{"id":"https://openalex.org/W2109746217","doi":"https://doi.org/10.1109/igarss.2009.5418005","title":"Hyperspectral imager characterization and calibration","display_name":"Hyperspectral imager characterization and calibration","publication_year":2009,"publication_date":"2009-01-01","ids":{"openalex":"https://openalex.org/W2109746217","doi":"https://doi.org/10.1109/igarss.2009.5418005","mag":"2109746217"},"language":"en","primary_location":{"id":"doi:10.1109/igarss.2009.5418005","is_oa":false,"landing_page_url":"https://doi.org/10.1109/igarss.2009.5418005","pdf_url":null,"source":null,"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"2009 IEEE International Geoscience and Remote Sensing Symposium","raw_type":"proceedings-article"},"type":"article","indexed_in":["crossref"],"open_access":{"is_oa":false,"oa_status":"closed","oa_url":null,"any_repository_has_fulltext":false},"authorships":[{"author_position":"first","author":{"id":"https://openalex.org/A5077676427","display_name":"John T. Woodward","orcid":"https://orcid.org/0000-0001-7719-3187"},"institutions":[{"id":"https://openalex.org/I1321296531","display_name":"National Institute of Standards and Technology","ror":"https://ror.org/05xpvk416","country_code":"US","type":"funder","lineage":["https://openalex.org/I1321296531","https://openalex.org/I1343035065"]},{"id":"https://openalex.org/I59499333","display_name":"Optica","ror":"https://ror.org/00jypd850","country_code":"US","type":"nonprofit","lineage":["https://openalex.org/I59499333"]}],"countries":["US"],"is_corresponding":true,"raw_author_name":"John T. Woodward","raw_affiliation_strings":["Optical Technology Division, National Institute for Standards and Technology, Gaithersburg, MD, USA","Optical Technology Division National Institute of Standards and Technology Gaithersburg MD USA"],"affiliations":[{"raw_affiliation_string":"Optical Technology Division, National Institute for Standards and Technology, Gaithersburg, MD, USA","institution_ids":["https://openalex.org/I1321296531"]},{"raw_affiliation_string":"Optical Technology Division National Institute of Standards and Technology Gaithersburg MD USA","institution_ids":["https://openalex.org/I1321296531","https://openalex.org/I59499333"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5069538749","display_name":"Steven W. Brown","orcid":"https://orcid.org/0000-0003-3561-3934"},"institutions":[{"id":"https://openalex.org/I59499333","display_name":"Optica","ror":"https://ror.org/00jypd850","country_code":"US","type":"nonprofit","lineage":["https://openalex.org/I59499333"]},{"id":"https://openalex.org/I1321296531","display_name":"National Institute of Standards and Technology","ror":"https://ror.org/05xpvk416","country_code":"US","type":"funder","lineage":["https://openalex.org/I1321296531","https://openalex.org/I1343035065"]}],"countries":["US"],"is_corresponding":false,"raw_author_name":"Steven W. Brown","raw_affiliation_strings":["Optical Technology Division, National Institute for Standards and Technology, Gaithersburg, MD, USA","Optical Technology Division National Institute of Standards and Technology Gaithersburg MD USA"],"affiliations":[{"raw_affiliation_string":"Optical Technology Division, National Institute for Standards and Technology, Gaithersburg, MD, USA","institution_ids":["https://openalex.org/I1321296531"]},{"raw_affiliation_string":"Optical Technology Division National Institute of Standards and Technology Gaithersburg MD USA","institution_ids":["https://openalex.org/I1321296531","https://openalex.org/I59499333"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5112414149","display_name":"A. W. Smith","orcid":null},"institutions":[{"id":"https://openalex.org/I59499333","display_name":"Optica","ror":"https://ror.org/00jypd850","country_code":"US","type":"nonprofit","lineage":["https://openalex.org/I59499333"]},{"id":"https://openalex.org/I1321296531","display_name":"National Institute of Standards and Technology","ror":"https://ror.org/05xpvk416","country_code":"US","type":"funder","lineage":["https://openalex.org/I1321296531","https://openalex.org/I1343035065"]}],"countries":["US"],"is_corresponding":false,"raw_author_name":"Allan W. Smith","raw_affiliation_strings":["Optical Technology Division, National Institute for Standards and Technology, Gaithersburg, MD, USA","Optical Technology Division National Institute of Standards and Technology Gaithersburg MD USA"],"affiliations":[{"raw_affiliation_string":"Optical Technology Division, National Institute for Standards and Technology, Gaithersburg, MD, USA","institution_ids":["https://openalex.org/I1321296531"]},{"raw_affiliation_string":"Optical Technology Division National Institute of Standards and Technology Gaithersburg MD USA","institution_ids":["https://openalex.org/I1321296531","https://openalex.org/I59499333"]}]},{"author_position":"last","author":{"id":"https://openalex.org/A5046331291","display_name":"Keith R. Lykke","orcid":null},"institutions":[{"id":"https://openalex.org/I1321296531","display_name":"National Institute of Standards and Technology","ror":"https://ror.org/05xpvk416","country_code":"US","type":"funder","lineage":["https://openalex.org/I1321296531","https://openalex.org/I1343035065"]},{"id":"https://openalex.org/I59499333","display_name":"Optica","ror":"https://ror.org/00jypd850","country_code":"US","type":"nonprofit","lineage":["https://openalex.org/I59499333"]}],"countries":["US"],"is_corresponding":false,"raw_author_name":"Keith R. Lykke","raw_affiliation_strings":["Optical Technology Division, National Institute for Standards and Technology, Gaithersburg, MD, USA","Optical Technology Division National Institute of Standards and Technology Gaithersburg MD USA"],"affiliations":[{"raw_affiliation_string":"Optical Technology Division, National Institute for Standards and Technology, Gaithersburg, MD, USA","institution_ids":["https://openalex.org/I1321296531"]},{"raw_affiliation_string":"Optical Technology Division National Institute of Standards and Technology Gaithersburg MD USA","institution_ids":["https://openalex.org/I1321296531","https://openalex.org/I59499333"]}]}],"institutions":[],"countries_distinct_count":1,"institutions_distinct_count":4,"corresponding_author_ids":["https://openalex.org/A5077676427"],"corresponding_institution_ids":["https://openalex.org/I1321296531","https://openalex.org/I59499333"],"apc_list":null,"apc_paid":null,"fwci":0.0,"has_fulltext":false,"cited_by_count":4,"citation_normalized_percentile":{"value":0.10503585,"is_in_top_1_percent":false,"is_in_top_10_percent":false},"cited_by_percentile_year":{"min":90,"max":97},"biblio":{"volume":"6565","issue":null,"first_page":"II","last_page":"77"},"is_retracted":false,"is_paratext":false,"is_xpac":false,"primary_topic":{"id":"https://openalex.org/T12019","display_name":"Calibration and Measurement Techniques","score":1.0,"subfield":{"id":"https://openalex.org/subfields/2202","display_name":"Aerospace Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},"topics":[{"id":"https://openalex.org/T12019","display_name":"Calibration and Measurement Techniques","score":1.0,"subfield":{"id":"https://openalex.org/subfields/2202","display_name":"Aerospace Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T12389","display_name":"Infrared Target Detection Methodologies","score":0.9957000017166138,"subfield":{"id":"https://openalex.org/subfields/2202","display_name":"Aerospace Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T11320","display_name":"Atmospheric Ozone and Climate","score":0.9936000108718872,"subfield":{"id":"https://openalex.org/subfields/1902","display_name":"Atmospheric Science"},"field":{"id":"https://openalex.org/fields/19","display_name":"Earth and Planetary Sciences"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"keywords":[{"id":"https://openalex.org/keywords/hyperspectral-imaging","display_name":"Hyperspectral imaging","score":0.9194544553756714},{"id":"https://openalex.org/keywords/remote-sensing","display_name":"Remote sensing","score":0.7683472633361816},{"id":"https://openalex.org/keywords/radiometric-calibration","display_name":"Radiometric calibration","score":0.7457957863807678},{"id":"https://openalex.org/keywords/calibration","display_name":"Calibration","score":0.6430705785751343},{"id":"https://openalex.org/keywords/computer-science","display_name":"Computer science","score":0.6181147694587708},{"id":"https://openalex.org/keywords/radiometry","display_name":"Radiometry","score":0.49608954787254333},{"id":"https://openalex.org/keywords/characterization","display_name":"Characterization (materials science)","score":0.4956766366958618},{"id":"https://openalex.org/keywords/full-spectral-imaging","display_name":"Full spectral imaging","score":0.4741484522819519},{"id":"https://openalex.org/keywords/image-sensor","display_name":"Image sensor","score":0.44589778780937195},{"id":"https://openalex.org/keywords/black-body-radiation","display_name":"Black-body radiation","score":0.4158703684806824},{"id":"https://openalex.org/keywords/computer-vision","display_name":"Computer vision","score":0.41438406705856323},{"id":"https://openalex.org/keywords/artificial-intelligence","display_name":"Artificial intelligence","score":0.3970716595649719},{"id":"https://openalex.org/keywords/optics","display_name":"Optics","score":0.3204355239868164},{"id":"https://openalex.org/keywords/radiation","display_name":"Radiation","score":0.31587278842926025},{"id":"https://openalex.org/keywords/geology","display_name":"Geology","score":0.19350206851959229},{"id":"https://openalex.org/keywords/physics","display_name":"Physics","score":0.12839314341545105}],"concepts":[{"id":"https://openalex.org/C159078339","wikidata":"https://www.wikidata.org/wiki/Q959005","display_name":"Hyperspectral imaging","level":2,"score":0.9194544553756714},{"id":"https://openalex.org/C62649853","wikidata":"https://www.wikidata.org/wiki/Q199687","display_name":"Remote sensing","level":1,"score":0.7683472633361816},{"id":"https://openalex.org/C2778522173","wikidata":"https://www.wikidata.org/wiki/Q7281293","display_name":"Radiometric calibration","level":3,"score":0.7457957863807678},{"id":"https://openalex.org/C165838908","wikidata":"https://www.wikidata.org/wiki/Q736777","display_name":"Calibration","level":2,"score":0.6430705785751343},{"id":"https://openalex.org/C41008148","wikidata":"https://www.wikidata.org/wiki/Q21198","display_name":"Computer science","level":0,"score":0.6181147694587708},{"id":"https://openalex.org/C87456703","wikidata":"https://www.wikidata.org/wiki/Q247760","display_name":"Radiometry","level":2,"score":0.49608954787254333},{"id":"https://openalex.org/C2780841128","wikidata":"https://www.wikidata.org/wiki/Q5073781","display_name":"Characterization (materials science)","level":2,"score":0.4956766366958618},{"id":"https://openalex.org/C78660771","wikidata":"https://www.wikidata.org/wiki/Q5508206","display_name":"Full spectral imaging","level":3,"score":0.4741484522819519},{"id":"https://openalex.org/C76935873","wikidata":"https://www.wikidata.org/wiki/Q209121","display_name":"Image sensor","level":2,"score":0.44589778780937195},{"id":"https://openalex.org/C157909335","wikidata":"https://www.wikidata.org/wiki/Q900097","display_name":"Black-body radiation","level":3,"score":0.4158703684806824},{"id":"https://openalex.org/C31972630","wikidata":"https://www.wikidata.org/wiki/Q844240","display_name":"Computer vision","level":1,"score":0.41438406705856323},{"id":"https://openalex.org/C154945302","wikidata":"https://www.wikidata.org/wiki/Q11660","display_name":"Artificial intelligence","level":1,"score":0.3970716595649719},{"id":"https://openalex.org/C120665830","wikidata":"https://www.wikidata.org/wiki/Q14620","display_name":"Optics","level":1,"score":0.3204355239868164},{"id":"https://openalex.org/C153385146","wikidata":"https://www.wikidata.org/wiki/Q18335","display_name":"Radiation","level":2,"score":0.31587278842926025},{"id":"https://openalex.org/C127313418","wikidata":"https://www.wikidata.org/wiki/Q1069","display_name":"Geology","level":0,"score":0.19350206851959229},{"id":"https://openalex.org/C121332964","wikidata":"https://www.wikidata.org/wiki/Q413","display_name":"Physics","level":0,"score":0.12839314341545105},{"id":"https://openalex.org/C62520636","wikidata":"https://www.wikidata.org/wiki/Q944","display_name":"Quantum mechanics","level":1,"score":0.0}],"mesh":[],"locations_count":1,"locations":[{"id":"doi:10.1109/igarss.2009.5418005","is_oa":false,"landing_page_url":"https://doi.org/10.1109/igarss.2009.5418005","pdf_url":null,"source":null,"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"2009 IEEE International Geoscience and Remote Sensing Symposium","raw_type":"proceedings-article"}],"best_oa_location":null,"sustainable_development_goals":[],"awards":[],"funders":[],"has_content":{"pdf":false,"grobid_xml":false},"content_urls":null,"referenced_works_count":13,"referenced_works":["https://openalex.org/W1993308672","https://openalex.org/W2000590751","https://openalex.org/W2008610262","https://openalex.org/W2020533035","https://openalex.org/W2035946199","https://openalex.org/W2036162929","https://openalex.org/W2042677259","https://openalex.org/W2060165924","https://openalex.org/W2067022460","https://openalex.org/W2070748536","https://openalex.org/W2329475115","https://openalex.org/W6655317516","https://openalex.org/W6668450797"],"related_works":["https://openalex.org/W2351712597","https://openalex.org/W4320479303","https://openalex.org/W2052948700","https://openalex.org/W2116728133","https://openalex.org/W2347506004","https://openalex.org/W2000047745","https://openalex.org/W151369123","https://openalex.org/W2005789008","https://openalex.org/W4380741647","https://openalex.org/W2953429881"],"abstract_inverted_index":{"Current":[0],"radiometric":[1,34],"calibration":[2],"standards,":[3],"specifically":[4],"blackbody":[5],"and":[6,14,26,47,53,76],"lamp-based":[7],"optical":[8],"radiation":[9],"sources,":[10],"produce":[11],"spatially,":[12,24],"spectrally,":[13,25],"temporally":[15,27],"simple":[16],"scenes.":[17],"Hyperspectral":[18],"imaging":[19,82],"instruments,":[20],"which":[21],"in-practice":[22],"view":[23],"complex":[28],"scenes,":[29],"would":[30],"benefit":[31],"from":[32],"advanced":[33],"artifacts":[35,48],"that":[36,49,55],"more":[37],"closely":[38],"resemble":[39],"scenes":[40],"the":[41,57,73],"sensor":[42,51,63],"will":[43],"ultimately":[44],"view.":[45],"Techniques":[46],"advance":[50],"characterization":[52],"algorithms":[54,77],"reduce":[56],"impact":[58],"of":[59,72],"scattered":[60],"light":[61],"on":[62,78],"performance":[64],"are":[65,84],"presented":[66],"in":[67],"this":[68],"work.":[69],"Example":[70],"applications":[71],"new":[74],"technologies":[75],"remote":[79],"sensing":[80],"hyperspectral":[81],"instruments":[83],"presented.":[85]},"counts_by_year":[{"year":2024,"cited_by_count":1},{"year":2019,"cited_by_count":3}],"updated_date":"2025-11-06T03:46:38.306776","created_date":"2025-10-10T00:00:00"}