{"id":"https://openalex.org/W2096521803","doi":"https://doi.org/10.1109/igarss.2003.1294128","title":"Surface parameter retrieval from polarimetric and multi-frequency SAR data","display_name":"Surface parameter retrieval from polarimetric and multi-frequency SAR data","publication_year":2004,"publication_date":"2004-05-25","ids":{"openalex":"https://openalex.org/W2096521803","doi":"https://doi.org/10.1109/igarss.2003.1294128","mag":"2096521803"},"language":"en","primary_location":{"id":"doi:10.1109/igarss.2003.1294128","is_oa":false,"landing_page_url":"https://doi.org/10.1109/igarss.2003.1294128","pdf_url":null,"source":null,"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"IGARSS 2003. 2003 IEEE International Geoscience and Remote Sensing Symposium. Proceedings (IEEE Cat. No.03CH37477)","raw_type":"proceedings-article"},"type":"conference-paper","indexed_in":["crossref"],"open_access":{"is_oa":false,"oa_status":"closed","oa_url":null,"any_repository_has_fulltext":false},"authorships":[{"author_position":"first","author":{"id":"https://openalex.org/A5110499034","display_name":"S. Allain","orcid":"https://orcid.org/0000-0002-9119-1898"},"institutions":[{"id":"https://openalex.org/I1294671590","display_name":"Centre National de la Recherche Scientifique","ror":"https://ror.org/02feahw73","country_code":"FR","type":"government","lineage":["https://openalex.org/I1294671590"]},{"id":"https://openalex.org/I4210100151","display_name":"Institut d'\u00c9lectronique et des Technologies du num\u00e9Rique","ror":"https://ror.org/013q33h79","country_code":"FR","type":"facility","lineage":["https://openalex.org/I1294671590","https://openalex.org/I1294671590","https://openalex.org/I28221208","https://openalex.org/I4210095849","https://openalex.org/I4210100151","https://openalex.org/I56067802","https://openalex.org/I97188460"]},{"id":"https://openalex.org/I56067802","display_name":"Universit\u00e9 de Rennes","ror":"https://ror.org/015m7wh34","country_code":"FR","type":"education","lineage":["https://openalex.org/I56067802"]}],"countries":["FR"],"is_corresponding":false,"raw_author_name":"S. Allain","raw_affiliation_strings":["I.E.T.R, UMR CNRS 6164, Radar Polarimetry Division, University of Rennes I, Rennes, France","Radar Polarimetry Div., Rennes Univ., France"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"I.E.T.R, UMR CNRS 6164, Radar Polarimetry Division, University of Rennes I, Rennes, France","institution_ids":["https://openalex.org/I1294671590","https://openalex.org/I4210100151","https://openalex.org/I56067802"]},{"raw_affiliation_string":"Radar Polarimetry Div., Rennes Univ., France","institution_ids":["https://openalex.org/I56067802"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5082938344","display_name":"Laurent Ferro-Famil","orcid":null},"institutions":[{"id":"https://openalex.org/I1294671590","display_name":"Centre National de la Recherche Scientifique","ror":"https://ror.org/02feahw73","country_code":"FR","type":"government","lineage":["https://openalex.org/I1294671590"]},{"id":"https://openalex.org/I4210100151","display_name":"Institut d'\u00c9lectronique et des Technologies du num\u00e9Rique","ror":"https://ror.org/013q33h79","country_code":"FR","type":"facility","lineage":["https://openalex.org/I1294671590","https://openalex.org/I1294671590","https://openalex.org/I28221208","https://openalex.org/I4210095849","https://openalex.org/I4210100151","https://openalex.org/I56067802","https://openalex.org/I97188460"]},{"id":"https://openalex.org/I56067802","display_name":"Universit\u00e9 de Rennes","ror":"https://ror.org/015m7wh34","country_code":"FR","type":"education","lineage":["https://openalex.org/I56067802"]}],"countries":["FR"],"is_corresponding":false,"raw_author_name":"L. Ferro-Famil","raw_affiliation_strings":["I.E.T.R, UMR CNRS 6164, Radar Polarimetry Division, University of Rennes I, Rennes, France","Radar Polarimetry Div., Rennes Univ., France"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"I.E.T.R, UMR CNRS 6164, Radar Polarimetry Division, University of Rennes I, Rennes, France","institution_ids":["https://openalex.org/I1294671590","https://openalex.org/I4210100151","https://openalex.org/I56067802"]},{"raw_affiliation_string":"Radar Polarimetry Div., Rennes Univ., France","institution_ids":["https://openalex.org/I56067802"]}]},{"author_position":"last","author":{"id":"https://openalex.org/A5060425384","display_name":"\u00c9ric Pottier","orcid":"https://orcid.org/0000-0002-5165-1423"},"institutions":[{"id":"https://openalex.org/I1294671590","display_name":"Centre National de la Recherche Scientifique","ror":"https://ror.org/02feahw73","country_code":"FR","type":"government","lineage":["https://openalex.org/I1294671590"]},{"id":"https://openalex.org/I4210100151","display_name":"Institut d'\u00c9lectronique et des Technologies du num\u00e9Rique","ror":"https://ror.org/013q33h79","country_code":"FR","type":"facility","lineage":["https://openalex.org/I1294671590","https://openalex.org/I1294671590","https://openalex.org/I28221208","https://openalex.org/I4210095849","https://openalex.org/I4210100151","https://openalex.org/I56067802","https://openalex.org/I97188460"]},{"id":"https://openalex.org/I56067802","display_name":"Universit\u00e9 de Rennes","ror":"https://ror.org/015m7wh34","country_code":"FR","type":"education","lineage":["https://openalex.org/I56067802"]}],"countries":["FR"],"is_corresponding":false,"raw_author_name":"E. Pottier","raw_affiliation_strings":["I.E.T.R, UMR CNRS 6164, Radar Polarimetry Division, University of Rennes I, Rennes, France","Radar Polarimetry Div., Rennes Univ., France"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"I.E.T.R, UMR CNRS 6164, Radar Polarimetry Division, University of Rennes I, Rennes, France","institution_ids":["https://openalex.org/I1294671590","https://openalex.org/I4210100151","https://openalex.org/I56067802"]},{"raw_affiliation_string":"Radar Polarimetry Div., Rennes Univ., France","institution_ids":["https://openalex.org/I56067802"]}]}],"institutions":[],"countries_distinct_count":1,"institutions_distinct_count":3,"corresponding_author_ids":[],"corresponding_institution_ids":[],"apc_list":null,"apc_paid":null,"fwci":null,"has_fulltext":false,"cited_by_count":18,"citation_normalized_percentile":null,"cited_by_percentile_year":null,"biblio":{"volume":"2","issue":null,"first_page":"1417","last_page":"1419"},"is_retracted":false,"is_paratext":false,"is_xpac":false,"primary_topic":{"id":"https://openalex.org/T11312","display_name":"Soil Moisture and Remote Sensing","score":0.9998999834060669,"subfield":{"id":"https://openalex.org/subfields/2305","display_name":"Environmental Engineering"},"field":{"id":"https://openalex.org/fields/23","display_name":"Environmental Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},"topics":[{"id":"https://openalex.org/T11312","display_name":"Soil Moisture and Remote Sensing","score":0.9998999834060669,"subfield":{"id":"https://openalex.org/subfields/2305","display_name":"Environmental Engineering"},"field":{"id":"https://openalex.org/fields/23","display_name":"Environmental Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T10801","display_name":"Synthetic Aperture Radar (SAR) Applications and Techniques","score":0.9993000030517578,"subfield":{"id":"https://openalex.org/subfields/2202","display_name":"Aerospace Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T11609","display_name":"Geophysical Methods and Applications","score":0.9847999811172485,"subfield":{"id":"https://openalex.org/subfields/2212","display_name":"Ocean Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"keywords":[{"id":"https://openalex.org/keywords/polarimetry","display_name":"Polarimetry","score":0.749039888381958},{"id":"https://openalex.org/keywords/surface-roughness","display_name":"Surface roughness","score":0.6996119022369385},{"id":"https://openalex.org/keywords/inversion","display_name":"Inversion (geology)","score":0.696420431137085},{"id":"https://openalex.org/keywords/remote-sensing","display_name":"Remote sensing","score":0.695649266242981},{"id":"https://openalex.org/keywords/dielectric","display_name":"Dielectric","score":0.5434489846229553},{"id":"https://openalex.org/keywords/surface","display_name":"Surface (topology)","score":0.4611968994140625},{"id":"https://openalex.org/keywords/inverse-transform-sampling","display_name":"Inverse transform sampling","score":0.45682528614997864},{"id":"https://openalex.org/keywords/synthetic-aperture-radar","display_name":"Synthetic aperture radar","score":0.4445136785507202},{"id":"https://openalex.org/keywords/environmental-science","display_name":"Environmental science","score":0.400623619556427},{"id":"https://openalex.org/keywords/materials-science","display_name":"Materials science","score":0.3011366128921509},{"id":"https://openalex.org/keywords/geology","display_name":"Geology","score":0.28842484951019287},{"id":"https://openalex.org/keywords/surface-wave","display_name":"Surface wave","score":0.25296032428741455},{"id":"https://openalex.org/keywords/physics","display_name":"Physics","score":0.23426446318626404},{"id":"https://openalex.org/keywords/mathematics","display_name":"Mathematics","score":0.2297263741493225},{"id":"https://openalex.org/keywords/optics","display_name":"Optics","score":0.22197198867797852},{"id":"https://openalex.org/keywords/scattering","display_name":"Scattering","score":0.16331756114959717},{"id":"https://openalex.org/keywords/optoelectronics","display_name":"Optoelectronics","score":0.08077359199523926},{"id":"https://openalex.org/keywords/geometry","display_name":"Geometry","score":0.07214602828025818}],"concepts":[{"id":"https://openalex.org/C28493345","wikidata":"https://www.wikidata.org/wiki/Q899381","display_name":"Polarimetry","level":3,"score":0.749039888381958},{"id":"https://openalex.org/C107365816","wikidata":"https://www.wikidata.org/wiki/Q114817","display_name":"Surface roughness","level":2,"score":0.6996119022369385},{"id":"https://openalex.org/C1893757","wikidata":"https://www.wikidata.org/wiki/Q3653001","display_name":"Inversion (geology)","level":3,"score":0.696420431137085},{"id":"https://openalex.org/C62649853","wikidata":"https://www.wikidata.org/wiki/Q199687","display_name":"Remote sensing","level":1,"score":0.695649266242981},{"id":"https://openalex.org/C133386390","wikidata":"https://www.wikidata.org/wiki/Q184996","display_name":"Dielectric","level":2,"score":0.5434489846229553},{"id":"https://openalex.org/C2776799497","wikidata":"https://www.wikidata.org/wiki/Q484298","display_name":"Surface (topology)","level":2,"score":0.4611968994140625},{"id":"https://openalex.org/C143606050","wikidata":"https://www.wikidata.org/wiki/Q1377019","display_name":"Inverse transform sampling","level":3,"score":0.45682528614997864},{"id":"https://openalex.org/C87360688","wikidata":"https://www.wikidata.org/wiki/Q740686","display_name":"Synthetic aperture radar","level":2,"score":0.4445136785507202},{"id":"https://openalex.org/C39432304","wikidata":"https://www.wikidata.org/wiki/Q188847","display_name":"Environmental science","level":0,"score":0.400623619556427},{"id":"https://openalex.org/C192562407","wikidata":"https://www.wikidata.org/wiki/Q228736","display_name":"Materials science","level":0,"score":0.3011366128921509},{"id":"https://openalex.org/C127313418","wikidata":"https://www.wikidata.org/wiki/Q1069","display_name":"Geology","level":0,"score":0.28842484951019287},{"id":"https://openalex.org/C84174578","wikidata":"https://www.wikidata.org/wiki/Q889796","display_name":"Surface wave","level":2,"score":0.25296032428741455},{"id":"https://openalex.org/C121332964","wikidata":"https://www.wikidata.org/wiki/Q413","display_name":"Physics","level":0,"score":0.23426446318626404},{"id":"https://openalex.org/C33923547","wikidata":"https://www.wikidata.org/wiki/Q395","display_name":"Mathematics","level":0,"score":0.2297263741493225},{"id":"https://openalex.org/C120665830","wikidata":"https://www.wikidata.org/wiki/Q14620","display_name":"Optics","level":1,"score":0.22197198867797852},{"id":"https://openalex.org/C191486275","wikidata":"https://www.wikidata.org/wiki/Q210028","display_name":"Scattering","level":2,"score":0.16331756114959717},{"id":"https://openalex.org/C49040817","wikidata":"https://www.wikidata.org/wiki/Q193091","display_name":"Optoelectronics","level":1,"score":0.08077359199523926},{"id":"https://openalex.org/C2524010","wikidata":"https://www.wikidata.org/wiki/Q8087","display_name":"Geometry","level":1,"score":0.07214602828025818},{"id":"https://openalex.org/C151730666","wikidata":"https://www.wikidata.org/wiki/Q7205","display_name":"Paleontology","level":1,"score":0.0},{"id":"https://openalex.org/C109007969","wikidata":"https://www.wikidata.org/wiki/Q749565","display_name":"Structural basin","level":2,"score":0.0},{"id":"https://openalex.org/C159985019","wikidata":"https://www.wikidata.org/wiki/Q181790","display_name":"Composite material","level":1,"score":0.0}],"mesh":[],"locations_count":1,"locations":[{"id":"doi:10.1109/igarss.2003.1294128","is_oa":false,"landing_page_url":"https://doi.org/10.1109/igarss.2003.1294128","pdf_url":null,"source":null,"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"IGARSS 2003. 2003 IEEE International Geoscience and Remote Sensing Symposium. Proceedings (IEEE Cat. No.03CH37477)","raw_type":"proceedings-article"}],"best_oa_location":null,"sustainable_development_goals":[{"id":"https://metadata.un.org/sdg/15","display_name":"Life in Land","score":0.6700000166893005}],"awards":[],"funders":[],"has_content":{"grobid_xml":false,"pdf":false},"content_urls":null,"referenced_works_count":11,"referenced_works":["https://openalex.org/W2044043851","https://openalex.org/W2044781968","https://openalex.org/W2078985447","https://openalex.org/W2090664287","https://openalex.org/W2092055157","https://openalex.org/W2133013453","https://openalex.org/W2144447636","https://openalex.org/W2622314246","https://openalex.org/W6670432983","https://openalex.org/W6739079967","https://openalex.org/W7066729498"],"related_works":["https://openalex.org/W2469797871","https://openalex.org/W2044527509","https://openalex.org/W3151319332","https://openalex.org/W2377084220","https://openalex.org/W4293147659","https://openalex.org/W2378498423","https://openalex.org/W172951924","https://openalex.org/W4308342250","https://openalex.org/W2390674751","https://openalex.org/W4285327398"],"abstract_inverted_index":{"The":[0,60],"aim":[1],"of":[2,17,22,25],"this":[3],"paper":[4],"is":[5,41,46,63],"to":[6,48,65],"present":[7],"a":[8,44,50],"surface":[9,26,51],"model":[10],"inversion":[11,61],"using":[12],"the":[13,23],"integral":[14],"equation":[15],"formulation":[16],"backscattering":[18],"coefficients.":[19],"A":[20],"quantification":[21],"influence":[24],"parameters":[27],"such":[28],"as":[29],"roughness":[30],"and":[31,54,67],"soil":[32],"moisture":[33],"on":[34],"polarimetric":[35,66],"indicators":[36],"for":[37],"various":[38],"frequency":[39],"bands":[40],"led.":[42],"Finally,":[43],"technique":[45,62],"introduced":[47],"retrieve":[49],"RMS":[52],"height":[53],"dielectric":[55],"constant":[56],"from":[57],"multi-frequency":[58,68],"data.":[59],"applied":[64],"measurements":[69],"acquired":[70],"at":[71],"EMSL,":[72],"JRC":[73],"laboratory.":[74]},"counts_by_year":[{"year":2020,"cited_by_count":1},{"year":2019,"cited_by_count":1},{"year":2018,"cited_by_count":1},{"year":2016,"cited_by_count":1},{"year":2014,"cited_by_count":1},{"year":2013,"cited_by_count":1},{"year":2012,"cited_by_count":2}],"updated_date":"2026-07-22T07:51:19.307946","created_date":"2025-10-10T00:00:00"}