{"id":"https://openalex.org/W2150810426","doi":"https://doi.org/10.1109/igarss.2011.6049814","title":"Compressive sampling for microwave tomography","display_name":"Compressive sampling for microwave tomography","publication_year":2011,"publication_date":"2011-07-01","ids":{"openalex":"https://openalex.org/W2150810426","doi":"https://doi.org/10.1109/igarss.2011.6049814","mag":"2150810426"},"language":"en","primary_location":{"id":"doi:10.1109/igarss.2011.6049814","is_oa":false,"landing_page_url":"https://doi.org/10.1109/igarss.2011.6049814","pdf_url":null,"source":null,"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"2011 IEEE International Geoscience and Remote Sensing Symposium","raw_type":"proceedings-article"},"type":"article","indexed_in":["crossref"],"open_access":{"is_oa":false,"oa_status":"closed","oa_url":null,"any_repository_has_fulltext":false},"authorships":[{"author_position":"first","author":{"id":"https://openalex.org/A5072489230","display_name":"Roberta Autieri","orcid":null},"institutions":[{"id":"https://openalex.org/I183638586","display_name":"Parthenope University of Naples","ror":"https://ror.org/05pcv4v03","country_code":"IT","type":"education","lineage":["https://openalex.org/I183638586"]}],"countries":["IT"],"is_corresponding":true,"raw_author_name":"R. Autieri","raw_affiliation_strings":["Dipartimento per le Tecnologie, Centro Direzionale di Napoli, Universit\u00e0 degli Studi di Napoli Parthenope, Napoli, Italy"],"affiliations":[{"raw_affiliation_string":"Dipartimento per le Tecnologie, Centro Direzionale di Napoli, Universit\u00e0 degli Studi di Napoli Parthenope, Napoli, Italy","institution_ids":["https://openalex.org/I183638586"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5081608048","display_name":"M. D\u2019Urso","orcid":null},"institutions":[{"id":"https://openalex.org/I76806421","display_name":"SELEX Sistemi Integrati","ror":"https://ror.org/02sj0zy88","country_code":"IT","type":"company","lineage":["https://openalex.org/I76806421"]}],"countries":["IT"],"is_corresponding":false,"raw_author_name":"M. D'Urso","raw_affiliation_strings":["Giugliano Research Center, Large Systems Unit, SElectrical Sistemi Integrati, Giugliano di Napoli, Italy"],"affiliations":[{"raw_affiliation_string":"Giugliano Research Center, Large Systems Unit, SElectrical Sistemi Integrati, Giugliano di Napoli, Italy","institution_ids":["https://openalex.org/I76806421"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5019413332","display_name":"S. Malanga","orcid":null},"institutions":[{"id":"https://openalex.org/I183638586","display_name":"Parthenope University of Naples","ror":"https://ror.org/05pcv4v03","country_code":"IT","type":"education","lineage":["https://openalex.org/I183638586"]}],"countries":["IT"],"is_corresponding":false,"raw_author_name":"S. Malanga","raw_affiliation_strings":["Dipartimento per le Tecnologie, Centro Direzionale di Napoli, Universit\u00e0 degli Studi di Napoli Parthenope, Napoli, Italy"],"affiliations":[{"raw_affiliation_string":"Dipartimento per le Tecnologie, Centro Direzionale di Napoli, Universit\u00e0 degli Studi di Napoli Parthenope, Napoli, Italy","institution_ids":["https://openalex.org/I183638586"]}]},{"author_position":"last","author":{"id":"https://openalex.org/A5012118000","display_name":"Vito Pascazio","orcid":"https://orcid.org/0000-0002-5403-5482"},"institutions":[{"id":"https://openalex.org/I183638586","display_name":"Parthenope University of Naples","ror":"https://ror.org/05pcv4v03","country_code":"IT","type":"education","lineage":["https://openalex.org/I183638586"]}],"countries":["IT"],"is_corresponding":false,"raw_author_name":"V. Pascazio","raw_affiliation_strings":["Dipartimento per le Tecnologie, Centro Direzionale di Napoli, Universit\u00e0 degli Studi di Napoli Parthenope, Napoli, Italy"],"affiliations":[{"raw_affiliation_string":"Dipartimento per le Tecnologie, Centro Direzionale di Napoli, Universit\u00e0 degli Studi di Napoli Parthenope, Napoli, Italy","institution_ids":["https://openalex.org/I183638586"]}]}],"institutions":[],"countries_distinct_count":1,"institutions_distinct_count":4,"corresponding_author_ids":["https://openalex.org/A5072489230"],"corresponding_institution_ids":["https://openalex.org/I183638586"],"apc_list":null,"apc_paid":null,"fwci":0.0,"has_fulltext":false,"cited_by_count":1,"citation_normalized_percentile":{"value":0.16685642,"is_in_top_1_percent":false,"is_in_top_10_percent":false},"cited_by_percentile_year":{"min":90,"max":94},"biblio":{"volume":"1","issue":null,"first_page":"2873","last_page":"2876"},"is_retracted":false,"is_paratext":false,"is_xpac":false,"primary_topic":{"id":"https://openalex.org/T11739","display_name":"Microwave Imaging and Scattering Analysis","score":1.0,"subfield":{"id":"https://openalex.org/subfields/2204","display_name":"Biomedical Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},"topics":[{"id":"https://openalex.org/T11739","display_name":"Microwave Imaging and Scattering Analysis","score":1.0,"subfield":{"id":"https://openalex.org/subfields/2204","display_name":"Biomedical Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T10500","display_name":"Sparse and Compressive Sensing Techniques","score":0.9998000264167786,"subfield":{"id":"https://openalex.org/subfields/2206","display_name":"Computational Mechanics"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T11609","display_name":"Geophysical Methods and Applications","score":0.9966999888420105,"subfield":{"id":"https://openalex.org/subfields/2212","display_name":"Ocean Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"keywords":[{"id":"https://openalex.org/keywords/compressed-sensing","display_name":"Compressed sensing","score":0.7328747510910034},{"id":"https://openalex.org/keywords/microwave-imaging","display_name":"Microwave imaging","score":0.6996601819992065},{"id":"https://openalex.org/keywords/tomography","display_name":"Tomography","score":0.5936113595962524},{"id":"https://openalex.org/keywords/inversion","display_name":"Inversion (geology)","score":0.5917137861251831},{"id":"https://openalex.org/keywords/computer-science","display_name":"Computer science","score":0.5876145362854004},{"id":"https://openalex.org/keywords/iterative-reconstruction","display_name":"Iterative reconstruction","score":0.5466360449790955},{"id":"https://openalex.org/keywords/microwave","display_name":"Microwave","score":0.5354516506195068},{"id":"https://openalex.org/keywords/data-acquisition","display_name":"Data acquisition","score":0.5322753190994263},{"id":"https://openalex.org/keywords/sampling","display_name":"Sampling (signal processing)","score":0.4902811348438263},{"id":"https://openalex.org/keywords/signal-reconstruction","display_name":"Signal reconstruction","score":0.47259077429771423},{"id":"https://openalex.org/keywords/algorithm","display_name":"Algorithm","score":0.43637365102767944},{"id":"https://openalex.org/keywords/property","display_name":"Property (philosophy)","score":0.42731574177742004},{"id":"https://openalex.org/keywords/signal-processing","display_name":"Signal processing","score":0.36064034700393677},{"id":"https://openalex.org/keywords/computer-vision","display_name":"Computer vision","score":0.2970627546310425},{"id":"https://openalex.org/keywords/telecommunications","display_name":"Telecommunications","score":0.24126675724983215},{"id":"https://openalex.org/keywords/geology","display_name":"Geology","score":0.18075919151306152},{"id":"https://openalex.org/keywords/optics","display_name":"Optics","score":0.17919519543647766},{"id":"https://openalex.org/keywords/physics","display_name":"Physics","score":0.15280508995056152},{"id":"https://openalex.org/keywords/seismology","display_name":"Seismology","score":0.09288108348846436}],"concepts":[{"id":"https://openalex.org/C124851039","wikidata":"https://www.wikidata.org/wiki/Q2665459","display_name":"Compressed sensing","level":2,"score":0.7328747510910034},{"id":"https://openalex.org/C2779885931","wikidata":"https://www.wikidata.org/wiki/Q17010029","display_name":"Microwave imaging","level":3,"score":0.6996601819992065},{"id":"https://openalex.org/C163716698","wikidata":"https://www.wikidata.org/wiki/Q841267","display_name":"Tomography","level":2,"score":0.5936113595962524},{"id":"https://openalex.org/C1893757","wikidata":"https://www.wikidata.org/wiki/Q3653001","display_name":"Inversion (geology)","level":3,"score":0.5917137861251831},{"id":"https://openalex.org/C41008148","wikidata":"https://www.wikidata.org/wiki/Q21198","display_name":"Computer science","level":0,"score":0.5876145362854004},{"id":"https://openalex.org/C141379421","wikidata":"https://www.wikidata.org/wiki/Q6094427","display_name":"Iterative reconstruction","level":2,"score":0.5466360449790955},{"id":"https://openalex.org/C44838205","wikidata":"https://www.wikidata.org/wiki/Q127995","display_name":"Microwave","level":2,"score":0.5354516506195068},{"id":"https://openalex.org/C163985040","wikidata":"https://www.wikidata.org/wiki/Q1172399","display_name":"Data acquisition","level":2,"score":0.5322753190994263},{"id":"https://openalex.org/C140779682","wikidata":"https://www.wikidata.org/wiki/Q210868","display_name":"Sampling (signal processing)","level":3,"score":0.4902811348438263},{"id":"https://openalex.org/C70958404","wikidata":"https://www.wikidata.org/wiki/Q7512728","display_name":"Signal reconstruction","level":4,"score":0.47259077429771423},{"id":"https://openalex.org/C11413529","wikidata":"https://www.wikidata.org/wiki/Q8366","display_name":"Algorithm","level":1,"score":0.43637365102767944},{"id":"https://openalex.org/C189950617","wikidata":"https://www.wikidata.org/wiki/Q937228","display_name":"Property (philosophy)","level":2,"score":0.42731574177742004},{"id":"https://openalex.org/C104267543","wikidata":"https://www.wikidata.org/wiki/Q208163","display_name":"Signal processing","level":3,"score":0.36064034700393677},{"id":"https://openalex.org/C31972630","wikidata":"https://www.wikidata.org/wiki/Q844240","display_name":"Computer vision","level":1,"score":0.2970627546310425},{"id":"https://openalex.org/C76155785","wikidata":"https://www.wikidata.org/wiki/Q418","display_name":"Telecommunications","level":1,"score":0.24126675724983215},{"id":"https://openalex.org/C127313418","wikidata":"https://www.wikidata.org/wiki/Q1069","display_name":"Geology","level":0,"score":0.18075919151306152},{"id":"https://openalex.org/C120665830","wikidata":"https://www.wikidata.org/wiki/Q14620","display_name":"Optics","level":1,"score":0.17919519543647766},{"id":"https://openalex.org/C121332964","wikidata":"https://www.wikidata.org/wiki/Q413","display_name":"Physics","level":0,"score":0.15280508995056152},{"id":"https://openalex.org/C165205528","wikidata":"https://www.wikidata.org/wiki/Q83371","display_name":"Seismology","level":1,"score":0.09288108348846436},{"id":"https://openalex.org/C77928131","wikidata":"https://www.wikidata.org/wiki/Q193343","display_name":"Tectonics","level":2,"score":0.0},{"id":"https://openalex.org/C554190296","wikidata":"https://www.wikidata.org/wiki/Q47528","display_name":"Radar","level":2,"score":0.0},{"id":"https://openalex.org/C138885662","wikidata":"https://www.wikidata.org/wiki/Q5891","display_name":"Philosophy","level":0,"score":0.0},{"id":"https://openalex.org/C111472728","wikidata":"https://www.wikidata.org/wiki/Q9471","display_name":"Epistemology","level":1,"score":0.0},{"id":"https://openalex.org/C106131492","wikidata":"https://www.wikidata.org/wiki/Q3072260","display_name":"Filter (signal processing)","level":2,"score":0.0},{"id":"https://openalex.org/C111919701","wikidata":"https://www.wikidata.org/wiki/Q9135","display_name":"Operating system","level":1,"score":0.0}],"mesh":[],"locations_count":2,"locations":[{"id":"doi:10.1109/igarss.2011.6049814","is_oa":false,"landing_page_url":"https://doi.org/10.1109/igarss.2011.6049814","pdf_url":null,"source":null,"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"2011 IEEE International Geoscience and Remote Sensing Symposium","raw_type":"proceedings-article"},{"id":"pmh:oai:ricerca.uniparthenope.it:11367/18165","is_oa":false,"landing_page_url":"http://hdl.handle.net/11367/18165","pdf_url":null,"source":{"id":"https://openalex.org/S4377196432","display_name":"CINECA IRIS Institutial research information system (Parthenope University of Naples)","issn_l":null,"issn":null,"is_oa":false,"is_in_doaj":false,"is_core":false,"host_organization":"https://openalex.org/I183638586","host_organization_name":"Parthenope University of Naples","host_organization_lineage":["https://openalex.org/I183638586"],"host_organization_lineage_names":[],"type":"repository"},"license":null,"license_id":null,"version":"submittedVersion","is_accepted":false,"is_published":false,"raw_source_name":null,"raw_type":"info:eu-repo/semantics/conferenceObject"}],"best_oa_location":null,"sustainable_development_goals":[{"id":"https://metadata.un.org/sdg/9","score":0.46000000834465027,"display_name":"Industry, innovation and infrastructure"}],"awards":[],"funders":[],"has_content":{"pdf":false,"grobid_xml":false},"content_urls":null,"referenced_works_count":7,"referenced_works":["https://openalex.org/W1486239230","https://openalex.org/W2111012480","https://openalex.org/W2119667497","https://openalex.org/W2141760377","https://openalex.org/W2146942354","https://openalex.org/W2154638489","https://openalex.org/W6629166934"],"related_works":["https://openalex.org/W2378166785","https://openalex.org/W2156466545","https://openalex.org/W2379468505","https://openalex.org/W3104324607","https://openalex.org/W4206981968","https://openalex.org/W1987102304","https://openalex.org/W4285251805","https://openalex.org/W2537887767","https://openalex.org/W1606356673","https://openalex.org/W2601968125"],"abstract_inverted_index":{"This":[0],"communication":[1],"deals":[2],"with":[3],"the":[4,37,43,51,59,63],"solution":[5],"of":[6,30,62],"microwave":[7],"imaging":[8],"problems":[9],"exploiting":[10],"a":[11],"Compressive":[12],"Sampling":[13],"(CS)":[14],"based":[15,26],"method,":[16],"an":[17],"emerging":[18],"technique":[19],"for":[20],"data":[21],"acquisition":[22],"and":[23],"signal":[24],"recovery":[25],"on":[27,42],"its":[28],"property":[29],"requiring":[31],"lower":[32],"dimensional":[33],"data.":[34],"In":[35],"particular,":[36],"inversion":[38,54],"procedure":[39],"was":[40],"tested":[41],"Contrast":[44],"Source-Extended":[45],"Born":[46,53],"model.":[47],"We":[48],"also":[49],"considered":[50],"classic":[52],"in":[55],"order":[56],"to":[57],"remark":[58],"reconstruction":[60],"ability":[61],"proposed":[64],"method.":[65]},"counts_by_year":[{"year":2015,"cited_by_count":1}],"updated_date":"2025-11-06T03:46:38.306776","created_date":"2025-10-10T00:00:00"}