{"id":"https://openalex.org/W4205601886","doi":"https://doi.org/10.1109/ieem50564.2021.9672908","title":"PDMS-based RF Resonant Sensor for Measuring the Concentration of Micro-Plastics","display_name":"PDMS-based RF Resonant Sensor for Measuring the Concentration of Micro-Plastics","publication_year":2021,"publication_date":"2021-12-13","ids":{"openalex":"https://openalex.org/W4205601886","doi":"https://doi.org/10.1109/ieem50564.2021.9672908"},"language":"en","primary_location":{"id":"doi:10.1109/ieem50564.2021.9672908","is_oa":false,"landing_page_url":"https://doi.org/10.1109/ieem50564.2021.9672908","pdf_url":null,"source":{"id":"https://openalex.org/S4363607822","display_name":"2021 IEEE International Conference on Industrial Engineering and Engineering Management (IEEM)","issn_l":null,"issn":null,"is_oa":false,"is_in_doaj":false,"is_core":false,"host_organization":null,"host_organization_name":null,"host_organization_lineage":[],"host_organization_lineage_names":[],"type":"conference"},"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"2021 IEEE International Conference on Industrial Engineering and Engineering Management (IEEM)","raw_type":"proceedings-article"},"type":"article","indexed_in":["crossref"],"open_access":{"is_oa":false,"oa_status":"closed","oa_url":null,"any_repository_has_fulltext":false},"authorships":[{"author_position":"first","author":{"id":"https://openalex.org/A5056918782","display_name":"J. H. Kim","orcid":null},"institutions":[{"id":"https://openalex.org/I4210131650","display_name":"Korea Electronics Technology Institute","ror":"https://ror.org/039k6f508","country_code":"KR","type":"facility","lineage":["https://openalex.org/I2801339556","https://openalex.org/I4210089395","https://openalex.org/I4210131650"]},{"id":"https://openalex.org/I139264467","display_name":"Seoul National University","ror":"https://ror.org/04h9pn542","country_code":"KR","type":"education","lineage":["https://openalex.org/I139264467"]}],"countries":["KR"],"is_corresponding":true,"raw_author_name":"J. H. Kim","raw_affiliation_strings":["Department of Electrical and Computer Engineering, Seoul National University, Seoul, Korea","Department of Industrial Engineering, Korea Electronics Technology Institute, Seongnam, Korea"],"affiliations":[{"raw_affiliation_string":"Department of Electrical and Computer Engineering, Seoul National University, Seoul, Korea","institution_ids":["https://openalex.org/I139264467"]},{"raw_affiliation_string":"Department of Industrial Engineering, Korea Electronics Technology Institute, Seongnam, Korea","institution_ids":["https://openalex.org/I4210131650"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5019883517","display_name":"K. H. Lee","orcid":null},"institutions":[{"id":"https://openalex.org/I4210131650","display_name":"Korea Electronics Technology Institute","ror":"https://ror.org/039k6f508","country_code":"KR","type":"facility","lineage":["https://openalex.org/I2801339556","https://openalex.org/I4210089395","https://openalex.org/I4210131650"]}],"countries":["KR"],"is_corresponding":false,"raw_author_name":"K. H. Lee","raw_affiliation_strings":["Department of Industrial Engineering, Korea Electronics Technology Institute, Seongnam, Korea"],"affiliations":[{"raw_affiliation_string":"Department of Industrial Engineering, Korea Electronics Technology Institute, Seongnam, Korea","institution_ids":["https://openalex.org/I4210131650"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5039970763","display_name":"C. U.","orcid":null},"institutions":[{"id":"https://openalex.org/I4210131650","display_name":"Korea Electronics Technology Institute","ror":"https://ror.org/039k6f508","country_code":"KR","type":"facility","lineage":["https://openalex.org/I2801339556","https://openalex.org/I4210089395","https://openalex.org/I4210131650"]}],"countries":["KR"],"is_corresponding":false,"raw_author_name":"C. U. Cha","raw_affiliation_strings":["Department of Industrial Engineering, Korea Electronics Technology Institute, Seongnam, Korea"],"affiliations":[{"raw_affiliation_string":"Department of Industrial Engineering, Korea Electronics Technology Institute, Seongnam, Korea","institution_ids":["https://openalex.org/I4210131650"]}]},{"author_position":"last","author":{"id":"https://openalex.org/A5056962742","display_name":"Yuntei Hong","orcid":null},"institutions":[{"id":"https://openalex.org/I139264467","display_name":"Seoul National University","ror":"https://ror.org/04h9pn542","country_code":"KR","type":"education","lineage":["https://openalex.org/I139264467"]}],"countries":["KR"],"is_corresponding":false,"raw_author_name":"Y. T. Hong","raw_affiliation_strings":["Department of Electrical and Computer Engineering, Seoul National University, Seoul, Korea"],"affiliations":[{"raw_affiliation_string":"Department of Electrical and Computer Engineering, Seoul National University, Seoul, Korea","institution_ids":["https://openalex.org/I139264467"]}]}],"institutions":[],"countries_distinct_count":1,"institutions_distinct_count":4,"corresponding_author_ids":["https://openalex.org/A5056918782"],"corresponding_institution_ids":["https://openalex.org/I139264467","https://openalex.org/I4210131650"],"apc_list":null,"apc_paid":null,"fwci":0.6929,"has_fulltext":false,"cited_by_count":3,"citation_normalized_percentile":{"value":0.65366615,"is_in_top_1_percent":false,"is_in_top_10_percent":false},"cited_by_percentile_year":{"min":89,"max":99},"biblio":{"volume":null,"issue":null,"first_page":"293","last_page":"296"},"is_retracted":false,"is_paratext":false,"is_xpac":false,"primary_topic":{"id":"https://openalex.org/T10753","display_name":"Microplastics and Plastic Pollution","score":0.9994000196456909,"subfield":{"id":"https://openalex.org/subfields/2310","display_name":"Pollution"},"field":{"id":"https://openalex.org/fields/23","display_name":"Environmental Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},"topics":[{"id":"https://openalex.org/T10753","display_name":"Microplastics and Plastic Pollution","score":0.9994000196456909,"subfield":{"id":"https://openalex.org/subfields/2310","display_name":"Pollution"},"field":{"id":"https://openalex.org/fields/23","display_name":"Environmental Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T12017","display_name":"Recycling and Waste Management Techniques","score":0.9904000163078308,"subfield":{"id":"https://openalex.org/subfields/2311","display_name":"Industrial and Manufacturing Engineering"},"field":{"id":"https://openalex.org/fields/23","display_name":"Environmental Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T14318","display_name":"Polydiacetylene-based materials and applications","score":0.9761000275611877,"subfield":{"id":"https://openalex.org/subfields/1605","display_name":"Organic Chemistry"},"field":{"id":"https://openalex.org/fields/16","display_name":"Chemistry"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"keywords":[{"id":"https://openalex.org/keywords/microplastics","display_name":"Microplastics","score":0.9031810164451599},{"id":"https://openalex.org/keywords/dielectric","display_name":"Dielectric","score":0.7299843430519104},{"id":"https://openalex.org/keywords/capacitor","display_name":"Capacitor","score":0.727081298828125},{"id":"https://openalex.org/keywords/materials-science","display_name":"Materials science","score":0.5780429840087891},{"id":"https://openalex.org/keywords/optoelectronics","display_name":"Optoelectronics","score":0.48407402634620667},{"id":"https://openalex.org/keywords/particle","display_name":"Particle (ecology)","score":0.4823450446128845},{"id":"https://openalex.org/keywords/radio-frequency","display_name":"Radio frequency","score":0.4533032178878784},{"id":"https://openalex.org/keywords/electrical-engineering","display_name":"Electrical engineering","score":0.3768499493598938},{"id":"https://openalex.org/keywords/electronic-engineering","display_name":"Electronic engineering","score":0.3715934753417969},{"id":"https://openalex.org/keywords/engineering","display_name":"Engineering","score":0.17403364181518555},{"id":"https://openalex.org/keywords/chemistry","display_name":"Chemistry","score":0.10526964068412781},{"id":"https://openalex.org/keywords/voltage","display_name":"Voltage","score":0.09859505295753479},{"id":"https://openalex.org/keywords/environmental-chemistry","display_name":"Environmental chemistry","score":0.0800575315952301}],"concepts":[{"id":"https://openalex.org/C2780401329","wikidata":"https://www.wikidata.org/wiki/Q6839919","display_name":"Microplastics","level":2,"score":0.9031810164451599},{"id":"https://openalex.org/C133386390","wikidata":"https://www.wikidata.org/wiki/Q184996","display_name":"Dielectric","level":2,"score":0.7299843430519104},{"id":"https://openalex.org/C52192207","wikidata":"https://www.wikidata.org/wiki/Q5322","display_name":"Capacitor","level":3,"score":0.727081298828125},{"id":"https://openalex.org/C192562407","wikidata":"https://www.wikidata.org/wiki/Q228736","display_name":"Materials science","level":0,"score":0.5780429840087891},{"id":"https://openalex.org/C49040817","wikidata":"https://www.wikidata.org/wiki/Q193091","display_name":"Optoelectronics","level":1,"score":0.48407402634620667},{"id":"https://openalex.org/C2778517922","wikidata":"https://www.wikidata.org/wiki/Q7140482","display_name":"Particle (ecology)","level":2,"score":0.4823450446128845},{"id":"https://openalex.org/C74064498","wikidata":"https://www.wikidata.org/wiki/Q3396184","display_name":"Radio frequency","level":2,"score":0.4533032178878784},{"id":"https://openalex.org/C119599485","wikidata":"https://www.wikidata.org/wiki/Q43035","display_name":"Electrical engineering","level":1,"score":0.3768499493598938},{"id":"https://openalex.org/C24326235","wikidata":"https://www.wikidata.org/wiki/Q126095","display_name":"Electronic engineering","level":1,"score":0.3715934753417969},{"id":"https://openalex.org/C127413603","wikidata":"https://www.wikidata.org/wiki/Q11023","display_name":"Engineering","level":0,"score":0.17403364181518555},{"id":"https://openalex.org/C185592680","wikidata":"https://www.wikidata.org/wiki/Q2329","display_name":"Chemistry","level":0,"score":0.10526964068412781},{"id":"https://openalex.org/C165801399","wikidata":"https://www.wikidata.org/wiki/Q25428","display_name":"Voltage","level":2,"score":0.09859505295753479},{"id":"https://openalex.org/C107872376","wikidata":"https://www.wikidata.org/wiki/Q321355","display_name":"Environmental chemistry","level":1,"score":0.0800575315952301},{"id":"https://openalex.org/C111368507","wikidata":"https://www.wikidata.org/wiki/Q43518","display_name":"Oceanography","level":1,"score":0.0},{"id":"https://openalex.org/C127313418","wikidata":"https://www.wikidata.org/wiki/Q1069","display_name":"Geology","level":0,"score":0.0}],"mesh":[],"locations_count":1,"locations":[{"id":"doi:10.1109/ieem50564.2021.9672908","is_oa":false,"landing_page_url":"https://doi.org/10.1109/ieem50564.2021.9672908","pdf_url":null,"source":{"id":"https://openalex.org/S4363607822","display_name":"2021 IEEE International Conference on Industrial Engineering and Engineering Management (IEEM)","issn_l":null,"issn":null,"is_oa":false,"is_in_doaj":false,"is_core":false,"host_organization":null,"host_organization_name":null,"host_organization_lineage":[],"host_organization_lineage_names":[],"type":"conference"},"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"2021 IEEE International Conference on Industrial Engineering and Engineering Management (IEEM)","raw_type":"proceedings-article"}],"best_oa_location":null,"sustainable_development_goals":[{"score":0.4699999988079071,"id":"https://metadata.un.org/sdg/7","display_name":"Affordable and clean energy"}],"awards":[],"funders":[],"has_content":{"pdf":false,"grobid_xml":false},"content_urls":null,"referenced_works_count":4,"referenced_works":["https://openalex.org/W1976960673","https://openalex.org/W2051121620","https://openalex.org/W2608368045","https://openalex.org/W3042481855"],"related_works":["https://openalex.org/W4366956929","https://openalex.org/W4292702250","https://openalex.org/W4313424063","https://openalex.org/W3137432639","https://openalex.org/W3008604706","https://openalex.org/W4293363595","https://openalex.org/W2922519157","https://openalex.org/W3005399349","https://openalex.org/W3131968902","https://openalex.org/W205778126"],"abstract_inverted_index":{"Recently,":[0],"microplastics":[1,14,40,88],"have":[2],"become":[3],"a":[4,16,32,101,108],"big":[5],"problem,":[6],"but":[7],"conventional":[8],"particle":[9,103],"analyzers":[10],"that":[11,87,100],"can":[12,93,104],"detect":[13,39],"require":[15],"lot":[17],"of":[18,62],"time":[19],"and":[20,53,96],"cost,":[21],"so":[22],"in":[23,26,69,81],"this":[24,30,82],"paper,":[25],"order":[27],"to":[28,38],"solve":[29],"issue,":[31],"low-cost":[33],"RF":[34,44,78],"sensor":[35,45,79],"was":[36,46,57,85,98],"designed":[37,47,80],"through":[41,59,107],"it.":[42],"The":[43],"using":[48],"the":[49,54,60,63,70,74,77],"L-C-L":[50],"resonance":[51],"structure,":[52],"microplastic":[55,68],"concentration":[56],"detected":[58],"change":[61],"dielectric":[64,71],"constant":[65],"by":[66],"collecting":[67],"space":[72],"between":[73],"capacitors.":[75],"Through":[76],"study,":[83],"it":[84,97],"confirmed":[86,99],"as":[89,91],"small":[90],"0.1%":[92],"be":[94,105],"detected,":[95],"single":[102],"distinguished":[106],"readout":[109],"circuit.":[110]},"counts_by_year":[{"year":2026,"cited_by_count":1},{"year":2024,"cited_by_count":1},{"year":2023,"cited_by_count":1}],"updated_date":"2025-11-06T03:46:38.306776","created_date":"2025-10-10T00:00:00"}