{"id":"https://openalex.org/W4391422945","doi":"https://doi.org/10.1109/ieem58616.2023.10406686","title":"Control Chart Pattern Recognition Based on MDWOP and Ensemble Classifier","display_name":"Control Chart Pattern Recognition Based on MDWOP and Ensemble Classifier","publication_year":2023,"publication_date":"2023-12-18","ids":{"openalex":"https://openalex.org/W4391422945","doi":"https://doi.org/10.1109/ieem58616.2023.10406686"},"language":"en","primary_location":{"id":"doi:10.1109/ieem58616.2023.10406686","is_oa":false,"landing_page_url":"http://dx.doi.org/10.1109/ieem58616.2023.10406686","pdf_url":null,"source":null,"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"2023 IEEE International Conference on Industrial Engineering and Engineering Management (IEEM)","raw_type":"proceedings-article"},"type":"conference-paper","indexed_in":["crossref"],"open_access":{"is_oa":false,"oa_status":"closed","oa_url":null,"any_repository_has_fulltext":false},"authorships":[{"author_position":"first","author":{"id":"https://openalex.org/A5100669064","display_name":"Yazhou Li","orcid":"https://orcid.org/0000-0003-4401-2698"},"institutions":[{"id":"https://openalex.org/I82880672","display_name":"Beihang University","ror":"https://ror.org/00wk2mp56","country_code":"CN","type":"education","lineage":["https://openalex.org/I82880672"]}],"countries":["CN"],"is_corresponding":false,"raw_author_name":"Yazhou Li","raw_affiliation_strings":["School of Reliability and Systems Engineering, Beihang University,Beijing,China","School of Reliability and Systems Engineering, Beihang University, Beijing, China"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"School of Reliability and Systems Engineering, Beihang University,Beijing,China","institution_ids":["https://openalex.org/I82880672"]},{"raw_affiliation_string":"School of Reliability and Systems Engineering, Beihang University, Beijing, China","institution_ids":["https://openalex.org/I82880672"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5100622398","display_name":"Yan-Yun Ma","orcid":"https://orcid.org/0000-0002-1867-7963"},"institutions":[],"countries":[],"is_corresponding":false,"raw_author_name":"Yanyun Ma","raw_affiliation_strings":["Aerospace Precision Products Co., Ltd,Tianjin,China","Aerospace Precision Products Co., Ltd, Tianjin, China"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Aerospace Precision Products Co., Ltd,Tianjin,China","institution_ids":[]},{"raw_affiliation_string":"Aerospace Precision Products Co., Ltd, Tianjin, China","institution_ids":[]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5081209439","display_name":"Wei Dai","orcid":"https://orcid.org/0000-0002-7376-6977"},"institutions":[{"id":"https://openalex.org/I82880672","display_name":"Beihang University","ror":"https://ror.org/00wk2mp56","country_code":"CN","type":"education","lineage":["https://openalex.org/I82880672"]}],"countries":["CN"],"is_corresponding":false,"raw_author_name":"Wei Dai","raw_affiliation_strings":["School of Reliability and Systems Engineering, Beihang University,Beijing,China","School of Reliability and Systems Engineering, Beihang University, Beijing, China"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"School of Reliability and Systems Engineering, Beihang University,Beijing,China","institution_ids":["https://openalex.org/I82880672"]},{"raw_affiliation_string":"School of Reliability and Systems Engineering, Beihang University, Beijing, China","institution_ids":["https://openalex.org/I82880672"]}]},{"author_position":"last","author":{"id":"https://openalex.org/A5101798257","display_name":"Weifang Zhang","orcid":"https://orcid.org/0000-0002-6222-278X"},"institutions":[{"id":"https://openalex.org/I82880672","display_name":"Beihang University","ror":"https://ror.org/00wk2mp56","country_code":"CN","type":"education","lineage":["https://openalex.org/I82880672"]}],"countries":["CN"],"is_corresponding":false,"raw_author_name":"Weifang Zhang","raw_affiliation_strings":["School of Reliability and Systems Engineering, Beihang University,Beijing,China","School of Reliability and Systems Engineering, Beihang University, Beijing, China"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"School of Reliability and Systems Engineering, Beihang University,Beijing,China","institution_ids":["https://openalex.org/I82880672"]},{"raw_affiliation_string":"School of Reliability and Systems Engineering, Beihang University, Beijing, China","institution_ids":["https://openalex.org/I82880672"]}]}],"institutions":[],"countries_distinct_count":1,"institutions_distinct_count":1,"corresponding_author_ids":[],"corresponding_institution_ids":[],"apc_list":null,"apc_paid":null,"fwci":0.0,"has_fulltext":false,"cited_by_count":0,"citation_normalized_percentile":{"value":0.40009145,"is_in_top_1_percent":false,"is_in_top_10_percent":false},"cited_by_percentile_year":null,"biblio":{"volume":null,"issue":null,"first_page":"1763","last_page":"1767"},"is_retracted":false,"is_paratext":false,"is_xpac":false,"primary_topic":{"id":"https://openalex.org/T11443","display_name":"Advanced Statistical Process Monitoring","score":0.9937999844551086,"subfield":{"id":"https://openalex.org/subfields/1804","display_name":"Statistics, Probability and Uncertainty"},"field":{"id":"https://openalex.org/fields/18","display_name":"Decision Sciences"},"domain":{"id":"https://openalex.org/domains/2","display_name":"Social Sciences"}},"topics":[{"id":"https://openalex.org/T11443","display_name":"Advanced Statistical Process Monitoring","score":0.9937999844551086,"subfield":{"id":"https://openalex.org/subfields/1804","display_name":"Statistics, Probability and Uncertainty"},"field":{"id":"https://openalex.org/fields/18","display_name":"Decision Sciences"},"domain":{"id":"https://openalex.org/domains/2","display_name":"Social Sciences"}},{"id":"https://openalex.org/T10876","display_name":"Fault Detection and Control Systems","score":0.9783999919891357,"subfield":{"id":"https://openalex.org/subfields/2207","display_name":"Control and Systems Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T12111","display_name":"Industrial Vision Systems and Defect Detection","score":0.972599983215332,"subfield":{"id":"https://openalex.org/subfields/2209","display_name":"Industrial and Manufacturing Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"keywords":[{"id":"https://openalex.org/keywords/pattern-recognition","display_name":"Pattern recognition (psychology)","score":0.752507209777832},{"id":"https://openalex.org/keywords/classifier","display_name":"Classifier (UML)","score":0.7515160441398621},{"id":"https://openalex.org/keywords/computer-science","display_name":"Computer science","score":0.7212598919868469},{"id":"https://openalex.org/keywords/control-chart","display_name":"Control chart","score":0.6687004566192627},{"id":"https://openalex.org/keywords/artificial-intelligence","display_name":"Artificial intelligence","score":0.647585391998291},{"id":"https://openalex.org/keywords/feature-extraction","display_name":"Feature extraction","score":0.5669015049934387},{"id":"https://openalex.org/keywords/chart","display_name":"Chart","score":0.5373564958572388},{"id":"https://openalex.org/keywords/feature","display_name":"Feature (linguistics)","score":0.42790257930755615},{"id":"https://openalex.org/keywords/data-mining","display_name":"Data mining","score":0.37763795256614685},{"id":"https://openalex.org/keywords/process","display_name":"Process (computing)","score":0.26031380891799927},{"id":"https://openalex.org/keywords/mathematics","display_name":"Mathematics","score":0.16447582840919495},{"id":"https://openalex.org/keywords/statistics","display_name":"Statistics","score":0.08942791819572449}],"concepts":[{"id":"https://openalex.org/C153180895","wikidata":"https://www.wikidata.org/wiki/Q7148389","display_name":"Pattern recognition (psychology)","level":2,"score":0.752507209777832},{"id":"https://openalex.org/C95623464","wikidata":"https://www.wikidata.org/wiki/Q1096149","display_name":"Classifier (UML)","level":2,"score":0.7515160441398621},{"id":"https://openalex.org/C41008148","wikidata":"https://www.wikidata.org/wiki/Q21198","display_name":"Computer science","level":0,"score":0.7212598919868469},{"id":"https://openalex.org/C196985124","wikidata":"https://www.wikidata.org/wiki/Q1369242","display_name":"Control chart","level":3,"score":0.6687004566192627},{"id":"https://openalex.org/C154945302","wikidata":"https://www.wikidata.org/wiki/Q11660","display_name":"Artificial intelligence","level":1,"score":0.647585391998291},{"id":"https://openalex.org/C52622490","wikidata":"https://www.wikidata.org/wiki/Q1026626","display_name":"Feature extraction","level":2,"score":0.5669015049934387},{"id":"https://openalex.org/C190812933","wikidata":"https://www.wikidata.org/wiki/Q28923","display_name":"Chart","level":2,"score":0.5373564958572388},{"id":"https://openalex.org/C2776401178","wikidata":"https://www.wikidata.org/wiki/Q12050496","display_name":"Feature (linguistics)","level":2,"score":0.42790257930755615},{"id":"https://openalex.org/C124101348","wikidata":"https://www.wikidata.org/wiki/Q172491","display_name":"Data mining","level":1,"score":0.37763795256614685},{"id":"https://openalex.org/C98045186","wikidata":"https://www.wikidata.org/wiki/Q205663","display_name":"Process (computing)","level":2,"score":0.26031380891799927},{"id":"https://openalex.org/C33923547","wikidata":"https://www.wikidata.org/wiki/Q395","display_name":"Mathematics","level":0,"score":0.16447582840919495},{"id":"https://openalex.org/C105795698","wikidata":"https://www.wikidata.org/wiki/Q12483","display_name":"Statistics","level":1,"score":0.08942791819572449},{"id":"https://openalex.org/C138885662","wikidata":"https://www.wikidata.org/wiki/Q5891","display_name":"Philosophy","level":0,"score":0.0},{"id":"https://openalex.org/C111919701","wikidata":"https://www.wikidata.org/wiki/Q9135","display_name":"Operating system","level":1,"score":0.0},{"id":"https://openalex.org/C41895202","wikidata":"https://www.wikidata.org/wiki/Q8162","display_name":"Linguistics","level":1,"score":0.0}],"mesh":[],"locations_count":1,"locations":[{"id":"doi:10.1109/ieem58616.2023.10406686","is_oa":false,"landing_page_url":"http://dx.doi.org/10.1109/ieem58616.2023.10406686","pdf_url":null,"source":null,"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"2023 IEEE International Conference on Industrial Engineering and Engineering Management (IEEM)","raw_type":"proceedings-article"}],"best_oa_location":null,"sustainable_development_goals":[],"awards":[],"funders":[],"has_content":{"pdf":false,"grobid_xml":false},"content_urls":null,"referenced_works_count":12,"referenced_works":["https://openalex.org/W2291427785","https://openalex.org/W2939733432","https://openalex.org/W3005583742","https://openalex.org/W3118773983","https://openalex.org/W3125287499","https://openalex.org/W3154466253","https://openalex.org/W3195598455","https://openalex.org/W4206013430","https://openalex.org/W4220943905","https://openalex.org/W4285007727","https://openalex.org/W4316372785","https://openalex.org/W4318612701"],"related_works":["https://openalex.org/W4245271849","https://openalex.org/W2257327145","https://openalex.org/W2732724927","https://openalex.org/W2946299465","https://openalex.org/W2094230469","https://openalex.org/W2126524872","https://openalex.org/W4386867921","https://openalex.org/W627037946","https://openalex.org/W2911502181","https://openalex.org/W4380272213"],"abstract_inverted_index":{"The":[0,24],"anomalies":[1,17],"in":[2],"product":[3,9,22],"manufacturing":[4],"process":[5],"are":[6],"related":[7],"to":[8,20,36,124],"defects,":[10],"and":[11,59,69,91,98,147],"the":[12,42,49,53,56,63,89,96,101,133,137,153],"accurate":[13],"detection":[14],"of":[15,41,52,62,72,95,103,136,152],"these":[16],"is":[18,84,122,145,148],"conducive":[19],"improving":[21],"quality.":[23],"feature-based":[25],"control":[26,73],"chart":[27,74],"pattern":[28,75,82],"recognition":[29,70,116,127],"(CCPR)":[30],"method":[31,71,117,139],"has":[32],"been":[33],"widely":[34],"applied":[35],"this":[37],"problem.":[38],"However,":[39],"most":[40],"existing":[43],"feature":[44,67],"methods":[45],"only":[46],"focus":[47],"on":[48,78,109,119],"amplitude":[50,90],"characteristics":[51,58,94],"data,":[54,97],"ignoring":[55],"structural":[57],"sequence":[60,92],"relations":[61],"data.":[64],"A":[65],"novel":[66],"extraction":[68],"(CCP)":[76],"based":[77,108,118],"multi-delay":[79,120],"weighted":[80],"ordinal":[81],"(MDWOP)":[83],"proposed.":[85],"MDWOP":[86],"features":[87,121],"integrate":[88],"structure":[93],"comprehensively":[99],"characterize":[100],"complexity":[102],"CCP":[104],"from":[105],"different":[106],"scales":[107],"time":[110],"delay":[111],"parameters.":[112],"An":[113],"ensemble":[114],"classifier":[115,155],"proposed":[123,138],"improve":[125],"model":[126],"accuracy.":[128],"Simulation":[129],"results":[130],"show":[131],"that":[132,151],"average":[134],"accuracy":[135],"for":[140],"eight":[141],"small":[142],"fluctuation":[143],"CCPs":[144],"95.44%,":[146],"better":[149],"than":[150],"single":[154],"method.":[156]},"counts_by_year":[],"updated_date":"2026-07-29T14:22:42.915294","created_date":"2025-10-10T00:00:00"}