{"id":"https://openalex.org/W1975572703","doi":"https://doi.org/10.1109/iembs.2011.6091778","title":"Electrical impedance tomography reconstruction through Simulated Annealing with incomplete evaluation of the objective function","display_name":"Electrical impedance tomography reconstruction through Simulated Annealing with incomplete evaluation of the objective function","publication_year":2011,"publication_date":"2011-08-01","ids":{"openalex":"https://openalex.org/W1975572703","doi":"https://doi.org/10.1109/iembs.2011.6091778","mag":"1975572703","pmid":"https://pubmed.ncbi.nlm.nih.gov/22255958"},"language":"en","primary_location":{"id":"doi:10.1109/iembs.2011.6091778","is_oa":false,"landing_page_url":"https://doi.org/10.1109/iembs.2011.6091778","pdf_url":null,"source":null,"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"2011 Annual International Conference of the IEEE Engineering in Medicine and Biology Society","raw_type":"proceedings-article"},"type":"conference-paper","indexed_in":["crossref","pubmed"],"open_access":{"is_oa":false,"oa_status":"closed","oa_url":null,"any_repository_has_fulltext":false},"authorships":[{"author_position":"first","author":{"id":"https://openalex.org/A5046774978","display_name":"Thiago de Castro Martins","orcid":"https://orcid.org/0000-0002-4751-1743"},"institutions":[],"countries":[],"is_corresponding":false,"raw_author_name":"T. de Castro Martins","raw_affiliation_strings":["Computational Geometry Laboratory, Escola Polit\u00e9cnica, S\u00e3o Paulo University, Brazil. thiago@usp.br","Computational Geometry Laboratory, Escola Polit\u00e9cnica, S\u00e3o Paulo University, Brazil"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Computational Geometry Laboratory, Escola Polit\u00e9cnica, S\u00e3o Paulo University, Brazil. thiago@usp.br","institution_ids":[]},{"raw_affiliation_string":"Computational Geometry Laboratory, Escola Polit\u00e9cnica, S\u00e3o Paulo University, Brazil","institution_ids":[]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5060370276","display_name":"Erick Dario Le\u00f3n Bueno de Camargo","orcid":"https://orcid.org/0000-0001-6191-0620"},"institutions":[{"id":"https://openalex.org/I17974374","display_name":"Universidade de S\u00e3o Paulo","ror":"https://ror.org/036rp1748","country_code":"BR","type":"education","lineage":["https://openalex.org/I17974374"]}],"countries":["BR"],"is_corresponding":false,"raw_author_name":"E. D. L. B. de Camargo","raw_affiliation_strings":["Department of Mechanical Engineering, Escola Polit\u00e9cnica, S\u00e3o Paulo University, Brazil"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Department of Mechanical Engineering, Escola Polit\u00e9cnica, S\u00e3o Paulo University, Brazil","institution_ids":["https://openalex.org/I17974374"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5090520014","display_name":"Ra\u00fal Gonz\u00e1lez Lima","orcid":"https://orcid.org/0000-0002-3747-1274"},"institutions":[{"id":"https://openalex.org/I17974374","display_name":"Universidade de S\u00e3o Paulo","ror":"https://ror.org/036rp1748","country_code":"BR","type":"education","lineage":["https://openalex.org/I17974374"]}],"countries":["BR"],"is_corresponding":false,"raw_author_name":"R. G. Lima","raw_affiliation_strings":["Department of Mechanical Engineering, Escola Polit\u00e9cnica, S\u00e3o Paulo University, Brazil"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Department of Mechanical Engineering, Escola Polit\u00e9cnica, S\u00e3o Paulo University, Brazil","institution_ids":["https://openalex.org/I17974374"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5075318238","display_name":"Marcelo B. P. Amato","orcid":"https://orcid.org/0000-0003-3525-8282"},"institutions":[{"id":"https://openalex.org/I17974374","display_name":"Universidade de S\u00e3o Paulo","ror":"https://ror.org/036rp1748","country_code":"BR","type":"education","lineage":["https://openalex.org/I17974374"]},{"id":"https://openalex.org/I4210145268","display_name":"Hospital das Cl\u00ednicas da Faculdade de Medicina da Universidade de S\u00e3o Paulo","ror":"https://ror.org/03se9eg94","country_code":"BR","type":"healthcare","lineage":["https://openalex.org/I4210145268"]}],"countries":["BR"],"is_corresponding":false,"raw_author_name":"M. B. P. Amato","raw_affiliation_strings":["Respiratory Intensive Care Unit, Pulmonary Division, Hospital das Cl\u00ednicas, University of S\u00e3o Paulo, Brazil","Respiratory Intensive Care Unit, Pulmonary Division, Hospital das Cl\u00ednicas, University of S\u00e3o Paulo, Brazil#TAB#"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Respiratory Intensive Care Unit, Pulmonary Division, Hospital das Cl\u00ednicas, University of S\u00e3o Paulo, Brazil","institution_ids":["https://openalex.org/I4210145268"]},{"raw_affiliation_string":"Respiratory Intensive Care Unit, Pulmonary Division, Hospital das Cl\u00ednicas, University of S\u00e3o Paulo, Brazil#TAB#","institution_ids":["https://openalex.org/I17974374"]}]},{"author_position":"last","author":{"id":"https://openalex.org/A5084328318","display_name":"Marcos de Sales Guerra Tsuzuki","orcid":"https://orcid.org/0000-0002-8495-2337"},"institutions":[],"countries":[],"is_corresponding":false,"raw_author_name":"M. de Sales Guerra Tsuzuki","raw_affiliation_strings":["Computational Geometry Laboratory, Escola Polit\u00e9cnica, S\u00e3o Paulo University, Brazil"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Computational Geometry Laboratory, Escola Polit\u00e9cnica, S\u00e3o Paulo University, Brazil","institution_ids":[]}]}],"institutions":[],"countries_distinct_count":1,"institutions_distinct_count":2,"corresponding_author_ids":[],"corresponding_institution_ids":[],"apc_list":null,"apc_paid":null,"fwci":2.685,"has_fulltext":false,"cited_by_count":29,"citation_normalized_percentile":{"value":0.8936441,"is_in_top_1_percent":false,"is_in_top_10_percent":false},"cited_by_percentile_year":{"min":89,"max":99},"biblio":{"volume":"2011","issue":null,"first_page":"7033","last_page":"7036"},"is_retracted":false,"is_paratext":false,"is_xpac":false,"primary_topic":{"id":"https://openalex.org/T11778","display_name":"Electrical and Bioimpedance Tomography","score":0.9998999834060669,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},"topics":[{"id":"https://openalex.org/T11778","display_name":"Electrical and Bioimpedance Tomography","score":0.9998999834060669,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T10572","display_name":"Geophysical and Geoelectrical Methods","score":0.9923999905586243,"subfield":{"id":"https://openalex.org/subfields/1908","display_name":"Geophysics"},"field":{"id":"https://openalex.org/fields/19","display_name":"Earth and Planetary Sciences"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T12169","display_name":"Non-Destructive Testing Techniques","score":0.9919000267982483,"subfield":{"id":"https://openalex.org/subfields/2210","display_name":"Mechanical Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"keywords":[{"id":"https://openalex.org/keywords/simulated-annealing","display_name":"Simulated annealing","score":0.8869197368621826},{"id":"https://openalex.org/keywords/electrical-impedance-tomography","display_name":"Electrical impedance tomography","score":0.8631742000579834},{"id":"https://openalex.org/keywords/electrical-impedance","display_name":"Electrical impedance","score":0.6134138703346252},{"id":"https://openalex.org/keywords/mathematical-optimization","display_name":"Mathematical optimization","score":0.523823082447052},{"id":"https://openalex.org/keywords/computer-science","display_name":"Computer science","score":0.48723092675209045},{"id":"https://openalex.org/keywords/algorithm","display_name":"Algorithm","score":0.4732035994529724},{"id":"https://openalex.org/keywords/iterative-reconstruction","display_name":"Iterative reconstruction","score":0.4672085642814636},{"id":"https://openalex.org/keywords/function","display_name":"Function (biology)","score":0.46687620878219604},{"id":"https://openalex.org/keywords/tomography","display_name":"Tomography","score":0.4660651981830597},{"id":"https://openalex.org/keywords/adaptive-simulated-annealing","display_name":"Adaptive simulated annealing","score":0.46535617113113403},{"id":"https://openalex.org/keywords/annealing","display_name":"Annealing (glass)","score":0.4644337594509125},{"id":"https://openalex.org/keywords/mathematics","display_name":"Mathematics","score":0.30467289686203003},{"id":"https://openalex.org/keywords/materials-science","display_name":"Materials science","score":0.1583678424358368},{"id":"https://openalex.org/keywords/artificial-intelligence","display_name":"Artificial intelligence","score":0.149886816740036},{"id":"https://openalex.org/keywords/engineering","display_name":"Engineering","score":0.10272207856178284},{"id":"https://openalex.org/keywords/physics","display_name":"Physics","score":0.09402862191200256},{"id":"https://openalex.org/keywords/optics","display_name":"Optics","score":0.0671478807926178}],"concepts":[{"id":"https://openalex.org/C126980161","wikidata":"https://www.wikidata.org/wiki/Q863783","display_name":"Simulated annealing","level":2,"score":0.8869197368621826},{"id":"https://openalex.org/C155175808","wikidata":"https://www.wikidata.org/wiki/Q1326472","display_name":"Electrical impedance tomography","level":3,"score":0.8631742000579834},{"id":"https://openalex.org/C17829176","wikidata":"https://www.wikidata.org/wiki/Q179043","display_name":"Electrical impedance","level":2,"score":0.6134138703346252},{"id":"https://openalex.org/C126255220","wikidata":"https://www.wikidata.org/wiki/Q141495","display_name":"Mathematical optimization","level":1,"score":0.523823082447052},{"id":"https://openalex.org/C41008148","wikidata":"https://www.wikidata.org/wiki/Q21198","display_name":"Computer science","level":0,"score":0.48723092675209045},{"id":"https://openalex.org/C11413529","wikidata":"https://www.wikidata.org/wiki/Q8366","display_name":"Algorithm","level":1,"score":0.4732035994529724},{"id":"https://openalex.org/C141379421","wikidata":"https://www.wikidata.org/wiki/Q6094427","display_name":"Iterative reconstruction","level":2,"score":0.4672085642814636},{"id":"https://openalex.org/C14036430","wikidata":"https://www.wikidata.org/wiki/Q3736076","display_name":"Function (biology)","level":2,"score":0.46687620878219604},{"id":"https://openalex.org/C163716698","wikidata":"https://www.wikidata.org/wiki/Q841267","display_name":"Tomography","level":2,"score":0.4660651981830597},{"id":"https://openalex.org/C46714192","wikidata":"https://www.wikidata.org/wiki/Q4680763","display_name":"Adaptive simulated annealing","level":3,"score":0.46535617113113403},{"id":"https://openalex.org/C2777855556","wikidata":"https://www.wikidata.org/wiki/Q4339544","display_name":"Annealing (glass)","level":2,"score":0.4644337594509125},{"id":"https://openalex.org/C33923547","wikidata":"https://www.wikidata.org/wiki/Q395","display_name":"Mathematics","level":0,"score":0.30467289686203003},{"id":"https://openalex.org/C192562407","wikidata":"https://www.wikidata.org/wiki/Q228736","display_name":"Materials science","level":0,"score":0.1583678424358368},{"id":"https://openalex.org/C154945302","wikidata":"https://www.wikidata.org/wiki/Q11660","display_name":"Artificial intelligence","level":1,"score":0.149886816740036},{"id":"https://openalex.org/C127413603","wikidata":"https://www.wikidata.org/wiki/Q11023","display_name":"Engineering","level":0,"score":0.10272207856178284},{"id":"https://openalex.org/C121332964","wikidata":"https://www.wikidata.org/wiki/Q413","display_name":"Physics","level":0,"score":0.09402862191200256},{"id":"https://openalex.org/C120665830","wikidata":"https://www.wikidata.org/wiki/Q14620","display_name":"Optics","level":1,"score":0.0671478807926178},{"id":"https://openalex.org/C119599485","wikidata":"https://www.wikidata.org/wiki/Q43035","display_name":"Electrical engineering","level":1,"score":0.0},{"id":"https://openalex.org/C159985019","wikidata":"https://www.wikidata.org/wiki/Q181790","display_name":"Composite material","level":1,"score":0.0},{"id":"https://openalex.org/C78458016","wikidata":"https://www.wikidata.org/wiki/Q840400","display_name":"Evolutionary biology","level":1,"score":0.0},{"id":"https://openalex.org/C86803240","wikidata":"https://www.wikidata.org/wiki/Q420","display_name":"Biology","level":0,"score":0.0}],"mesh":[{"descriptor_ui":"D000465","descriptor_name":"Algorithms","qualifier_ui":null,"qualifier_name":null,"is_major_topic":false},{"descriptor_ui":"D000465","descriptor_name":"Algorithms","qualifier_ui":null,"qualifier_name":null,"is_major_topic":false},{"descriptor_ui":"D000465","descriptor_name":"Algorithms","qualifier_ui":null,"qualifier_name":null,"is_major_topic":false},{"descriptor_ui":"D003198","descriptor_name":"Computer Simulation","qualifier_ui":null,"qualifier_name":null,"is_major_topic":false},{"descriptor_ui":"D003198","descriptor_name":"Computer Simulation","qualifier_ui":null,"qualifier_name":null,"is_major_topic":false},{"descriptor_ui":"D003198","descriptor_name":"Computer Simulation","qualifier_ui":null,"qualifier_name":null,"is_major_topic":false},{"descriptor_ui":"D004566","descriptor_name":"Electrodes","qualifier_ui":null,"qualifier_name":null,"is_major_topic":false},{"descriptor_ui":"D004566","descriptor_name":"Electrodes","qualifier_ui":null,"qualifier_name":null,"is_major_topic":false},{"descriptor_ui":"D004566","descriptor_name":"Electrodes","qualifier_ui":null,"qualifier_name":null,"is_major_topic":false},{"descriptor_ui":"D004594","descriptor_name":"Electrophysiology","qualifier_ui":"Q000379","qualifier_name":"methods","is_major_topic":false},{"descriptor_ui":"D004594","descriptor_name":"Electrophysiology","qualifier_ui":"Q000379","qualifier_name":"methods","is_major_topic":false},{"descriptor_ui":"D004594","descriptor_name":"Electrophysiology","qualifier_ui":"Q000379","qualifier_name":"methods","is_major_topic":false},{"descriptor_ui":"D004867","descriptor_name":"Equipment Design","qualifier_ui":null,"qualifier_name":null,"is_major_topic":false},{"descriptor_ui":"D004867","descriptor_name":"Equipment Design","qualifier_ui":null,"qualifier_name":null,"is_major_topic":false},{"descriptor_ui":"D004867","descriptor_name":"Equipment Design","qualifier_ui":null,"qualifier_name":null,"is_major_topic":false},{"descriptor_ui":"D006801","descriptor_name":"Humans","qualifier_ui":null,"qualifier_name":null,"is_major_topic":false},{"descriptor_ui":"D006801","descriptor_name":"Humans","qualifier_ui":null,"qualifier_name":null,"is_major_topic":false},{"descriptor_ui":"D006801","descriptor_name":"Humans","qualifier_ui":null,"qualifier_name":null,"is_major_topic":false},{"descriptor_ui":"D007091","descriptor_name":"Image Processing, Computer-Assisted","qualifier_ui":"Q000379","qualifier_name":"methods","is_major_topic":false},{"descriptor_ui":"D007091","descriptor_name":"Image Processing, Computer-Assisted","qualifier_ui":"Q000379","qualifier_name":"methods","is_major_topic":false},{"descriptor_ui":"D007091","descriptor_name":"Image Processing, Computer-Assisted","qualifier_ui":"Q000379","qualifier_name":"methods","is_major_topic":false},{"descriptor_ui":"D013696","descriptor_name":"Temperature","qualifier_ui":null,"qualifier_name":null,"is_major_topic":false},{"descriptor_ui":"D013696","descriptor_name":"Temperature","qualifier_ui":null,"qualifier_name":null,"is_major_topic":false},{"descriptor_ui":"D013696","descriptor_name":"Temperature","qualifier_ui":null,"qualifier_name":null,"is_major_topic":false},{"descriptor_ui":"D015203","descriptor_name":"Reproducibility of Results","qualifier_ui":null,"qualifier_name":null,"is_major_topic":false},{"descriptor_ui":"D015203","descriptor_name":"Reproducibility of Results","qualifier_ui":null,"qualifier_name":null,"is_major_topic":false},{"descriptor_ui":"D015203","descriptor_name":"Reproducibility of Results","qualifier_ui":null,"qualifier_name":null,"is_major_topic":false},{"descriptor_ui":"D015233","descriptor_name":"Models, Statistical","qualifier_ui":null,"qualifier_name":null,"is_major_topic":false},{"descriptor_ui":"D015233","descriptor_name":"Models, Statistical","qualifier_ui":null,"qualifier_name":null,"is_major_topic":false},{"descriptor_ui":"D015233","descriptor_name":"Models, Statistical","qualifier_ui":null,"qualifier_name":null,"is_major_topic":false},{"descriptor_ui":"D017097","descriptor_name":"Electric Impedance","qualifier_ui":null,"qualifier_name":null,"is_major_topic":true},{"descriptor_ui":"D017097","descriptor_name":"Electric Impedance","qualifier_ui":null,"qualifier_name":null,"is_major_topic":true},{"descriptor_ui":"D017097","descriptor_name":"Electric Impedance","qualifier_ui":null,"qualifier_name":null,"is_major_topic":true},{"descriptor_ui":"D019047","descriptor_name":"Phantoms, Imaging","qualifier_ui":null,"qualifier_name":null,"is_major_topic":false},{"descriptor_ui":"D019047","descriptor_name":"Phantoms, Imaging","qualifier_ui":null,"qualifier_name":null,"is_major_topic":false},{"descriptor_ui":"D019047","descriptor_name":"Phantoms, Imaging","qualifier_ui":null,"qualifier_name":null,"is_major_topic":false},{"descriptor_ui":"D020342","descriptor_name":"Finite Element Analysis","qualifier_ui":null,"qualifier_name":null,"is_major_topic":false},{"descriptor_ui":"D020342","descriptor_name":"Finite Element Analysis","qualifier_ui":null,"qualifier_name":null,"is_major_topic":false},{"descriptor_ui":"D020342","descriptor_name":"Finite Element Analysis","qualifier_ui":null,"qualifier_name":null,"is_major_topic":false}],"locations_count":2,"locations":[{"id":"doi:10.1109/iembs.2011.6091778","is_oa":false,"landing_page_url":"https://doi.org/10.1109/iembs.2011.6091778","pdf_url":null,"source":null,"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"2011 Annual International Conference of the IEEE Engineering in Medicine and Biology Society","raw_type":"proceedings-article"},{"id":"pmid:22255958","is_oa":false,"landing_page_url":"https://pubmed.ncbi.nlm.nih.gov/22255958","pdf_url":null,"source":{"id":"https://openalex.org/S4306525036","display_name":"PubMed","issn_l":null,"issn":null,"is_oa":false,"is_in_doaj":false,"is_core":false,"host_organization":"https://openalex.org/I1299303238","host_organization_name":"National Institutes of Health","host_organization_lineage":["https://openalex.org/I1299303238"],"host_organization_lineage_names":[],"type":"repository"},"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"Annual International Conference of the IEEE Engineering in Medicine and Biology Society. IEEE Engineering in Medicine and Biology Society. Annual International Conference","raw_type":null}],"best_oa_location":null,"sustainable_development_goals":[],"awards":[],"funders":[],"has_content":{"pdf":false,"grobid_xml":false},"content_urls":null,"referenced_works_count":14,"referenced_works":["https://openalex.org/W1777984739","https://openalex.org/W1969468690","https://openalex.org/W1995970316","https://openalex.org/W2008182965","https://openalex.org/W2021847672","https://openalex.org/W2023891589","https://openalex.org/W2064694526","https://openalex.org/W2098841537","https://openalex.org/W2104494306","https://openalex.org/W2107810166","https://openalex.org/W2111805630","https://openalex.org/W2137376807","https://openalex.org/W2278331350","https://openalex.org/W6652030021"],"related_works":["https://openalex.org/W3211685995","https://openalex.org/W2532315310","https://openalex.org/W2077092686","https://openalex.org/W2261837478","https://openalex.org/W3007136692","https://openalex.org/W2902419700","https://openalex.org/W3160616384","https://openalex.org/W1967687468","https://openalex.org/W2905540725","https://openalex.org/W4376629886"],"abstract_inverted_index":{"The":[0,82],"EIT":[1,59],"reconstruction":[2,83],"problem":[3,9,26],"is":[4,22,27,64,85],"approached":[5],"as":[6],"an":[7],"optimization":[8,25],"where":[10,60],"the":[11,19,42,47,61,73,76,79],"difference":[12],"between":[13],"a":[14,36,53],"simulated":[15,88],"impedance":[16],"domain":[17],"and":[18,89],"observed":[20],"one":[21],"minimized.":[23],"This":[24],"often":[28],"solved":[29],"by":[30],"Simulated":[31],"Annealing":[32],"(SA),":[33],"but":[34],"at":[35],"large":[37],"computational":[38],"cost":[39],"due":[40],"to":[41,58],"expensive":[43],"evaluation":[44],"process":[45],"of":[46,55,78],"objective":[48,62],"function.":[49],"We":[50],"propose":[51],"here,":[52],"variation":[54],"SA":[56],"applied":[57],"function":[63],"evaluated":[65,86],"only":[66],"partially,":[67],"while":[68],"ensuring":[69],"upper":[70],"boundaries":[71],"on":[72,75],"deviation":[74],"behavior":[77],"modified":[80],"SA.":[81],"method":[84],"with":[87],"experimental":[90],"data.":[91]},"counts_by_year":[{"year":2026,"cited_by_count":1},{"year":2024,"cited_by_count":2},{"year":2022,"cited_by_count":2},{"year":2021,"cited_by_count":11},{"year":2020,"cited_by_count":1},{"year":2019,"cited_by_count":1},{"year":2018,"cited_by_count":2},{"year":2016,"cited_by_count":3},{"year":2014,"cited_by_count":3},{"year":2013,"cited_by_count":1},{"year":2012,"cited_by_count":2}],"updated_date":"2026-07-29T14:22:42.915294","created_date":"2025-10-10T00:00:00"}