{"id":"https://openalex.org/W1963681152","doi":"https://doi.org/10.1109/igarss.2013.6723021","title":"A new MTF-based image quality assessment for high-resolution SAR Sensors","display_name":"A new MTF-based image quality assessment for high-resolution SAR Sensors","publication_year":2013,"publication_date":"2013-07-01","ids":{"openalex":"https://openalex.org/W1963681152","doi":"https://doi.org/10.1109/igarss.2013.6723021","mag":"1963681152"},"language":"en","primary_location":{"id":"doi:10.1109/igarss.2013.6723021","is_oa":false,"landing_page_url":"https://doi.org/10.1109/igarss.2013.6723021","pdf_url":null,"source":null,"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"2013 IEEE International Geoscience and Remote Sensing Symposium - IGARSS","raw_type":"proceedings-article"},"type":"conference-paper","indexed_in":["crossref"],"open_access":{"is_oa":false,"oa_status":"closed","oa_url":null,"any_repository_has_fulltext":false},"authorships":[{"author_position":"first","author":{"id":"https://openalex.org/A5087180897","display_name":"Xin Lin","orcid":"https://orcid.org/0000-0002-6230-438X"},"institutions":[{"id":"https://openalex.org/I183067930","display_name":"Shanghai Jiao Tong University","ror":"https://ror.org/0220qvk04","country_code":"CN","type":"education","lineage":["https://openalex.org/I183067930"]}],"countries":["CN"],"is_corresponding":false,"raw_author_name":"Xin Lin","raw_affiliation_strings":["Department of Electronic Engineering, Shanghai Jiao Tong University, China","Dept of Electron. Eng., Shanghai Jiao Tong Univ., Shanghai, China"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Department of Electronic Engineering, Shanghai Jiao Tong University, China","institution_ids":["https://openalex.org/I183067930"]},{"raw_affiliation_string":"Dept of Electron. Eng., Shanghai Jiao Tong Univ., Shanghai, China","institution_ids":["https://openalex.org/I183067930"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5101847072","display_name":"Kaizhi Wang","orcid":"https://orcid.org/0000-0001-7530-9502"},"institutions":[{"id":"https://openalex.org/I183067930","display_name":"Shanghai Jiao Tong University","ror":"https://ror.org/0220qvk04","country_code":"CN","type":"education","lineage":["https://openalex.org/I183067930"]}],"countries":["CN"],"is_corresponding":false,"raw_author_name":"Kaizhi Wang","raw_affiliation_strings":["Department of Electronic Engineering, Shanghai Jiao Tong University, China","Dept of Electron. Eng., Shanghai Jiao Tong Univ., Shanghai, China"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Department of Electronic Engineering, Shanghai Jiao Tong University, China","institution_ids":["https://openalex.org/I183067930"]},{"raw_affiliation_string":"Dept of Electron. Eng., Shanghai Jiao Tong Univ., Shanghai, China","institution_ids":["https://openalex.org/I183067930"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5061319150","display_name":"Xingzhao Liu","orcid":"https://orcid.org/0000-0002-4533-3904"},"institutions":[{"id":"https://openalex.org/I183067930","display_name":"Shanghai Jiao Tong University","ror":"https://ror.org/0220qvk04","country_code":"CN","type":"education","lineage":["https://openalex.org/I183067930"]}],"countries":["CN"],"is_corresponding":false,"raw_author_name":"Xingzhao Liu","raw_affiliation_strings":["Department of Electronic Engineering, Shanghai Jiao Tong University, China","Dept of Electron. Eng., Shanghai Jiao Tong Univ., Shanghai, China"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Department of Electronic Engineering, Shanghai Jiao Tong University, China","institution_ids":["https://openalex.org/I183067930"]},{"raw_affiliation_string":"Dept of Electron. Eng., Shanghai Jiao Tong Univ., Shanghai, China","institution_ids":["https://openalex.org/I183067930"]}]},{"author_position":"last","author":{"id":"https://openalex.org/A5100439816","display_name":"Jianjun Li","orcid":"https://orcid.org/0000-0003-2872-9648"},"institutions":[{"id":"https://openalex.org/I183067930","display_name":"Shanghai Jiao Tong University","ror":"https://ror.org/0220qvk04","country_code":"CN","type":"education","lineage":["https://openalex.org/I183067930"]}],"countries":["CN"],"is_corresponding":false,"raw_author_name":"Jianjun Li","raw_affiliation_strings":["Department of Electronic Engineering, Shanghai Jiao Tong University, China","Dept of Electron. Eng., Shanghai Jiao Tong Univ., Shanghai, China"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Department of Electronic Engineering, Shanghai Jiao Tong University, China","institution_ids":["https://openalex.org/I183067930"]},{"raw_affiliation_string":"Dept of Electron. Eng., Shanghai Jiao Tong Univ., Shanghai, China","institution_ids":["https://openalex.org/I183067930"]}]}],"institutions":[],"countries_distinct_count":1,"institutions_distinct_count":1,"corresponding_author_ids":[],"corresponding_institution_ids":["https://openalex.org/I183067930"],"apc_list":null,"apc_paid":null,"fwci":null,"has_fulltext":false,"cited_by_count":6,"citation_normalized_percentile":null,"cited_by_percentile_year":null,"biblio":{"volume":"513","issue":null,"first_page":"1305","last_page":"1308"},"is_retracted":false,"is_paratext":false,"is_xpac":false,"primary_topic":{"id":"https://openalex.org/T12389","display_name":"Infrared Target Detection Methodologies","score":0.9855999946594238,"subfield":{"id":"https://openalex.org/subfields/2202","display_name":"Aerospace Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},"topics":[{"id":"https://openalex.org/T12389","display_name":"Infrared Target Detection Methodologies","score":0.9855999946594238,"subfield":{"id":"https://openalex.org/subfields/2202","display_name":"Aerospace Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T11659","display_name":"Advanced Image Fusion Techniques","score":0.9818999767303467,"subfield":{"id":"https://openalex.org/subfields/2214","display_name":"Media Technology"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T14158","display_name":"Optical Systems and Laser Technology","score":0.9714000225067139,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"keywords":[{"id":"https://openalex.org/keywords/optical-transfer-function","display_name":"Optical transfer function","score":0.7610360383987427},{"id":"https://openalex.org/keywords/synthetic-aperture-radar","display_name":"Synthetic aperture radar","score":0.750933051109314},{"id":"https://openalex.org/keywords/image-quality","display_name":"Image quality","score":0.7472701072692871},{"id":"https://openalex.org/keywords/computer-science","display_name":"Computer science","score":0.7289822101593018},{"id":"https://openalex.org/keywords/image-resolution","display_name":"Image resolution","score":0.6202910542488098},{"id":"https://openalex.org/keywords/artificial-intelligence","display_name":"Artificial intelligence","score":0.6187282204627991},{"id":"https://openalex.org/keywords/computer-vision","display_name":"Computer vision","score":0.6139856576919556},{"id":"https://openalex.org/keywords/remote-sensing","display_name":"Remote sensing","score":0.5897020697593689},{"id":"https://openalex.org/keywords/quality-assessment","display_name":"Quality assessment","score":0.5395976305007935},{"id":"https://openalex.org/keywords/impulse-response","display_name":"Impulse response","score":0.4341965317726135},{"id":"https://openalex.org/keywords/inverse-synthetic-aperture-radar","display_name":"Inverse synthetic aperture radar","score":0.41634097695350647},{"id":"https://openalex.org/keywords/image-sensor","display_name":"Image sensor","score":0.4149794280529022},{"id":"https://openalex.org/keywords/radar-imaging","display_name":"Radar imaging","score":0.3872279226779938},{"id":"https://openalex.org/keywords/image","display_name":"Image (mathematics)","score":0.34810692071914673},{"id":"https://openalex.org/keywords/radar","display_name":"Radar","score":0.2719365358352661},{"id":"https://openalex.org/keywords/evaluation-methods","display_name":"Evaluation methods","score":0.1953265368938446},{"id":"https://openalex.org/keywords/optics","display_name":"Optics","score":0.12374657392501831},{"id":"https://openalex.org/keywords/mathematics","display_name":"Mathematics","score":0.10265758633613586},{"id":"https://openalex.org/keywords/engineering","display_name":"Engineering","score":0.09511485695838928},{"id":"https://openalex.org/keywords/telecommunications","display_name":"Telecommunications","score":0.09321743249893188},{"id":"https://openalex.org/keywords/geology","display_name":"Geology","score":0.09287455677986145},{"id":"https://openalex.org/keywords/physics","display_name":"Physics","score":0.0758475661277771}],"concepts":[{"id":"https://openalex.org/C175231954","wikidata":"https://www.wikidata.org/wiki/Q1942321","display_name":"Optical transfer function","level":2,"score":0.7610360383987427},{"id":"https://openalex.org/C87360688","wikidata":"https://www.wikidata.org/wiki/Q740686","display_name":"Synthetic aperture radar","level":2,"score":0.750933051109314},{"id":"https://openalex.org/C55020928","wikidata":"https://www.wikidata.org/wiki/Q3813865","display_name":"Image quality","level":3,"score":0.7472701072692871},{"id":"https://openalex.org/C41008148","wikidata":"https://www.wikidata.org/wiki/Q21198","display_name":"Computer science","level":0,"score":0.7289822101593018},{"id":"https://openalex.org/C205372480","wikidata":"https://www.wikidata.org/wiki/Q210521","display_name":"Image resolution","level":2,"score":0.6202910542488098},{"id":"https://openalex.org/C154945302","wikidata":"https://www.wikidata.org/wiki/Q11660","display_name":"Artificial intelligence","level":1,"score":0.6187282204627991},{"id":"https://openalex.org/C31972630","wikidata":"https://www.wikidata.org/wiki/Q844240","display_name":"Computer vision","level":1,"score":0.6139856576919556},{"id":"https://openalex.org/C62649853","wikidata":"https://www.wikidata.org/wiki/Q199687","display_name":"Remote sensing","level":1,"score":0.5897020697593689},{"id":"https://openalex.org/C3020001037","wikidata":"https://www.wikidata.org/wiki/Q836575","display_name":"Quality assessment","level":3,"score":0.5395976305007935},{"id":"https://openalex.org/C72279823","wikidata":"https://www.wikidata.org/wiki/Q1139726","display_name":"Impulse response","level":2,"score":0.4341965317726135},{"id":"https://openalex.org/C109094680","wikidata":"https://www.wikidata.org/wiki/Q6060432","display_name":"Inverse synthetic aperture radar","level":4,"score":0.41634097695350647},{"id":"https://openalex.org/C76935873","wikidata":"https://www.wikidata.org/wiki/Q209121","display_name":"Image sensor","level":2,"score":0.4149794280529022},{"id":"https://openalex.org/C10929652","wikidata":"https://www.wikidata.org/wiki/Q7279985","display_name":"Radar imaging","level":3,"score":0.3872279226779938},{"id":"https://openalex.org/C115961682","wikidata":"https://www.wikidata.org/wiki/Q860623","display_name":"Image (mathematics)","level":2,"score":0.34810692071914673},{"id":"https://openalex.org/C554190296","wikidata":"https://www.wikidata.org/wiki/Q47528","display_name":"Radar","level":2,"score":0.2719365358352661},{"id":"https://openalex.org/C3018395757","wikidata":"https://www.wikidata.org/wiki/Q1379672","display_name":"Evaluation methods","level":2,"score":0.1953265368938446},{"id":"https://openalex.org/C120665830","wikidata":"https://www.wikidata.org/wiki/Q14620","display_name":"Optics","level":1,"score":0.12374657392501831},{"id":"https://openalex.org/C33923547","wikidata":"https://www.wikidata.org/wiki/Q395","display_name":"Mathematics","level":0,"score":0.10265758633613586},{"id":"https://openalex.org/C127413603","wikidata":"https://www.wikidata.org/wiki/Q11023","display_name":"Engineering","level":0,"score":0.09511485695838928},{"id":"https://openalex.org/C76155785","wikidata":"https://www.wikidata.org/wiki/Q418","display_name":"Telecommunications","level":1,"score":0.09321743249893188},{"id":"https://openalex.org/C127313418","wikidata":"https://www.wikidata.org/wiki/Q1069","display_name":"Geology","level":0,"score":0.09287455677986145},{"id":"https://openalex.org/C121332964","wikidata":"https://www.wikidata.org/wiki/Q413","display_name":"Physics","level":0,"score":0.0758475661277771},{"id":"https://openalex.org/C200601418","wikidata":"https://www.wikidata.org/wiki/Q2193887","display_name":"Reliability engineering","level":1,"score":0.0},{"id":"https://openalex.org/C134306372","wikidata":"https://www.wikidata.org/wiki/Q7754","display_name":"Mathematical analysis","level":1,"score":0.0}],"mesh":[],"locations_count":1,"locations":[{"id":"doi:10.1109/igarss.2013.6723021","is_oa":false,"landing_page_url":"https://doi.org/10.1109/igarss.2013.6723021","pdf_url":null,"source":null,"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"2013 IEEE International Geoscience and Remote Sensing Symposium - IGARSS","raw_type":"proceedings-article"}],"best_oa_location":null,"sustainable_development_goals":[],"awards":[],"funders":[],"has_content":{"pdf":false,"grobid_xml":false},"content_urls":null,"referenced_works_count":8,"referenced_works":["https://openalex.org/W654913055","https://openalex.org/W1561806241","https://openalex.org/W1581917596","https://openalex.org/W1973241518","https://openalex.org/W2039846978","https://openalex.org/W2215189992","https://openalex.org/W2990036179","https://openalex.org/W6770691134"],"related_works":["https://openalex.org/W3107043386","https://openalex.org/W2908190742","https://openalex.org/W1596076796","https://openalex.org/W2172293690","https://openalex.org/W1420648437","https://openalex.org/W2260618954","https://openalex.org/W2140480766","https://openalex.org/W3215112777","https://openalex.org/W2040307044","https://openalex.org/W2777508220"],"abstract_inverted_index":{"Synthetic":[0],"aperture":[1],"radar":[2],"(SAR)":[3],"is":[4,10,31,51,77,115,138,175],"an":[5,79,171],"active":[6],"microwave":[7],"sensor":[8],"which":[9,42],"able":[11],"to":[12,53,69,140,153],"produce":[13],"high-resolution":[14,103],"images":[15],"of":[16,38,98,120,146,163],"the":[17,36,39,46,59,64,67,71,84,95,102,112,118,155,160,181],"earth":[18],"surface,":[19],"with":[20,125],"all-weather":[21],"day":[22],"and":[23,48,66,149,192],"night":[24],"capability.":[25],"Conventionally,":[26],"SAR":[27,72,85,104,134,187],"image":[28,73,86,113,135,188],"quality":[29,87,136,189],"assessment":[30,88,114,137,183,197],"typically":[32],"done":[33],"by":[34,117],"evaluating":[35],"signal":[37],"corner":[40],"reflectors":[41],"are":[43,151],"positioned":[44],"in":[45],"scenery,":[47],"a":[49,130,164],"specialist":[50],"needed":[52],"extract":[54],"some":[55],"characteristic":[56],"parameters":[57,92],"(e.g.":[58],"3-dB":[60],"impulse":[61],"response":[62],"width,":[63],"PSLR":[65],"ISLR)":[68],"assess":[70],"quality.":[74],"But":[75],"it":[76],"still":[78],"unsolved":[80],"problem":[81],"that":[82,180],"whether":[83],"based":[89],"on":[90],"current":[91],"can":[93,185],"predict":[94],"reliable":[96],"probabilities":[97],"target":[99],"recognition":[100],"from":[101],"images.":[105],"For":[106],"EO":[107],"sensors":[108],"(Electro":[109],"Optical":[110],"sensors),":[111],"assessed":[116],"evaluation":[119],"MTF":[121,150,172],"(Modulation":[122],"Transfer":[123],"Function),":[124],"non-specialists.":[126],"In":[127],"this":[128,142],"paper,":[129],"new":[131,156],"concept":[132],"for":[133,168],"proposed":[139,182],"solve":[141],"problem.":[143],"The":[144],"definitions":[145],"spatial":[147],"frequency":[148],"given":[152],"support":[154],"concept.":[157],"After":[158],"giving":[159],"scene":[161],"construction":[162],"TEST":[165],"Field":[166],"used":[167],"measuring":[169,173],"MTF,":[170],"algorithm":[174],"proposed.":[176],"Experiment":[177],"results":[178],"show":[179],"method":[184],"describe":[186],"more":[190],"accurately":[191],"effectively":[193],"than":[194],"traditional":[195],"PSF":[196],"method.":[198]},"counts_by_year":[{"year":2026,"cited_by_count":1},{"year":2025,"cited_by_count":1},{"year":2021,"cited_by_count":1},{"year":2020,"cited_by_count":1},{"year":2017,"cited_by_count":1},{"year":2016,"cited_by_count":1}],"updated_date":"2026-07-14T23:27:15.235271","created_date":"2025-10-10T00:00:00"}