{"id":"https://openalex.org/W1973929988","doi":"https://doi.org/10.1109/igarss.2010.5652587","title":"Target detection above rough surfaces in microwave imaging using Compressive Sampling","display_name":"Target detection above rough surfaces in microwave imaging using Compressive Sampling","publication_year":2010,"publication_date":"2010-07-01","ids":{"openalex":"https://openalex.org/W1973929988","doi":"https://doi.org/10.1109/igarss.2010.5652587","mag":"1973929988"},"language":"en","primary_location":{"id":"doi:10.1109/igarss.2010.5652587","is_oa":false,"landing_page_url":"https://doi.org/10.1109/igarss.2010.5652587","pdf_url":null,"source":null,"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"2010 IEEE International Geoscience and Remote Sensing Symposium","raw_type":"proceedings-article"},"type":"article","indexed_in":["crossref"],"open_access":{"is_oa":false,"oa_status":"closed","oa_url":null,"any_repository_has_fulltext":false},"authorships":[{"author_position":"first","author":{"id":"https://openalex.org/A5058709222","display_name":"Suman K. Gunnala","orcid":null},"institutions":[{"id":"https://openalex.org/I189196454","display_name":"The University of Texas at Arlington","ror":"https://ror.org/019kgqr73","country_code":"US","type":"education","lineage":["https://openalex.org/I189196454"]}],"countries":["US"],"is_corresponding":false,"raw_author_name":"Suman K. Gunnala","raw_affiliation_strings":["Wave Scattering Research Center, Department of Electrical Engineering, University of Texas, Arlington, Arlington, TX, USA","Wave Scattering Research Center, Department of Electrical Engineering, The University of Texas at Arlington, 76019-0016, USA"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Wave Scattering Research Center, Department of Electrical Engineering, University of Texas, Arlington, Arlington, TX, USA","institution_ids":["https://openalex.org/I189196454"]},{"raw_affiliation_string":"Wave Scattering Research Center, Department of Electrical Engineering, The University of Texas at Arlington, 76019-0016, USA","institution_ids":["https://openalex.org/I189196454"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5112139160","display_name":"L.M. Camacho","orcid":null},"institutions":[{"id":"https://openalex.org/I189196454","display_name":"The University of Texas at Arlington","ror":"https://ror.org/019kgqr73","country_code":"US","type":"education","lineage":["https://openalex.org/I189196454"]}],"countries":["US"],"is_corresponding":false,"raw_author_name":"Luis M. Camacho","raw_affiliation_strings":["Wave Scattering Research Center, Department of Electrical Engineering, University of Texas, Arlington, Arlington, TX, USA","Wave Scattering Research Center, Department of Electrical Engineering, The University of Texas at Arlington, 76019-0016, USA"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Wave Scattering Research Center, Department of Electrical Engineering, University of Texas, Arlington, Arlington, TX, USA","institution_ids":["https://openalex.org/I189196454"]},{"raw_affiliation_string":"Wave Scattering Research Center, Department of Electrical Engineering, The University of Texas at Arlington, 76019-0016, USA","institution_ids":["https://openalex.org/I189196454"]}]},{"author_position":"last","author":{"id":"https://openalex.org/A5078640843","display_name":"Saibun Tjuatja","orcid":"https://orcid.org/0000-0003-2614-7927"},"institutions":[{"id":"https://openalex.org/I189196454","display_name":"The University of Texas at Arlington","ror":"https://ror.org/019kgqr73","country_code":"US","type":"education","lineage":["https://openalex.org/I189196454"]}],"countries":["US"],"is_corresponding":false,"raw_author_name":"Saibun Tjuatja","raw_affiliation_strings":["Wave Scattering Research Center, Department of Electrical Engineering, University of Texas, Arlington, Arlington, TX, USA","Wave Scattering Research Center, Department of Electrical Engineering, The University of Texas at Arlington, 76019-0016, USA"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Wave Scattering Research Center, Department of Electrical Engineering, University of Texas, Arlington, Arlington, TX, USA","institution_ids":["https://openalex.org/I189196454"]},{"raw_affiliation_string":"Wave Scattering Research Center, Department of Electrical Engineering, The University of Texas at Arlington, 76019-0016, USA","institution_ids":["https://openalex.org/I189196454"]}]}],"institutions":[],"countries_distinct_count":1,"institutions_distinct_count":3,"corresponding_author_ids":[],"corresponding_institution_ids":[],"apc_list":null,"apc_paid":null,"fwci":0.0,"has_fulltext":false,"cited_by_count":1,"citation_normalized_percentile":{"value":0.07632577,"is_in_top_1_percent":false,"is_in_top_10_percent":false},"cited_by_percentile_year":{"min":90,"max":94},"biblio":{"volume":null,"issue":null,"first_page":"3498","last_page":"3501"},"is_retracted":false,"is_paratext":false,"is_xpac":false,"primary_topic":{"id":"https://openalex.org/T11739","display_name":"Microwave Imaging and Scattering Analysis","score":0.9998999834060669,"subfield":{"id":"https://openalex.org/subfields/2204","display_name":"Biomedical Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},"topics":[{"id":"https://openalex.org/T11739","display_name":"Microwave Imaging and Scattering Analysis","score":0.9998999834060669,"subfield":{"id":"https://openalex.org/subfields/2204","display_name":"Biomedical Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T10500","display_name":"Sparse and Compressive Sensing Techniques","score":0.9998000264167786,"subfield":{"id":"https://openalex.org/subfields/2206","display_name":"Computational Mechanics"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T11609","display_name":"Geophysical Methods and Applications","score":0.9987000226974487,"subfield":{"id":"https://openalex.org/subfields/2212","display_name":"Ocean Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"keywords":[{"id":"https://openalex.org/keywords/principal-component-analysis","display_name":"Principal component analysis","score":0.7694379091262817},{"id":"https://openalex.org/keywords/subspace-topology","display_name":"Subspace topology","score":0.7582184076309204},{"id":"https://openalex.org/keywords/synthetic-aperture-radar","display_name":"Synthetic aperture radar","score":0.6440515518188477},{"id":"https://openalex.org/keywords/clutter","display_name":"Clutter","score":0.5955072641372681},{"id":"https://openalex.org/keywords/sampling","display_name":"Sampling (signal processing)","score":0.5769656896591187},{"id":"https://openalex.org/keywords/inverse-synthetic-aperture-radar","display_name":"Inverse synthetic aperture radar","score":0.5752490162849426},{"id":"https://openalex.org/keywords/computer-science","display_name":"Computer science","score":0.5357353687286377},{"id":"https://openalex.org/keywords/pattern-recognition","display_name":"Pattern recognition (psychology)","score":0.5280480980873108},{"id":"https://openalex.org/keywords/curse-of-dimensionality","display_name":"Curse of dimensionality","score":0.524158239364624},{"id":"https://openalex.org/keywords/artificial-intelligence","display_name":"Artificial intelligence","score":0.5047675371170044},{"id":"https://openalex.org/keywords/surface-roughness","display_name":"Surface roughness","score":0.48177072405815125},{"id":"https://openalex.org/keywords/feature-extraction","display_name":"Feature extraction","score":0.4699784815311432},{"id":"https://openalex.org/keywords/compressed-sensing","display_name":"Compressed sensing","score":0.4632180333137512},{"id":"https://openalex.org/keywords/microwave-imaging","display_name":"Microwave imaging","score":0.42929011583328247},{"id":"https://openalex.org/keywords/radar-imaging","display_name":"Radar imaging","score":0.41607287526130676},{"id":"https://openalex.org/keywords/computer-vision","display_name":"Computer vision","score":0.2969454526901245},{"id":"https://openalex.org/keywords/radar","display_name":"Radar","score":0.284697949886322},{"id":"https://openalex.org/keywords/microwave","display_name":"Microwave","score":0.27748942375183105},{"id":"https://openalex.org/keywords/materials-science","display_name":"Materials science","score":0.2668657898902893},{"id":"https://openalex.org/keywords/filter","display_name":"Filter (signal processing)","score":0.07228285074234009}],"concepts":[{"id":"https://openalex.org/C27438332","wikidata":"https://www.wikidata.org/wiki/Q2873","display_name":"Principal component analysis","level":2,"score":0.7694379091262817},{"id":"https://openalex.org/C32834561","wikidata":"https://www.wikidata.org/wiki/Q660730","display_name":"Subspace topology","level":2,"score":0.7582184076309204},{"id":"https://openalex.org/C87360688","wikidata":"https://www.wikidata.org/wiki/Q740686","display_name":"Synthetic aperture radar","level":2,"score":0.6440515518188477},{"id":"https://openalex.org/C132094186","wikidata":"https://www.wikidata.org/wiki/Q641585","display_name":"Clutter","level":3,"score":0.5955072641372681},{"id":"https://openalex.org/C140779682","wikidata":"https://www.wikidata.org/wiki/Q210868","display_name":"Sampling (signal processing)","level":3,"score":0.5769656896591187},{"id":"https://openalex.org/C109094680","wikidata":"https://www.wikidata.org/wiki/Q6060432","display_name":"Inverse synthetic aperture radar","level":4,"score":0.5752490162849426},{"id":"https://openalex.org/C41008148","wikidata":"https://www.wikidata.org/wiki/Q21198","display_name":"Computer science","level":0,"score":0.5357353687286377},{"id":"https://openalex.org/C153180895","wikidata":"https://www.wikidata.org/wiki/Q7148389","display_name":"Pattern recognition (psychology)","level":2,"score":0.5280480980873108},{"id":"https://openalex.org/C111030470","wikidata":"https://www.wikidata.org/wiki/Q1430460","display_name":"Curse of dimensionality","level":2,"score":0.524158239364624},{"id":"https://openalex.org/C154945302","wikidata":"https://www.wikidata.org/wiki/Q11660","display_name":"Artificial intelligence","level":1,"score":0.5047675371170044},{"id":"https://openalex.org/C107365816","wikidata":"https://www.wikidata.org/wiki/Q114817","display_name":"Surface roughness","level":2,"score":0.48177072405815125},{"id":"https://openalex.org/C52622490","wikidata":"https://www.wikidata.org/wiki/Q1026626","display_name":"Feature extraction","level":2,"score":0.4699784815311432},{"id":"https://openalex.org/C124851039","wikidata":"https://www.wikidata.org/wiki/Q2665459","display_name":"Compressed sensing","level":2,"score":0.4632180333137512},{"id":"https://openalex.org/C2779885931","wikidata":"https://www.wikidata.org/wiki/Q17010029","display_name":"Microwave imaging","level":3,"score":0.42929011583328247},{"id":"https://openalex.org/C10929652","wikidata":"https://www.wikidata.org/wiki/Q7279985","display_name":"Radar imaging","level":3,"score":0.41607287526130676},{"id":"https://openalex.org/C31972630","wikidata":"https://www.wikidata.org/wiki/Q844240","display_name":"Computer vision","level":1,"score":0.2969454526901245},{"id":"https://openalex.org/C554190296","wikidata":"https://www.wikidata.org/wiki/Q47528","display_name":"Radar","level":2,"score":0.284697949886322},{"id":"https://openalex.org/C44838205","wikidata":"https://www.wikidata.org/wiki/Q127995","display_name":"Microwave","level":2,"score":0.27748942375183105},{"id":"https://openalex.org/C192562407","wikidata":"https://www.wikidata.org/wiki/Q228736","display_name":"Materials science","level":0,"score":0.2668657898902893},{"id":"https://openalex.org/C106131492","wikidata":"https://www.wikidata.org/wiki/Q3072260","display_name":"Filter (signal processing)","level":2,"score":0.07228285074234009},{"id":"https://openalex.org/C76155785","wikidata":"https://www.wikidata.org/wiki/Q418","display_name":"Telecommunications","level":1,"score":0.0},{"id":"https://openalex.org/C159985019","wikidata":"https://www.wikidata.org/wiki/Q181790","display_name":"Composite material","level":1,"score":0.0}],"mesh":[],"locations_count":1,"locations":[{"id":"doi:10.1109/igarss.2010.5652587","is_oa":false,"landing_page_url":"https://doi.org/10.1109/igarss.2010.5652587","pdf_url":null,"source":null,"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"2010 IEEE International Geoscience and Remote Sensing Symposium","raw_type":"proceedings-article"}],"best_oa_location":null,"sustainable_development_goals":[],"awards":[],"funders":[],"has_content":{"pdf":false,"grobid_xml":false},"content_urls":null,"referenced_works_count":14,"referenced_works":["https://openalex.org/W1985461305","https://openalex.org/W2045268369","https://openalex.org/W2076509502","https://openalex.org/W2086769036","https://openalex.org/W2094190316","https://openalex.org/W2099641086","https://openalex.org/W2102041916","https://openalex.org/W2129638195","https://openalex.org/W2141348340","https://openalex.org/W2145096794","https://openalex.org/W2148077929","https://openalex.org/W2160172035","https://openalex.org/W2166140407","https://openalex.org/W4236469104"],"related_works":["https://openalex.org/W2540450177","https://openalex.org/W2170580735","https://openalex.org/W1552305638","https://openalex.org/W2112228652","https://openalex.org/W2613451563","https://openalex.org/W1994788526","https://openalex.org/W2011609146","https://openalex.org/W1915418828","https://openalex.org/W1966299760","https://openalex.org/W2150075356"],"abstract_inverted_index":{"A":[0],"subspace":[1,104],"extraction":[2,18,105],"approach":[3,19],"for":[4],"detection":[5],"of":[6,23,54,68,80],"targets":[7,55],"embedded":[8],"in":[9,14,34,102],"the":[10,49,66,78,81,90,97],"clutter":[11],"is":[12,32,45,74],"presented":[13,33],"this":[15,35],"work.":[16],"Subspace":[17],"that":[20,87],"makes":[21],"use":[22],"both":[24],"Compressive":[25],"Sampling":[26],"and":[27,95],"Principal":[28],"Component":[29],"Analysis":[30],"(PCA)":[31],"paper.":[36],"Inverse":[37],"Synthetic":[38],"Aperture":[39],"Radar":[40],"(ISAR)":[41],"Imaging":[42],"measurement":[43],"data":[44],"used":[46],"to":[47],"validate":[48],"proposed":[50],"approach.":[51],"Experimental":[52],"results":[53],"above":[56],"rough":[57,72],"surface":[58,73],"with":[59],"intermediate":[60,70],"roughness":[61],"are":[62],"presented.":[63],"Results":[64,85],"showed":[65,86],"dimensionality":[67,79,91],"an":[69],"scale":[71],"generally":[75],"larger":[76],"than":[77],"finite":[82],"size":[83],"targets.":[84],"by":[88],"compressing":[89],"through":[92],"compressive":[93],"sampling":[94],"extracting":[96],"principal":[98],"components,":[99],"significant":[100],"improvement":[101],"target":[103],"can":[106],"be":[107],"achieved.":[108]},"counts_by_year":[{"year":2015,"cited_by_count":1}],"updated_date":"2026-06-11T09:08:48.828518","created_date":"2025-10-10T00:00:00"}