Technology","score":0.994700014591217,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"keywords":[{"id":"https://openalex.org/keywords/scattering","display_name":"Scattering","score":0.6891859173774719},{"id":"https://openalex.org/keywords/computation","display_name":"Computation","score":0.6469975113868713},{"id":"https://openalex.org/keywords/physics","display_name":"Physics","score":0.5417085886001587},{"id":"https://openalex.org/keywords/matrix","display_name":"Matrix (chemical analysis)","score":0.5124936103820801},{"id":"https://openalex.org/keywords/symmetry","display_name":"Symmetry (geometry)","score":0.4868301749229431},{"id":"https://openalex.org/keywords/feature-extraction","display_name":"Feature extraction","score":0.4684355854988098},{"id":"https://openalex.org/keywords/rotation-around-a-fixed-axis","display_name":"Rotation around a fixed axis","score":0.4506549537181854},{"id":"https://openalex.org/keywords/slipping","display_name":"Slipping","score":0.4275951385498047},{"id":"https://openalex.org/keywords/artificial-intelligence","display_name":"Artificial intelligence","score":0.3809112012386322},{"id":"https://openalex.org/keywords/computer-science","display_name":"Computer science","score":0.3354690372943878},{"id":"https://openalex.org/keywords/pattern-recognition","display_name":"Pattern recognition (psychology)","score":0.331706166267395},{"id":"https://openalex.org/keywords/algorithm","display_name":"Algorithm","score":0.32554298639297485},{"id":"https://openalex.org/keywords/geometry","display_name":"Geometry","score":0.3154650926589966},{"id":"https://openalex.org/keywords/optics","display_name":"Optics","score":0.3112659454345703},{"id":"https://openalex.org/keywords/mathematics","display_name":"Mathematics","score":0.28003939986228943},{"id":"https://openalex.org/keywords/classical-mechanics","display_name":"Classical mechanics","score":0.21909037232398987},{"id":"https://openalex.org/keywords/materials-science","display_name":"Materials science","score":0.0885271430015564}],"concepts":[{"id":"https://openalex.org/C191486275","wikidata":"https://www.wikidata.org/wiki/Q210028","display_name":"Scattering","level":2,"score":0.6891859173774719},{"id":"https://openalex.org/C45374587","wikidata":"https://www.wikidata.org/wiki/Q12525525","display_name":"Computation","level":2,"score":0.6469975113868713},{"id":"https://openalex.org/C121332964","wikidata":"https://www.wikidata.org/wiki/Q413","display_name":"Physics","level":0,"score":0.5417085886001587},{"id":"https://openalex.org/C106487976","wikidata":"https://www.wikidata.org/wiki/Q685816","display_name":"Matrix (chemical analysis)","level":2,"score":0.5124936103820801},{"id":"https://openalex.org/C2779886137","wikidata":"https://www.wikidata.org/wiki/Q21030012","display_name":"Symmetry (geometry)","level":2,"score":0.4868301749229431},{"id":"https://openalex.org/C52622490","wikidata":"https://www.wikidata.org/wiki/Q1026626","display_name":"Feature extraction","level":2,"score":0.4684355854988098},{"id":"https://openalex.org/C6342182","wikidata":"https://www.wikidata.org/wiki/Q2995427","display_name":"Rotation around a fixed axis","level":2,"score":0.4506549537181854},{"id":"https://openalex.org/C2777045574","wikidata":"https://www.wikidata.org/wiki/Q196100","display_name":"Slipping","level":2,"score":0.4275951385498047},{"id":"https://openalex.org/C154945302","wikidata":"https://www.wikidata.org/wiki/Q11660","display_name":"Artificial intelligence","level":1,"score":0.3809112012386322},{"id":"https://openalex.org/C41008148","wikidata":"https://www.wikidata.org/wiki/Q21198","display_name":"Computer science","level":0,"score":0.3354690372943878},{"id":"https://openalex.org/C153180895","wikidata":"https://www.wikidata.org/wiki/Q7148389","display_name":"Pattern recognition (psychology)","level":2,"score":0.331706166267395},{"id":"https://openalex.org/C11413529","wikidata":"https://www.wikidata.org/wiki/Q8366","display_name":"Algorithm","level":1,"score":0.32554298639297485},{"id":"https://openalex.org/C2524010","wikidata":"https://www.wikidata.org/wiki/Q8087","display_name":"Geometry","level":1,"score":0.3154650926589966},{"id":"https://openalex.org/C120665830","wikidata":"https://www.wikidata.org/wiki/Q14620","display_name":"Optics","level":1,"score":0.3112659454345703},{"id":"https://openalex.org/C33923547","wikidata":"https://www.wikidata.org/wiki/Q395","display_name":"Mathematics","level":0,"score":0.28003939986228943},{"id":"https://openalex.org/C74650414","wikidata":"https://www.wikidata.org/wiki/Q11397","display_name":"Classical mechanics","level":1,"score":0.21909037232398987},{"id":"https://openalex.org/C192562407","wikidata":"https://www.wikidata.org/wiki/Q228736","display_name":"Materials science","level":0,"score":0.0885271430015564},{"id":"https://openalex.org/C159985019","wikidata":"https://www.wikidata.org/wiki/Q181790","display_name":"Composite material","level":1,"score":0.0}],"mesh":[],"locations_count":1,"locations":[{"id":"doi:10.1109/igarss.2015.7326096","is_oa":false,"landing_page_url":"https://doi.org/10.1109/igarss.2015.7326096","pdf_url":null,"source":null,"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"2015 IEEE International Geoscience and Remote Sensing Symposium (IGARSS)","raw_type":"proceedings-article"}],"best_oa_location":null,"sustainable_development_goals":[],"awards":[],"funders":[{"id":"https://openalex.org/F4320306076","display_name":"National Science Foundation","ror":"https://ror.org/021nxhr62"}],"has_content":{"grobid_xml":false,"pdf":false},"content_urls":null,"referenced_works_count":10,"referenced_works":["https://openalex.org/W1992612520","https://openalex.org/W2012589245","https://openalex.org/W2037606967","https://openalex.org/W2049909263","https://openalex.org/W2051186205","https://openalex.org/W2110646474","https://openalex.org/W2139981415","https://openalex.org/W2360273861","https://openalex.org/W3154732924","https://openalex.org/W6648525468"],"related_works":["https://openalex.org/W2372999110","https://openalex.org/W3136493222","https://openalex.org/W65309699","https://openalex.org/W2005824415","https://openalex.org/W2997803326","https://openalex.org/W2021013972","https://openalex.org/W2019286687","https://openalex.org/W2054858771","https://openalex.org/W3176430321","https://openalex.org/W2394269979"],"abstract_inverted_index":{"Feature":[0],"extraction":[1],"and":[2,42,56,71,107],"recognition":[3],"of":[4,27,62,88],"wobbling":[5,64,90],"targets":[6],"are":[7,22,69],"very":[8],"important":[9],"in":[10],"spatial":[11],"target":[12,31,34,68],"surveillance.":[13],"It":[14],"has":[15],"been":[16],"shown":[17],"that":[18],"the":[19,25,28,33,38,48,53,72,89],"scattering":[20,40,50],"centers":[21],"slipping":[23],"on":[24,47,95],"edge":[26],"rotational":[29,65],"symmetry":[30,66],"with":[32],"micro-motion":[35,54],"according":[36],"to":[37,78],"electromagnetic":[39,43,104],"theory":[41],"computation":[44,105],"analysis.":[45],"Based":[46],"slippery":[49],"center":[51],"model,":[52],"model":[55,61],"high-range":[57],"resolution":[58],"profile":[59],"(HRRP)":[60],"a":[63,80,85],"cone-shaped":[67],"introduced,":[70],"observed":[73],"HRRP":[74],"sequence":[75],"is":[76,92,101],"used":[77],"construct":[79],"time-range":[81,96],"distribution":[82,97],"matrix,":[83],"then":[84],"estimation":[86],"method":[87],"period":[91],"proposed":[93],"based":[94],"matrix":[98],"correlation,":[99],"which":[100],"validated":[102],"by":[103],"data":[106],"dynamic":[108],"simulation.":[109]},"counts_by_year":[{"year":2023,"cited_by_count":1},{"year":2019,"cited_by_count":1}],"updated_date":"2026-07-29T14:22:42.915294","created_date":"2025-10-10T00:00:00"}